KR101110713B1 - Dual line producing apparatus and method for solar battery - Google Patents

Abstract

The present invention relates to an apparatus and a method for producing a solar cell, and in particular, to arrange two printing units for printing a wafer, but only one inspection unit to improve productivity by requiring no additional inspection unit, thereby reducing equipment costs. The present invention relates to a dual-line production apparatus and a production method of solar cells, which can reduce costs and eventually reduce manufacturing costs of solar cells.

Dual Line, Inspection Device, Camera Alternator, Solar Cell

Description

Dual line producing apparatus and method for solar battery

The present invention relates to an apparatus and a method for producing a solar cell, and in particular, to arrange two printing units for printing a wafer, but only one inspection unit to improve productivity by requiring no additional inspection unit, thereby reducing equipment costs. The present invention relates to a dual-line production apparatus and a production method of solar cells, which can reduce costs and eventually reduce manufacturing costs of solar cells.

In general, a solar cell generates electron and hole pairs inside a semiconductor of a solar cell by light from outside, and electrons move to an n-type semiconductor by an electric field generated at a pn junction by the electron and hole pairs. Moving to p-type semiconductors produces power.

Types of solar cells can be broadly classified into compound based, organic based, and silicon based on their materials.

Among silicon-based solar cells, crystalline silicon solar cells having high energy conversion efficiency and relatively low manufacturing cost are widely used for ground power.

The crystalline solar cell forms a front electrode (Ag Paste), a back electrode (Ag + Al), a BSF (Backside Surface Field Effect) on a wafer coated with an antireflection film [AR], and performs drying and firing processes. Is produced through.

Such a solar cell production apparatus includes a transfer unit for transferring a wafer, a printing unit for printing the wafer, an inspection unit for inspecting the printed wafer, and a wafer passed through the inspection unit, as is widely known. And a housing for accommodating the discharge unit, the transfer unit, the printing unit, and the inspection unit.

The solar cell is produced by such a conventional production apparatus, and the wafer has a brittle property due to its brittleness, and the breakage rate of the wafer is greatly increased due to the process of repeating the printing process and the drying process using a screen printer. . In addition, a vision inspection system is installed for each process because a printed pattern inspection must be performed after the printing process.

Inspection of the wafer is largely performed by Broken, Chipping, Crack, μ-Crack, print pattern, foreign matter, printing precision.

Conventional vision inspection system uses a CCD camera to inspect μ-Crack through a system separate from wafer inspection (Broken, Chipping, Crack) and printing pattern [short, foreign material], printing accuracy [Align degree]. We examine and need two cameras.

In particular, when two printing units of solar cells are added to increase production, the inspection system should be added to two. However, in this case, a lot of costs are required to install equipment for the inspection system, resulting in an increase in manufacturing cost. There is this.

The present invention is to solve the above-mentioned problems, while the existing printing unit is expanded to two, but the inspection system can be maintained at one, so that the cost of equipment investment can reduce the manufacturing cost of the solar cell dual line production apparatus And to provide a production method.

A transfer unit for transferring the present wafer for achieving the above object, a printing unit for printing the wafer, an inspection unit for inspecting the printed wafer, an ejection unit for transferring the wafer passed through the inspection unit to the outside; In the production apparatus of a solar cell comprising a housing for receiving the transfer unit, the printing unit and the inspection unit, the inspection unit is mounted to the upper surface of the housing to generate a rotational force, and through the upper surface of the housing Dual line of solar cells including a camera rotating device including a rotating shaft extending to an inner surface of the housing and being rotated by the driving unit, a supporting arm extending to both sides of the rotating shaft, and two cameras respectively mounted to the supporting arm. There is a characteristic in the production apparatus.

In this case, the transfer unit, and may further include a controller connected to the printing unit, the inspection unit and the discharge unit.

In addition, the discharge unit may include a first discharge unit for transferring the wafer determined as a normal product to the outside in the inspection unit, and a second discharge unit for transferring the wafer determined as the defective product to the outside.

The apparatus may further include an illumination unit disposed on a bottom surface of the camera to supply light to the wafer.

In addition, the present invention is the first and second transfer unit for transferring two wafers, the first and second printing unit for printing the wafer, respectively, and the printed wafer and the first and second camera alternately An inspection unit for inspection, a discharge unit for transferring the wafer passing through the inspection unit to the outside, a transfer unit, a printing unit and a controller connected to the inspection unit, the transfer unit, the printing unit and the inspection unit A production method using a dual-line production apparatus of a solar cell including a housing, the method comprising: printing a wafer in the first printing unit, transferring the wafer to an inspection unit, and inspecting the wafer with a first camera and then claiming claim 1 Inspecting the wafer again with the second camera using the camera alternating device according to claim 1, and discharging the inspected wafer. There is another feature of the dual line production method of a solar cell with a camera alternating device comprising transferring to a net.

According to the present invention as described above, by increasing the number of printing units to two, it is possible to maintain a single inspection system while improving productivity, thereby reducing the manufacturing cost.

Hereinafter, the accompanying drawings and embodiments will be described in detail with respect to the present invention.

1 to 3 are perspective views of the production apparatus of the present invention.

4 to 9 are conceptual views showing the production method of the present invention.

The present invention is described in the following embodiments as a dual line production apparatus 100 of a solar cell and a production method (S100, S200, S300) using the same.

Example 1

In this embodiment, the dual line production apparatus 100 of the solar cell will be described with reference to FIGS. 1 to 3.

The production apparatus 100 includes a transfer unit 250 for transferring a wafer (not shown), a printing unit 210 for printing the wafer, an inspection unit 220 for inspecting the printed wafer, And a discharge unit D for transferring the wafer passed through the inspection unit 220 to the outside, a transfer unit 250, a printing unit 210, and a housing 260 for receiving the inspection unit 220. (See FIG. 1)

The present invention further includes a camera alternating device 100 in such a production device 200.

As shown in FIG. 2, the camera alternating device 100 is mounted on an upper surface of the housing 260 to generate rotational force, and an upper surface of the housing 260 to the inner surface of the housing 260 through a pipe. Two shafts (CM) which are extended and rotated by the driving unit 110, a support arm 130 extending to both sides of the rotation shaft 120, and two cameras mounted on the support arm 130, respectively. ).

At this time, the pulley 140 is mounted on the upper end of the rotary shaft 120 and disposed on the upper surface of the housing 260, and may further include a belt 150 for connecting the rotary shaft 120 and the pulley 140. have.

In other words, the driving unit 110 transmits the rotational force to the pulley 140 through the belt 150, and the transmitted rotational force is connected to the rotation shaft 120 through the pulley 140 to rotate the two cameras CM. Let's go.

Meanwhile, FIG. 1 illustrates a concept of the camera alternating device 100, and a specific embodiment thereof is illustrated in FIG. 2.

Meanwhile, a separate rotating shaft (not shown) and another pulley BR mounted on the rotating shaft may be mounted on the bottom surface of the driving unit 110 and then connected to the belt 150.

In addition, it is also possible to further include a cover 270 that is mounted on the upper surface of the housing 260 to cover the drive unit 110.

In this embodiment, it is illustrated that the housing 260 and the cover 270 have a hollow box shape.

However, the housing 260 and the cover 270 is intended to accommodate the production apparatus 100 or to cover the drive unit 110, so as to achieve this purpose, the housing 260 and the cover 270 Naturally, all of them belong to the scope of the present invention.

Meanwhile, a controller (not shown) connected to the transfer unit 250, the printing unit 210, the inspection unit 220, and the discharge unit D to control each unit of the production apparatus 100 of the present invention. It is also possible to include more.

Meanwhile, the camera alternation device 100 of the inspection unit 220 includes two cameras, wherein one of the cameras is a CCD camera and the other is an infrared camera.

As described above, the CCD camera can inspect the wafer appearance inspection [Broken, Chipping, Crack] and the printing pattern [paragraph, foreign matter], printing accuracy [Align degree].

In addition, it is possible to inspect the micro-cracks by the infrared camera.

The camera alternating apparatus 100 of the present invention as described above allows the two cameras CM to inspect the wafers (not shown) while the two cameras CM rotate.

In the present embodiment, no particular limitation is imposed on the driving unit 110 of the camera alternation device 100.

Therefore, it is clear that the present invention is not limited by the type as long as it is a configuration capable of providing a rotational force capable of rotating the rotary shaft 120 (for example, a motor).

In addition, the present embodiment illustrates a case in which the rotating shaft 120 is a cylindrical shape extending in the lower direction in the drawing.

However, the rotary shaft 120 is intended to rotate the support arm 130 by receiving a rotational force from the drive unit 110, so that the rotary shaft 120 has a different shape as long as this object is achieved. In any case, it belongs to the scope of the present invention.

In addition, in the present embodiment, the support arm 130 has a shape that becomes narrower from the center to both ends 131 and 132, and the rotation shaft 120 is provided at the center.

However, the support arm 130 is rotated by the rotation shaft 120, and aims to support the two cameras (CM), even if the support arm 130 has a different shape Naturally, it belongs to the scope of the present invention.

In particular, after the brackets 131a and 132a are formed on both ends 131 and 132 of the support arm 130, the first camera CM1 is mounted on the left bracket 131a in the drawing, and the right bracket (in the drawing). An example in which the second camera CM2 is attached to 132a is illustrated.

However, the brackets 131a and 132a are aimed at supporting the camera CM. As long as the object is achieved, the brackets 131a and 132a have different shapes or the support arms 130 are provided. Naturally, even if the camera CM is mounted on itself, it belongs to the scope of the present invention.

On the other hand, the discharge unit (D) is the first discharge unit 230 for transferring the wafer determined to be a normal product to the outside in the inspection unit 220, and the second discharge for transferring the wafer determined to be defective product to the outside Unit 240 may be included.

In this embodiment, only the second discharge unit 240 of the discharge unit D is illustrated. (See FIGS. 1 to 3).

The second discharge unit 240 is disposed on the left and right sides of the production apparatus 200 in the present embodiment to discharge the wafer determined as a defective product.

However, since the second discharge unit 240 is intended to discharge the wafer to the outside, even if the second discharge unit 240 takes a different manner as long as the object is achieved, all of the second discharge unit 240 is within the scope of the present invention. Of course.

On the other hand, the first discharge unit is not shown separately, which is a well-known technique, and thus the drawings are omitted for clarity.

On the other hand, in order to increase the reliability of the inspection device 220 may further include an illumination unit 300 for supplying light to the wafer.

The lighting unit 300 is disposed on the bottom surface of the camera CM to supply light to the wafer.

In this case, the illumination unit 300 may include a first illumination unit 310 disposed on the upper side of the wafer and a second illumination unit 320 disposed on the bottom surface of the wafer, as shown in FIG. 3. .

The first lighting unit 310 is fixed to a plate-shaped support frame 311 having a hollow rectangular cross section, a holder 312 and a holder 312 disposed on the bottom surface of the support frame 311 It can include a lighting means (313).

That is, when the first lighting unit 310 is disposed on the wafer, the wafer is exposed to the camera CM through the opening of the support frame 311.

In this case, when the illumination means 313 supplies light to the wafer, a more reliable image can be obtained.

In this embodiment, the holders 312 are disposed on the bottom of the support frame 311 of the first lighting unit 310.

At this time, the holder 312 has a beam shape having a long rectangular cross section is disposed to be inclined toward the wafer.

In addition, it is illustrated that a plurality of lighting means 313 is mounted inside the holder 312.

However, the first frame 311 and the holder 312 is intended to support the lighting means 313 for supplying light to the wafer, so that the first frame 311 and Even if the holder 312 has a different shape, all belong to the scope of the invention is natural.

In addition, in this embodiment, there is no particular limitation on the lighting means 313.

The lighting means 313 includes any device capable of supplying light to a general bulb or an LED lamp wafer, and in this aspect, it is clear that the lighting means 313 of the present invention is not limited to the kind thereof.

Meanwhile, as shown in the drawing, the holder 312 may be fixed by a bracket 314 installed at a bottom edge of the support frame 311.

The second lighting unit 320 is disposed on the bottom surface of the transfer belt B for transferring the wafer, and has a hollow shape, but has an upper surface of the housing 321 and illumination received in the housing 321. Means 322 and a cover 322 covering the upper surface of the housing 321 may be included.

In this embodiment, only the lighting means 322 is mounted to the housing 321 is shown.

However, since it is obvious to those skilled in the art that the lighting means 322 is seated on the housing 321 and supplied with power through a predetermined wiring operation, it will be apparent to those skilled in the art. There will be.

In addition, the second lighting unit 320 does not have any particular limitation on the lighting means 322, and includes all available light emitting devices.

On the other hand, since the cover 323 is disposed on the lighting means 322, it will be preferable to use a transparent material to transmit light.

Example 2

In the present embodiment, the production method S100 using the production apparatus 200 will be described with reference to FIGS. 4 and 5.

The production apparatus 200 provided in the production method S100 includes a first transfer unit 251 and a second transfer unit 252 for transferring two wafers, respectively, as described above, and an agent for printing the wafers, respectively. A first printing unit 210A and a second printing unit 210B, an inspection unit 220 in which the first camera 221 and the second camera 222 alternately inspect the printed wafer, and the inspection unit ( A discharge unit (D) for transferring the wafer passed through 220 to the outside, the transfer units (251, 242), a printing unit (210A, 210B) and a controller (C) connected to the inspection unit (220), and the transfer unit 251 and 252, and housings 260 (see Fig. 2) for receiving printing units 210A and 210B and inspection units 220.

By using the production apparatus 200 as described above, a step S110 of processing the wafer W in the first printing line 210A is first performed (see FIG. 4).

After performing the step S110, the wafer W is transferred to the inspection unit 220 and inspected by the first camera 221, and then the wafer W is moved using the camera alternating device 100. In operation S120, the second camera 222 is inspected again. (See FIG. 5)

4 and 5 continuously illustrate that the wafer W printed on the first printing line 210A is transferred to the first camera 221.

That is, the wafer W shown in the first processing line 210A in FIG. 4 and the wafer W transferred to the first camera 221 are the same.

Thereafter, as shown in FIG. 5, the first camera 221 and the second camera 222 are alternated with each other so that the second camera 222 inspects the wafer W.

The wafer W, which has undergone the step S120 as described above, is performed to be transferred to the discharge unit D (S130).

The configuration for transferring to the discharge unit (D) is conceptually shown in FIGS. 4 and 5.

However, since the configuration is well known to those skilled in the art, it may be easily implemented without specific illustration (see FIGS. 1 to 3).

As described above, even when two printing lines 210A and 210B are provided by the production method S100 of the present invention, only one inspection unit 220 may be used, thereby reducing the cost of supplying the production equipment.

On the other hand, when inspecting the wafer (W) by the inspection unit 220 is provided on the bottom surface of the camera (221, 222) provided with an illumination unit 300 for supplying light to the wafer (W) the wafer (W) It is also possible to improve the reliability of the obtained image by further comprising the step (SE) of supplying light.

In this case, the lighting unit 300 may include a first lighting unit 310 and a second lighting unit 320.

The first lighting unit 310 is disposed on the upper side of the wafer W, and has a plate-shaped support frame 311 having a hollow rectangular cross section, and a holder disposed on a bottom surface of the support frame 311. 312 and lighting means 313 fixed to the holder 312 may be included.

The second lighting unit 320 is disposed on the bottom surface of the wafer (W), is disposed on the bottom surface of the transfer belt (B) for transporting the wafer (W) has a hollow shape, the upper surface of the housing 321, a lighting means 322 accommodated in the housing 321, and a second lighting unit having a cover 323 covering an upper surface of the housing 321 (see FIG. 2). )

This is as described above, and overlapping descriptions will be omitted in the following embodiments.

Example 3

In this embodiment, another production method S200 using the production apparatus 200 will be described with reference to FIGS. 6 to 8.

The production apparatus 200 provided in the production method S200 includes a first transfer unit 251 and a second transfer unit 252 for transferring two wafers, respectively, as described above, and an agent for printing the wafers, respectively. A first printing unit 210A and a second printing unit 210B, an inspection unit 220 in which the first camera 221 and the second camera 222 alternately inspect the printed wafer, and the inspection unit ( A discharge unit (D) for transferring the wafer passed through 220 to the outside, the transfer units (251, 242), a printing unit (210A, 210B) and a controller (C) connected to the inspection unit (220), and the transfer unit Points 251 and 252, a printing unit 210A and 210B and a housing 260 for receiving the inspection unit 220 are as described above.

At this time, the step (S210) of printing the first wafer (W1) in the first printing line (210A) is performed (see Fig. 6).

This step S210 is the same as the step S110 of Embodiment 2 described above.

After performing the step S210, the second wafer W2 is transferred from the second print line 210B while the first wafer W1 is transferred to the inspection unit 220 and inspected by the first camera 221. A printing step S220 is performed (see FIG. 7).

After the step S220, the second wafer W2 is inspected by the inspection unit 220 while the first wafer W1 is again inspected by the second camera 222 using the camera alternating device 100. The transfer is performed to inspect the first camera 221 (S230). (See FIG. 8).

Thereafter, during the transfer of the first wafer W1 to the discharge units D and 230, the step S240 of inspecting the second wafer W2 with the second camera 222 is performed again (FIG. 9). Reference)

Meanwhile, in the present exemplary embodiment, the case in which the discharge unit D is discharged to the first discharge unit 230 is illustrated. However, the present invention is not limited thereto, and the discharge unit D includes the discharge unit D. Of course.

Example 4

The production method S300 to be described in this embodiment is basically similar to the method S200 described in the third embodiment, and the production apparatus 200 is also the same.

Therefore, the description of the production apparatus 200 will be omitted, and the production method S300 of the present embodiment will be described below with reference to FIGS. 6 to 9.

First, the first wafer W1 is printed in the first printing unit 210A, and the second wafer W2 is introduced into the second transfer unit 252 (S310).

Thereafter, the first wafer W1 is transferred to the inspection unit 220 and the second wafer W2 is printed by the second printing unit 210B while the first camera 221 is inspected by the first camera 221. In operation S320, a third wafer W3 is injected into the step 251. (See FIG. 7).

Then, the second wafer W2 is transferred to the inspection unit 220 while the first wafer W1 is again inspected by the second camera 222 using the camera alternation device 100 as described above. Inspecting with the first camera 221 and printing the third wafer W3 in the first printing unit 210A, and injecting the fourth wafer W4 into the second transfer unit 252 (S330). (See FIG. 8).

Thereafter, while transferring the first wafer W1 to the discharge units D and 230, the third wafer W3 is transferred to the inspection unit 220 and inspected by the first camera 221. The wafer W2 is inspected again by the second camera 222 using the camera alternating device 100, and the fourth wafer W4 is printed by the second printing unit 210B, and the first transfer unit ( In step 340, the fifth wafer W5 is injected into the second wafer W5.

That is, the method (S300) of the present embodiment is to enable more continuous production than the method (S200) of the third embodiment.

1 is a perspective view of a camera alternating device of the present invention.

2 to 8 are conceptual views showing the production method for each embodiment of the present invention.

9 is a partially separated perspective view showing one embodiment of the production apparatus of the present invention.

<Explanation of symbols for the main parts of the drawings>

100: camera alternating device 200: production device

210A, 210B: Printing unit 220: Inspection unit

D (230,240): discharge unit

S100, S200, S300: Production Method

Claims (13)

A transfer unit for transferring a wafer, a printing unit for printing the wafer, an inspection unit for inspecting the printed wafer, an ejection unit for transferring the wafer passing through the inspection unit to the outside, the transfer unit, and a printing unit And in the production apparatus of a solar cell comprising a housing for receiving the inspection unit, The inspection unit may include a driving unit mounted to an upper surface of the housing to generate a rotational force, a rotating shaft extending through the upper surface of the housing to an inner surface of the housing and rotated by the driving unit, and support arms extending to both sides of the rotating shaft; And a camera alternating device having two cameras each mounted to said support arm. The method of claim 1, And a pulley mounted to an upper end of the rotating shaft and disposed on an upper surface of the housing, and a belt connecting the rotating shaft and the pulley. The method of claim 1, And a cover mounted on the upper surface of the housing and covering the driving unit. The method of claim 1, And a controller connected to the transfer unit, the printing unit, the inspection unit and the discharge unit. The method of claim 1, Wherein one of the cameras of the inspection unit is a CCD camera and the other is an infrared camera. The method of claim 1, The discharge unit includes a first discharge unit for transferring the wafer determined as a normal product to the outside in the inspection unit, and a second discharge unit for transferring the wafer determined as the defective product to the outside. Line production device. The method of claim 1, And a lighting unit disposed on the bottom of the camera to supply light to the wafer. The method of claim 7, wherein The illumination unit includes a first illumination unit disposed on the upper side of the wafer and a second illumination unit disposed on the bottom surface of the wafer, The first lighting unit includes a plate-shaped support frame having a hollow rectangular cross section, a holder disposed on the bottom of the support frame, and lighting means fixed to the holder, The second lighting unit is disposed on the bottom surface of the transfer belt for transferring the wafer and has a hollow shape, the housing having an open top surface, an illumination means accommodated in the housing, and a cover covering the top surface of the housing. Dual line production apparatus of a solar cell comprising a. First and second transfer units for transferring two wafers, first and second printing units for printing the wafers respectively, and an inspection unit for alternately inspecting the printed wafers by the first and second cameras; And a discharge unit for transferring the wafer passed through the inspection unit to the outside, a transfer unit, a printing unit, a controller connected to the inspection unit, a housing for receiving the transfer unit, the printing unit, and the inspection unit. As a production method using the dual line production apparatus of the battery,  Printing a wafer in the first printing unit; Transferring the wafer to an inspection unit and inspecting the wafer with a first camera and then inspecting the wafer again with a second camera using a camera alternating apparatus included in the dual line production apparatus of the solar cell according to claim 1; And transferring the wafers inspected by the first camera and the second camera to a discharge unit. First and second transfer units for transferring two wafers, first and second printing units for printing the wafers respectively, and an inspection unit for alternately inspecting the printed wafers by the first and second cameras; And a discharge unit for transferring the wafer passed through the inspection unit to the outside, a transfer unit, a printing unit, a controller connected to the inspection unit, a housing for receiving the transfer unit, the printing unit, and the inspection unit. As a production method using the dual line production apparatus of the battery, Processing a first wafer in the first printing unit; Transferring the first wafer to an inspection unit and printing the second wafer in a second processing line while the first camera is inspected by the first camera; The second wafer is transferred to the inspection unit and inspected by the first camera while the first wafer is inspected by the second camera using the camera alternating apparatus included in the dual line production apparatus of the solar cell according to claim 1. Steps, And inspecting the second wafer again with a second camera while transferring the first wafer to the discharge unit. First and second transfer units for transferring two wafers, first and second printing units for printing the wafers respectively, and an inspection unit for alternately inspecting the printed wafers by the first and second cameras; And a discharge unit for transferring the wafer passed through the inspection unit to the outside, a transfer unit, a printing unit, a controller connected to the inspection unit, a housing for receiving the transfer unit, the printing unit, and the inspection unit. As a production method using the dual line production apparatus of the battery, Printing a first wafer from the first printing unit and inserting a second wafer into a second transfer unit; Transferring the first wafer to the inspection unit and printing a second wafer from the second printing unit while the first camera is inspected by the first camera, and inserting a third wafer into the first transfer unit; The second wafer is transferred to the inspection unit and inspected by the first camera while the first wafer is inspected again by the second camera using a camera alternating apparatus included in the dual line production apparatus of the solar cell according to claim 1. Printing the third wafer in a first printing unit and injecting a fourth wafer into the second transfer unit; While transferring the first wafer to the discharge unit, the third wafer is transferred to the inspection unit and inspected by the first camera, and the second wafer is returned to the second camera by using the camera alternating device according to claim 1. Inspecting and printing the fourth wafer in a second printing unit, and injecting a fifth wafer into the first transfer unit. The method according to any one of claims 9 to 11, And providing a light to the wafer when the wafer is inspected by the inspection unit, the lighting unit being provided on the bottom surface of the camera to supply light to the wafer. Production method. The method of claim 12, The lighting unit is disposed on an upper side of the wafer, and includes a plate-shaped support frame having a hollow rectangular cross section, a holder disposed on a bottom surface of the support frame, and a lighting means fixed to the holder. Unit, Is disposed on the bottom surface of the wafer, disposed on the bottom surface of the transfer belt for transporting the wafer has a hollow shape, the top surface is open, the lighting means accommodated in the housing and covering the top surface of the housing Including a second lighting unit having a cover, Dual line production method of a solar cell, characterized in that for supplying light to the wafer when inspecting the wafer.

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