KR100464204B1 - 그레이톤 마스크 및 이를 이용한 액정디스플레이 제조방법 - Google Patents
그레이톤 마스크 및 이를 이용한 액정디스플레이 제조방법 Download PDFInfo
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- KR100464204B1 KR100464204B1 KR10-2001-0032067A KR20010032067A KR100464204B1 KR 100464204 B1 KR100464204 B1 KR 100464204B1 KR 20010032067 A KR20010032067 A KR 20010032067A KR 100464204 B1 KR100464204 B1 KR 100464204B1
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- mask
- gray tone
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- photosensitive material
- tone mask
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 28
- 238000004519 manufacturing process Methods 0.000 title abstract description 37
- 239000000463 material Substances 0.000 claims abstract description 50
- 238000000034 method Methods 0.000 claims abstract description 46
- 238000000059 patterning Methods 0.000 claims abstract description 17
- 239000000758 substrate Substances 0.000 claims abstract description 13
- 239000010409 thin film Substances 0.000 claims abstract description 11
- 238000000206 photolithography Methods 0.000 claims abstract description 7
- 238000000151 deposition Methods 0.000 claims abstract description 6
- 239000010410 layer Substances 0.000 claims description 61
- 239000004065 semiconductor Substances 0.000 claims description 32
- 239000012535 impurity Substances 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 17
- 239000002184 metal Substances 0.000 claims description 17
- 239000010408 film Substances 0.000 claims description 11
- 238000005530 etching Methods 0.000 claims description 9
- 239000011241 protective layer Substances 0.000 claims description 6
- 230000018109 developmental process Effects 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 239000011810 insulating material Substances 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 229910018125 Al-Si Inorganic materials 0.000 description 2
- 229910018520 Al—Si Inorganic materials 0.000 description 2
- 229910018594 Si-Cu Inorganic materials 0.000 description 2
- 229910008332 Si-Ti Inorganic materials 0.000 description 2
- 229910004205 SiNX Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910008465 Si—Cu Inorganic materials 0.000 description 2
- 229910006749 Si—Ti Inorganic materials 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66765—Lateral single gate single channel transistors with inverted structure, i.e. the channel layer is formed after the gate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
- G02F1/136236—Active matrix addressed cells for reducing the number of lithographic steps using a grey or half tone lithographic process
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Mathematical Physics (AREA)
- Ceramic Engineering (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (10)
- 기판 위에 다수의 박막을 순차적으로 증착하고 각각의 박막을 패터닝하여 전자소자를 제조하는 공정에서, 사진 식각을 위하여 사용되는 패터닝된 그레이톤 마스크에 있어서,상기 마스크는 노광장치의 스캐닝방향에 대해 수직방향 및 수평방향으로 형성된 그레이톤 패턴을 포함하며, 상기 패턴을 통과하여 감광물질에 조사되는 광량이 서로 동일하도록 상기 수직방향과 수평방향의 패턴은 그 형태가 다른 것을 특징으로 하는 그레이톤 마스크.
- 제 1 항에 있어서, 상기 마스크는 수직방향과 수평방향의 패턴간의 간격을 달리한 것을 특징으로 하는 그레이톤 마스크.
- 제 1 항에 있어서, 상기 마스크는 수직방향과 수평방향의 패턴간의 폭을 달리한 것을 특징으로 하는 그레이톤 마스크.
- 제 1 항에 있어서, 상기 노광장치는 스캐닝 방식의 얼라이너인 것을 특징으로 하는 그레이톤 마스크.
- 제 4 항에 있어서, 포지티브 감광물질을 사용하는 경우에는 수직방향의 마스크 패턴은 수평방향의 마스크 패턴보다 간격을 넓게 하거나 폭을 좁게 하는 것을 특징으로 하는 그레이톤 마스크.
- 제 4 항에 있어서, 네가티브 감광물질을 사용하는 경우에는 수직방향의 마스크 패턴은 수평방향의 마스크 패턴보다 간격을 좁게 하거나 폭을 넓게 하는 것을 특징으로 하는 그레이톤 마스크.
- 제 1 항에 있어서, 상기 마스크에 의하여 그레이톤 패턴에 대응하는 감광물질은 노광장치의 스캐닝방향에 관계없이 동일한 두께의 그레이톤으로 패턴화되는 것을 특징으로 하는 그레이톤 마스크.
- 액정디스플레이의 액티브패널 상에 게이트전극을 형성하는 단계;상기 게이트전극 상에 유전막, 반도체층, 불순물 반도체층, 소스/드레인 금속층을 순차적으로 적층하는 단계;상기 소스/드레인 금속층 위에 감광물질을 도포하는 단계;회절노광이 가능한 그레이톤 마스크로서, 노광장치의 스캐닝방향에 대해 수직방향과 수평방향의 슬릿간의 간격을 달리한 마스크를 사용하여 박막 트랜지스터의 채널 영역에 해당하는 게이트전극 상부의 감광물질에 그레이톤의 노광영역과 데이터라인과 소스전극 및 드레인전극 영역의 감광물질에 완전노광영역을 형성하는 단계;상기 그레이톤의 노광영역과 완전 노광영역 이외의 부분에서 1차 식각 공정으로 상기 소스/드레인 금속층, 불순물 반도체층, 반도체층을 제거하는 단계;상기 그레이톤의 노광영역을 완전히 제거한 다음, 상기 채널 영역의 상기 불순물 반도체층과 소스/드레인 금속층을 2차로 식각하여 소스전극과 드레인전극을 형성하는 단계;보호층을 액티브패널 전면에 증착한 후, 상기 보호층을 패터닝하여 상기 드레인전극 상에 픽셀전극 콘택용 홀을 형성하는 단계; 및상기 액티브패널 전면에 픽셀전극용 도전층을 형성시키고, 상기 도전층을 패터닝하여 픽셀전극을 형성하는 단계를 포함하여 구성되는 액정디스플레이 제조방법.
- 제 8 항에 있어서, 상기 박막 트랜지스터 채널 영역의 상기 불순물 반도체층, 소스/드레인 금속층의 식각은 동시에 이루어지는 것을 특징으로 하는 액정디스플레이 제조방법.
- 제 8 항에 있어서, 상기 박막 트랜지스터 채널 영역의 상기 불순물 반도체층, 소스/드레인 금속층의 식각은 단계적으로 이루어지는 것을 특징으로 하는 액정디스플레이 제조방법.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0032067A KR100464204B1 (ko) | 2001-06-08 | 2001-06-08 | 그레이톤 마스크 및 이를 이용한 액정디스플레이 제조방법 |
US10/163,431 US6876428B2 (en) | 2001-06-08 | 2002-06-07 | Method of manufacturing a liquid crystal display panel using a gray tone mask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0032067A KR100464204B1 (ko) | 2001-06-08 | 2001-06-08 | 그레이톤 마스크 및 이를 이용한 액정디스플레이 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR20020093351A KR20020093351A (ko) | 2002-12-16 |
KR100464204B1 true KR100464204B1 (ko) | 2005-01-03 |
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KR10-2001-0032067A KR100464204B1 (ko) | 2001-06-08 | 2001-06-08 | 그레이톤 마스크 및 이를 이용한 액정디스플레이 제조방법 |
Country Status (2)
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US (1) | US6876428B2 (ko) |
KR (1) | KR100464204B1 (ko) |
Families Citing this family (19)
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JP2002141512A (ja) * | 2000-11-06 | 2002-05-17 | Advanced Display Inc | 薄膜のパターニング方法およびそれを用いたtftアレイ基板およびその製造方法 |
JP4565799B2 (ja) * | 2002-07-01 | 2010-10-20 | 大林精工株式会社 | 横電界方式液晶表示装置、その製造方法、走査露光装置およびミックス走査露光装置 |
KR101009662B1 (ko) * | 2003-12-30 | 2011-01-19 | 엘지디스플레이 주식회사 | 액정표시장치의 마스크 |
JP4614696B2 (ja) * | 2004-06-24 | 2011-01-19 | Hoya株式会社 | グレートーンマスクの製造方法 |
KR101061844B1 (ko) * | 2004-06-29 | 2011-09-02 | 삼성전자주식회사 | 박막 표시판의 제조 방법 |
JP2006030320A (ja) * | 2004-07-12 | 2006-02-02 | Hoya Corp | グレートーンマスク及びグレートーンマスクの製造方法 |
TWI294177B (en) * | 2005-12-30 | 2008-03-01 | Au Optronics Corp | Method for manufacturing pixel structure |
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CN100421019C (zh) * | 2006-12-06 | 2008-09-24 | 友达光电股份有限公司 | 液晶显示装置基板的制造方法 |
US20080182179A1 (en) * | 2007-01-25 | 2008-07-31 | Allied Integrated Patterning Corp. | Gray tone mask and method for manufacturing the same |
KR101392848B1 (ko) * | 2007-03-28 | 2014-05-09 | 삼성디스플레이 주식회사 | 마스크 및 이의 제조 방법 |
CN101315517A (zh) * | 2007-05-30 | 2008-12-03 | 北京京东方光电科技有限公司 | 像素沟道区的掩模版及用该掩模版形成的薄膜晶体管 |
CN101382728B (zh) * | 2007-09-07 | 2010-07-28 | 北京京东方光电科技有限公司 | 灰阶掩膜版结构 |
CN101387825B (zh) * | 2007-09-10 | 2011-04-06 | 北京京东方光电科技有限公司 | 补偿型灰阶掩膜版结构 |
TWI374510B (en) * | 2008-04-18 | 2012-10-11 | Au Optronics Corp | Gate driver on array of a display and method of making device of a display |
CN101661907B (zh) * | 2008-08-27 | 2011-12-28 | 北京京东方光电科技有限公司 | 液晶显示装置的阵列基板制造方法 |
TWI444758B (zh) * | 2009-06-19 | 2014-07-11 | Au Optronics Corp | 薄膜電晶體元件與用於定義薄膜電晶體元件之光罩及薄膜電晶體元件之製作方法 |
KR101673618B1 (ko) * | 2010-12-06 | 2016-11-07 | 두산공작기계 주식회사 | Nc 공작기계 공구경로 파트 프로그램 수정 시스템 |
CN108089396A (zh) * | 2018-01-03 | 2018-05-29 | 京东方科技集团股份有限公司 | 一种单缝衍射掩膜板及制作方法、薄膜晶体管、阵列基板 |
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JPH08306615A (ja) * | 1995-05-10 | 1996-11-22 | Oki Electric Ind Co Ltd | ハーフトーンマスク及びそれを用いたパターン形成方法 |
KR20020091447A (ko) * | 2001-05-30 | 2002-12-06 | 주식회사 현대 디스플레이 테크놀로지 | 고개구율 액정표시장치의 제조방법 |
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US5914202A (en) * | 1996-06-10 | 1999-06-22 | Sharp Microeletronics Technology, Inc. | Method for forming a multi-level reticle |
JP3347670B2 (ja) * | 1998-07-06 | 2002-11-20 | キヤノン株式会社 | マスク及びそれを用いた露光方法 |
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JPH08250446A (ja) * | 1995-02-16 | 1996-09-27 | Samsung Electron Co Ltd | グレートーンマスク、これを用いたパターンの形成方法およびイオン注入方法 |
JPH08306615A (ja) * | 1995-05-10 | 1996-11-22 | Oki Electric Ind Co Ltd | ハーフトーンマスク及びそれを用いたパターン形成方法 |
KR20020091447A (ko) * | 2001-05-30 | 2002-12-06 | 주식회사 현대 디스플레이 테크놀로지 | 고개구율 액정표시장치의 제조방법 |
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US20020186332A1 (en) | 2002-12-12 |
US6876428B2 (en) | 2005-04-05 |
KR20020093351A (ko) | 2002-12-16 |
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