KR101011714B1 - 테스트 트레이 - Google Patents
테스트 트레이 Download PDFInfo
- Publication number
- KR101011714B1 KR101011714B1 KR1020080117723A KR20080117723A KR101011714B1 KR 101011714 B1 KR101011714 B1 KR 101011714B1 KR 1020080117723 A KR1020080117723 A KR 1020080117723A KR 20080117723 A KR20080117723 A KR 20080117723A KR 101011714 B1 KR101011714 B1 KR 101011714B1
- Authority
- KR
- South Korea
- Prior art keywords
- pallet
- connector
- backlight
- inspected object
- panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 238000012360 testing method Methods 0.000 title abstract description 61
- 238000000034 method Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 abstract description 2
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Multimedia (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
Claims (10)
- 피검사물에 전기적 연결을 제공하는 장치로서,상기 피검사물이 안착되는 안착부가 형성되는 팔레트부와;상기 피검사물과 전기적으로 연결되는 커넥터부와;상기 커넥터부와 전기적으로 연결되는 단자부를 포함하며,상기 안착부에는 복수 개의 고정홀이 형성되며,상기 피검사물이 상기 안착부에 고정되도록 상기 고정홀에 삽입되는 스톱퍼를 포함하는 테스트 트레이.
- 제1항에 있어서,상기 단자부는 상기 팔레트부의 일측에 형성되는 것을 특징으로 하는 테스트 트레이.
- 삭제
- 제1항에 있어서,상기 피검사물의 전선이 상기 팔레트부에 고정되도록 상기 팔레트부에 인접하여 결합되는 스냅핏(snap fit) 또는 벨크로 테이프(velcro tape)를 더 포함하는 테스트 트레이.
- 제1항에 있어서,상기 피검사물이 안착되도록 상기 팔레트부에 탈착 가능하게 결합되는 서브 팔레트부를 더 포함하는 테스트 트레이.
- 제5항에 있어서,상기 서브 팔레트부에는 복수 개의 고정홀에 형성되며,상기 피검사물이 상기 서브 팔레트부에 고정되도록 상기 고정홀에 삽입되는 스톱퍼를 더 포함하는 테스트 트레이.
- 제5항에 있어서,상기 피검사물의 전선이 상기 서브 팔레트부에 고정되도록 상기 서브 팔레트부에 결합되는 벨크로 테이프를 더 포함하는 테스트 트레이.
- 제2항에 있어서,상기 팔레트부가 안착되는 프레임과, 상기 프레임의 일측에 상기 단자부가 삽입되는 소켓부를 포함하는 소켓 팔레트부를 더 포함하는 테스트 트레이.
- 제1항에 있어서,상기 피검사물은외부전원을 공급받는 외부전원부와,디스플레이 패널에 전원을 공급하는 패널전원부와,상기 디스플레이 패널의 피드백 신호를 수신하는 패널신호수신부와,디스플레이 백라이트에 전원을 공급하는 백라이트전원부, 및상기 디스플레이 백라이트의 피드백 신호를 수신하는 백라이트신호수신부를 포함하는 디스플레이 전원공급장치이며,상기 커넥터부는상기 외부전원부와 탈착 가능하게 결합되는 외부전원커넥터와,상기 패널전원부와 탈착 가능하게 결합되는 패널전원커넥터와,상기 패널신호수신부와 탈착 가능하게 결합되는 패널신호커넥터와,상기 백라이트전원부와 탈착 가능하게 결합되는 백라이트전원커넥터, 및상기 백라이트신호수신부와 탈착 가능하게 결합되는 백라이트신호커넥터를 포함하는 것을 특징으로 하는 테스트 트레이.
- 제9항에 있어서,상기 패널전원커넥터, 상기 패널신호커넥터, 상기 백라이트전원커넥터, 상기 백라이트신호커넥터, 상기 단자부는 상기 팔레트부의 일측에 형성되는 인쇄회로기판 상에 형성되는 것을 특징으로 하는 테스트 트레이.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080117723A KR101011714B1 (ko) | 2008-11-25 | 2008-11-25 | 테스트 트레이 |
CN2009101801665A CN101738505B (zh) | 2008-11-25 | 2009-11-11 | 测试托盘 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080117723A KR101011714B1 (ko) | 2008-11-25 | 2008-11-25 | 테스트 트레이 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100059080A KR20100059080A (ko) | 2010-06-04 |
KR101011714B1 true KR101011714B1 (ko) | 2011-01-28 |
Family
ID=42360429
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080117723A Expired - Fee Related KR101011714B1 (ko) | 2008-11-25 | 2008-11-25 | 테스트 트레이 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101011714B1 (ko) |
CN (1) | CN101738505B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20170004095A (ko) * | 2015-07-01 | 2017-01-11 | 주식회사 딜라이브 | 마운팅 장치를 포함하는 검사 장치 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101706982B1 (ko) * | 2012-08-16 | 2017-02-16 | (주)테크윙 | 테스트핸들러용 인서트 |
CN109471280A (zh) * | 2018-12-25 | 2019-03-15 | 中航华东光电有限公司 | 通用背光工装及制作方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980027504A (ko) * | 1996-10-16 | 1998-07-15 | 김영환 | 액정표시소자용 내열성 테스트 시스템의 구동회로 체크장치 |
KR20060117649A (ko) * | 2005-05-13 | 2006-11-17 | 강성일 | 액정모듈 테스트용 지그 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2641630Y (zh) * | 2003-06-20 | 2004-09-15 | 顺德市顺达电脑厂有限公司 | 母板夹具 |
CN1922687B (zh) * | 2005-04-26 | 2010-10-06 | 创新塑科技有限公司 | 用于存储装置的测试托架 |
CN101114040A (zh) * | 2006-07-27 | 2008-01-30 | 鸿富锦精密工业(深圳)有限公司 | 托盘定位平台 |
KR100845979B1 (ko) * | 2006-11-28 | 2008-07-11 | 미래산업 주식회사 | 핸들러의 테스트트레이 반송장치 |
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2008
- 2008-11-25 KR KR1020080117723A patent/KR101011714B1/ko not_active Expired - Fee Related
-
2009
- 2009-11-11 CN CN2009101801665A patent/CN101738505B/zh not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980027504A (ko) * | 1996-10-16 | 1998-07-15 | 김영환 | 액정표시소자용 내열성 테스트 시스템의 구동회로 체크장치 |
KR20060117649A (ko) * | 2005-05-13 | 2006-11-17 | 강성일 | 액정모듈 테스트용 지그 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20170004095A (ko) * | 2015-07-01 | 2017-01-11 | 주식회사 딜라이브 | 마운팅 장치를 포함하는 검사 장치 |
KR101718446B1 (ko) * | 2015-07-01 | 2017-03-21 | 주식회사 딜라이브 | 마운팅 장치를 포함하는 검사 장치 |
Also Published As
Publication number | Publication date |
---|---|
CN101738505B (zh) | 2012-11-07 |
KR20100059080A (ko) | 2010-06-04 |
CN101738505A (zh) | 2010-06-16 |
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