KR101496051B1 - 다이 본딩 위치 표시 방법 - Google Patents
다이 본딩 위치 표시 방법 Download PDFInfo
- Publication number
- KR101496051B1 KR101496051B1 KR20130145955A KR20130145955A KR101496051B1 KR 101496051 B1 KR101496051 B1 KR 101496051B1 KR 20130145955 A KR20130145955 A KR 20130145955A KR 20130145955 A KR20130145955 A KR 20130145955A KR 101496051 B1 KR101496051 B1 KR 101496051B1
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- South Korea
- Prior art keywords
- camera
- alignment mark
- screen
- dies
- die
- Prior art date
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- 238000000034 method Methods 0.000 title claims abstract description 24
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2408—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
- G01N2021/177—Detector of the video camera type
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- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Abstract
Description
도 2는 도 1에 도시된 카메라의 기준 위치를 기준으로 상기 카메라에서 확인된 얼라인 마크의 틀어진 정도를 확인하는 단계를 설명하기 위한 화면이다.
도 3은 도 1에 도시된 다이 본딩 위치 표시 방법에 따라 다이 본딩 위치와 순서가 표시된 화면이다.
30 : 화면 A : 얼라인 마크 중심
B : 화면 중심
Claims (3)
- 기판의 얼라인 마크를 카메라로 확인하는 단계;
상기 카메라에 확인된 얼라인 마크의 위치와 상기 카메라의 배율 정보를 이용하여 상기 카메라의 기준 위치를 기준으로 상기 카메라에서 확인된 상기 얼라인 마크의 틀어진 정도를 확인하는 단계; 및
상기 기판의 얼라인 마크를 기준으로 다이들이 본딩될 위치에 대한 좌표 정보, 상기 얼라인 마크의 틀어진 정도 및 상기 카메라의 배율 정보를 이용하여 상기 카메라와 연결된 화면에 상기 다이들의 본딩 위치를 표시하는 단계를 포함하는 것을 특징으로 하는 다이 본딩 위치 표시 방법. - 제1항에 있어서, 상기 얼라인 마크의 틀어진 정도는 상기 카메라가 상기 기준 위치에 위치할 때 상기 화면의 중심에서 상기 화면에 표시된 상기 얼라인 마크까지의 X축 거리, Y축 거리 및 상기 화면의 좌표축에 대한 상기 얼라인 마크의 회전 각도인 것을 특징으로 하는 다이 본딩 위치 표시 방법.
- 제1항에 있어서, 상기 화면에 표시되는 상기 다이들의 본딩 위치에는 상기 다이들이 부착될 순서도 같이 표시되는 것을 특징으로 하는 다이 본딩 위치 표시 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20130145955A KR101496051B1 (ko) | 2013-11-28 | 2013-11-28 | 다이 본딩 위치 표시 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20130145955A KR101496051B1 (ko) | 2013-11-28 | 2013-11-28 | 다이 본딩 위치 표시 방법 |
Publications (1)
Publication Number | Publication Date |
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KR101496051B1 true KR101496051B1 (ko) | 2015-02-25 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR20130145955A KR101496051B1 (ko) | 2013-11-28 | 2013-11-28 | 다이 본딩 위치 표시 방법 |
Country Status (1)
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KR (1) | KR101496051B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10763243B2 (en) | 2017-12-18 | 2020-09-01 | Samsung Electronics Co., Ltd. | Substrate bonding apparatus |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0689910A (ja) * | 1992-09-07 | 1994-03-29 | Toshiba Corp | ダイボンディング装置 |
JP2000217131A (ja) | 1999-01-22 | 2000-08-04 | Sony Corp | 位置認識情報生成方法と情報読取方法および仮想画像立体合成装置 |
JP2000230806A (ja) | 1999-02-09 | 2000-08-22 | Sony Corp | 位置認識装置、位置認識方法及び仮想画像立体合成装置 |
JP2004354320A (ja) | 2003-05-30 | 2004-12-16 | Mitsubishi Electric Engineering Co Ltd | 撮像対象物品の認識検定システム |
-
2013
- 2013-11-28 KR KR20130145955A patent/KR101496051B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0689910A (ja) * | 1992-09-07 | 1994-03-29 | Toshiba Corp | ダイボンディング装置 |
JP2000217131A (ja) | 1999-01-22 | 2000-08-04 | Sony Corp | 位置認識情報生成方法と情報読取方法および仮想画像立体合成装置 |
JP2000230806A (ja) | 1999-02-09 | 2000-08-22 | Sony Corp | 位置認識装置、位置認識方法及び仮想画像立体合成装置 |
JP2004354320A (ja) | 2003-05-30 | 2004-12-16 | Mitsubishi Electric Engineering Co Ltd | 撮像対象物品の認識検定システム |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10763243B2 (en) | 2017-12-18 | 2020-09-01 | Samsung Electronics Co., Ltd. | Substrate bonding apparatus |
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