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KR100715838B1 - Low temperature test Large diameter tensile specimen Length strain measuring device - Google Patents

Low temperature test Large diameter tensile specimen Length strain measuring device Download PDF

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KR100715838B1
KR100715838B1 KR1020050103210A KR20050103210A KR100715838B1 KR 100715838 B1 KR100715838 B1 KR 100715838B1 KR 1020050103210 A KR1020050103210 A KR 1020050103210A KR 20050103210 A KR20050103210 A KR 20050103210A KR 100715838 B1 KR100715838 B1 KR 100715838B1
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chamber
tensile specimen
temperature test
low temperature
specimen
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KR20070046468A (en
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박동수
박재우
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한국전력공사
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • G01N3/18—Performing tests at high or low temperatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/04—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B5/043—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37031—Lvdt for x and y in a plane, center lines intersect at locating point

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Abstract

본 발명은 저온시험이 요구되는 대구경 및 실물 시험 인장시편의 길이 변형율을 정확하고 용이하게 측정할 수 있는 측정장치에 관한 것이다. The present invention relates to a measuring device capable of accurately and easily measuring a strain rate of a tensile specimen of a large diameter test and a toughness test which require a low temperature test.

본 발명은 UTM 등을 이용하여 저온에서 재료의 기계적인 성질을 측정함에 있어서, 대구경 및 실물 시험 인장시편의 길이 변형율을 정확히 측정하기 위한 장치로서, 인장시편의 표점구간 상ㆍ하부에 각각 고정되는 대향하는 두 개의 반원통형 블록과 인장시편의 단면 축소에 따라 탄력적으로 시편에 밀착고정하기 위한 압착수단을 포함하는 상ㆍ하부 표점지그, 저온 시험을 위한 챔버 및 인장시편에 설치된 상·하부 가이드로 인하여 수직방향으로 평행 이동되어 인장시편의 늘어나는 변형율을 정확히 측정할 수 있다. The present invention relates to an apparatus for accurately measuring the strain rate of a tensile specimen of a large diameter and a specimen in measuring the mechanical properties of the material at a low temperature using a UTM or the like, The upper and lower gauge jig including the pressing means for resiliently pressing and fixing the specimen according to the section reduction of the tensile specimen, the chambers for the low temperature test, and the upper and lower guides installed on the tensile specimen, And the elongation strain of the tensile specimen can be accurately measured.

지온시험, 인장시편, 길이 변형률, 표점지그, 챔버, Temperature test, tensile specimen, strain, strain gauge, chamber,

Description

저온시험 대구경 인장시편 길이변형률 측정장치{A extensometer for large diameter in low temparuture}BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a large-

도 1은 본 발명에 따른 일 실시예의 단면 구성도.BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a sectional structural view of an embodiment according to the present invention;

도 2는 도 1 시제품을 이용한 시험광경.FIG. 2 shows a test scene using the prototype of FIG.

도 3은 표점지그 단면부Fig. 3 is a cross-

<도면의 주요 부분에 대한 부호의 설명>Description of the Related Art

101: 저온시험 챔버 102: 인장 시편 101: low temperature test chamber 102: tensile specimen

103,103': 상·하부 표점지그 104,104': 상·하부 가이드103, 103 ': upper and lower gauge points 104, 104': upper and lower guides

105: 챔버 지지 슬리브 106: 챔버 지지대105: chamber support sleeve 106: chamber support

107: 챔버 밀폐용 힌지 108: 챔버 밀폐용 단추107: chamber sealing hinge 108: chamber sealing button

109: 챔버 손잡이 110: LVDT 지지대 109: chamber handle 110: LVDT support

111: LVDT 112: 케이블 고정부111: LVDT 112: Cable fixing part

113: 케이블 114: 챔버 공기 배출구113: cable 114: chamber air outlet

401,401': 상·하부 표점지그 시편압축부 401,401 ': upper and lower gauge specimen compression part

본 발명은 저온시험 대구경 인장시편의 길이 변형률 측정장치에 관한 것이다. 더욱 상세하게, 본 발명은 지온시험이 요구되는 대구경 및 실물 시험 인장시편의 길이 변형률을 정확하고 용이하게 측정하여 대구경 및 실물 시험 재료의 길이 변형율 측정치의 정확성을 향상시킬 수 있는 대구경 인장시편 길이 변형률의 측정장치에 관한 것이다. The present invention relates to an apparatus for measuring the strain of a large-diameter tensile specimen. More particularly, the present invention relates to a method for measuring the tensile strain of a large-diameter tensile specimen, which can accurately and accurately measure the strain of a large-diameter and a long-tensile tensile specimen, To a measuring device.

상온에서의 재료의 기계적인 성질, 길이 변형률을 측정하기 위한 인장시험은 엑스텐소미터 (Extensometer) 등을 이용하여 연신량을 용이하게 측정할 수 있으나 저온시험시는 시편을 시험시 저온을 유지하기 위하여 챔버 내에 설치하므로 엑스텐소미터를 설치하지 못하여 변형률을 측정하지 못하였다. 다만, 스트레인게이지를 시편의 표면에 부착하여 일부분의 스트레인을 측정하여 변형율로 계산하는 수준이었다.The tensile test for measuring the mechanical properties of the material at room temperature and the strain at the room temperature can be easily measured by using an extensometer or the like. In low temperature test, however, Because it was installed in the chamber, the strain could not be measured because the extensometer was not installed. However, the strain gauge was attached to the surface of the specimen, and the strain was measured at a level to calculate strain.

본 발명은 상기한 문제점을 해소하기 위하여 안출된 것으로서, SUMMARY OF THE INVENTION The present invention has been made to solve the above problems,

본 발명의 목적은, 저온시험을 위한 챔버를 설치하고 인장시편의 길이 변형율을 측정하기 위한 것으로서,An object of the present invention is to provide a chamber for low temperature testing and to measure a strain rate of a tensile specimen,

챔버와 시편에 가이드를 설치하고 인장시편의 단면적 축소에 탄력적으로 대응하는 상·하부 표점지그에 의해 표점위치가 정확히 지켜지도록 하고, 표점지그의 수직방향 평행 유지수단에 의해 상하부 표점지그가 수직방향으로 평행 이동되게 하며, 좌,우에 설치되는 두 LVDT 측정치의 평균값으로 측정치를 도출함으로써 대구경 및 실물 시험 인장시편의 연신율의 시험 정확도를 향상시키고, 시험작업을 용이하게 하도록 하는 저온시험시 인장시편 길이 변형율의 측정장치를 제공함에 있다.A guide is provided in the chamber and the specimen, and the upper and lower gauges are vertically aligned by vertically parallel holding means of the gauging jig in such a manner that the upper and lower gauges are vertically aligned Parallel movements of the test specimens and to derive measurements from the mean values of the two LVDT measurements on the left and right sides of the test specimens to improve the test accuracy of the elongation of the tensile specimens and to facilitate the test work. And a measuring device.

상기한 목적을 달성하는 본 발명에 따른 저온시험시 인장시편 길이 변형율의 측정장치는, UTM 등을 이용하여 저온에서의 인장시험시 재료의 기계적인 성질을 조사 계측하기 위한 것으로, The apparatus for measuring a strain rate of a tensile specimen at low temperature according to the present invention is for measuring the mechanical properties of a material during a tensile test at a low temperature using UTM or the like.

원통형의 저온시험 챔버(101);A cylindrical low temperature test chamber 101;

상기 저온시험 챔버(101) 내부에 설치되어 있으며, 길이 변형율을 측정하고자 하는 인장시편(102)의 표점구간 상ㆍ하부에 각각 고정되어 있되 상기 시편에 탄력적으로 밀착되어 있는 상·하부 표점지그 시편압축부(401,401')을 포함하는 대향하는 두 개의 반원통형의 블록으로 구성된 상부 표점지그(103) 및 하부표점 지그(103')The test specimens 102 are installed in the low temperature test chamber 101 and are fixed to the upper and lower sections of the tensile specimen 102 to be measured, The upper and lower centering jigs 103 and 103 ', which are composed of two opposing semicylindrical blocks including the units 401 and 401'

상기 인장시편(102)에서 수직방향으로 평행 이동하여 늘어나는 변형율을 측정하게 되며 상기 상ㆍ하부 표점지그(103,103') 사이에서 미끄러지게 되는 원통형의 슬리브인 상·하부 가이드(104,104'); Upper and lower guides 104 and 104 ', which are cylindrical sleeves that measure the deformation rate of the tensile specimen 102 that moves in parallel in the vertical direction and slides between the upper and lower barrel jigs 103 and 103';

상기 상ㆍ하부 표점지그(103) 외부에서 상기 챔버에 미끄러지게 설치되어 있는 수직방향 평행유지수단; 및Vertically parallel holding means slidably installed in the chamber outside the upper and lower centering jigs 103; And

상기 저온시험 챔버(101)의 외부에 설치되어 있으며, 상기 상ㆍ하부 표점지그(103,103')에 각각 연결되어 있는 한 쌍의 LVDT(직선형 가변 차동 변압기 : Linear Variable Differential Transformer)로 구성되어 있는 것을 특징으로 한다. And a pair of LVDT (Linear Variable Differential Transformer) which is provided outside the low-temperature test chamber 101 and is connected to the upper and lower barrier gauge jigs 103 and 103 ' .

이하, 본 발명의 저온시험시 인장시편 길이 변형율 측정장치에 대한 일 실시 예를 첨부도면을 참조하여 보다 상세히 설명한다.BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, one embodiment of the apparatus for measuring the strain rate of a tensile specimen during the low-temperature test according to the present invention will be described in detail with reference to the accompanying drawings.

도 1은 본 발명에 따른 일 실시예의 저온시험시 인장시편 길이 변형율 측정장치의 구성을 보이는 단면도이며, 도 2는 도 1 시제품을 이용하여 시험하는 광경을 촬영한 사진이고, 도 3는 표점지그의 단면도이다. FIG. 1 is a cross-sectional view showing a configuration of a device for measuring a strain rate of a tensile specimen during a low-temperature test according to an embodiment of the present invention. FIG. 2 is a photograph of a scene for testing using a prototype of FIG. 1, Sectional view.

도 1 내지 도 3에 도시된 바와 같이, 본 발명에 따른 일 실시예의 저온시험시 인장시편 길이 변형율 측정장치는, 원통형의 저온시험 챔버(101)와, 상기 챔버(101) 내부에 설치되어 있으면서 길이 변형률을 측정하고자 하는 인장시편(102)의 표점구간 상부와 하부에는 서로 대향하는 두 개의 반원통형의 블록으로 구성된 상부 표점지그(103) 및 하부 표점지그(103')가 각각 고정되어 있으며, 상기 인장시편(102)의 단면 축소에 따라 탄력적으로 시편에 밀착고정하기 위한 압착수단으로서 상·하부 표점지그 시편압축부(401,401')을 포함되어 있다. 1 to 3, the apparatus for measuring a strain rate of a tensile specimen during a low temperature test according to an embodiment of the present invention includes a cylindrical low temperature test chamber 101, The upper and lower centering jigs 103 and 103 ', each consisting of two semicylindrical blocks opposed to each other, are fixed to the upper and lower portions of the barrel section of the tensile specimen 102 to be measured for strain, And upper and lower gauge jig specimen compressing units 401 and 401 'as pressing means for pressingly fixing the specimen 102 to the specimen in accordance with the reduction of the cross section.

상기 상ㆍ하부 표점지그(103,103') 안쪽에 끼워진 인장시편(102)에는 원통형의 슬리브인 상·하부 가이드(104,104')가 고정되어 있다. 이 상·하부 가이드(104,104')의 중간부에는 인장시편(102)에 고정시킬 수 있는 볼트 장치가 있다. Upper and lower guides 104 and 104 ', which are cylindrical sleeves, are fixed to the tensile specimen 102 sandwiched between the upper and lower centering jigs 103 and 103'. At the middle portion of the upper and lower guides 104 and 104 ', there is a bolt device which can be fixed to the tensile specimen 102.

상기 상ㆍ하부 표점지그(103,103')는 저온시험 챔버(101)의 위 아래 면에 원통형의 구멍이 뚫려 있으며, 상기의 구멍에 원통형의 상ㆍ하부 표점지그(103,103')가 유연성이 있는 끼움재를 매개로 하여 끼워져 있다. 변형율의 측정을 위해서는 저온시험 챔버(101) 외부로 돌출된 상·하부 표점지그(103,103')의 끝부분에 LVDT(111)를 연결할 수 있는 LVDT 지지대(110)가 설치되어 있다. The upper and lower bar-shaped pointing jigs 103 and 103 'have a cylindrical hole on the upper and lower surfaces of the low-temperature test chamber 101, and cylindrical upper and lower bar-shaped pointing jigs 103 and 103' As shown in Fig. In order to measure the strain rate, an LVDT support 110 is provided at the end of the upper and lower centering jigs 103 and 103 'protruding out of the low-temperature test chamber 101 to connect the LVDT 111.

이와 같은 구성을 지닌 본 발명에 따른 저온시험시 인장시편 길이 변형율의 측정장치의 작동원리는 아래와 같다.The operation principle of the apparatus for measuring the tensile specimen strain at the time of the low-temperature test according to the present invention having the above-described structure is as follows.

저온에서 인장시편(102)을 만능시험기(Universal Testing Machine : UTM)에서 시험하기 위해서 챔버(101) 내부에서 인장시편(102)의 중간에 저온시험 챔버(101)의 무게를 지지할 수 있는 챔버 지지 슬리브(105)를 끼우고 챔버 지지대(106)를 이용하여 삽입 볼트(115)를 이용하여 고정한다. 기계적 이음부가 있는 시험편은 기계적이음부가 지지 슬리브의 역할을 할 수 있으므로 지지 슬리브를 끼우지 않는다.
따라서, 챔버 지지 슬리브(105)는 인장시편(102)인 철근에 고정되어 있으며, 챔버 지지대(106)는 챔버(101)에 고정되어 있으므로, 챔버(101) 전체의 무게를 챔버 지지대(106)를 통하여 챔버지지 슬리브(105) 윗면 모서리에 지지할 수 있다.
챔버지지 슬리브(105)를 인장시편(102)의 중간에 설치하고 양쪽에 상ㆍ하부 표점지그(103,103')의 설치위치를 고려하여 인장시편(102)에 상·하부 가이드(104.104')를 끼우고 표점거리를 맞추어 상ㆍ하부 표점지그(103,103')를 삽입볼트를 이용하여 인장시편(102)에 고정한다. 이와 같이 인장시편(102)에 부가장치를 부착하여 준비하고 시험규격에서 요구하는 조건인 규정 시간동안 규정온도에서 저온장치인 냉장고 등을 이용하여 보관한다. A chamber support 101 capable of supporting the weight of the low temperature test chamber 101 in the middle of the tensile specimen 102 inside the chamber 101 for testing the tensile specimen 102 at a low temperature in a universal testing machine The sleeve 105 is fitted and fixed using the insert bolt 115 using the chamber support 106. [ Test specimens with mechanical joints do not fit support sleeves because mechanical joints may serve as support sleeves.
Thus, the chamber support sleeve 105 is fixed to the reinforcing bar 102, which is the tensile specimen 102, and the chamber support 106 is fixed to the chamber 101, so that the entire weight of the chamber 101 is supported by the chamber support 106 To the upper edge of the chamber support sleeve 105.
The chamber supporting sleeve 105 is installed in the middle of the tensile specimen 102 and the upper and lower guides 104.104 'are inserted into the tensile specimen 102 in consideration of the installation positions of the upper and lower core points jigs 103 and 103' The upper and lower pour point jigs 103 and 103 'are fixed to the tensile specimen 102 with the use of the insertion bolts while matching the raindrop gauge length. The tensile specimen 102 is attached to the tensile specimen 102, and the specimen is stored in a refrigerator or the like at a prescribed temperature for a predetermined time, which is a condition required by the test standard.

시편이 저온 보관되는 동안 저온시험 챔버(101) 내부에 인장시험시 저온시험 챔버(101)의 무게를 지지할 수 있도록 챔버(101) 내부에 챔버 지지대(106)를 설치한다. 규정된 시간이 경과한 후 저온장치에서 인장시편(102)을 꺼내어 저온시험 챔버(101)에 챔버 지지대(106)를 이용하여 챔버 지지슬리브(105)에 맞대어 설치하고 저온시험 챔버(101)를 봉함한다. 저온시험 챔버(101)는 챔버 밀폐용 힌지(107)와 챔버 밀폐용 단추(108)를 이용하여 봉함하고 설치방향은 챔버 지지대(106)가 챔버지지 슬리브(105) 윗부분에 설치되도록 한다.The chamber support 106 is installed inside the chamber 101 so as to support the weight of the low temperature test chamber 101 during the tensile test inside the low temperature test chamber 101 while the specimen is kept at a low temperature. After the prescribed time has elapsed, the tensile specimen 102 is taken out of the low-temperature apparatus and placed in the low-temperature test chamber 101 against the chamber support sleeve 105 using the chamber support 106 and the low-temperature test chamber 101 is sealed do. The low temperature test chamber 101 is sealed using a chamber sealing hinge 107 and a chamber sealing button 108 so that the chamber supporting rods 106 are installed on the chamber supporting sleeve 105.

이와 같이 저온시험 챔버(101)에 인장시편(102)을 결합한 후 저온시험 챔버(101) 양끝에 돌출된 부분의 인장시편(102)을 UTM에 설치하고 인장시험을 하면 인장력에 의하여 인장시편(102)이 늘어나고 인장시편(102)과 결합되어 있는 상ㆍ하부 표점지그(103,103')가 인장시편(102)에 설치된 상·하부 가이드(104,104')와 함께 챔버(101)의 원통형 구멍을 따라서 수직방향으로 인장시편(102)과 평행하게 변형되며, 상ㆍ하부 표점지그(103,103') 끝단에 설치된 LVDT 지지대(110)와 LVDT 지지대에 설치된 LVDT(111)에 의하여 변형율이 정확하게 측정된다.
따라서, 수직방향의 평행유지는 인장시편(102)인 철근에 고정된 원형 단면의 상부표점지그(103)가 챔버(101)에 뚫린 원형 단면 구멍을 상/하에 걸쳐 미끄러짐으로 상ㆍ하부 표점지그(103,103')에 부착된 상하의 LVDT 지지대(110) 사이에 평행이 유지되며 시험의 진행에 따라 간격이 벌어짐으로 철근의 인장길이를 정확하게 측정할 수 있다.After the tensile specimen 102 is joined to the low temperature chamber 101 and then the tensile specimen 102 protruded from both ends of the low temperature chamber 101 is installed in the UTM and subjected to a tensile test, And the upper and lower centering jigs 103 and 103 'coupled with the tensile specimen 102 together with the upper and lower guides 104 and 104' provided in the tensile specimen 102 are moved in the vertical direction along the cylindrical hole of the chamber 101 And the strain rate is accurately measured by the LVDT support 110 installed at the end of the upper and lower centering jigs 103 and 103 'and the LVDT 111 installed at the LVDT support.
Accordingly, the parallel holding in the vertical direction is performed by the upper end point jig 103 of the circular cross section fixed to the reinforcing bars as the tensile specimen 102 slides on the upper and lower sides of the circular cross-section hole opened in the chamber 101, 103 and 103 ', the distance between the upper and lower LVDT supports 110 can be accurately measured.

미설명부호 112는 케이블 고정부이고, 113은 케이블이며, 114는 챔버공기배출구이다. Reference numeral 112 denotes a cable fixing portion, 113 a cable, and 114 a chamber air outlet.

본 발명은, 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자에게 있어 본 발명의 기술적 사상을 벗어나지 않는 범위 내에서 여러 가지 치환, 변형 및 변경이 가능하므로, 전술한 실제예 및 도면에 한정되는 것은 아니다.It will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents. It is not.

이상에서 상세히 살펴 본 바와 같이, 본 발명에 따른 저온시험시 인장시편 길이 변형율 측정장치는 저온시험을 위한 챔버를 설치하고 인장시편의 길이 변형율을 측정하기 위한 것으로서, 챔버와 시편에 가이드를 설치하고 인장시편의 단면적 축소에 탄력적으로 대응하는 상하부 표점지그로 하여 표점위치가 정확히 지켜지도록 하고, 표점지그의 수직방향 평행유지수단으로 하여 상하부 표점지그가 수직 평행이동되게 하며, 저온시험 챔버 좌,우에 설치되는 두 LVDT 측정치의 평균값으로 측정치를 도출함으로써 저온에서의 대구경 및 실물 인장시편의 연신율 측정의 정확도를 향상시키고, 시험작업을 용이하게 하도록 하는 저온시험시 인장시편 길이 변 형율 측정장치를 제공함에 있다. 이에 따라 인장시편의 길이 변형율을 측정함에 있어 정확성이 현저히 향상되며, 시험 작업도 용이하도록 하는 잇점을 갖는 기술이다.As described above, in the low temperature test according to the present invention, the apparatus for measuring the strain rate of a tensile specimen is provided with a chamber for low temperature test and a length strain rate of the tensile specimen. The guide is installed in the chamber and the specimen, The upper and lower gauges are vertically and parallelly moved by the vertically parallel holding means of the gauge jig so as to vertically and parallelly move the upper and lower gauge jigs, The present invention provides an apparatus for measuring the elongation of a tensile specimen during a low temperature test, which improves the accuracy of elongation measurement of a large diameter and a real tensile specimen at low temperature by deriving a measured value from the average value of two LVDT measurements. Accordingly, it is an advantageous technique to improve the accuracy in measurement of the strain rate of the tensile specimen and to facilitate the test work.

Claims (4)

원통형의 저온시험 챔버(101);A cylindrical low temperature test chamber 101; 상기 저온시험 챔버(101) 내부에 설치되어 있으며, 길이 변형율을 측정하고자 하는 인장시편(102)의 표점구간 상ㆍ하부에 각각 고정되어 있되 상기 시편에 탄력적으로 밀착되어 있는 상·하부 표점지그 시편압축부(401,401')을 포함하는 대향하는 두 개의 반원통형의 블록으로 구성된 상부 표점지그(103) 및 하부 표점지그(103')The test specimens 102 are installed in the low temperature test chamber 101 and are fixed to the upper and lower sections of the tensile specimen 102 to be measured, The upper and lower centering jigs 103 and 103 ', which are composed of two opposing semicylindrical blocks including the units 401 and 401' 상기 인장시편(102)에서 수직방향으로 평행 이동하여 늘어나는 변형율을 측정하게 되며 상기 상ㆍ하부 표점지그(103,103') 사이에서 미끄러지게 되는 원통형의 슬리브인 상·하부 가이드(104,104'); Upper and lower guides 104 and 104 ', which are cylindrical sleeves that measure the deformation rate of the tensile specimen 102 that moves in parallel in the vertical direction and slides between the upper and lower barrel jigs 103 and 103'; 상기 상ㆍ하부 표점지그(103) 외부에서 상기 챔버에 미끄러지게 설치되어 있는 수직방향 평행유지수단; 및Vertically parallel holding means slidably installed in the chamber outside the upper and lower centering jigs 103; And 상기 저온시험 챔버(101)의 외부에 설치되어 있으며, 상기 상ㆍ하부 표점지그(103,103')에 각각 연결되어 있는 한 쌍의 LVDT로 구성되어 있는 것을 특징으로 하는 저온시험 대구경 인장시편 길이변형률 측정장치.And a pair of LVDTs provided outside the low-temperature test chamber 101 and connected to the upper and lower bar-shaped pointing jigs 103 and 103 ', respectively. . 제 1항에 있어서, 상기 상·하부 가이드(104,104')의 중간부에는 인장시편(102)에 고정시킬 수 있는 볼트 장치가 형성되어 있는 것을 특징으로 하는 있는 저온시험 대구경 인장시편 길이변형률 측정장치.The apparatus according to claim 1, wherein a bolt device capable of being fixed to the tensile specimen (102) is formed at an intermediate portion of the upper and lower guides (104, 104 '). 제 1항에 있어서, 상기 상ㆍ하부 표점지그(103,103')는 저온시험 챔버(101)의 위 아래 면에 원통형의 구멍이 뚫려 있으며, 상기의 구멍에 원통형의 상ㆍ하부 표점지그(103,103')가 유연성이 있는 끼움재를 매개로 하여 끼워져 있는 것을 특징으로 하는 저온시험 대구경 인장시편 길이변형률 측정장치.2. The apparatus according to claim 1, wherein the upper and lower bar-shaped pointing jigs (103, 103 ') have a cylindrical bore in upper and lower surfaces of the low-temperature test chamber (101), and cylindrical upper and lower bar- Wherein the elastic member is sandwiched by a flexible fitting member. 제 1항에 있어서, 상기 챔버(101) 내부에서 인장시편(102)의 중간에 저온시험 챔버(101)의 무게를 지지할 수 있는 챔버 지지 슬리브(105)가 끼워져 있고 챔버 지지대(106)를 이용하여 삽입 볼트(115)에 의해 고정되어 있는 것을 특징으로 하는 저온시험 대구경 인장시편 길이변형률 측정장치.The apparatus according to claim 1, wherein a chamber support sleeve (105) capable of supporting the weight of the low temperature test chamber (101) is fitted in the middle of the tensile specimen (102) inside the chamber And is fixed by an insertion bolt (115).
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CN113075053B (en) * 2021-03-31 2023-02-17 华能国际电力股份有限公司 Method and system for rapidly predicting long-term thermal exposure tensile strength of Ni3Al reinforced alloy

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