KR100583944B1 - 상압 화학 기상 증착 공정용 서셉터 - Google Patents
상압 화학 기상 증착 공정용 서셉터 Download PDFInfo
- Publication number
- KR100583944B1 KR100583944B1 KR1019990050229A KR19990050229A KR100583944B1 KR 100583944 B1 KR100583944 B1 KR 100583944B1 KR 1019990050229 A KR1019990050229 A KR 1019990050229A KR 19990050229 A KR19990050229 A KR 19990050229A KR 100583944 B1 KR100583944 B1 KR 100583944B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- susceptor
- vacuum
- supply hole
- reticle
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract description 20
- 238000005229 chemical vapour deposition Methods 0.000 title description 5
- 239000000428 dust Substances 0.000 claims description 5
- 238000001505 atmospheric-pressure chemical vapour deposition Methods 0.000 abstract description 9
- 230000035515 penetration Effects 0.000 abstract description 6
- 230000002159 abnormal effect Effects 0.000 abstract description 3
- 238000000151 deposition Methods 0.000 abstract description 2
- 230000008021 deposition Effects 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 40
- 238000006243 chemical reaction Methods 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 4
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000005380 borophosphosilicate glass Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
Description
Claims (3)
- 레티클 반입구, 배기관, 및 상기 배기관 측으로 가까워질수록 단면적이 작아지는 원추 형상의 내부 공간부를 구비한 함체;상기 함체의 레티클 반입구를 통하여 안착대 위에 레티클을 안착시켜 반입 및 반출시킬 수 있는 레티클 이송 수단;고압 공기를 상기 레티클의 상하면을 향하여 분사시킬 수 있도록 상기 레티클의 상하측에 배치되며, 상기 함체의 레티클 반입구 쪽 내측면에 장착되는 공기 토출기; 및상기 공기 토출기에 의해 떨어져 나온 먼지를 강제로 배출시킬 수 있도록 상기 배기관에 연결되는 송풍팬을 포함하는 것을 특징으로 하는 반도체 노광 공정용 레티클의 먼지 제거 장치.
- 삭제
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990050229A KR100583944B1 (ko) | 1999-11-12 | 1999-11-12 | 상압 화학 기상 증착 공정용 서셉터 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990050229A KR100583944B1 (ko) | 1999-11-12 | 1999-11-12 | 상압 화학 기상 증착 공정용 서셉터 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010046451A KR20010046451A (ko) | 2001-06-15 |
KR100583944B1 true KR100583944B1 (ko) | 2006-05-26 |
Family
ID=19619808
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019990050229A KR100583944B1 (ko) | 1999-11-12 | 1999-11-12 | 상압 화학 기상 증착 공정용 서셉터 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100583944B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100989156B1 (ko) * | 2003-12-18 | 2010-10-20 | 엘지디스플레이 주식회사 | 화학기상 증착장비 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55121648A (en) * | 1979-03-14 | 1980-09-18 | Pioneer Electronic Corp | Cvd device |
JPH0338357U (ko) * | 1989-08-21 | 1991-04-12 | ||
JPH08153773A (ja) * | 1994-11-30 | 1996-06-11 | Hitachi Ltd | 基板ホルダ、基板の保持方法、基板処理装置、基板の処理方法、基板検査装置及び基板の検査方法 |
-
1999
- 1999-11-12 KR KR1019990050229A patent/KR100583944B1/ko not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55121648A (en) * | 1979-03-14 | 1980-09-18 | Pioneer Electronic Corp | Cvd device |
JPH0338357U (ko) * | 1989-08-21 | 1991-04-12 | ||
JPH08153773A (ja) * | 1994-11-30 | 1996-06-11 | Hitachi Ltd | 基板ホルダ、基板の保持方法、基板処理装置、基板の処理方法、基板検査装置及び基板の検査方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20010046451A (ko) | 2001-06-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5367068B2 (ja) | 半導体ウェハのエッチング装置 | |
US6040011A (en) | Substrate support member with a purge gas channel and pumping system | |
US5945351A (en) | Method for etching damaged zones on an edge of a semiconductor substrate, and etching system | |
EP0903769B1 (en) | Spatially uniform gas supply and pump configuration for large wafer diameters | |
US7159597B2 (en) | Multistep remote plasma clean process | |
JP4732475B2 (ja) | 表面処理方法及びその装置 | |
JP2918785B2 (ja) | 改良された化学気相蒸着チャンバおよび方法 | |
KR101210210B1 (ko) | 배치대 구조, 성막 장치 및 성막 방법 | |
US20070266946A1 (en) | Semiconductor device manufacturing apparatus and method of using the same | |
US7588036B2 (en) | Chamber clean method using remote and in situ plasma cleaning systems | |
WO1990013687A3 (en) | Apparatus and method for treating flat substrates under reduced pressure | |
JP2001520321A (ja) | 非対称の流動形状を用いるプロセスチャンバ用リッドアセンブリ | |
JP4124543B2 (ja) | 表面処理方法及びその装置 | |
KR100583944B1 (ko) | 상압 화학 기상 증착 공정용 서셉터 | |
KR102666133B1 (ko) | 초임계 건조 장치 및 그를 이용한 기판 건조방법 | |
JP4124800B2 (ja) | 表面処理方法及びその装置 | |
JP4916070B2 (ja) | 基板処理装置 | |
JP4149694B2 (ja) | 半導体製造装置及び半導体製造方法 | |
KR101374300B1 (ko) | 배기부재와 이를 이용한 기판 처리 장치 및 방법 | |
KR101564582B1 (ko) | 기판처리장치 | |
JPH04320025A (ja) | 化学気相成長装置 | |
KR20050040035A (ko) | 웨이퍼가 로딩되는 보트를 구비하는 증착 공정 설비 | |
JP4612063B2 (ja) | 表面処理方法及びその装置 | |
JPS6223106A (ja) | 処理装置 | |
KR100636025B1 (ko) | 반도체 장치의 제조를 위한 증착장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19991112 |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20040913 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19991112 Comment text: Patent Application |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20051220 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20060306 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20060522 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20060523 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20090514 Start annual number: 4 End annual number: 4 |
|
PR1001 | Payment of annual fee |
Payment date: 20100429 Start annual number: 5 End annual number: 5 |
|
FPAY | Annual fee payment |
Payment date: 20110429 Year of fee payment: 6 |
|
PR1001 | Payment of annual fee |
Payment date: 20110429 Start annual number: 6 End annual number: 6 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |