KR100529130B1 - 적외선 흡수 볼로메터 제조 방법 - Google Patents
적외선 흡수 볼로메터 제조 방법 Download PDFInfo
- Publication number
- KR100529130B1 KR100529130B1 KR10-2001-0050516A KR20010050516A KR100529130B1 KR 100529130 B1 KR100529130 B1 KR 100529130B1 KR 20010050516 A KR20010050516 A KR 20010050516A KR 100529130 B1 KR100529130 B1 KR 100529130B1
- Authority
- KR
- South Korea
- Prior art keywords
- conductive line
- layer
- infrared
- forming
- bolometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 20
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 238000010521 absorption reaction Methods 0.000 claims abstract description 61
- 239000000758 substrate Substances 0.000 claims abstract description 21
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims abstract description 19
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims abstract description 18
- 239000000463 material Substances 0.000 claims description 18
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 6
- 229910052726 zirconium Inorganic materials 0.000 claims description 6
- 229910001093 Zr alloy Inorganic materials 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 3
- 239000010410 layer Substances 0.000 abstract description 75
- 239000011241 protective layer Substances 0.000 abstract description 13
- 229910004298 SiO 2 Inorganic materials 0.000 abstract description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 8
- 229910052814 silicon oxide Inorganic materials 0.000 abstract description 8
- 238000000151 deposition Methods 0.000 abstract description 5
- 238000009413 insulation Methods 0.000 abstract description 4
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 abstract description 3
- 229910010413 TiO 2 Inorganic materials 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 20
- 230000008569 process Effects 0.000 description 15
- 230000008859 change Effects 0.000 description 7
- 238000005530 etching Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000000206 photolithography Methods 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 238000002835 absorbance Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/10—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0853—Optical arrangements having infrared absorbers other than the usual absorber layers deposited on infrared detectors like bolometers, wherein the heat propagation between the absorber and the detecting element occurs within a solid
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Abstract
Description
Claims (2)
- 내부 회로와 전기적으로 연결되는 다수의 접속단자를 갖는 구동 기판 상에 셀 단위의 적외선 흡수 볼로메터를 제조하는 방법에 있어서,상기 구동 기판과의 사이에 제 1 희생층을 게재하며, 대응하는 접속단자에 연결되는 하부 전도선이 포함된 지지 레벨 구조를 형성하는 과정;상기 지지 레벨 구조를 매립하는 형태의 제 2 희생층을 형성하고, 상기 제 2 희생층의 일부를 선택적으로 제거함으로써, 상기 하부 전도선의 상부 일부를 노출시키는 포스트 형성홀을 형성하는 과정;상기 노출된 하부 전도선의 상부를 제외한 영역의 전반에 걸쳐 상부 지지 교각 물질을 형성하는 과정;상기 상부 지지 교각 물질의 상부에 상기 노출된 하부 전도선에 연결되는 상부 전도선을 형성하는 과정;상기 상부 전도선의 상부 전면에 걸쳐 티타늄 산화막을 형성하는 과정;상기 티타늄 산화막의 상부 전면에 걸쳐 지르코늄 또는 지르코늄 합금으로 이루어진 적외선 흡수층을 형성하는 과정;상기 적외선 흡수층, 티타늄 산화막 및 지지층의 일부를 선택적으로 제거하여 상기 제 2 희생층의 상부 일부를 노출시킴으로써, 셀 단위의 포스트 및 검출 레벨 구조를 형성하는 과정; 및상기 제 1 및 제 2 희생층을 제거함으로써, 각 셀 단위의 볼로메터 구조를 완성하는 과정으로 이루어진 적외선 흡수 볼로메터 제조 방법.
- 제 1 항에 있어서,상기 적외선 흡수 볼로메터 제조 방법은,상기 적외선 흡수층의 상부 전면에 ZnS2로 이루어진 유전층을 형성하는 과정을 더 포함하는 것을 특징으로 하는 적외선 흡수 볼로메터 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0050516A KR100529130B1 (ko) | 2001-08-22 | 2001-08-22 | 적외선 흡수 볼로메터 제조 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0050516A KR100529130B1 (ko) | 2001-08-22 | 2001-08-22 | 적외선 흡수 볼로메터 제조 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030017701A KR20030017701A (ko) | 2003-03-04 |
KR100529130B1 true KR100529130B1 (ko) | 2005-11-15 |
Family
ID=27720191
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0050516A Expired - Fee Related KR100529130B1 (ko) | 2001-08-22 | 2001-08-22 | 적외선 흡수 볼로메터 제조 방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100529130B1 (ko) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR960012279A (ko) * | 1994-09-30 | 1996-04-20 | 이형도 | 초전형 적외선 센서 |
KR20010013151A (ko) * | 1997-05-28 | 2001-02-26 | 스켈톤 에스. 알. | 열 검출기 어레이 |
KR20010039752A (ko) * | 1999-07-26 | 2001-05-15 | 가네코 히사시 | 고감도 열 분리 구조를 구비한 열형 적외선 검출기 |
KR20010074731A (ko) * | 1999-05-20 | 2001-08-09 | 추후제출 | 저복사율의 반사방지막 또는 적외선 흡수막을 구비한 투명기판 |
-
2001
- 2001-08-22 KR KR10-2001-0050516A patent/KR100529130B1/ko not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR960012279A (ko) * | 1994-09-30 | 1996-04-20 | 이형도 | 초전형 적외선 센서 |
KR20010013151A (ko) * | 1997-05-28 | 2001-02-26 | 스켈톤 에스. 알. | 열 검출기 어레이 |
KR20010074731A (ko) * | 1999-05-20 | 2001-08-09 | 추후제출 | 저복사율의 반사방지막 또는 적외선 흡수막을 구비한 투명기판 |
KR20010039752A (ko) * | 1999-07-26 | 2001-05-15 | 가네코 히사시 | 고감도 열 분리 구조를 구비한 열형 적외선 검출기 |
Also Published As
Publication number | Publication date |
---|---|
KR20030017701A (ko) | 2003-03-04 |
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