JPWO2022239144A1 - - Google Patents
Info
- Publication number
- JPWO2022239144A1 JPWO2022239144A1 JP2023520652A JP2023520652A JPWO2022239144A1 JP WO2022239144 A1 JPWO2022239144 A1 JP WO2022239144A1 JP 2023520652 A JP2023520652 A JP 2023520652A JP 2023520652 A JP2023520652 A JP 2023520652A JP WO2022239144 A1 JPWO2022239144 A1 JP WO2022239144A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/04—Voltage dividers
- G01R15/06—Voltage dividers having reactive components, e.g. capacitive transformer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/018037 WO2022239144A1 (ja) | 2021-05-12 | 2021-05-12 | 測定システム、変換係数取得装置、および電圧測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2022239144A1 true JPWO2022239144A1 (ja) | 2022-11-17 |
Family
ID=84028546
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023520652A Pending JPWO2022239144A1 (ja) | 2021-05-12 | 2021-05-12 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20240255548A1 (ja) |
JP (1) | JPWO2022239144A1 (ja) |
WO (1) | WO2022239144A1 (ja) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58135845U (ja) * | 1982-03-09 | 1983-09-12 | 加藤 良智 | 差動遅延型静電容量センサ |
DE4134695A1 (de) * | 1991-10-21 | 1993-04-22 | Beha C Gmbh | Pruefgeraet zur anzeige elektrischer spannung |
JPH10246647A (ja) * | 1997-03-04 | 1998-09-14 | Fuji Electric Co Ltd | 静電容量型センサ |
US6549385B1 (en) * | 1999-10-19 | 2003-04-15 | Associated Research, Inc. | Test circuit for a withstand voltage tester |
JP7071645B2 (ja) * | 2019-01-15 | 2022-05-19 | 日本電信電話株式会社 | 容量性電圧測定装置 |
WO2021029040A1 (ja) * | 2019-08-14 | 2021-02-18 | 日本電信電話株式会社 | 対地電圧測定装置とその方法 |
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2021
- 2021-05-12 JP JP2023520652A patent/JPWO2022239144A1/ja active Pending
- 2021-05-12 US US18/559,866 patent/US20240255548A1/en active Pending
- 2021-05-12 WO PCT/JP2021/018037 patent/WO2022239144A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US20240255548A1 (en) | 2024-08-01 |
WO2022239144A1 (ja) | 2022-11-17 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231012 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240806 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240917 |