KR100281882B1 - Automatic generation of printed circuit board test program - Google Patents

Abstract

According to an aspect of the present invention, there is provided a method of automatically generating a printed circuit board test program, the method including: reading a CAD data file of a test target PCB into a storage device of a system; Setting stylus options for each type and capacity of components installed in the PCB; Setting a test command and a command format for each type of component provided by the test equipment; Setting a test program generation order for each test item; Analyzing the read data file to construct a parts list database having a part number as a key field; Generating a main test routine according to the set test program generation procedure; And sequentially generating a test command list from the first component to the last component in the read data file.

According to the present invention, unlike the conventional manual method by using a computer system linked to the CAD system by analyzing and reconstructing the CAD data file of the PCB to be tested automatically generates a test command finally, the test program This significantly reduces the time required to generate the data and prevents data entry errors or missing test items due to manual operations.

Description

Automatic generation of printed circuit board test program

The present invention relates to a method for automatically generating a printed circuit board test program, and in particular, a printed circuit board test program that can automatically set a test sequence for each stimulus option and test item according to each component type and capacity. The automatic generation method.

After designing a printed circuit board (PCB) using a computer aided design (CAD) system, a designer or user has conventionally written a PCB test program by hand in order to test the manufactured PCB. Therefore, there was a need for specialized knowledge for writing a program, a lot of time, and a problem such as a data input error or a missing test item.

The present invention has been made in view of the above problems, and an object thereof is to provide a method for automatically generating a printed circuit board test program which can generate a PCB test program within a short time without input error or missing test items.

1 is a flow chart showing an execution process of a method for automatically generating a printed circuit board test program according to the present invention.

2 is a view showing a test program list structure generated by the method of automatically generating a printed circuit board test program according to the present invention.

Figure 3 is a schematic diagram showing a process for generating a test program according to the method for automatically generating a printed circuit board test program according to the present invention.

Figure 4 is a schematic diagram showing a process of generating a test program taking the case of a resistor according to the method for automatically generating a printed circuit board test program according to the present invention.

<Explanation of symbols for main parts of drawing>

CAD data files 302 ... Parts

303 ... Stimulus option list 304 ... Command format list

305 ... Part List Database

In order to achieve the above object, a method for automatically generating a printed circuit board test program according to the present invention includes: reading a CAD data file of a test target PCB into a storage device of a system; Setting stylus options for each type and capacity of components installed in the PCB; Setting a test command and a command format for each type of component provided by the test equipment; Setting a test program generation order for each test item; Analyzing the read data file to construct a parts list database; Generating a main test routine according to the set test program generation order; And sequentially generating a test command list from the first component to the last component in the read data file.

Here, in particular, in constructing the database, in order to prevent duplication of part numbers, a database is preferably constructed with a part number as a key field. In constructing the database as described above, a database having a different recording structure is created for each component type, and the values of each field are read from the data file and stored. In addition, the main test routine is generated according to the format (grammar) of test instructions provided by the PCB test equipment to be used.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a flowchart illustrating an execution process of a method for automatically generating a printed circuit board test program according to the present invention.

Referring to FIG. 1, in order to perform a method for automatically generating a printed circuit board test program according to the present invention, a designer or user prepares a CAD data file of a PCB designed using a CAD system (step 101). Then, the CAD data file of the PCB under test among the CAD data files of the prepared PCB is read into the storage of the system (step 102). Then, the stylus option is set for each type and capacity of the (electronic) components installed in the PCB (step 103). Here, the Stimulus option means whether to perform a test with the power on or a power off in testing a part, and to what extent if the power is applied. It means the condition of whether to do it.

After setting the stylus option as described above, a test command and a command format are set for each component type according to the function provided by the test equipment (step 104). Then, a test program generation order is set for each test item (step 105). Here, the test item may be changed according to a function provided by the test equipment to be used.

When the setting of the test program generation order is completed, the CAD data file read in step 102 is analyzed to build a parts list database in the storage of the system (step 106). Here, in constructing a parts list database, in order to prevent duplication of part numbers, a database is preferably constructed with a part number as a key field. In constructing such a database, as shown in Table 1 below, a database having a different recording structure is created for each component type, and the values of each field are read and stored in the data file. Here, look at Table 1 for reference. This shows a parts list database structure in which parts are sorted by type. For parts from a register to a potentiometer, as described in the fields, "ElectType; PartNo; Type; Value; HTol; LTol ". In this field structure, "HTol" and "LTol" represent an upper limit tolerance and a lower limit tolerance, respectively. In addition, the diode and the light emitting diode (LED) have a field structure of "ElectType; PartNo; Type; ForwardBias; Reverse Bias; HTol; LTol", and the zener diode is "ElectType; PartNo; Type; Forward Bias; ZenerVoltage; HTol; LTol" The digital, analog and hybrid ICs each have a field structure of "ElectType; PartNo; Type; LibraryName; NumOfPins".

On the other hand, the parts list database does not only describe the test of each part, but also describes the continuity and open test.

Part type Fields RegisterRheostatJumperInductorTrim-InductorCapacitorTrim-CapacitorElectrolytic CapacitorPotentiometer ElectType; PartNo; Type; Value; HTol; LTol DiodeLED ElectType; PartNo; Type; ForwardBias; ReverseBias; HTol; LTol Zener Diode ElectType; PartNo; Type; ForwardBias; ZenerVoltage; HTol; LTol IC-digitalIC-analogIC-hybrid ElectType; PartNo; Type; LibraryName; NumOfPins Transistor PNP Transistor NPNNFETPFETNMOSPMOS ElectType; PartNo; Type; BEVol; BCVol; Amplification; HTol; LTol Continuity ElectType; PartNo; Type; R-Max Open ElectType; PartNo; Type; R-Min CPL ElectType; PartNo; Type; LibraryName; NumOfPins; Parameters

When the construction of the parts list database is completed in this way, a main test routine is generated based on the procedure set in step 105 (step 107). Here, this main test routine is generated in accordance with the format (grammar) of the test instructions provided by the PCB test equipment to be used. After generation of the main test routine, the first component to generate a test instruction is selected from the data file read in step 102 (step 108). Here, the information of the selected part depends on the type of the part as shown in Table 2 below, but basically includes the part name, part number, and net information. Based on this Table 2, the relevant information is read.

Part type Fields RegisterRheostatJumperInductorTrim-InductorCapacitorTrim-CapacitorPotentiometer CompName; PartNumber; A; B DiodeLEDZener Diode CompName; PartNumber; Anode; Cathode Electrolytic Capacitor CompName; PartNumber; +;- Potentiometer CompName; PartNumber; Pin1; Pin2: Slider Transistor PNP Transistor NPNNFETPFETNMOSPMOS CompName; PartNumber; Collector; Base; Emitter ContinuityOpen CompName; PartNumber; PinList IC CompName; PartNumber; OpenCheckFlag; NumOfPins; Pin-1; ...; Pin-n CPL CompName; PartNumber; NumOfPins; Pin-1; ...; Pin-n

When the information of the selected part is read in this way, the record of the same part number is found in the database constructed in step 106 using the part number of the information of the selected part (step 109). Stimulus option information corresponding to the current component type and capacity is obtained from the stylus options set in step 103 by using the part type and capacity information of the found record (step 110). Then, from the test command and command format set in step 104, a test command and command format corresponding to the part type information of the record found in step 109 are obtained (step 111). Then, pin information corresponding to the net information is obtained from the data file read in step 102 using the net information of the record found in step 109 (step 112). Then, based on the command format information obtained in step 111, a test command for the current part is configured by combining the information of the component selected in step 108 and the pin information obtained in step 112 (step 113). Then, a test program for the current component is generated using the configured command (step 114). In this way, when the test program generation for the first component is completed, the second component is selected from the data file read in step 102 (step 108), and the subsequent steps 109 to 114 are repeated. . Then, the same process from steps 108 to 114 is repeated for the third and fourth parts. Then, it is determined whether the generation of the test program is completed up to the last part (step 115). If the generation of the test program is not completed until the last part in this determination, the flow returns to step 108 above. When the generation of the test program up to the last part is completed, the generated test program list as shown in FIG. 2 is stored in the storage device (disk) of the system (step 116). Here, the test program list of FIG. 2 will be described. Referring to FIG. 2, the test program list is largely composed of a main list unit 201 and a sub list unit 202 (203) 204. The main list unit 201 is composed of a plurality of unit lists. The "count" 201a in the unit list indicates the number of the lists 201c, and the "Header" 201b includes the features of the parts and the test equipment. Relevant information can be recorded, where "list" indicates the detailed structure of the lists of the test program. "DoTest" 201d indicates a test execution command.

Meanwhile, FIGS. 3 and 4 conceptually show a process of automatically generating a PCB test program according to the method of automatically generating a PCB test program according to the present invention, and FIG. 3 is a schematic view showing a process of generating a test program. 4 is a schematic diagram illustrating a process of generating a test program by taking a case of a resistor as an example.

Referring to FIG. 3, first, the stylus option list 303 according to the type and capacity of the (electronic) component 302 installed in the PCB from the CAD data file 301 and the type of the component according to the function provided by the test equipment The test command form list 304 is constructed while the parts list database 305 is constructed. Then, based on the stimulus option list 303 and the command format list 304, an option and a command format corresponding to the current part are obtained (306). Based on this, the test program is finally generated by combining the stimulus options and the test instructions for each component (307).

4 illustrates the above process using the case of resistance as an example. As described above, the part information 401 basically includes a part name (CompName), a part number (Part No.), and net information (A-NetName). , B-NetName). The part name contains a message (402), and the part number includes the electrical type (ElectType), the type of the part (Type), the capacity value (Value), and the upper and lower tolerances (HTol and LTol) (403). The net information includes a pin number (404). Based on the basic information as described above, the test name information is configured through the message of the part name (405), the Stimulus option and the test command information are acquired through the type and capacity of the part (406), and the type and capacity of the part The test command is configured using the upper and lower tolerances, the pin number and the obtained test command information (407), and finally generates a test command (408).

As described above, the method for automatically generating a printed circuit board test program according to the present invention, unlike a conventional manual method, analyzes and reconstructs a CAD data file of a PCB under test using a computer system linked to a CAD system. As the test command is automatically generated, the time required for generating the test program can be significantly reduced, and the data input error or the test item missing due to the manual operation can be prevented.

Claims (7)

(a) reading the CAD data file of the PCB under test into the storage of the system; (b) setting stylus options for each type and capacity of components installed on the PCB; (c) setting a test command and a command format for each type of component provided by the test equipment; (d) setting a test program generation order for each test item; (e) analyzing the read data file to construct a parts list database; (f) generating a main test routine according to the set test program generation order; And and (g) generating a test command list sequentially from the first component to the last component in the read data file. The method of claim 1, Method for automatically generating a printed circuit board test program comprising the step of preparing a CAD data file of a PCB designed using the CAD system before the step (a). The method of claim 1, In constructing the database in the step (e), in order to prevent duplication of part numbers, preferably, a database is constructed with a part number as a key field. The method of claim 3, wherein In constructing a database using the part number as a key field, a printed circuit board test is generated in which a database having a different recording structure is generated for each type of component, and the values of each field are read from a data file and stored. How to automatically create a program. The method of claim 1, The main test routine in the step (f) is automatically generated according to the format (grammar) of the test command provided by the PCB test equipment to be used. The method of claim 1, wherein step (g) (g-1) selecting a first component to generate a test command from the data file read in step (a); (g-2) finding a record of the same part number in the database constructed in step (e) using the part number of the information of the selected part; (g-3) obtaining stimulus option information corresponding to the type and capacity of the current component among the stylus options set in the step (b) using the found part type and capacity information of the found record; (g-4) obtaining a test command and a command format corresponding to the part type information of the record found in the step (g-2) from the test command and the command format set in the step (c); (g-5) obtaining pin information corresponding to the net information from the data file read in step (a) using the net information of the record found in step (g-2) ; (g-6) Based on the instruction format information obtained in the step (g-4), the current part by combining the information of the component selected in the step (g-1) and the pin information obtained in the step (g-5) Constructing a test instruction for the; (g-7) generating a test program for the current component using the constructed command; And (g-8) repeating the steps (g-1) to (g-7) from the second part to the last part in the data file read in step (a). Method for automatically generating a printed circuit board test program. The method of claim 1, And storing the test program list generated after the step (g) in a storage device of the system.