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KR100951221B1 - 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 - Google Patents

렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 Download PDF

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Publication number
KR100951221B1
KR100951221B1 KR1020087005324A KR20087005324A KR100951221B1 KR 100951221 B1 KR100951221 B1 KR 100951221B1 KR 1020087005324 A KR1020087005324 A KR 1020087005324A KR 20087005324 A KR20087005324 A KR 20087005324A KR 100951221 B1 KR100951221 B1 KR 100951221B1
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KR
South Korea
Prior art keywords
measuring
reference point
aspherical lens
vertex
holder
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Expired - Fee Related
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KR1020087005324A
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English (en)
Korean (ko)
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KR20080031509A (ko
Inventor
가쯔시게 나까무라
가쯔히로 미우라
Original Assignee
미따까 고오끼 가부시끼가이샤
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Publication of KR20080031509A publication Critical patent/KR20080031509A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • G02B19/0052—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a laser diode
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020087005324A 2005-08-05 2006-08-03 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 Expired - Fee Related KR100951221B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005228760 2005-08-05
JPJP-P-2005-00228760 2005-08-05

Publications (2)

Publication Number Publication Date
KR20080031509A KR20080031509A (ko) 2008-04-08
KR100951221B1 true KR100951221B1 (ko) 2010-04-05

Family

ID=37727303

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020087005324A Expired - Fee Related KR100951221B1 (ko) 2005-08-05 2006-08-03 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법

Country Status (4)

Country Link
JP (1) JP4767255B2 (ja)
KR (1) KR100951221B1 (ja)
CN (1) CN101233386B (ja)
WO (1) WO2007018118A1 (ja)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090144999A1 (en) * 2006-11-30 2009-06-11 Lau Kam C Interior contour measurement probe
JP5236962B2 (ja) * 2008-02-18 2013-07-17 株式会社ミツトヨ 被測定物の表裏面測定方法
CN101576641B (zh) * 2008-05-07 2011-12-28 亚洲光学股份有限公司 光学系统中的嵌合式镜片组及其嵌合精度补正方法
JP2010237189A (ja) * 2009-03-11 2010-10-21 Fujifilm Corp ３次元形状測定方法および装置
JP5337955B2 (ja) * 2009-05-19 2013-11-06 株式会社ミツトヨ 形状測定装置、形状測定方法、及びプログラム
JP2010281792A (ja) * 2009-06-08 2010-12-16 Fujifilm Corp 非球面体測定方法および装置
US8184301B2 (en) * 2009-08-19 2012-05-22 Benz Research And Development Corporation Surface alignment and positioning method and apparatus
US8665425B2 (en) 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method
WO2012001929A1 (ja) * 2010-07-01 2012-01-05 パナソニック株式会社 波面収差測定装置及び波面収差測定方法
US20120133957A1 (en) * 2010-11-30 2012-05-31 Widman Michael F Laser confocal sensor metrology system
WO2013119775A1 (en) 2012-02-10 2013-08-15 Johnson & Johnson Vision Care, Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
AU2014261378B2 (en) * 2013-05-02 2017-02-16 Carl Zeiss Ag Method and system for determining the spatial structure of an object
DE102013219838B4 (de) * 2013-09-30 2015-11-26 Carl Zeiss Ag Verfahren und System für das Ermitteln der räumlichen Struktur eines Gegenstands
WO2015146634A1 (ja) * 2014-03-28 2015-10-01 コニカミノルタ株式会社 非球面の偏心量測定方法及び形状解析方法
DE102014007203A1 (de) * 2014-05-19 2015-11-19 Luphos Gmbh Vorrichtung und Verfahren zur geometrischen Vermessung eines Objekts
EP3180597B1 (en) * 2014-08-15 2021-02-17 Zygo Corporation Optical evaluation of lenses and lens molds
JP6302864B2 (ja) * 2015-03-31 2018-03-28 富士フイルム株式会社 レンズの形状測定方法及び形状測定装置
US10295754B2 (en) * 2017-05-11 2019-05-21 Nalux Co., Ltd. Position determination method and element
JP7201312B2 (ja) 2017-07-26 2023-01-10 株式会社ダイセル 光学部品、及びその製造方法
DE102018201481A1 (de) 2018-01-31 2019-08-01 Carl Zeiss Vision Gmbh Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Oberflächengeometrie von Objekten
KR102028699B1 (ko) * 2018-02-21 2019-11-04 지메스소프트 주식회사 렌즈의 3차원 형상 측정 방법 및 이를 위한 시스템
JP7034803B2 (ja) * 2018-03-30 2022-03-14 浜松ホトニクス株式会社 測距ユニット及び光照射装置
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法
JP7537930B2 (ja) 2020-07-28 2024-08-21 株式会社ミツトヨ 形状測定方法
CN113310455B (zh) * 2021-04-08 2023-07-11 超丰微纳科技(宁波)有限公司 一种检测模压成型加工双面镜偏心量的方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3725817B2 (ja) * 2001-11-20 2005-12-14 オリンパス株式会社 非球面レンズの偏心測定方法及び偏心測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Also Published As

Publication number Publication date
JPWO2007018118A1 (ja) 2009-02-19
CN101233386B (zh) 2010-09-29
WO2007018118A1 (ja) 2007-02-15
JP4767255B2 (ja) 2011-09-07
KR20080031509A (ko) 2008-04-08
CN101233386A (zh) 2008-07-30

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