KR100919635B1 - 능동행렬 표시장치 - Google Patents
능동행렬 표시장치Info
- Publication number
- KR100919635B1 KR100919635B1 KR1020020088482A KR20020088482A KR100919635B1 KR 100919635 B1 KR100919635 B1 KR 100919635B1 KR 1020020088482 A KR1020020088482 A KR 1020020088482A KR 20020088482 A KR20020088482 A KR 20020088482A KR 100919635 B1 KR100919635 B1 KR 100919635B1
- Authority
- KR
- South Korea
- Prior art keywords
- thin film
- film transistor
- active matrix
- electrode
- display device
- Prior art date
Links
- 239000011159 matrix material Substances 0.000 title claims abstract description 40
- 239000010409 thin film Substances 0.000 claims abstract description 144
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 13
- 239000010410 layer Substances 0.000 claims description 63
- 239000004065 semiconductor Substances 0.000 claims description 48
- 238000000034 method Methods 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 16
- 239000004973 liquid crystal related substance Substances 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 description 15
- 229910052710 silicon Inorganic materials 0.000 description 14
- 239000010703 silicon Substances 0.000 description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 13
- 239000010408 film Substances 0.000 description 13
- 229910021417 amorphous silicon Inorganic materials 0.000 description 11
- 239000011229 interlayer Substances 0.000 description 8
- 229910021419 crystalline silicon Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 6
- 239000011241 protective layer Substances 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 239000012535 impurity Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 241000270730 Alligator mississippiensis Species 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 229920001621 AMOLED Polymers 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
- H01L27/1274—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement using crystallisation of amorphous semiconductor or recrystallisation of crystalline semiconductor
- H01L27/1285—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement using crystallisation of amorphous semiconductor or recrystallisation of crystalline semiconductor using control of the annealing or irradiation parameters, e.g. using different scanning direction or intensity for different transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1296—Multistep manufacturing methods adapted to increase the uniformity of device parameters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78663—Amorphous silicon transistors
- H01L29/78669—Amorphous silicon transistors with inverted-type structure, e.g. with bottom gate
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thin Film Transistor (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
Claims (6)
- 다수의 화소가 매트릭스 형상으로 배열되고, 게이트전극, 소스전극, 드레인전극, 채널영역의 반도체층을 각각 포함하는 제 1 및 제 2 박막트랜지스터를 포함하는 능동행렬 표시장치로서,상기 제 1 박막트랜지스터의 상기 채널영역의 반도체층과 상기 제 2 박막트랜지스터의 상기 채널영역의 반도체층은 동일한 수, 동일한 방향, 동일간격의 규칙적인 그레인 바운더리가 존재하는 다결정 실리콘 박막을 포함하는 능동행렬 표시장치
- 삭제
- 삭제
- 청구항 1에 있어서,상기 다결정 실리콘 박막은 SLS 방법으로 형성되는 능동행렬 표시장치
- 청구항 1에 있어서,상기 능동행렬 표시장치는,기판과;상기 기판 상부에 형성된 화소영역을 정의하는 게이트라인 및 데이터라인과;상기 각 화소영역에 형성되는 적어도 하나 이상의 스위칭 박막트랜지스터와;상기 각 화소영역에 형성되는 적어도 하나 이상의 드라이빙 박막트랜지스터를 포함하는 유기전기발광소자인 능동행렬 표시장치
- 청구항 1에 있어서,상기 능동행렬 표시장치는 액정표시장치인 능동행렬 표시장치
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020088482A KR100919635B1 (ko) | 2002-12-31 | 2002-12-31 | 능동행렬 표시장치 |
US10/742,550 US20040144988A1 (en) | 2002-12-31 | 2003-12-19 | Active matric display device including polycrystalline silicon thin film transistor and manufacturing method of the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020088482A KR100919635B1 (ko) | 2002-12-31 | 2002-12-31 | 능동행렬 표시장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040062155A KR20040062155A (ko) | 2004-07-07 |
KR100919635B1 true KR100919635B1 (ko) | 2009-09-30 |
Family
ID=32733069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020088482A KR100919635B1 (ko) | 2002-12-31 | 2002-12-31 | 능동행렬 표시장치 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20040144988A1 (ko) |
KR (1) | KR100919635B1 (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100796758B1 (ko) * | 2001-11-14 | 2008-01-22 | 삼성전자주식회사 | 다결정 규소용 마스크 및 이를 이용한 박막 트랜지스터의제조 방법 |
KR100466628B1 (ko) | 2002-11-12 | 2005-01-15 | 삼성에스디아이 주식회사 | 평판표시장치 및 그의 제조방법 |
CN1324540C (zh) * | 2003-06-05 | 2007-07-04 | 三星Sdi株式会社 | 具有多晶硅薄膜晶体管的平板显示装置 |
US8441049B2 (en) * | 2003-07-16 | 2013-05-14 | Samsung Display Co., Ltd. | Flat panel display device comprising polysilicon thin film transistor and method of manufacturing the same |
US7259106B2 (en) * | 2004-09-10 | 2007-08-21 | Versatilis Llc | Method of making a microelectronic and/or optoelectronic circuitry sheet |
KR20070014528A (ko) * | 2005-07-29 | 2007-02-01 | 삼성전자주식회사 | 어레이 기판, 이의 제조방법 및 실리콘 결정화 방법 |
JP4169071B2 (ja) * | 2006-05-25 | 2008-10-22 | ソニー株式会社 | 表示装置 |
JP5308656B2 (ja) * | 2007-12-10 | 2013-10-09 | グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー | 画素回路 |
CN103794566A (zh) * | 2014-01-17 | 2014-05-14 | 深圳市华星光电技术有限公司 | 一种显示面板制作方法 |
JP7020900B2 (ja) | 2017-12-15 | 2022-02-16 | キヤノン株式会社 | 露光装置および物品の製造方法 |
KR101908383B1 (ko) | 2018-04-25 | 2018-12-11 | 삼성디스플레이 주식회사 | 유기발광표시장치 및 그 제조방법 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010004129A (ko) * | 1999-06-28 | 2001-01-15 | 구본준 | 레이저 어닐링 방법 |
KR20020027315A (ko) * | 2000-03-16 | 2002-04-13 | 추후보정 | 연속 모션 sls를 제공하기 위한 방법 및 시스템 |
KR20020056239A (ko) * | 2000-12-29 | 2002-07-10 | 구본준, 론 위라하디락사 | 액티브 매트릭스 유기 전계발광 디스플레이 장치 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3423165B2 (ja) * | 1996-11-07 | 2003-07-07 | シャープ株式会社 | 液晶表示装置 |
TW521226B (en) * | 2000-03-27 | 2003-02-21 | Semiconductor Energy Lab | Electro-optical device |
JP5030345B2 (ja) * | 2000-09-29 | 2012-09-19 | 三洋電機株式会社 | 半導体装置 |
KR100400510B1 (ko) * | 2000-12-28 | 2003-10-08 | 엘지.필립스 엘시디 주식회사 | 실리콘 결정화 장치와 실리콘 결정화 방법 |
US6740938B2 (en) * | 2001-04-16 | 2004-05-25 | Semiconductor Energy Laboratory Co., Ltd. | Transistor provided with first and second gate electrodes with channel region therebetween |
KR100558678B1 (ko) * | 2001-06-01 | 2006-03-10 | 엘지.필립스 엘시디 주식회사 | 폴리실리콘 결정화방법 |
-
2002
- 2002-12-31 KR KR1020020088482A patent/KR100919635B1/ko active IP Right Grant
-
2003
- 2003-12-19 US US10/742,550 patent/US20040144988A1/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010004129A (ko) * | 1999-06-28 | 2001-01-15 | 구본준 | 레이저 어닐링 방법 |
KR20020027315A (ko) * | 2000-03-16 | 2002-04-13 | 추후보정 | 연속 모션 sls를 제공하기 위한 방법 및 시스템 |
KR20020056239A (ko) * | 2000-12-29 | 2002-07-10 | 구본준, 론 위라하디락사 | 액티브 매트릭스 유기 전계발광 디스플레이 장치 |
Also Published As
Publication number | Publication date |
---|---|
US20040144988A1 (en) | 2004-07-29 |
KR20040062155A (ko) | 2004-07-07 |
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