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KR0131919B1 - Method and apparatus for detecting defects at high speeds - Google Patents

Method and apparatus for detecting defects at high speeds

Info

Publication number
KR0131919B1
KR0131919B1 KR89700622A KR890700622A KR0131919B1 KR 0131919 B1 KR0131919 B1 KR 0131919B1 KR 89700622 A KR89700622 A KR 89700622A KR 890700622 A KR890700622 A KR 890700622A KR 0131919 B1 KR0131919 B1 KR 0131919B1
Authority
KR
South Korea
Prior art keywords
high speeds
detecting defects
defects
detecting
speeds
Prior art date
Application number
KR89700622A
Other languages
English (en)
Inventor
Katsuyuki Tanimizu
Shinichi Meguro
Akira Ishii
Original Assignee
Nippon Telegraph & Telephone
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/JP1988/000787 external-priority patent/WO1989001669A1/ja
Application filed by Nippon Telegraph & Telephone filed Critical Nippon Telegraph & Telephone
Application granted granted Critical
Publication of KR0131919B1 publication Critical patent/KR0131919B1/ko

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/751—Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30144—Printing quality

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
KR89700622A 1987-08-13 1989-04-11 Method and apparatus for detecting defects at high speeds KR0131919B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP20095787 1987-08-13
JP63196110A JP2510687B2 (ja) 1987-08-13 1988-08-08 高速欠陥検出方法および装置
PCT/JP1988/000787 WO1989001669A1 (en) 1987-08-13 1988-08-09 Method and apparatus for detecting defects at high speeds

Publications (1)

Publication Number Publication Date
KR0131919B1 true KR0131919B1 (en) 1998-04-24

Family

ID=26509544

Family Applications (1)

Application Number Title Priority Date Filing Date
KR89700622A KR0131919B1 (en) 1987-08-13 1989-04-11 Method and apparatus for detecting defects at high speeds

Country Status (5)

Country Link
US (1) US5255329A (ko)
EP (1) EP0332706B1 (ko)
JP (1) JP2510687B2 (ko)
KR (1) KR0131919B1 (ko)
DE (1) DE3850651T2 (ko)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4142481A1 (de) * 1991-08-12 1993-02-18 Koenig & Bauer Ag Qualitaetskontrolle einer bildvorlage z. b. eines gedruckten musters
DE4321177A1 (de) * 1993-06-25 1995-01-05 Heidelberger Druckmasch Ag Vorrichtung zur parallelen Bildinspektion und Farbregelung an einem Druckprodukt
US6081608A (en) * 1995-02-09 2000-06-27 Mitsubishi Jukogyo Kabushiki Kaisha Printing quality examining method
IT1284432B1 (it) * 1996-03-22 1998-05-21 De La Rue Giori Sa Procedimento di controllo automatico della qualita' di stampa di un'immagine policroma
FR2754058B1 (fr) * 1996-10-02 1998-12-18 Etat Francais Laboratoire Cent Procede de detection de defauts de surface sur une surface texturee
JPH11212714A (ja) * 1998-01-27 1999-08-06 Sanyo Electric Co Ltd 座標検出装置および座標検出方法
US6341020B1 (en) * 1998-12-28 2002-01-22 Xerox Corporation Anamorphic object optimized function application for printer defect pre-compensation
DE10017461A1 (de) * 2000-04-07 2001-10-11 Steag Eta Optik Gmbh Verfahren und Vorrichtung zum Auswerten digitaler Bilddaten
US6886016B2 (en) * 2001-09-12 2005-04-26 International Business Machines Corporation Method and system for supporting multivalue attributes in a database system
JP4126938B2 (ja) * 2002-03-22 2008-07-30 セイコーエプソン株式会社 画像処理装置および画像出力装置
US7054017B2 (en) * 2002-04-30 2006-05-30 Hewlett-Packard Development, L.P. Avoiding printing defects
JP4472260B2 (ja) * 2003-02-07 2010-06-02 日本ボールドウィン株式会社 印刷面検査方法
JP4507523B2 (ja) * 2003-07-23 2010-07-21 富士ゼロックス株式会社 印刷物検査装置、及び印刷物検査プログラム
US7817307B2 (en) 2005-01-06 2010-10-19 Zenographics, Inc. Digital image processing without rasterization
US7880750B2 (en) * 2005-01-06 2011-02-01 Zenographics, Inc. Digital image processing with inherent compression
KR101320037B1 (ko) * 2006-07-31 2013-10-18 어플라이드 머티리얼즈 이스라엘 리미티드 결함 검출을 위한 방법 및 시스템
JP2010151606A (ja) * 2008-12-25 2010-07-08 Ricoh Co Ltd 画像検査装置、画像検査方法及びプログラム
JP5423278B2 (ja) * 2009-02-25 2014-02-19 富士電機株式会社 色空間判別条件生成装置及びこれを使用した画像検査装置
KR20120035096A (ko) 2010-10-04 2012-04-13 한국전자통신연구원 쿼드 트리 변환 구조에서 부가 정보의 시그널링 방법 및 장치
US8767240B1 (en) 2011-01-28 2014-07-01 Marvell International Ltd. Method and apparatus for encoding data to perform real-time rendering
JP7024239B2 (ja) * 2017-07-25 2022-02-24 オムロン株式会社 画像処理システム、画像処理装置および画像処理プログラム
US11073828B2 (en) * 2017-12-08 2021-07-27 Samsung Electronics Co., Ltd. Compression of semantic information for task and motion planning
US10868950B2 (en) * 2018-12-12 2020-12-15 Karl Storz Imaging, Inc. Systems and methods for operating video medical scopes using a virtual camera control unit
US20220215521A1 (en) * 2019-08-09 2022-07-07 Raydisoft Inc. Transmission image-based non-destructive inspecting method, method of providing non-destructive inspection function, and device therefor
JP7462429B2 (ja) * 2020-02-26 2024-04-05 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2022159639A (ja) * 2021-04-05 2022-10-18 キヤノン株式会社 画像処理装置および画像処理方法、プログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1129509B (it) * 1980-01-14 1986-06-04 Tasco Spa Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali
DE3070433D1 (en) * 1980-12-18 1985-05-09 Ibm Method for the inspection and automatic sorting of objects with configurations of fixed dimensional tolerances, and device for carrying out the method
JPS58201185A (ja) * 1982-05-19 1983-11-22 Toshiba Corp 位置検出装置
GB8415996D0 (en) * 1984-06-22 1984-07-25 Bank Of England Image model
DE3577485D1 (de) * 1984-07-18 1990-06-07 Nec Corp Bildeingabevorrichtung zur verarbeitung eines fingerabdruckes vor der identifikation.
US4648053A (en) * 1984-10-30 1987-03-03 Kollmorgen Technologies, Corp. High speed optical inspection system
EP0195161B1 (en) * 1985-03-14 1993-09-15 Nikon Corporation Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
US4742556A (en) * 1985-09-16 1988-05-03 Davis Jr Ray E Character recognition method
US4841473A (en) * 1986-12-19 1989-06-20 Robert S. Salzman Computer architecture providing programmable degrees of an almost condition

Also Published As

Publication number Publication date
EP0332706A1 (en) 1989-09-20
US5255329A (en) 1993-10-19
JPH01222381A (ja) 1989-09-05
EP0332706A4 (en) 1989-12-19
DE3850651T2 (de) 1995-03-16
EP0332706B1 (en) 1994-07-13
DE3850651D1 (de) 1994-08-18
JP2510687B2 (ja) 1996-06-26

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
LAPS Lapse due to unpaid annual fee