KR100607546B1 - Automatic Memory Tester for Computer - Google Patents

Abstract

The present invention relates to a mounting test of a computer memory, and more particularly, the memory is inserted into a plurality of motherboards individually, and the test is performed accurately while maintaining the locking, and after the test is completed, the unlocking of the memory is completed. The present invention relates to an automatic memory test apparatus for computer, which can perform work to be separated from the main board automatically to significantly improve work efficiency and productivity.

The present invention is a loading unit freely transported in the X, Y axis direction,

A gripper mounting plate installed at a lower end of the loading unit to be selectively rotated according to the operation of the gripper rotary motor;

A gripper guide plate which is integrally installed at both sides of the transfer block that is movably coupled to the gripper mounting plate to guide the rise and fall of the gripper;

Inserting means for selectively lowering an insert member coupled to the gripper guide plate to insert a gripped memory into a memory socket of a main board;

And a gripper for gripping both sides of the memory by simultaneously pivoting a pair of grip levers installed through the insert member inward.

Description

Memory auto tester for computer

1 is a perspective view of an embodiment of a clean room to which the present invention is applied

Figure 2 is a side view of the installation state of the present invention

3 is a perspective view of the installation state of the present invention

Figure 4 is a front view of the installation state of the present invention

5 is a perspective view of main parts showing the assembled state of the present invention;

Figure 6 is a perspective view of the present invention motherboard mounting

7 is a side view of the operating state of the gripper according to the present invention

Figure 8 is a side view of the operation of the gripper according to the present invention the low speed rising, falling operation

Figure 9 is a plan sectional view of the coupling state of the gripper mounting plate and the gripper guide plate of the present invention

10 is an enlarged cross-sectional view of an operating state of the gripper of the present invention;

Figure 11 is a longitudinal cross-sectional view of the installation state of the gripper of the present invention

12 is a perspective view and a longitudinal cross-sectional view of the locking control means of the present invention;

Figure 13 is an enlarged cross-sectional view of the operating state of the memory sensing means of the present invention

Figure 14 is a perspective view of the memory tray of the present invention

15 is a perspective view of another embodiment of a clean room to which the present invention is applied

[Explanation of symbols on the main parts of the drawings]

1: clean room 2: loading unit

7: motherboard 8: memory

8a: bump 8b: lock groove

9: memory socket 9a: memory lock

100: gripper mounting plate 200: gripper guide plate

250: auxiliary insert means 251: insert motor

252: ball screw 254: transfer block

300: inserting means 302: insert member

304: insert cylinder 400: gripper

405: grip lever 406: grip groove

409: grip cylinder 500: test version

504: support block 600: locking control means

602: locking cylinder 607: lock operating mechanism

608: pushing side 609: towing groove

700: memory detection means 703: detection rod

704: sensor 800: memory tray

The present invention relates to a mounting test of a computer memory, and more particularly, the memory is inserted into a plurality of motherboards individually, and the test is performed accurately while maintaining the locking, and after the test is completed, the unlocking of the memory is completed. The present invention relates to an automatic memory test apparatus for computer, which can perform work to be separated from the main board automatically to significantly improve work efficiency and productivity.

In general, memory, a semiconductor memory device capable of recording and reading data from a computer or other electronic device, is installed by inserting a contact formed at a lower end into a memory socket formed on a main board.

These memories are primarily tested for physical abnormalities in the production process, and when production is completed, the memory is finally plugged into the memory socket of the motherboard in the clean room and communicated with the tester to determine whether the memory is defective according to the test result. A mounting test is conducted to determine.

However, in the past, in most production sites, a person manually inspects a memory module by inserting it into a memory socket of a motherboard for the mounting test.

Therefore, in order to facilitate the mounting test, a clean room of a larger area must be secured, and thus, a large number of workers are required, resulting in a problem of deterioration of work efficiency and productivity.

In recent years, "Patent Application No. 1999-50000 No. RAM Mounting Test Device" has been proposed as a method for solving some of the problems caused by the manual work.

In this regard, the invention of the above-mentioned application is provided by installing a transfer table which is moved in accordance with the abnormality of the ram when discharging the ram on the upper surface of the main body, and installing the ram on the ram slot or by installing a cylinder for extracting the ram on the transfer table. It was able to test accurately without damaging the ram, and automatically sorted according to the abnormality of the ram, thereby improving work efficiency and productivity.

However, the present invention has a detailed technical configuration of the finger mechanism, which is a key technology that plays a role of picking up and inserting the ram into a ram slot for testing a ram, and the organic coupling configuration between these components is very insufficient. On the basis of the invention, a problem that cannot be carried out smoothly was caused.

In addition, even when the operation of the cylinder is controlled at a low speed as the ram is completely dependent on the cylinder, the micro-shock occurs when the ram is inserted into the ram slot, thereby damaging the ram or the ram slot. It was high.

In addition, the invention of the prior application was that the indirect test while inserting dozens of RAM into one motherboard in succession, the actual mounting test for each computer environment could not be achieved, the accuracy of the test was inferior.

In other words, the main board constituting a computer and the memory coupled to the main board cannot be used to test under the same conditions as the actual computer environment, but do not insert or remove dozens of memory into a single main board. This reduces the accuracy of the test by limiting it to indirect testing.

In addition, when the ram is inserted into the ram slot to perform the test, the ram is not simply provided with separate equipment for supporting the ram on both sides to prevent the flow of the ram. This occurred so that accurate and smooth testing could not be achieved.

In other words, the ram is not able to carry out its role due to poor connection or disconnection even in fine flow. Therefore, both sides of the ram must be strongly grasped without flow, even in actual use and in the case of test work. However, the present invention does not satisfy these conditions. I could not.

In addition, since the device for automatically unlocking the locking means as well as the fixing means of the ram is not provided, an accurate test of the ram cannot be performed by the automatic operation.

In order to completely solve the problems caused by the above-described invention, the present invention does not perform a test using a single main board, and automatically uses the main board and the memory required for one computer under the same conditions as the actual environment. The main object of the invention is to enable more accurate and systematic memory test execution.

The present invention for achieving the desired object of the present invention is to provide a pair of grip levers without damaging both sides of the memory stored in the tray freely transferred in the X, Y axis direction of each of the main boards arranged at predetermined intervals Find a technique to move upwards.

In addition, the technology of the grip state to lower the first and second in accordance with the operation of the insert cylinder and the insert motor to accurately insert into the memory socket formed on each motherboard to perform a test.

In addition, by controlling the locking of the memory lock to prevent the flow of the memory in accordance with the operation of the locking cylinder in the state that the memory is plugged into the motherboard to perform an accurate test as well as to automatically remove the memory from the memory socket Find skills.

Furthermore, a technology is developed to prevent the malfunction of unnecessary test work by sequential next operation only when the sensing sensor recognizes the grip state of the memory by the gripper.

The configuration of the preferred embodiment for effectively achieving the object of the present invention will be described.

The overall configuration of the present invention can be seen at a glance through Figures 1 to 5, when looking at this schematically in the loading unit (2) free to transport in the X, Y-axis direction on top of the clean room (1), A gripper mounting plate 100 selectively installed at a lower end of the loading unit 2 according to the operation of the gripper rotating motor 101, and a transfer block 254 coupled to the gripper mounting plate 100 so as to be transported. The memory 8 is provided by selectively lowering the gripper guide plate 200 integrally installed at both sides of the gripper 400 to guide the lifting and lowering of the gripper 400, and the insert member 302 coupled to the gripper guide plate 200. A gripper for gripping both sides of the memory 8 without flow by simultaneously turning the inserting means 300 inserted into the memory socket 9 and the grip lever 405 installed through the insert member 302 inwardly ( It can be seen that it consists of 400).

Hereinafter, the present invention having the schematic configuration will be described in more detail.

First of all, the loading unit 2 for freely moving the gripper 400 of the present invention in the X and Y axis directions has an X-axis feed rail at an upper end of the vertical frame 3 which is installed at a predetermined interval in the clean room 1. (4) is installed, the X-axis carriage 5 is coupled to the X-axis transfer rail 4 so as to be transported in the X-axis direction, the lower end of the X-axis carriage 5 is transferred in the Y-axis direction The Y-axis feeder 6 is coupled to each other while the X and Y-axis feeder 5 and 6 are each not exactly shown in the drawing, but are precisely moved by a predetermined pitch by a power source such as a motor to reach a desired position. It consists of a well-known structure which can be performed.

The motor bracket 6a attached to the lower end of the Y-axis feeder 6 of the loading unit 2 also rotates the gripper 400 selectively, so that the main board 7 inclined in the clean room 1 may be used. A gripper rotary motor 101 is installed horizontally to smoothly insert the memory 8, and a rotary bracket 102 is installed at the tip of the motor shaft of the gripper rotary motor 101, and the rotary bracket 102 is provided. The gripper mounting plate 100 for mounting a pair of grippers 400 is attached to one side of the lower part.

The gripper guide plate 200 disposed on both sides of the gripper mounting plate 100 to smoothly guide the lifting and lowering of the gripper 400 may move the insert motor 251 to one side of the gripper mounting plate 100. Accordingly, the upper and lower sliding integrally installed on both sides of the transfer block 254 coupled to be possible.

That is, the transfer block 254 is provided with a gripper guide plate on the mounting protrusion 257 because the mounting protrusion 257 protruding on one side is installed to penetrate the guide groove 258 formed on the gripper mounting plate 100 as shown in FIG. 9. 200 can be attached integrally. Therefore, the pair of gripper guide plates 200 operate in conjunction with each other when the transfer block 254 moves up or down.

Here, the reason for allowing the gripper guide plate 200 to be interlocked can be operated by using a single motor to simultaneously operate a pair of grippers 400 at a time, thereby making the structure more compact and simpler. This is to save productivity as well as to improve productivity.

Inserting means 300, which are provided in the pair of gripper guide plates 200, respectively, to insert the memory 8 into the memory socket 9 of the main board 7, are installed at both sides of the gripper guide plate 200. The guide member 303 attached to the insert member 302 is coupled to the LM guide 301 so that the insert member 303 can slide upward and downward on the LM guide 301.

The insert member 302 is connected to the tip of the piston rod 305 of the insert cylinder 304 attached to the upper portion of the gripper guide plate 200 to be selectively lowered according to the operation of the insert cylinder 304 and held. Serves to plug the memory 8 into the memory socket 9 of the motherboard 7 primarily.

Herein, the present invention is not limited to simply inserting the memory into the memory socket 9 through the inserting means 300, and the inserting means 300 primarily attaches the memory to the memory socket 9. It performs the role of plugging, and by the auxiliary auxiliary inserting means 250 to be made through the dualization operation to completely plug into the memory socket (9) while lowering the memory (8) at low speed secondary.

The reason for dualizing the operation of plugging the memory in the present invention is that when inserting the memory entirely depending on the insert cylinder 304 which is difficult to control the low speed, the insert member 302 suddenly descends while the memory is likely to be damaged. In order to effectively prevent this, when the memory 8 is inserted to some extent by the insert cylinder 304, the insert member 302 is lowered at a low speed in accordance with the operation of the ball screw 252 of the auxiliary inserting means 250. (8) can be inserted completely.

The auxiliary inserting means 250 having this purpose has an insert motor 251 installed on the upper portion of the rotary bracket 102, and the ball screw 252 is integrally coupled to the front end of the motor shaft of the insert motor 251. The ball screw 252 is freely installed on the fixed block 253 fixed to the upper and lower portions of the gripper mounting plate 100, while the ball screw 252 is coupled to the transfer block 254, The transfer block 254 is a ball screw 252 in accordance with the operation of the insert motor 251 by the guide member 255 attached to both sides is coupled to the LM guide 256 attached to both sides of the gripper mounting plate 100 By rotating (), the transfer block 254 can be selectively raised and lowered, thereby lowering the gripper guide plate 200 so that the memory 8 can be inserted without flow in a stable state without being damaged.

On the other hand, the gripper is organically coupled to the insert member 302 to simultaneously rotate the pair of grip lever 405 to the inside to grip both sides of the memory 8 without any damage to the memory 8 without flow ( 10 and 11, the lever mounting brackets 402 are spaced apart from each other by a predetermined distance up and down by the connector 401 on both lower sides of the insert member 302, as shown in FIGS. 10 to 11. The hinge brackets 403 formed on both sides of the penetrating penetrating groove 404 formed in the insert member 302 and the lever mounting table 402 are installed so that a pair of grip levers 405 can be pivoted through the hinge shaft, respectively. do.

Here, the grip lever 405 is formed inside the lower end of the grip groove 406 for gripping without holding the locking projections (8a) formed on both sides of the upper portion of the memory 8, the grip groove 406 is a locking projection ( The guide surface 407 is formed at the inlet side to guide the fitting so that 8a) can be inserted smoothly, and the guide surface 407 is formed in a shape that is gradually opened while going inward outwardly on a plane of the memory 8. The locking projection 8a is guided smoothly to the grip groove 406 by the guide surface 407 and is fitted in the close contact with the grip groove 406 via the guide surface 407 to maintain a firm grip state. .

In addition, the grip lever 405 is in close contact with the tip of the piston rod 410 of the grip cylinder (409) installed on the cylinder bracket 408 on the upper side of the insert member 302, thereby selectively depending on the operation of the grip cylinder (409) The grip lever 405 is able to automatically grip the memory 8 strongly or release the grip state while simultaneously turning inward and outward by the principle of the lever.

Meanwhile, a plurality of main boards 7 for inserting and testing the memory 8 are installed inside the clean room 1, and a plurality of test boards are installed in the clean room 1 at predetermined intervals as shown in FIG. 1. A 500 is disposed and the test plate 500 is maintained in a fixed state by the clamp 502 in a state where the main board mounting plate 501 is seated, and is supported by both sides of the main board mounting plate 501. Block 504 is entered.

The support block 504 can be maintained in a fixed state by moving the main board 7 for testing in close contact with the inner surface of each support block 504, as shown in Figure 6, the support block 504 The upper plate 505 is integrally coupled to the upper end of the upper panel 505, and a pair of grippers 400 are held in the memory socket 9 of the main board 7 located below the upper plate 505. A pair of guide grooves (506) for guiding the user to accurately insert is spaced apart.

Furthermore, in addition to the guide role of the guide groove 506, guide holes 507 are formed at both sides of the guide groove 506, and the guide pins are formed at both sides of the lower end of the lever mount 402 in the guide hole 507. The 402a is selectively fitted so that the memory 8 can be correctly inserted into the memory socket 9.

That is, the main board 7 is inserted into the lower part of the upper plate 505, but the memory socket 9 formed in the main board 7 must be identically positioned in a vertical line under the guide groove 506. There is no risk of damage when 8) is inserted.

In addition, the present invention is to automatically operate the memory lock (9a) formed in the memory socket (9) in a way that a more accurate and reliable test can be made when the memory is completely inserted into the memory socket (9) There is additionally provided a separate locking control means 600 for freely controlling the locking state of the memory 8.

Locking control means 600 for this purpose, as shown in Figure 11 to 12, the locking cylinder 602 is installed horizontally on the cylinder bracket 601 installed on both test plates 500 of the support block 504, respectively, A pair of guide holders 603 are installed through the support block 504, and a pair of operating rods 604 interpolated in the guide holders 603 are integrated on one side via a connecting plate 605. The connecting plate 605 is integrally connected to the locking cylinder 602.

Accordingly, as the locking cylinder 602 is operated, the pair of operating rods 604 may be moved in and out at the same time while being guided by the guide holder 603.

In addition, a lock that pushes or pulls the memory lock 9a at the tip of each of the operating rods 604 so that the memory lock 9a can be inserted into or removed from the lock grooves 8b formed on both sides of the memory 8. The actuating tool 607 is integrally attached.

The lock operation mechanism 607 serves as a stopper for preventing the locking piece 9b formed in the memory lock 9a from fully turning outward, as well as pushing the locking piece 9b inward to be locked. Push surface 608 is formed so that, the upper portion of the push surface 608 has a configuration in which a pull groove 609 is formed to pull the locking piece (9b) of the locked state to release the locking.

Accordingly, as the locking cylinder 602 is operated, the lock operation mechanism 607 selectively pulls or pushes the memory lock 9a so that the memory lock 9a is provided in both lock grooves 8b of the memory 8. Automatic locking control as it is dislodged or inserted allows greater accuracy in testing.

Furthermore, the present invention automatically interrupts the subsequent operation when the gripper 400 does not correctly hold the memory 8 loaded on the memory tray 800 and simultaneously notifies the worker of the time, thereby causing unnecessary work and malfunction. And reduce costs.

This object can be achieved by the memory sensing means 700 as shown in FIG. 13, and the specific configuration of the memory sensing means 700 is provided with a sensing rod casing 701 at the upper center of the lever mount 402. The sensing rod 703 in which the separation prevention plate 702 is formed inside the sensing rod casing 701 is installed to be transported upward and downward through the lever mounting table 402 and the sensing rod casing 701. .

That is, the sensing rod 703 is smoothly transported up and down inside the sensing rod casing 701, and the upper end selectively protrudes to the outside through the sensing rod casing 701, or the lower end of the lever mounting table 402. The sensor rod 703 is protruded to the outside, and the sensing rod 703 is embedded in the sensing rod casing 701 without being completely separated to the outside by the release preventing plate 702.

In addition, a sensing sensor 704 is inserted into the upper insert member 302 of the sensing rod casing 701.

Therefore, the lower end of the sensing rod 703 is formed to protrude downwardly through the lever mount 402 as usual, and in this state, when the gripper 400 descends, the upper end of the memory 8 is detected by the sensing rod 703. In close contact with the lower end of the gripper 400, the lowering of the gripper 400 is added, the sensing rod 703 is lifted to the upper by the memory 8 while the upper end is inserted into the detection sensor 704.

In addition, the gripper 400 may hold the memory 8 completely so that the next operation may be sequentially performed only when the sensing rod 703 does not lower and continuously maintains the state recognized by the sensing sensor 704.

That is, only when the sensor 704 recognizes the grip state of the memory by the gripper 400, the limited sequential operation is performed, thereby preventing malfunction, and more accurate testing can be performed.

Meanwhile, according to the present invention, the memory 8 for the mounting test may be stacked in a dedicated memory tray 800 having a plurality of insertion grooves 801 formed at regular intervals as shown in FIG. 14.

A test process of the memory according to the present invention having such a configuration will be described.

First, the mounting test apparatus T of the present invention moves to the upper portion of the memory tray 800 according to the operation of the loading unit 2, and then either the insert cylinder 304 is lowered and the memory ( The gripper 400 can be positioned on the upper portion of the 8).

In this state, when the grip cylinder 409 is operated, the lower ends of the pair of grip levers 405 pivot inward with respect to the hinge axis, and both sides of the memory 8 are fitted into the grip groove 406, thereby allowing the memory 8 to be inserted into the grip cylinder 409. Gripping without flow, the sensor 704 detects the grip state of the memory 8, the gripper 400 is sequentially restored to the top.

As described above, when a pair of grippers 400 hold all of the memory 8, the test device is mounted to the main board 7 mounted on the test board 500 to be tested according to the operation of the loading unit 2. T) is moved.

That is, the gripper 400 is positioned on the upper plate 505, respectively, and in particular, the pair of memory 8 is positioned vertically on the upper portion of the guide groove 506 formed on the upper plate 505.

In this state, as the pair of insert cylinders 304 are operated simultaneously, the gripper 400 is also lowered at the same time so that the memory 8 is primarily inserted into the memory socket 9.

Then, as the insert motor 251 of the auxiliary inserting means 250 moves sequentially, the ball screw 252 rotates, and the transfer block 254 descends according to the rotation of the ball screw 252. At the same time, the pair of grippers 400 are lowered at a low speed so that the memory 8 is completely inserted into the memory socket 9, and the memory 8 is not damaged or damaged in this process.

As described above, when the memory 8 is inserted, the locking cylinder 602 is sequentially operated so that the lock operation mechanism 607 pushes the memory lock 9a so that the memory lock 9a is the lock groove of the memory 8. It fits in the 8b so as to keep the memory 8 in a rigid fixed state.

When the locking of the memory 8 is completed, the pair of grippers 400 release the grip state of the memory 8 and restore the original state, thereby creating conditions for the test.

As a result, by automatically mounting the memory 8 to the memory socket 9 without using a separate manpower, as well as freely control the locking state, it is possible to significantly improve the workability and productivity according to the test work.

Meanwhile, the clean room 1 in which the mounting test apparatus T of the present invention is installed may be implemented as a straight line as shown in FIG. 1, in which case the memory tray 800 is installed inside the clean room 1. To maximize space utilization.

In addition, the clean room 1 may be implemented in a track-like form as shown in FIG. 15. In this case, after the memory 8 is automatically inserted in the loading part, the main board 7 moves on the conveyor while the test is performed. When the main board 7 arrives at the unloading part, it is determined whether the memory is defective according to the test result, and the process is automatically sorted by grade and then repeatedly moved to the loading part to increase the productivity of the test. It can be maximized.

According to the present invention, a pair of grip levers grips both sides of the memory without flow and then moves freely in the X and Y axis directions to accurately move to a plurality of main boards arranged in a clean room so that accurate testing can be performed without damaging the memory. Will be.

In addition, the grip state of the memory is first inserted into the memory socket according to the operation of the insert cylinder, and then secondly moving slowly at the low speed according to the operation of the insert motor, so that the memory is completely prevented from being damaged by the memory socket. do

Furthermore, the memory inserted into the main board automatically controls the locking of the memory lock selectively according to the operation of the locking cylinder, thereby enabling accurate testing as well as automatically detaching the memory. Will provide a beneficial effect.

In addition, since the next sensor is connected only when the sensing sensor of the memory detecting means detects the grip state of the memory, the malfunction of the test operation can be prevented in advance, thereby improving the work quality.

Claims (11)

In the loading unit 2 freely transported in the X, Y axis direction, A gripper mounting plate 100 installed at a lower end of the loading unit 2 so as to be selectively rotated according to the operation of the gripper rotating motor 101; A gripper guide plate 200 which is integrally installed at both sides of the transfer block 254 coupled to the gripper mounting plate 100 to guide the lifting and lowering of the gripper 400; Inserting means 300 for selectively lowering the insert member 302 coupled to the gripper guide plate 200 to insert the gripper memory 8 into the memory socket 9 of the motherboard 7 )and; Automatic memory mounting test apparatus for a computer, comprising a gripper 400 which grips both sides of the memory 8 by simultaneously turning a pair of grip levers 405 installed through the insert member 302. . The method of claim 1, Inserting means 300 is the insert member 302 is coupled to the LM guide 301 installed on both sides of the gripper guide plate 200 so as to be slidably transportable, the insert member 302 is movable of the insert cylinder 304 Automatically mounting memory test device for a computer, characterized in that by selectively lowering according to the gripping state of the memory socket (9). The method of claim 1, The gripper 400 has a lever mounting stand 402 spaced apart from the insert member 302 via the connector 401, and the insert member 302 and the lever mounting stand are provided at both sides of the lever mounting stand 402. A pair of grip levers 405 are pivotally installed through the 402, and the grip levers 405 are selectively moved in and out according to the operation of the grip cylinder 409 installed in the insert member 302. Automatic memory mounting test apparatus for a computer, characterized in that both sides of the memory 8 are gripped without moving while simultaneously turning. The method of claim 3, wherein The grip lever 405 is provided with a grip groove 406 for holding the engaging projection 8a formed on both sides of the memory 8 inside the lower end, and the engaging projection 8a is fitted into the inlet of the grip groove 406. The automatic memory test device for a computer, characterized in that the guide surface 407 is formed to be inwardly outward to facilitate the load. The method of claim 1, The gripper mounting plate 100 is integrally attached to the lower part of the rotary bracket 102 installed at the tip of the gripper rotary motor 101, and an insert motor 251 is installed on the upper part of the rotary bracket 102. The ball screw 252 coupled to the motor 251 is freely rotatably arranged in the fixed block 253 installed at the upper and lower portions of the gripper mounting plate 100, and the transfer block 254 screwed to the ball screw 252. ) Is selectively lowered at low speed in accordance with the operation of the insert motor 251, and the secondary inserting means 250 which completely plugs the memory 8 primarily inserted by the inserting means 300 without damage. Automatic memory test device for a computer, characterized in that it comprises a). The method according to any one of claims 1 to 5, In the clean room 1 in which the gripper 400 is installed, a plurality of test plates 500 are disposed at predetermined intervals, and the main boards 7 are disposed on both sides of the main board mount 501 seated on the test plate 500. A support block 504 for supporting both ends of each other is inserted, and the upper end of the support block 504 allows the memory 8 of the gripped state to be correctly inserted into the memory socket 9 of the motherboard 7. Automated testing device for a computer memory, characterized in that the guide plate 506 for guiding a guide plate 505 is spaced apart from each other integrally coupled. The method of claim 6, Guide holes for guiding the guide pins 402a installed on both sides of the lower end of the lever mounting stand 402 so that the memory 8 is accurately inserted into the memory socket 9 of the motherboard 7 on both sides of the guide groove 506. Automatic memory test device for a computer, characterized in that the formed 507. The method of claim 6, A locking cylinder 601 is installed in both test plates 500 of the support block 504, and the locking cylinder 601 is inserted into an operating rod interpolated by a pair of guide holders 603 installed in the support block 504. The lock operation tool 607 coupled to the end of the operating rod 604 selectively pushes or pulls the memory lock 9a installed in the memory socket 9 in accordance with the operation of the locking cylinder 601. Automatically mounting a computer memory, characterized in that it comprises a locking control means 600 for automatically controlling the locking as the memory lock (9a) is inserted into the lock groove (8b) formed on both sides of the main memory (8) Test equipment. The method of claim 8, The lock operation mechanism 607 is provided with a pushing surface 608 for preventing the locking piece 9b formed on the memory lock 9a from excessively turning outward and pushing the locking piece 9b inward to lock the lock piece. The upper surface of the pushing surface (608), the automatic memory test device for a computer, characterized in that the traction groove (609) is formed by pulling the locking piece (9b) in the locked state to release the locking. The method according to any one of claims 1 to 5, A sensing rod casing 701 is installed at an upper center of the lever mounting stage 402, and a sensing rod 703 is installed inside the sensing rod casing 701 to mount the lever mounting stage 402 and the sensing rod casing 701. It is installed to be transported up and down, and the sensing rod 703 is recognized by the sensing sensor 704 installed in the insert member 302 while being pushed upward by the memory 8 in the grip state of the memory 8. Automatic memory test device for a computer, characterized in that it further comprises a memory detecting means 700 to be performed in a limited sequential operation if possible. The method according to any one of claims 1 to 5, The memory for mounting test (8) is an automatic memory mounting test apparatus for a computer, characterized in that it is placed in a plurality of insertion grooves (801) formed at a predetermined interval in a separate memory tray (800).

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