KR100999255B1 - 수직 이방성을 가지는 나노기둥 자성박막 제조방법 - Google Patents
수직 이방성을 가지는 나노기둥 자성박막 제조방법 Download PDFInfo
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- KR100999255B1 KR100999255B1 KR1020080072693A KR20080072693A KR100999255B1 KR 100999255 B1 KR100999255 B1 KR 100999255B1 KR 1020080072693 A KR1020080072693 A KR 1020080072693A KR 20080072693 A KR20080072693 A KR 20080072693A KR 100999255 B1 KR100999255 B1 KR 100999255B1
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- pores
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- aluminum sheet
- oxide film
- anodic oxidation
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- 239000010409 thin film Substances 0.000 title claims abstract description 11
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000002061 nanopillar Substances 0.000 title claims abstract description 9
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 38
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 38
- 238000000034 method Methods 0.000 claims abstract description 38
- 239000011148 porous material Substances 0.000 claims abstract description 33
- 239000010408 film Substances 0.000 claims abstract description 19
- 238000001556 precipitation Methods 0.000 claims abstract description 11
- 238000000151 deposition Methods 0.000 claims abstract description 9
- 238000002048 anodisation reaction Methods 0.000 claims abstract description 7
- 230000003647 oxidation Effects 0.000 claims description 25
- 238000007254 oxidation reaction Methods 0.000 claims description 25
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 claims description 15
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 12
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 6
- 238000005530 etching Methods 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- 238000000137 annealing Methods 0.000 claims description 3
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 claims description 3
- 230000008021 deposition Effects 0.000 claims description 3
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 claims description 3
- UEZVMMHDMIWARA-UHFFFAOYSA-N Metaphosphoric acid Chemical compound OP(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-N 0.000 claims description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 239000003513 alkali Substances 0.000 claims 2
- KTVIXTQDYHMGHF-UHFFFAOYSA-L cobalt(2+) sulfate Chemical compound [Co+2].[O-]S([O-])(=O)=O KTVIXTQDYHMGHF-UHFFFAOYSA-L 0.000 claims 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 14
- 238000007743 anodising Methods 0.000 abstract description 6
- 238000000975 co-precipitation Methods 0.000 description 6
- 239000000243 solution Substances 0.000 description 5
- 230000005684 electric field Effects 0.000 description 4
- 239000003792 electrolyte Substances 0.000 description 4
- 239000008151 electrolyte solution Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 238000004090 dissolution Methods 0.000 description 3
- 239000000696 magnetic material Substances 0.000 description 3
- 239000002253 acid Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229920001817 Agar Polymers 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000008272 agar Substances 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 239000010407 anodic oxide Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- -1 oxygen ions Chemical class 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/02—Anodisation
- C25D11/34—Anodisation of metals or alloys not provided for in groups C25D11/04 - C25D11/32
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/006—Nanostructures, e.g. using aluminium anodic oxidation templates [AAO]
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Electrochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
Claims (1)
- 수직 이방성을 가지는 나노기둥 자성박막 제조방법에 있어서,알루미늄 함유량이 99wt% 이상인 0.2∼0.4mm의 두께의 순수알루미늄 박판을 2×10-5torr 이상의 진공 상태로 2시간 동안 550℃에서 풀림하는 열처리 과정의 1단계와, 상기 열처리 과정의 1단계 과정을 거친 순수 알루미늄 박판을 50℃ 수산화나트륨(NaOH)에서 5분 동안 알칼리 에칭하는 2단계와, 상기 알칼리 에칭의 2단계 과정을 거친 순수 알루미늄 박판을 2시간 동안 2∼4℃에서 0.2M의 수산으로 40V의 정전압을 가하여 산화 피막으로 된 기공을 만드는 1차 양극 산화의 3단계와, 상기 1차 양극 산화의 3단계 과정을 거친 순수 알루미늄 박판을 3시간 동안 60℃의 0.4M의 인산과 0.2M의 크롬산에서 산화 피막으로 된 기공을 제거하는 4단계와, 상기 산화 피막의 기공을 제거하는 과정을 거친 순수 알루미늄 박판을 7시간 동안 2∼4℃에서 0.3M의 수산으로 40V의 정전압을 가하여 산화 피막으로 된 기공을 만드는 2차 양극 산화의 5단계와, 상기 2차 양극 산화의 5단계 과정을 거친 순수 알루미늄 박판을 3∼5wt% 인산에서 1시간 동안 산화 피막으로 된 기공을 확장하는 6단계와, 상기 산화 피막으로 된 기공을 확정하는 6단계 과정을 거친 순수 알루미늄 박판의 산화 피막으로 된 기공이 생성된 면에 금을 증착 후 0.1M의 염화구리(CuCl2)용액 속에서 반대쪽 알루미늄을 제거하는 7단계와, 상기 7단계 과정을 거친 순수알루미늄 박판에서 알루미늄이 제거된 면을 3∼5wt%의 인산용액 속에서 기공을 확장하는 8단계로 이루어진 two-step 양극 산화의 1차 공정과;상기 two-step양극 산화 공정을 거친 순수 알루미늄 박판을 0.1M의 황산코발트(CoSO4)용액에서 표준전극, 작업전극, 상대전극 그리고 브릿지를 이용하여 1시간 동안 전해 석출하여 Co나노패턴을 제작하는 전해석출의 2차 공정으로 이루어진 것이 특징인 수직 이방성을 가지는 나노기둥 자성박막 제조방법.
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KR20100011463A KR20100011463A (ko) | 2010-02-03 |
KR100999255B1 true KR100999255B1 (ko) | 2010-12-07 |
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KR101356545B1 (ko) * | 2011-02-11 | 2014-02-06 | 삼영전자공업(주) | 전해콘덴서용 알루미늄 전극박의 제조방법 |
WO2016024803A1 (ko) * | 2014-08-14 | 2016-02-18 | 한국전기연구원 | 양각 몰드 제조방법, 양각 몰드를 이용하여 제조한 막 및 그 제조방법 |
CN114497435B (zh) * | 2022-01-21 | 2024-07-26 | 西安交通大学 | 一种铝电池负极及其阳极氧化制备方法和应用 |
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Non-Patent Citations (1)
Title |
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강희우, 코발트-철을 전해석출한 양극산화피막의 제작과 자기특성, 1994, 한국자기학회지, 4(1), 25-31 |
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