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KR101006244B1 - A socket for testing electonic camera module - Google Patents

A socket for testing electonic camera module Download PDF

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Publication number
KR101006244B1
KR101006244B1 KR1020080086932A KR20080086932A KR101006244B1 KR 101006244 B1 KR101006244 B1 KR 101006244B1 KR 1020080086932 A KR1020080086932 A KR 1020080086932A KR 20080086932 A KR20080086932 A KR 20080086932A KR 101006244 B1 KR101006244 B1 KR 101006244B1
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KR
South Korea
Prior art keywords
camera module
cover
pin assembly
body portion
hinge
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Application number
KR1020080086932A
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Korean (ko)
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KR20100027849A (en
Inventor
김영진
김행수
Original Assignee
주식회사 엔티에스
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Priority to KR1020080086932A priority Critical patent/KR101006244B1/en
Publication of KR20100027849A publication Critical patent/KR20100027849A/en
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Publication of KR101006244B1 publication Critical patent/KR101006244B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

카메라모듈 검사용 소켓에 대한 발명이 개시된다. 개시된 카메라모듈 검사용 소켓은 카메라모듈이 안착되는 몸체부와, 몸체부의 상부에 형성되는 덮개부와, 덮개부가 몸체부의 상면에 선택적으로 접하도록 하는 작동부와, 몸체부의 일측에 형성되고, 작동부에 의해 덮개부와 몸체부의 접함 시 카메라모듈의 하부 패턴에 접속되는 제1핀조립체와, 제1핀조립체에 연결되고 연결배선에 의해 검사장치와 연결되는 제1인쇄회로기판과, 제1핀조립체와 마주하도록 덮개부에 형성되고, 덮개부와 몸체부의 접함시 카메라모듈의 상부패턴에 접속되는 제2핀조립체 및 제2핀조립체에 연결되고, 연결배선에 의해 검사장치와 연결되는 제2인쇄회로기판을 포함하여 이루어진다.Disclosed is a camera module inspection socket. The disclosed camera module inspection socket has a body portion on which the camera module is seated, a cover portion formed on an upper portion of the body portion, an operation portion for selectively contacting the upper surface of the body portion, and an operation portion formed on one side of the body portion. A first pin assembly connected to the lower pattern of the camera module when the cover part and the body part are contacted with each other, a first printed circuit board connected to the first pin assembly and connected to the inspection apparatus by a connection wiring, and the first pin assembly A second printed circuit formed on the cover part so as to face the cover part and connected to the second pin assembly and the second pin assembly connected to the upper pattern of the camera module when the cover part and the body part are in contact with each other, and connected to the inspection apparatus by a connection wiring. It comprises a substrate.

카메라모듈, 검사용 소켓, 인쇄회로기판 Camera Module, Inspection Socket, Printed Circuit Board

Description

카메라모듈 검사용 소켓{A socket for testing electonic camera module}A socket for testing electonic camera module

본 발명은 카메라모듈 검사용 소켓에 관한 것으로서, 보다 상세하게는 검사작업이 간편하여 작업효율이 우수하고, 카메라모듈의 양면패널을 동시에 검사할 수 있어 검사시간을 단축하는 카메라모듈 검사용 소켓에 관한 것이다.The present invention relates to a camera module inspection socket, and more particularly to a camera module inspection socket for reducing the inspection time because the inspection operation is simple and excellent work efficiency, and can inspect both sides of the camera module at the same time. will be.

최근 정보 통신 기술의 비약적인 발전에 의하여 데이터 통신 속도의 향상이나 데이터 통신량의 확대가 실현되고, 휴대전화나 노트북 등의 모바일계의 전자기기에는 CCD 이미지센서나 CMOS 이미지센서 등의 촬상소자가 실장되는 것이 보급되고 있으며, 이들은 문제 데이터 외에 카메라모듈에 의하여 촬상한 화상 데이터를 실시간 송신할 수 있게 된다.Recently, due to the rapid development of information and communication technology, the improvement of data communication speed and the increase of data communication amount are realized, and the imaging devices such as CCD image sensor and CMOS image sensor are mounted on mobile electronic devices such as mobile phones and laptops. It is spread | distributing and these can transmit the image data image | photographed by the camera module in addition to the problem data in real time.

카메라모듈의 경우에는 커넥터에 접속하여 기능검사를 수행함과 동시에 렌즈링(11)을 회전시켜 초점을 맞추는 작업을 거친다.In the case of the camera module is connected to the connector to perform a functional test and at the same time to rotate the lens ring 11 to focus.

이러한 작업을 거친 후 조립되어 완제품이 되는 것이다.After such work, it is assembled and becomes a finished product.

도 1은 종래의 검사모듈 검사방법을 나타낸 개념도이다.1 is a conceptual diagram showing a conventional inspection module inspection method.

도시된 바와 같이, 카메라모듈(10)에는 조립을 위한 커넥터(12)를 구비하고 있다. 검사장치(20)측에 상기 커넥터(12)에 대응하는 대응커넥터를 부착하여 카메라모듈(10)의 커넥터(12)를 대응커넥터(22)에 끼움으로써 검사장치와 접속시켜 카메라모듈(10)의 성능 검사를 수행하고 있었다.As shown, the camera module 10 is provided with a connector 12 for assembly. Attach the corresponding connector corresponding to the connector 12 to the inspection device 20 side and insert the connector 12 of the camera module 10 into the corresponding connector 22 to connect with the inspection device to I was performing a performance check.

그리고, 근래에는 제품의 소형화와 콤팩트한 구조를 지니기 위해 패턴층이 위아래 도통이 가능한 하나의 양방 PCB를 사용하는 추세이다.In recent years, in order to miniaturize the product and have a compact structure, the pattern layer has a trend of using one bidirectional PCB capable of conducting up and down.

그러나, 종래에 의하면 커넥터에 대응커넥터는 금속박판으로 이루어진 탄성력을 가진 커넥터핀으로 접속되는 것으로 탈부착 과정에서 카메라모듈 측 커넥터에 손상이 가해질 수 있으며, 대응커넥터의 수명이 짧아서 그 주기마다 대응커넥터를 교체하고 검사를 수행하는 문제점이 있으며, 부품이 작기 때문에 탈부착 작업이 번거로와 검사작업의 효율성이 좋지 못한 문제점이 있었다.However, according to the related art, the corresponding connector is connected to the connector by a connector pin having an elastic force made of a thin metal plate, which may damage the connector of the camera module in the detachable process, and the corresponding connector is shortened so that the corresponding connector is replaced every cycle. And there is a problem to perform the inspection, because the parts are small, there is a problem that the removal work is cumbersome and the efficiency of the inspection work is not good.

더욱이 양방에 패턴을 형성한 양방PCB의 경우 상방 하방을 각각 검사해야 하는 문제점이 있었다.Furthermore, in the case of both PCBs having a pattern formed on both sides, there was a problem in that the upper and lower sides were respectively inspected.

따라서, 이를 개선할 필요성이 요청된다.Therefore, there is a need for improvement.

본 발명은 상기와 같은 필요성에 의해 창출된 것으로서, 검사작업이 간편하여 작업효율이 우수한 카메라모듈 검사용 소켓을 제공하는데 그 목적이 있다.The present invention has been made by the necessity as described above, and an object of the present invention is to provide a camera module inspection socket which is easy to inspect and has excellent work efficiency.

또한, 상부하부에 각각 핀조립를 구비하여 카메라모듈의 양면패턴을 한번의 작업으로 동시에 검사할 수 있어 검사시간을 단축하는 카메라모듈 검사용 소켓을 제공하는데 그 목적이 있다.In addition, the upper and lower parts are each provided with a pin assembly can simultaneously inspect the double-sided pattern of the camera module in a single operation to provide a camera module inspection socket for reducing the inspection time.

본 발명에 따른 카메라모듈 검사용 소켓은 카메라모듈이 안착되는 몸체부와, 몸체부의 상부에 형성되는 덮개부와, 덮개부가 몸체부의 상면에 선택적으로 접하도록 하는 작동부와, 몸체부의 일측에 형성되고, 작동부에 의해 덮개부와 몸체부의 접함 시 카메라모듈의 하부 패턴에 접속되는 제1핀조립체와, 제1핀조립체에 연결되고 연결배선에 의해 검사장치와 연결되는 제1인쇄회로기판과, 제1핀조립체와 마주하도록 덮개부에 형성되고, 덮개부와 몸체부의 접함시 카메라모듈의 상부패턴에 접속되는 제2핀조립체 및 제2핀조립체에 연결되고, 연결배선에 의해 검사장치와 연결되는 제2인쇄회로기판을 포함하여 이루어져 카메라모듈의 상·하부패턴을 동시에 검사하는 것을 특징으로 한다.The camera module inspection socket according to the present invention includes a body portion on which the camera module is seated, a cover portion formed on an upper portion of the body portion, an operation portion to selectively contact the upper surface of the body portion, and formed on one side of the body portion. A first pin assembly connected to the lower pattern of the camera module when the cover part and the body part are contacted by the operation part, a first printed circuit board connected to the first pin assembly and connected to the inspection apparatus by a connection wiring, It is formed in the cover portion to face the 1-pin assembly, and the second pin assembly and the second pin assembly connected to the upper pattern of the camera module when the cover portion and the body portion are in contact, and is connected to the inspection device by a connecting wiring It consists of two printed circuit boards, characterized in that to examine the upper and lower patterns of the camera module at the same time.

작동부는 몸체부와 덮개부의 일측 가장자리에 각각 형성되어 서로 연통되는 힌지공을 갖는 힌지편과, 힌지편의 힌지공에 삽입되어 힌지 연결하는 힌지축과, 힌지축에 권취되고, 양끝단이 각각 몸체부와 덮개부를 탄성지지하는 탄성부재 및 덮개부가 몸체부의 상단면에 접한 상태를 유지하도록 고정하는 클립부를 포함하여 이루어진다.The operating portion is formed at one edge of each of the body portion and the cover portion, the hinge piece having a hinge hole in communication with each other, a hinge axis inserted into the hinge hole of the hinge piece and connected to the hinge, and wound around the hinge axis, both ends of the body portion And a clip part for fixing the cover part to elastically support the cover part and the cover part to be in contact with the upper surface of the body part.

그리고, 클립부는 몸체부의 타측에 회동 가능하게 형성된 리브와, 리브의 상부에서 몸체부의 내측으로 돌출된 로크돌기와, 몸체부와 리브의 하측 사이에 개재 되어 리브를 탄성 지지하는 탄성지지부재 및 덮개부의 타측에 형성되어 리브의 회전방향에 따라 탄성지지부재의 압축시 로크돌기와 분리됨과 더불어 탄성지지부재의 탄성 복원시 로크돌기에 구속되는 로크턱을 포함하여 이루어진다.The clip portion includes a rib formed to be rotatable on the other side of the body portion, a lock protrusion protruding from the upper portion of the rib to the inside of the body portion, and an elastic support member interposed between the body portion and the lower side of the rib to elastically support the rib and the other side of the lid portion. It is formed in the separation of the locking protrusion when the elastic support member is compressed in accordance with the rotational direction of the rib and comprises a lock jaw is constrained to the lock protrusion when the elastic support member is elastically restored.

또한, 덮개부에는 카메라 모듈의 렌즈부를 압박하는 렌즈압박부가 일체로 형성됨을 특징으로 한다.In addition, the cover portion is characterized in that the lens pressing portion for pressing the lens portion of the camera module is integrally formed.

이상에서 설명한 바와 같이, 본 발명에 따른 카메라모듈 검사용 소켓은 종래 발명과 달리 카메라모듈에 손상을 주지 않고 카메라모듈을 검사할 수 있는 카메라모듈 검사용 소켓을 제공하는 효과가 있다.As described above, the camera module inspection socket according to the present invention has an effect of providing a camera module inspection socket capable of inspecting the camera module without damaging the camera module, unlike the conventional invention.

또한, 카메라모듈을 안착하고 카메라모듈에 접속하는 작업이 용이하여 작업효율이 우수한 카메라모듈 검사용 소켓을 제공한다.In addition, it is easy to work to seat the camera module and connect to the camera module provides a camera module inspection socket with excellent work efficiency.

또한, 몸체부와 덮개부의 상부하부에 각각 핀조립체를 구비하여 카메라모듈의 양면패턴을 한번의 작업으로 동시에 검사할 수 있어 검사시간을 단축하는 효과를 지닌다.In addition, a pin assembly is provided at the upper and lower portions of the body and the cover, respectively, so that both surfaces of the camera module can be simultaneously examined in one operation, thereby reducing the inspection time.

이하, 첨부된 도면들을 참조하여 본 발명에 따른 카메라모듈 검사용 소켓의 바람직한 일 실시예를 설명한다. 이 과정에서 도면에 도시된 선들의 두께나 구성요소의 크기 등은 설명의 명료성과 편의상 과장되게 도시되어 있을 수 있다. 또한, 후술되는 용어들은 본 발명에서의 기능을 고려하여 정의된 용어들로서 이는 사용자, 운용자의 의도 또는 관례에 따라 달라질 수 있다. 그러므로, 이러한 용어들에 대한 정의는 본 명세서 전반에 걸친 내용을 토대로 내려져야 할 것이다.Hereinafter, with reference to the accompanying drawings will be described a preferred embodiment of the camera module inspection socket according to the present invention. In this process, the thickness of the lines or the size of the components shown in the drawings may be exaggerated for clarity and convenience of description. In addition, terms to be described below are terms defined in consideration of functions in the present invention, which may vary according to the intention or convention of a user or an operator. Therefore, definitions of these terms should be made based on the contents throughout the specification.

도 2는 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 사시도이고, 도 3은 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 작동을 보인 측면도이며, 도 4는 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 고정구조 및 접속구조를 나타낸 개략적인 단면도이고, 도 5는 도 4의 요부 확대도이다.Figure 2 is a perspective view of a camera module inspection socket according to a preferred embodiment of the present invention, Figure 3 is a side view showing the operation of the camera module inspection socket according to a preferred embodiment of the present invention, Figure 4 is a preferred embodiment of the present invention FIG. 5 is a schematic cross-sectional view illustrating a fixing structure and a connection structure of a camera module inspecting socket according to an embodiment, and FIG. 5 is an enlarged view illustrating main parts of FIG. 4.

도시한 바와 같이 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓(100)은 크게 몸체부(110)와 덮개부(120)로 이루어진다.As shown, the camera module inspection socket 100 according to the preferred embodiment of the present invention includes a body 110 and a cover 120.

몸체부(110)는 작업대 역할을 수행하며 상면에 별도의 안착판(115)을 구비하는 것이 바람직한데, 카메라모듈은 다양한 형상을 가질 수 있으므로, 안착판(115)에 카메라모듈의 형상에 대응하는 안착홈(117)을 형성하면, 안착판(115)을 교체하는 것만으로 카메라모듈의 형상에 대응할 수 있게 된다.Body portion 110 serves as a workbench and preferably has a separate mounting plate 115 on the upper surface, since the camera module may have a variety of shapes, corresponding to the shape of the camera module on the mounting plate 115 When the mounting groove 117 is formed, it is possible to correspond to the shape of the camera module by simply replacing the mounting plate 115.

그리고, 몸체부(110)의 상부에는 덮개부(120)가 구비된다.And, the upper portion of the body portion 110 is provided with a cover portion 120.

덮개부(120)는 작동부(130)에 의해 몸체부(110)의 상면에 선택적으로 접하게 되는데, 작동부(130)는 몸체부(110)와 덮개부(120)의 일측 가장자리에 각각 형성되어 서로 연통되는 힌지공(133)을 갖는 힌지편(132)과, 힌지편(132)의 힌지공(133)에 삽입되어 힌지 연결하는 힌지축(134)과, 힌지축(134)에 권취되고 양끝단이 각각 몸체부(110)와 덮개부(120)를 탄성지지하는 탄성부재(136) 및 덮개부(120)가 몸체 부(110)의 상면에 접한 상태를 유지하도록 고정하는 클립부(140)를 포함하여 구성된다.The cover portion 120 is selectively in contact with the upper surface of the body portion 110 by the operation portion 130, the operation portion 130 is formed on one side edge of the body portion 110 and the cover portion 120, respectively Hinge piece 132 having a hinge hole 133 in communication with each other, a hinge axis 134 inserted into the hinge hole 133 of the hinge piece 132 and hinged, and wound around the hinge axis 134 and both ends Each end of the clip portion 140 for fixing the body portion 110 and the cover portion 120 to elastically support the elastic member 136 and the cover portion 120 to maintain a state in contact with the upper surface of the body portion 110 It is configured to include.

힌지편(132)은 몸체부(110)와 덮개부(120)의 가장자리에 각각 형성되는데 각각의 측면이 접하여 돌출되어 형성됨으로, 서로의 힌지공(133)이 연통되는 것이다.The hinge pieces 132 are formed at the edges of the body part 110 and the cover part 120, respectively, and are formed by protruding side surfaces thereof so that the hinge holes 133 communicate with each other.

그리고, 클립부(140)는 몸체부(110)의 타측에 회동 가능하게 형성된 리브(142)와, 리브(142)의 상부에서 몸체부(110)의 내측으로 돌출된 로크돌기(144)와, 몸체부(110)와 리브(142)의 하측 사이에 개재되어 리브(142)를 탄성 지지하는 탄성지지부재(146) 및 덮개부(120)의 타측에 형성되어 리브(142)의 회전방향에 따라 탄성지지부재(146)의 압축시 로크돌기(144)와 분리됨과 더불어 탄성지지부재(146)의 탄성 복원시 로크돌기(144)에 구속되는 로크턱(148)을 포함하여 구성된다.In addition, the clip unit 140 includes a rib 142 rotatably formed at the other side of the body unit 110, a lock protrusion 144 protruding from the upper portion of the rib 142 to the inside of the body unit 110, and Interposed between the body portion 110 and the lower side of the rib 142 is formed on the other side of the elastic support member 146 and the cover portion 120 to elastically support the rib 142 according to the rotation direction of the rib 142 The lock support 144 is separated from the locking protrusion 144 when the elastic support member 146 is compressed, and includes a lock jaw 148 that is restrained by the lock protrusion 144 when the elastic support member 146 is elastically restored.

한편, 몸체부(110)의 일측에는 제1핀조립체(150)가 구비된다.On the other hand, one side of the body portion 110 is provided with a first pin assembly 150.

제1핀조립체(150)는 몸체부(110)의 안착판(115) 하부에 형성되고 카메라모듈의 하부패턴에 접속되는 프로브핀(152)이 구비되어 있어 각각의 패턴에 접속된다.The first pin assembly 150 is formed under the seating plate 115 of the body portion 110 and is provided with a probe pin 152 connected to the lower pattern of the camera module.

그리고, 프로브핀(152)은 제1핀조립체(150)의 하측에 구비된 제1인쇄회로기판(170)에 접속되고, 제1인쇄회로기판(170)은 FPCB(Flexible printed circuit board) 또는 전선다발로 이루어진 연결배선(172)에 접속되어 있으며, 연결배선(172)은 다시 검사장치(200)에 연결되는 구조를 갖는다.The probe pin 152 is connected to a first printed circuit board 170 provided below the first pin assembly 150, and the first printed circuit board 170 is a flexible printed circuit board (FPCB) or an electric wire. It is connected to the connection wiring 172 made of a bundle, the connection wiring 172 has a structure that is connected to the inspection apparatus 200 again.

또한, 덮개부(120)의 일측에는 제2핀조립체(160)가 구비된다.In addition, one side of the cover portion 120 is provided with a second pin assembly 160.

제2핀조립체(160)는 제1핀조립체(150)에 마주하도록 덮개부(120)에 형성되는 데, 작동부(130)에 의해 몸체부(110)와 덮개부(120)의 접함 시 카메라모듈의 상부패턴에 접속되는 것이다.The second pin assembly 160 is formed on the cover part 120 so as to face the first pin assembly 150. The camera when the body part 110 and the cover part 120 are contacted by the operation part 130. It is connected to the upper pattern of the module.

제2핀조립체(160)도 제1핀조립체(150)와 동일한 구조로 이루어지는데, 프로브핀(162)이 구비되어 각각의 상부패턴에 접속되고 제1핀조립체(150)의 상측에 구비된 제2인쇄회로기판(180)에 접속되며, 제2인쇄회로기판(180)이 제1인쇄회로기판(170)과 접속되어 연결배선(172)에 의해 검사장치(200)에 연결되는 구조를 갖는다.The second pin assembly 160 also has the same structure as the first pin assembly 150. The probe pin 162 is provided to be connected to each upper pattern and is provided on the upper side of the first pin assembly 150. The second printed circuit board 180 is connected to the second printed circuit board 180, and the second printed circuit board 180 is connected to the first printed circuit board 170 to be connected to the inspection apparatus 200 by the connection wiring 172.

제1인쇄회로기판(170)과 제2인쇄회로기판(180)은 접속핀(190)에 의해 서로 연결되는 것을 특징으로 한다.The first printed circuit board 170 and the second printed circuit board 180 are connected to each other by the connecting pin 190.

그리고, 덮개부(120)에는 카메라모듈의 렌즈부를 압박하는 렌즈압박부(125)가 일체로 형성됨을 특징으로 한다.In addition, the cover unit 120 is characterized in that the lens pressing unit 125 for pressing the lens unit of the camera module is integrally formed.

이하, 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 작용 및 효과를 설명하도록 한다.Hereinafter, the operation and effects of the camera module inspection socket according to the preferred embodiment of the present invention.

우선, 카메라모듈의 고정구조를 살펴보면, 몸체부(110)의 타측에 구비되는 리브(142)의 하측을 눌러주게 되면 상측이 회동됨과 동시에 탄성지지부재(146)가 수축되고, 로크돌기(144)가 로크턱(148)에서 이탈되면서, 몸체부(110)에 힌지 연결된 덮개부(120)가 탄성부재(136)에 의해 상측으로 회동되어 몸체부(110)의 상면을 개방하게 된다.First, looking at the fixing structure of the camera module, when pressing the lower side of the rib 142 provided on the other side of the body portion 110, the upper side is rotated and the elastic support member 146 is contracted, the lock projection 144 As the cover jaw 148 is separated, the cover portion 120 hinged to the body portion 110 is rotated upward by the elastic member 136 to open the upper surface of the body portion 110.

이후, 몸체부(110)의 상면에 구비된 안착판(115)의 안착홈(117)에 카메라모 듈을 안착한 후 다시 덮개부(120)를 회동시켜 몸체부(110)의 상면을 덮어주어 검사대상인 카메라모듈을 검사하게 된다.Subsequently, the camera module is seated in the seating groove 117 of the seating plate 115 provided on the top of the body 110, and then the cover 120 is rotated to cover the top of the body 110. The target camera module will be examined.

이때, 덮개부(120)의 타측 끝단이 리브(142)의 선단에 형성된 경사면(143)에 접하면서 리브(142)를 회동시키고, 덮개부(120)가 몸체부(110)의 상면에 접하게 되면, 탄성지지부재(146)의 탄성력에 의해 리브(142)가 회동되어 로크돌기(144)가 로크턱(148)에 걸쳐져 덮개부(120)와 몸체부(110)의 접함상태를 유지하게 된다.At this time, when the other end of the cover portion 120 is in contact with the inclined surface 143 formed on the tip of the rib 142, the rib 142 is rotated, and the cover portion 120 is in contact with the upper surface of the body portion 110 The rib 142 is rotated by the elastic force of the elastic support member 146, so that the lock protrusion 144 is interposed with the lock jaw 148 to maintain the contact state between the cover part 120 and the body part 110.

이러한 카메라모듈 고정구조는 작업자가 카메라모듈을 안착홈(117)에 올려놓고 덮개부(120)를 몸체부(110)의 상면으로 덮어주는 것만으로 장착과 접속이 이루어지므로 작업성이 우수하여 검사시간을 단축시켜 준다.Such a camera module fixing structure allows the operator to mount the camera module on the seating groove 117 and cover and cover the cover 120 with the upper surface of the body 110 so that installation and connection are made, so that the workability is excellent. It shortens.

다음으로 검사대상인 카메라모듈을 검사하기 위한 접속구조를 살펴보면, 도 4에서 도시된 바와 같이 덮개부(120)가 몸체부(110)에 밀착된 상태로 고정되며, 카메라모듈의 상하면에 패턴은 제1,2핀조립체(150,160)에 의해 각각 접속된다.Next, referring to the connection structure for inspecting the camera module to be inspected, as shown in FIG. 4, the cover 120 is fixed in close contact with the body 110 and a pattern is formed on the upper and lower surfaces of the camera module. And two pin assemblies 150 and 160, respectively.

이를 자세히 설명하면, 몸체부(110)에 구비된 제1핀조립체(150)의 프로브핀(152)은 카메라모듈의 하부패턴에 접속되고, 덮개부(120)에 구비된 제2핀조립체(160)의 프로브핀(162)은 카메라모듈의 상부패턴에 접속된다.In detail, the probe pin 152 of the first pin assembly 150 provided in the body part 110 is connected to the lower pattern of the camera module, and the second pin assembly 160 provided in the cover part 120. Probe pin 162 is connected to the upper pattern of the camera module.

그리고, 제1핀조립체(150)의 프로브핀(152)은 제1인쇄회로기판(170)에 접속되고, 제2핀조립체(160)의 프로브핀(162)은 제2인쇄회로기판(180)에 접속되어 연결배선(172)을 통해 검사장치(200)와 연결됨에 따라 검사가 이루어진다.The probe pin 152 of the first pin assembly 150 is connected to the first printed circuit board 170, and the probe pin 162 of the second pin assembly 160 is the second printed circuit board 180. The inspection is performed as it is connected to the inspection apparatus 200 through the connection wiring 172 is connected to.

이때, 상기 제1인쇄회로기판(170)과 제2인쇄회로기판(180)은 접속핀에 의해 연결되어 카메라모듈의 상부패턴과 하부패턴을 동시에 검사할 수 있는 것이며, 이 에 따라 검사시간을 단축할 수 있는 효과를 지닌다.In this case, the first printed circuit board 170 and the second printed circuit board 180 are connected by a connection pin to simultaneously inspect the upper pattern and the lower pattern of the camera module, thereby reducing the inspection time. It has an effect that can be done.

본 발명은 도면에 도시된 실시예를 참고로 하여 설명되었으나, 이는 예시적인 것에 불과하며, 당해 기술이 속하는 분야에서 통상의 지식을 가진 자라면 이로부터 다양한 변형 및 균등한 타 실시예가 가능하다는 점을 이해할 것이다. Although the present invention has been described with reference to the embodiments shown in the drawings, this is merely exemplary, and those skilled in the art to which the art belongs can make various modifications and other equivalent embodiments therefrom. I will understand.

따라서, 본 발명의 진정한 기술적 보호범위는 특허청구범위에 의해서 정하여져야 할 것이다.Therefore, the true technical protection scope of the present invention will be defined by the claims.

도 1은 종래의 검사모듈 검사방법을 나타낸 개념도.1 is a conceptual diagram showing a conventional inspection module inspection method.

도 2는 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 사시도.2 is a perspective view of a camera module inspection socket according to a preferred embodiment of the present invention.

도 3은 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 작동을 보인 측면도.Figure 3 is a side view showing the operation of the camera module inspection socket according to a preferred embodiment of the present invention.

도 4는 본 발명의 바람직한 실시예에 따른 카메라모듈 검사용 소켓의 고정구조 및 접속구조를 나타낸 개략적인 단면도.Figure 4 is a schematic cross-sectional view showing a fixing structure and a connection structure of the camera module inspection socket according to an embodiment of the present invention.

도 5는 도 4의 요부 확대도.5 is an enlarged view illustrating main parts of FIG. 4;

< 도면의 주요 부분에 대한 부호의 설명 ><Description of Symbols for Main Parts of Drawings>

100 : 카메라모듈 검사용 소켓 110 : 몸체부100: camera module inspection socket 110: body

115 : 안착판 117 : 안착홈115: seating plate 117: seating groove

120 : 덮개부 125 : 렌즈압박부120: cover portion 125: lens pressing portion

130 : 작동부 132 : 힌지편130: operating unit 132: hinge piece

133 : 힌지공 134 : 힌지축133: hinge hole 134: hinge axis

136 : 탄성부재 140 : 클립부136: elastic member 140: clip portion

142 : 리브 143 : 경사면142: rib 143: inclined surface

144 : 로크돌기 146 : 탄성지지부재144: locking protrusion 146: elastic support member

148 : 로크턱 150 : 제1핀조립체148: lock jaw 150: first pin assembly

152, 162 : 프로브핀 160 : 제2핀조립체152, 162: probe pin 160: second pin assembly

170 : 제1인쇄회로기판 172 : 연결배선170: first printed circuit board 172: connection wiring

180 : 제2인쇄회로기판 190 : 접속핀180: second printed circuit board 190: connection pin

200 : 검사장치200: inspection device

Claims (4)

카메라모듈이 안착되는 몸체부;Body portion on which the camera module is seated; 상기 몸체부의 상부에 형성되는 덮개부;A cover part formed on an upper portion of the body part; 상기 덮개부가 상기 몸체부의 상면에 선택적으로 접하도록 하는 작동부;An operation unit for allowing the cover unit to selectively contact an upper surface of the body unit; 상기 몸체부의 일측에 형성되고, 상기 작동부에 의해 상기 덮개부와 몸체부의 접함 시 카메라모듈의 하부 패턴에 접속되는 제1핀조립체;A first pin assembly formed at one side of the body part and connected to the lower pattern of the camera module when the cover part and the body part are contacted by the operation part; 상기 제1핀조립체에 연결되고 연결배선에 의해 검사장치와 연결되는 제1인쇄회로기판;A first printed circuit board connected to the first pin assembly and connected to the inspection apparatus by a connection wiring; 상기 제1핀조립체와 마주하도록 상기 덮개부에 형성되고, 상기 덮개부와 몸체부의 접함시 카메라모듈의 상부패턴에 접속되는 제2핀조립체; 및A second pin assembly formed on the cover part to face the first pin assembly and connected to an upper pattern of the camera module when the cover part and the body part contact each other; And 상기 제2핀조립체에 연결되고, 연결배선에 의해 검사장치와 연결되는 제2인쇄회로기판을 포함하여 이루어져;A second printed circuit board connected to the second pin assembly and connected to the inspection apparatus by a connection wiring; 상기 카메라모듈의 상·하부패턴을 동시에 검사할 수 있고,The upper and lower patterns of the camera module can be inspected at the same time, 상기 작동부는,The operation unit, 상기 몸체부와 상기 덮개부의 일측 가장자리에 각각 형성되어 서로 연통되는 힌지공을 갖는 힌지편; 상기 힌지편의 힌지공에 삽입되어 힌지 연결하는 힌지축; 상기 힌지축에 권취되고, 양끝단이 각각 상기 몸체부와 상기 덮개부를 탄성지지하는 탄성부재; 및 상기 덮개부가 상기 몸체부의 상단면에 접한 상태를 유지하도록 고정하는 클립부를 포함하는 카메라모듈 검사용 소켓.A hinge piece having hinge holes formed on one side edge of the body portion and the cover portion to communicate with each other; A hinge shaft inserted into the hinge hole of the hinge piece and connected to the hinge; An elastic member wound on the hinge shaft and both ends of which are elastically supported by the body portion and the cover portion, respectively; And a clip part configured to fix the cover part to be in contact with the top surface of the body part. 삭제delete 제 1항에 있어서,The method of claim 1, 상기 클립부는 상기 몸체부의 타측에 회동 가능하게 형성된 리브;The clip portion ribs rotatably formed on the other side of the body portion; 상기 리브의 상부에서 상기 몸체부의 내측으로 돌출된 로크돌기;A locking protrusion protruding inwardly of the body portion from the upper portion of the rib; 상기 몸체부와 상기 리브의 하측 사이에 개재되어 상기 리브를 탄성 지지하는 탄성지지부재; 및An elastic support member interposed between the body portion and the lower side of the rib to elastically support the rib; And 상기 덮개부의 타측에 형성되어 상기 리브의 회전방향에 따라 상기 탄성지지부재의 압축시 상기 로크돌기와 분리됨과 더불어 상기 탄성지지부재의 탄성 복원시 상기 로크돌기에 구속되는 로크턱을 포함하는 카메라모듈 검사용 소켓.Is formed on the other side of the cover for the camera module inspection including a lock jaw is separated from the lock projection when the elastic support member is compressed in accordance with the rotational direction of the rib and restrained to the lock protrusion when the elastic support member is elastically restored socket. 제 1항에 있어서,The method of claim 1, 상기 덮개부에는 상기 카메라 모듈의 렌즈부를 압박하는 렌즈압박부가 일체로 형성됨을 특징으로 하는 카메라모듈 검사용 소켓.Camera cover inspection socket, characterized in that the cover portion is integrally formed with a lens pressing unit for pressing the lens of the camera module.
KR1020080086932A 2008-09-03 2008-09-03 A socket for testing electonic camera module KR101006244B1 (en)

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Cited By (3)

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CN103630711A (en) * 2012-08-24 2014-03-12 显微科技系统株式会社 Camera module test socket
KR101897105B1 (en) 2017-05-24 2018-09-11 주식회사 엔티에스 Test socket for preventing move of camera module
KR101992803B1 (en) 2018-01-26 2019-06-25 주식회사 세인블루텍 Image Sensor Module Socket

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KR101230447B1 (en) * 2012-11-19 2013-02-06 프라임텍 주식회사 Jig for testing camera module
KR101321968B1 (en) * 2013-06-18 2013-10-28 프라임텍 주식회사 Electric resistance testing socket for camera module
KR101444254B1 (en) * 2013-08-09 2014-09-26 주식회사 엔티에스 Apparatus for inspecting camera module
KR101442035B1 (en) * 2013-10-01 2014-09-25 디플러스(주) Apparatus for testing camera module
KR101498687B1 (en) * 2014-01-17 2015-03-06 리노공업주식회사 A testing device
KR102527100B1 (en) * 2017-09-18 2023-05-02 주식회사 탑 엔지니어링 Socket for camera module

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Publication number Priority date Publication date Assignee Title
CN103630711A (en) * 2012-08-24 2014-03-12 显微科技系统株式会社 Camera module test socket
KR101897105B1 (en) 2017-05-24 2018-09-11 주식회사 엔티에스 Test socket for preventing move of camera module
KR101992803B1 (en) 2018-01-26 2019-06-25 주식회사 세인블루텍 Image Sensor Module Socket

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