KR100712179B1 - Organic light-emitting diode array substrate - Google Patents

Abstract

The present invention discloses an OLED array substrate capable of ledger inspection. The OLED array substrate has a plurality of OLED panels and a plurality of wiring groups. The plurality of wiring groups include a first power line and a second power line for supplying power to the OLED panels. The first power line or the second power line includes resistors connected to the OLED panels and each having a different size.

Voltage is supplied to the first power line and the second power line from pads located outside the substrate, and the same voltage is applied to each OLED panel due to the resistors. An OLED panel to which both a positive power supply voltage and a negative power supply voltage are supplied at the same time is selected, and a test is performed on the selected OLED panel using signal lines provided in each wiring group.

Description

Organic Light-Emitting Diode Array Substrate

1 is a plan view showing an OLED array substrate according to an embodiment of the present invention.

FIG. 2 is a block diagram illustrating the OLED panel and wiring groups shown in FIG. 1 according to an embodiment of the present invention.

3 is a schematic diagram of a portion of the OLED array substrate of FIG. 1, in accordance with an embodiment of the invention.

4A and 4B are circuit diagrams for explaining performance of a lighting test according to a preferred embodiment of the present invention.

5 is another circuit diagram for describing a lighting test according to a preferred embodiment of the present invention.

6A to 6F are block diagrams illustrating a method of performing a ledger unit test according to a preferred embodiment of the present invention.

Explanation of symbols on the main parts of the drawings

110: OLED panel 130: first wiring group

131: first power line 132: first resistor

133: scan generation line 135: data selection line

150: second wiring group 151: second power line

152: second resistor 153: lighting inspection line

160: pad 310: light circuit portion

430: data divider

The present invention relates to an OLED array substrate, and more particularly, to an OLED array substrate capable of inspecting a plurality of OLED panels in a sheet unit.

OLED panels are formed on the substrate. That is, multiple OLED panels are manufactured through the same manufacturing process on one common substrate. The method of inspecting the defects of the plurality of OLED panels manufactured as described above is largely divided into two methods.

The first is to scribe the substrate to divide each OLED panel and to perform an inspection on each of the divided OLED panels. That is, the inspection is performed on the divided OLED panel without having a separate wiring structure. The above method requires inspection to be performed in the inspection unit of the panel unit, so if the model of the panel is changed and the circuit wiring constituting the panel is changed or the size of the panel is changed, the inspection equipment is changed or required for inspection. There is a problem that the jig to be changed.

Secondly, the substrate is scribed in one column or one row to perform inspection in stick units. Korean Patent Laid-Open Publication No. 2002-41674 and Korean Patent Laid-Open Publication No. 1999-3277 disclose a method of performing an inspection on a stick basis for a liquid crystal display. The disclosed patents are premised that each panel is made of liquid crystal, and is characterized in that the test pads are provided on both sides of the stick in order to perform the stick unit inspection. In particular, the inspection process on a stick basis is described as being provided for performing visual inspection.

In the case of the liquid crystal display, a process in which the liquid crystal is injected between the upper substrate and the lower substrate is essentially interposed, and since the items of the characteristic inspection are concentrated on the visual inspection, even when the inspection is performed in units of sticks (Turn Around Time; TAT) This longer problem does not occur. However, in the case of the OLED panel, since a plurality of inspection items are required in addition to the visual inspection in the state where the organic layer including the organic light emitting layer is already formed, there is a problem in that the inspection time is long when the inspection by the stick unit is made.

Accordingly, the present invention has been made to solve the above problems, it is possible to inspect the ledger unit, and to reduce the drop of the voltage supplied to each OLED panel during the inspection, OLED which can improve the reliability of the inspection An array substrate is provided.

The present invention for achieving the above object, a plurality of OLED panels formed on a substrate; A first wiring group located on a spaced space between adjacent OLED panels, the first wiring group including a first power line for applying a positive power supply voltage to the OLED panels arranged in the first direction; And a second wiring group positioned in the separation space and including a second power line for applying a negative power supply voltage to the OLED panels arranged in a second direction crossing the first direction. The power supply line or the second power supply line comprises an OLED array substrate characterized in that it comprises resistors having different sizes and connected to the OLED panels arranged in the first direction or the OLED panels arranged in the second direction. to provide.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

(Example)

1 is a plan view illustrating an OLED array substrate according to an embodiment of the present invention, and FIG. 2 is a block diagram showing one OLED panel and wiring groups shown in FIG. 1 according to an embodiment of the present invention.

1 and 2, OLED panels 110 provided with an organic light emitting diode are disposed on a substrate. The organic light emitting diode includes at least a first pixel having a first electrode, a second electrode, and an organic light emitting layer interposed between the first electrode and the second electrode. In addition, one unit pixel has at least red, green, and blue subpixels. Each subpixel includes an organic light emitting display device and an active circuit for controlling the light emission operation of the organic light emitting display device. In addition, according to the exemplary embodiment, each pixel may further include a white subpixel.

The OLED panels 110 are repeatedly arranged in a regular pattern on the substrate. That is, it is arranged to have a constant spacing in the vertical direction in the first direction, and is arranged with a certain spacing space in the horizontal direction in the second direction. The number of OLED panels 110 arranged on the substrate can be changed depending on the size of the substrate and the OLED panel 110.

A plurality of lines are disposed in the spaced space between the OLED panels 110. The first wire group 130 is disposed in the vertical direction. The first wiring group 130 may include a first power line 131, a scan generation line 133, a data selection line 135, and the like for supplying a positive voltage.

The first power line 131 supplies a positive power supply voltage ELVDD to the OLED panels 110 arranged in the first direction.

When the OLED panel 110 includes a scan driver for generating a scan signal, the scan generation line 131 supplies the scan generation signal to the scan driver. The scan generation signal may include a power supply voltage, a start pulse, and a clock signal of the scan driver.

When a power supply voltage necessary for the operation of the scan driver is applied and a start pulse and a clock signal are applied, the scan driver generates a scan signal in synchronization with the clock signal. The generated scan signal is used to select a pixel provided in the OLED panel 110. In addition, it is preferable that a plurality of scan generation lines 133 are provided to transmit the power supply voltage, the start pulse, and the clock signal of the scan driver. Therefore, when the scan driver is embedded in the OLED panel 110, the scan generation line 133 is not one line but is composed of a plurality of lines.

The data selection line 135 supplies a data selection signal for controlling the data distributor provided in the OLED panel 110. When the data distributor is not provided in the OLED panel 110, the data selection line 135 may not be disposed.

In addition, the scan generation line 133 and the data selection line 135 may be disposed in the second wiring group 150. Whether the scan generation line 133 or the data selection line 135 belongs to the first wiring group 130 or the second wiring group 150 is appropriately determined according to the size of the separation space.

The second wiring group 150 is disposed in the horizontal direction. The second wiring group 150 may include a second power line 151 and a lighting test line 153. In FIG. 1 and FIG. 2, the second wiring group 150 is illustrated as being disposed in a lower spaced space of the OLED panel 110, but the second wiring group 150 is formed in the upper spaced space of the OLED panel 110. The OLED panel 110 may be disposed above and below the OLED panel 110.

The second power line 151 supplies a negative power supply voltage ELVSS to the OLED panel 110.

In addition, the lighting test line 153 supplies lighting signals used for lighting inspection of the OLED panel 110. That is, the lighting control signal TEST_GATE and the lighting inspection signal TEST_DATA are supplied through the lighting inspection line 153. In FIG. 1 and FIG. 2, the lighting test line 153 is illustrated as being composed of one line. However, the lighting test line 153 is provided for easy understanding and may be provided in plural numbers depending on the type of signal required for the lighting test.

The first power line 131 belonging to the first wiring group 130 and the second power line 151 belonging to the second wiring group 150 cross each other in a space. In addition, the first power line 131 is disposed in the vertical direction and supplies a positive power supply voltage ELVDD to the plurality of OLED panels 110 adjacent to the first power line 131 and arranged in the vertical direction. The second power line 151 is disposed in the horizontal direction, and supplies a negative power supply voltage ELVSS to the plurality of OLED panels 110 adjacent to the second power line 151 and arranged in the horizontal direction.

The first wiring group 130 including the first power line 131 and the second wiring group 150 including the second power line 151 are connected to the substrate through pads 160 positioned outside the substrate. It may be electrically connected to the outside, thereby providing power to the OLED panels 110.

In order to apply the same voltage to the OLED panels 110, the first power line 131 is connected to the plurality of OLED panels 110 arranged in the vertical direction and has different sizes of resistors ( 132). In addition, the second power line 151 is connected to the plurality of OLED panels 110 arranged in the horizontal direction, and includes resistors 152 having different sizes.

In order to inspect the OLED panels 110 arranged on the OLED array substrate 100, power is applied to the OLED panels 110 from a pad 160 located outside of the substrate. The power is supplied to the OLED panels 110 through a first power line 131 or a second power line 151, wherein the length of the first power line 131 or the second power line 151 is provided. As a result of the voltage drop, a lower voltage is applied to the OLED panel 110 located far from the pad 160 than the OLED panel 110 located close to the pad 160. Therefore, since the amount of current flowing through each of the OLED panels 110 is different, it is difficult to apply the same criteria to determine whether the OLED panels 110 are defective.

Accordingly, to compensate for the voltage drop, the first power line 131 or the second power line 151 may include the first resistors or the second resistors 132 and 152. The size of the first and second resistors 132 and 152 is increased based on the OLED panel located farthest from the pad.

3 is a partially enlarged plan view of an OLED array substrate according to an exemplary embodiment of the present invention, with reference to which will be described the size of resistors for applying the same voltage to the OLED panels.

Referring to FIG. 3, four OLED panels P1, P2, P3, and P4 are arranged in the same row. A positive voltage having the same magnitude is applied to the OLED panels P1, P2, P3, and P4 through a first power line (not shown), and a negative voltage V0 through the second power line 151. Is applied. In order to apply the same voltage to the OLED panels P1, P2, P3, and P4, the second power line 151 may include resistors connected to the respective OLED panels P1, P2, P3, and P4. (R1, R2, R3, R4).

Here, each of the OLED panels P1, P2, P3, and P4 are arranged at equal intervals, so that they have the same wiring resistance r, and are applied to the OLED panels P1, P2, P3, and P4. When the voltage and current to be equal are the ratio of the magnitude of the resistors (R1, R2, R3, R4) is as follows.

V1 = V0-r (I1 + I2 + I3 + I4)-R1I1

V2 = V0-r (I1 + I2 + I3 + I4)-r (I2 + I3 + I4)-R2I2

V3 = V0-r (I1 + I2 + I3 + I4)-r (I2 + I3 + I4)-r (I3 + I4)-R3I3

V4 = V0-r (I1 + I2 + I3 + I4)-r (I2 + I3 + I4)-r (I3 + I4)-rI4- R4I4

if, V1 = V2 = V3 = V4, I1 = I2 = I3 = I4

R4: R3: R2: R1 = 1: 2: 4: 4:

As described above, the size of the resistors R1, R2, R3, and R4 connected to the OLED panels P1, P2, P3, and P4 increases as the distance from the pad increases, that is, the size of the resistor R4 connected to P4 increases. It can be seen that the smallest, and the size of the resistors sequentially increases.

3 illustrates only four OLED panels. When a larger number of OLED panels are placed, the ratio of the size of the resistors is in the form of a sequence such as 1: 2: 4: 7: 11: 16 ..... based on the OLED panel furthest from the pad. It can be seen that the sequence sequence of the sequence is an equal order sequence having a tolerance of 1.

In FIG. 3, the power is applied only in one direction. However, as shown in FIG. 1, when the pads are positioned on both sides of the substrate, the power may be applied in both directions. In this case, the size of the resistor connected to the OLED panel located at the center is the smallest, and it can be expected that the size of the resistor increases toward the outside of the substrate.

As described above, when the first power line or the second power line is connected to the respective OLED panels and has a resistor having a different size, the same voltage can be applied to the respective OLED panels, thereby improving the reliability of the inspection. You can.

A positive power supply voltage ELVDD is supplied to a specific first power supply line among the plurality of first power supply lines 131, and a negative power supply voltage is supplied to a specific second power supply line among the plurality of second power supply lines 151. When the ELVSS is supplied, only a specific OLED panel to which the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are applied together is selected, and the check for the selected EL panel 110 can be performed.

In addition, the lighting test line 153 may be formed horizontally with the second power line 151, or may be formed horizontally with the first power line 131. That is, the lighting test line 153 may belong to the first wiring group 130.

In addition, the size of the OLED panel 110, the position of the first wiring group 130 and the second wiring group 150 and the number of lines shown in FIGS. 1 and 2 are somewhat for easy understanding of the present invention. Exemplarily exaggerated, a number of lines used for the inspection of the OLED panel can be arranged, unlike shown in Figures 1 and 2 above.

4A and 4B are circuit diagrams for explaining performance of a lighting test according to a preferred embodiment of the present invention.

Referring to FIG. 4A, a lighting circuit unit 310 and a plurality of data lines 315 connected to the lighting circuit unit are shown. The lighting circuit unit 310 is preferably embedded in the OLED panel.

The lighting circuit 310 is composed of a plurality of switching elements connected in parallel. The switching element may be a transistor as shown in FIG. 4A or may be a transfer gate according to an embodiment. Therefore, any number of switching elements may be used as long as the switching element transmits the lighting test signal TEST_DATA to the data line 315 according to the lighting control signal TEST_GATE. However, since FIG. 4A illustrates the switching element as a PMOS, a lighting test performed according to the operation of the PMOS will be described.

First, the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are supplied to the OLED panel where the lighting check is performed.

When the lighting control signal TEST_GATE is at the low level, the transistors are turned on. The lighting test signal TEST_DATA is applied to the data lines 315 through the turned-on transistors. In response to the application of the lighting test signal TEST_DATA, the OLED panel starts emitting operation. When there is a pixel having a characteristic defect among a plurality of pixels constituting the OLED panel, despite the application of the lighting test signal TEST_DATA, the pixel having the characteristic defect does not perform a light emitting operation. Therefore, it is possible to know whether a bad pixel exists by applying the lighting test signal TEST_DATA.

In addition, during the lighting test, since the lighting test signal TEST_DATA of the same level is supplied to the plurality of pixels constituting the OLED panel, white balancing of the pixels can be known, and progression failure can be detected.

Referring to FIG. 4B, the lighting circuit unit 330 illustrated in FIG. 4A is divided into a plurality of lighting circuit units according to types of data lines. That is, the red lighting circuit unit 331, the green lighting circuit unit 333, the blue lighting circuit unit 335, and the plurality of data lines 332, 334, and 336 connected to the three lighting circuit units 331, 333, 335 are shown.

The red lighting circuit unit 331 includes a plurality of transistors, and the transistors perform an on / off operation by the red lighting control signal TEST_GATE_R. In addition, the lighting test signal TEST_DATA is applied to one end of the transistor of the red lighting circuit unit 331, and the other end is connected to the red data line 332. The red data line 332 transmits a lighting test signal TEST_DATA to the red subpixel. For example, when the red lighting control signal TEST_GATE_R is at a low level, the transistors of the red lighting circuit unit 331 are turned on, and the red lighting test signal TEST_DATA is applied to the plurality of red data lines 332.

In addition, the green lighting circuit unit 333 includes a plurality of transistors, which are simultaneously turned on / off by the green lighting control signal TEST_GATE_G. Therefore, when the green lighting control signal TEST_GATE_G is at the low level, the lighting test signal TEST_DATA is applied to the green data lines 334.

In addition, the blue lighting circuit unit 335 is composed of a plurality of transistors, which are simultaneously turned on / off by the blue lighting control signal TEST_GATE_B. Therefore, when the blue lighting control signal TEST_GATE_B is at a low level, the lighting inspection signal TEST_DATA is applied to the blue data lines 336.

The red lighting control signal TEST_GATE_R, the green lighting control signal TEST_GATE_G and the blue lighting control signal TEST_GATE_B may be applied simultaneously, and may be applied sequentially.

Although not shown in FIG. 4B, each pixel may have a white subpixel in addition to the red, green, and blue subpixels. Therefore, a white lighting circuit part may be further included in addition to the red, green, and blue lighting circuit parts.

In addition, although the circuit diagrams shown in FIGS. 3A and 3B are illustrated to explain the lighting inspection of the OLED panel, the circuit diagrams illustrated in FIGS. 3A and 3B may be used for various inspections.

For example, by applying a high bias voltage or a bias current to the organic light emitting display device, it can be used for an aging test or heat treatment test for detecting a progression defect of the organic light emitting device. The heat treatment test is to detect whether the organic light emitting diode operates normally in a state where a rapid temperature change is applied. In addition, the heat treatment test may be in the form of detecting whether the organic light emitting device is operating normally at low or high temperature.

In addition, the circuit diagrams shown in FIGS. 3A and 3B may also be used for leakage current inspection. That is, the current flowing through the first and second power supply voltage lines or the first and second power supply lines under the condition that the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are applied to detect the presence of leakage current in the OLED panel. can do. In the leakage current test, in the state in which the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are applied, the current flowing in the first and second power supply voltage lines or the first and second power supply lines in a state in which the lighting circuit part is turned off entirely. Can be detected.

5 is another circuit diagram for describing a lighting test according to a preferred embodiment of the present invention.

Referring to FIG. 5, the lighting circuit unit 410, the data distributor 430, and the data lines 451, 453, and 455 are shown. In addition, the circuit shown in FIG. 5 is preferably embedded in an OLED panel.

The lighting circuit unit 410 has the same configuration as shown in FIG. 4A.

In addition, the data distributor 430 is connected between the lighting circuit unit 410 and the data lines 451, 453, and 455. The data divider 430 transmits a signal input to the data divider 430 to the red data line 451, the green data line 453, or the blue data line 455 under the control of the data selection signals SLR, SLG, and SLB. Supply. The data selection signals are divided into a red data selection signal SLR, a green data selection signal SLG, and a blue data selection signal SLB.

For example, when the red data selection signal SLR is at a low level and the lighting control signal TEST_GATE is at a low level, the transistors connected to the red data selection signal SLR are turned on, and the lighting check signal TEST_DATA is turned on through the turned on transistor. Is applied. The lighting test signal TEST_DATA applied to the red data line 451 lights up the red subpixels of the OLED panel.

In addition, when the green data selection signal SLG is at a low level and the lighting control signal TEST_GATE is at a low level, the transistors connected to the green data selection signal SLG are turned on. The turn-on test signal TEST_DATA is applied to the green data line 453 through the turned-on transistors. The lighting test signal TEST_DATA applied to the green data line 453 lights up the green subpixels of the OLED panel.

When the blue data selection signal SLB is low level and the lighting control signal TEST_GATE is low level, the lighting test signal TEST_DATA is applied to the blue data line 455, and the lighting test signal TEST_DATA lights the blue subpixels of the OLED panel. .

Although not illustrated in FIG. 5, the data selection signal may further have a white data selection signal. That is, the lighting test signal TEST_DATA may light white subpixels through the white data line by the white data selection signal.

In addition, the circuit diagram shown in FIG. 5 can be used for various inspections of the OLED panel. That is, by applying a high bias voltage or a bias current to the organic light emitting device, it can be used for aging test (heating test) and heat treatment test for detecting the progression defects of the organic light emitting device. The heat treatment test is to detect whether the organic light emitting diode operates normally in a state where a rapid temperature change is applied. In addition, the heat treatment test may be in the form of detecting whether the organic light emitting device is operating normally at low or high temperature.

In addition, the circuit diagram shown in FIG. 5 may also be used for leakage current inspection. That is, the current flowing through the first power supply line or the second power supply line may be detected in a situation where the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are applied, and thus the presence of a leakage current may be checked in the OLED panel.

In addition, a plurality of pads 460 may be interposed between the data distributor and the lighting circuit unit. The pad 460 is disposed between a line connecting the lighting circuit unit 410 and the data distributor 430. The pad 460 may be used for various image quality inspections of the OLED panel. That is, various signals may be applied to the data distributor 430 by using a probe tip or a spring pin on the pad 460.

6A to 6F are block diagrams illustrating a method of performing a ledger unit test according to a preferred embodiment of the present invention.

Referring to Fig. 6A, a positive power supply voltage ELVDD is supplied to an OLED panel arranged in the first row on the substrate. In addition, a negative power supply voltage ELVSS is supplied to the OLED panel arranged in the first column on the substrate. Therefore, the positive power supply voltage ELVDD and the negative power supply voltage ELVSS are supplied to the OLED panels arranged in the first row and the first column on the substrate, and a plurality of inspections are performed. Aging check, leakage current check and lighting quality check are sequentially performed for the selected OLED panel. In addition, the order of inspection may be changed for the selected OLED panel, and it is apparent to those skilled in the art that various inspections may be performed to confirm whether the OLED panel is normally operated.

Referring to FIG. 6B, a positive power supply voltage ELVDD is applied to the second row on the substrate, and a negative power supply voltage ELVSS is applied to the first column in the same manner as in FIG. 6A. Thus, the OLED panels arranged in the second row and the first column are selected, and the inspection for the selected OLED panel is performed. Aging inspection, leakage current inspection, and lighting quality inspection are sequentially performed on the OLED panels arranged in the second row and one column.

Referring to FIG. 6C, a positive power supply voltage ELVDD is applied to a third row on a substrate, and a negative power supply voltage ELVSS is applied to a first column. That is, the OLED panels arranged in the third row and the first column are selected, and the inspection for the selected OLED panel is performed.

6A to 6C, OLED panels are sequentially selected in the horizontal direction, and the selected OLED panel is inspected.

6D to 6F, selection and inspection operations for OLED panels disposed in the second row are sequentially performed. A negative power supply voltage ELVSS is supplied to the second power supply line located in the second row to sequentially select the OLED panels arranged in the second row. In addition, the positive power supply voltage ELVDD is applied to the first column, and the positive power supply voltage ELVDD is sequentially supplied in the horizontal direction.

The inspection method disclosed in FIGS. 6A to 6F described above may be performed by changing a direction in which the inspection is performed. That is, first, the positive power supply voltage ELVDD may be applied in the vertical direction, and the negative power supply voltage ELVSS applied in the horizontal direction may be sequentially applied in alternating rows.

6A to 6F illustrate a plurality of OLED panels disclosed in this embodiment and a method using a plurality of wiring groups for performing electrical inspection on the OLED panels.

In other words, the inspection may be performed in a sheet unit without performing separate scribing to inspect a plurality of OLED panels formed on one substrate.

Therefore, by scribing and separating each OLED panel, the inspection time can be shortened than the electrical inspection performed on the separated OLED panel, and the reliability of the inspection can be improved by applying a voltage having the same magnitude to each OLED panel. Can be improved. In addition, it is possible to reduce the consumption of equipment such as jig required for inspection.

According to the present invention as described above, a plurality of OLED panels can be inspected by the ledger unit which is one substrate. That is, a specific OLED panel can be selected by selectively supplying a positive power supply voltage and a negative power supply voltage, and the signals used for inspection can be supplied to the selected OLED panel. In addition, it is possible to apply a voltage having the same magnitude to each OLED panel by compensating for the voltage drop along the length of the wiring, thereby increasing the reliability of the inspection. Therefore, the present invention can shorten the time required for inspecting the OLED panels, increase the reliability of the inspection, and facilitate the preparation of the inspection equipment used for the inspection. In addition, since it is an inspection by the ledger unit, the examination equipment can be enlarged and standardized.

Although described above with reference to a preferred embodiment of the present invention, those skilled in the art will be variously modified and changed within the scope of the invention without departing from the spirit and scope of the invention described in the claims below I can understand that you can.

Claims (11)

A plurality of OLED panels located on the substrate; First wiring groups on a spaced space between adjacent OLED panels, the first wiring groups including a first power line for applying a positive power supply voltage to the OLED panels arranged in the first direction; And Second wiring groups located in the spaced space and including second power lines for applying a negative power supply voltage to OLED panels arranged in a second direction crossing the first direction; And The first power line or the second power line is connected to the OLED panels arranged in the first direction or the OLED panels arranged in the second direction and each of the first resistors or second resistors having different sizes. OLED array substrate comprising a. The method of claim 1, Located at the outer periphery of the substrate, and includes pads for electrically connecting the first wiring group or the second wiring group to the outside of the substrate, And the first resistors or the second resistors increase in size relative to the OLED panel located furthest from the pad. The method of claim 2, And the ratio of the magnitudes of the first resistors or the second resistors is in the form of a sequence, and the sequence of the sequences is an equal order sequence having a tolerance of 1. The method of claim 1, And the first wiring groups or the second wiring groups further comprise a scan generation line for supplying a scan generation signal. The method of claim 4, wherein And the scan generation line transfers a power supply voltage, a start pulse, and a clock signal of the scan driver. The method of claim 4, wherein Each of the OLED panels includes a scan driver for generating a scan signal and a light emitting driver for driving a light emission control signal, wherein the scan generation signals are input signals of the scan driver. The method of claim 1, The first wiring group or the second wiring group further comprises a lighting test line for supplying a lighting signal. The method of claim 7, wherein Each OLED panel, A lighting circuit unit for selecting a data line according to a lighting control signal among the lighting signals and applying a lighting test signal among the lighting signals to the data line; And And an pixel connected to each of said data lines. The method of claim 8, The lighting circuit portion has a plurality of transistors, A red lighting circuit unit for selecting a red data line according to a red lighting control signal; A green lighting circuit unit for selecting a green data line according to a green lighting control signal; And And a green lighting circuit for selecting a blue data line according to a blue lighting control signal. The method of claim 7, wherein And the first wiring group or the second wiring group further comprises a data selection line for transmitting a data selection signal. The method according to claim 8 or 9, The OLED panel, And a data divider for selecting a data line according to the data selection signal between the lighting circuit unit and the data line.

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