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JPS6323502B2 - - Google Patents

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Publication number
JPS6323502B2
JPS6323502B2 JP61251053A JP25105386A JPS6323502B2 JP S6323502 B2 JPS6323502 B2 JP S6323502B2 JP 61251053 A JP61251053 A JP 61251053A JP 25105386 A JP25105386 A JP 25105386A JP S6323502 B2 JPS6323502 B2 JP S6323502B2
Authority
JP
Japan
Prior art keywords
sample
sample plate
plate
dish
storage container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP61251053A
Other languages
Japanese (ja)
Other versions
JPS62142259A (en
Inventor
Hideaki Ida
Ryo Fujimori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP61251053A priority Critical patent/JPS62142259A/en
Publication of JPS62142259A publication Critical patent/JPS62142259A/en
Publication of JPS6323502B2 publication Critical patent/JPS6323502B2/ja
Granted legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、電気泳動装置において用いられる電
気泳動用試料皿に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an electrophoresis sample dish used in an electrophoresis apparatus.

[従来の技術] 自動電気泳動装置において使用される試料皿
は、第4図に示す如く、一つの試料皿1に複数の
試料分注用凹部1aが形成されて成るものであ
り、これらに夫々異なる試料2が入れられてい
る。そして、この試料2からの水分の蒸発を防止
しつつ試料皿1を供給する試料供給装置は、例え
ば本願出願人の特願昭54−57845号(特開昭55−
149826号公報参照)において発明されている。即
ち、その試料供給装置は、第5図に示した如く、
上部開口3aと内側の寸法が試料皿1の外側寸法
とほぼ同じであつて複数の試料皿1を上下方向に
重ね収納することが出来且つ下端部に一つの試料
皿1が通り得る大きさの前部開口3bを有してい
ると共に支持台4上に設置された試料皿収納容器
3と、最上位の試料皿1の上に置かれた試料皿保
護カバー5と、最下位の試料皿1を前部開口3b
を通して試料付着位置Aへ移送するためのピスト
ン式試料移送機構6と、使用済みの試料皿1を収
納する受け皿7とを備え、試料移送機構6により
最下位の試料皿1を前部開口3bより押し出して
試料付着位置Aまで移動させ、ここで試料塗布具
8の塗布先9に試料2を付着させてから試料塗布
位置Bにおいて塗布先9に付着している試料2を
支持体10上に塗布し、この間に試料移送機構6
を再作動させて続いて最下位になつた二番目の試
料皿1を試料付着位置Aまで押し出し、この時そ
れまで試料付着位置Aにあつた最初の試料皿1を
二番目の試料皿1の移動により押して受け皿7内
に落下せしめ、以上の動作を順次繰返すようにし
て成るものであつて、試料皿1はそれが試料皿収
納容器3内にある間即ち試料付着位置Aへ移動せ
しめられるまでの間は保護カバー5又はすぐ上に
重ねられた試料皿1によつて密封状態が維持され
これにより試料2からの水分の蒸発が防止されて
いた。
[Prior Art] As shown in FIG. 4, a sample dish used in an automatic electrophoresis apparatus is one in which a plurality of sample dispensing recesses 1a are formed in one sample dish 1. A different sample 2 is included. A sample supply device that supplies the sample dish 1 while preventing moisture evaporation from the sample 2 is disclosed in, for example, Japanese Patent Application No. 54-57845 filed by the present applicant (Japanese Unexamined Patent Application Publication No. 55-578).
149826)). That is, the sample supply device is as shown in FIG.
The upper opening 3a and the inner dimensions are almost the same as the outer dimensions of the sample dish 1, and the size is such that a plurality of sample dishes 1 can be stacked vertically and accommodated, and the lower end is large enough to allow one sample dish 1 to pass through. A sample plate storage container 3 having a front opening 3b and placed on a support stand 4, a sample plate protection cover 5 placed on the uppermost sample plate 1, and a lowermost sample plate 1. The front opening 3b
It is equipped with a piston-type sample transfer mechanism 6 for transferring the sample plate 1 to the sample attachment position A through the sample transfer mechanism 6, and a receiving tray 7 for storing the used sample plate 1. The sample 2 is pushed out and moved to the sample attachment position A, where the sample 2 is attached to the coating tip 9 of the sample applicator 8, and then the sample 2 attached to the coating tip 9 is applied onto the support 10 at the sample coating position B. During this time, the sample transfer mechanism 6
The second sample pan 1, which is now at the lowest position, is then pushed out to the sample attachment position A. At this time, the first sample tray 1, which had been at the sample attachment position A, is moved to the second sample tray 1. The sample plate 1 is pushed and dropped into the receiving tray 7 by movement, and the above-mentioned operations are repeated in sequence, while the sample plate 1 remains in the sample plate storage container 3, that is, until it is moved to the sample attachment position A. During this time, a sealed state was maintained by the protective cover 5 or the sample plate 1 stacked immediately above, thereby preventing moisture from evaporating from the sample 2.

[発明が解決しようとする問題点] しかしながら、この試料供給装置は、使用済の
試料皿を受け皿の中に落してしまうために、再検
査等のために試料の再利用が出来ないという欠点
を有していた。
[Problems to be Solved by the Invention] However, this sample supply device has the disadvantage that the used sample plate is dropped into the receiving tray, making it impossible to reuse the sample for reexamination, etc. had.

本発明は上記欠点に鑑みてなされたもので、試
料供給に適した電気泳動用試料皿を提供すること
を目的とする。
The present invention was made in view of the above drawbacks, and an object of the present invention is to provide a sample dish for electrophoresis suitable for supplying a sample.

[問題点を解決するための手段及び作用] 本発明は試料を収納する複数の凹部を有する試
料皿の縁部に、複数の試料皿を重ねて収納する試
料皿収納容器に設けた試料皿排出用開口の方向
に、試料皿カバーを押し上げるための傾斜部を設
けることによつて、排出された試料皿を試料皿カ
バーで被うことができる。
[Means and effects for solving the problems] The present invention provides a sample plate ejector provided in a sample plate storage container for storing a plurality of sample plates in a stacked manner at the edge of a sample plate having a plurality of recesses for storing samples. By providing an inclined portion in the direction of the opening for pushing up the sample plate cover, the discharged sample plate can be covered with the sample plate cover.

[実施例] 本発明の一実施例を第1図A,B及び第2図を
参照して説明する。なお第4図及び第5図と同一
の部材には同一符号を付して説明する。
[Embodiment] An embodiment of the present invention will be described with reference to FIGS. 1A and 1B and FIG. 2. Note that the same members as in FIGS. 4 and 5 will be described with the same reference numerals.

第1図A,Bにおいて、1′はその頂面の前縁
側部分に複数の試料分注用凹部1′aが形成され
且つ後縁部分に傾斜部1′bが形成されていると
共にその底面の後縁部分に後述の試料皿送りレバ
ーの上端が係合し得る左右一対の係合穴1′cが
形成されている試料皿、3′は基本的構造が従来
の試料皿収納容器3と同じであるが更にその下端
部に一つの試料皿1′が通り得る大きさの後部開
口3′cが設けられた試料皿収納容器、4′は基本
的構造が従来の支持台4と同じであるが更にその
頂壁に後述の試料皿送りレバーの上端が貫通する
前後に長い左右一対のスロツト4′aが設けられ
た支持台、5′は基本的構造が従来の試料皿保護
カバー5と同じであるが更にその底面の後縁側部
分に後述の試料皿送りレバーの上端が係合し得る
左右一対の係合穴5′aが形成されている試料皿
保護カバーである。11は試料皿収納容器3′の
後方近傍において支持台4′上に取り外し可能に
固定されていると共にその下端部に一つの試料皿
1′が通り得る大きさの孔11aが設けられた固
定部材、12は後方に延出するようにして固定部
材11に固定された水平支持棒、13は支持棒1
2に一定の範囲内で上下動可能に装架されている
と共にその底面の位置(支持台4′の頂面からの
高さH′)が支持台4上に置かれた試料皿1′の頂
面の位置(試料皿1′の厚さH)よりも通常は低
くなつており且つ後方に向つて直列している複数
個の試料皿カバーである。14は支持台4′の底
壁上に固定された支持部材、15は支持部材14
に上下動可能に取付けられた鉛直支軸、16は鉛
直支軸15の上端に固着された上側レバー、1
7、は鉛直支軸15の下端に固着された下側レバ
ー、18は上側レバー16と支持部材14との間
に介在せしめられていて鉛直支軸15、上側レバ
ー16、下側レバー17全体に上方への移動習性
を付与しているスプリング、19は支持部材14
の上端に固着されていて鉛直支軸15、上側レバ
ー16、下側レバー17全体の上昇を所定の位置
まで規制するストツパー、20は下端20aが下
側レバー17に枢着されていて全体が鉛直面内に
て揺動可能となつており且つ上端20bが支持台
4′のスロツト4′aを貫通して試料皿1′の係合
穴1′cに係合し得るようになつていると共にそ
の中央部に長手方向に長いスロツト20cが設け
られている左右一対の試料皿送りレバー、21は
図示しないモータにより回転せしめられる円盤2
2の外周部の所定位置に固着されていると共にそ
の先端がスロツト20cに係合している駆動ピン
である。そして、円盤22の第2図時計方向の回
転による駆動ピン21の変位によつて、試料送り
レバー20の上端20bは、リセツト位置a(第
2図点線図示位置。この時、駆動ピン21がスプ
リング18の弾力に抗して上側レバー16を上昇
規制位置からストロークhだけ押し下げているの
で、試料送りレバー20も上昇規制位置からスト
ロークhだけ下降せしめられている。)、前方死点
位置b(第2図実線図示位置。この時、駆動ピン
21が上側レバー16から外れてしまうので、試
料送りレバー20はスプリング18の弾力により
ストロークhだけ上昇して上昇規制位置に戻つて
いる。)、後方死点位置c(第2図一点鎖線図示位
置。この時、駆動ピン21が上側レバー16をま
だ押し下げてはいないので、試料送りレバー21
は上昇規制位置に位置したままである。)を順次
とるようにして揺動及び上下動せしめられ、これ
が繰返されるようになつている。又、試料送りレ
バー20の上端20bのリセツト位置aから前方
死点位置bにかけての変位による試料皿1′の前
部開口3′からの前方移動距離は、該試料皿1′の
前後幅wよりも小さくなると共に試料皿1′の試
料分注用凹部1′aが試料皿収納容器3′から十分
露出する程度になるように設定されている。又、
試料送りレバー20の上端20bの前方死点位置
bから後方死点位置cにかけての変位による試料
皿1′の後部開口3′cからの後方移動距離は、該
試料皿1′の前後幅Wよりも大きくなるように設
定されている。
In FIGS. 1A and B, 1' has a plurality of sample dispensing recesses 1'a formed on the leading edge side of its top surface, an inclined part 1'b formed on its rear edge, and its bottom surface. The basic structure of the sample plate 3' is that of the conventional sample plate storage container 3, in which a pair of left and right engagement holes 1'c are formed in the rear edge portion of the sample plate feed lever, which will be described later, into which the upper end of the sample plate feed lever can be engaged. The sample plate storage container 4', which is the same but further has a rear opening 3'c at its lower end large enough for one sample plate 1' to pass through, has the same basic structure as the conventional support stand 4. In addition, the support stand 5' has a pair of long left and right slots 4'a on the top wall thereof, through which the upper end of the sample plate feed lever (described later) passes through, and 5' has a basic structure similar to that of the conventional sample plate protection cover 5. This is a sample plate protection cover which is the same but further has a pair of left and right engagement holes 5'a formed in the rear edge side portion of the bottom surface thereof, into which the upper end of a sample plate feed lever, which will be described later, can be engaged. Reference numeral 11 denotes a fixing member that is removably fixed on the support stand 4' near the rear of the sample plate storage container 3', and has a hole 11a in its lower end that is large enough to allow one sample plate 1' to pass through. , 12 is a horizontal support rod fixed to the fixing member 11 so as to extend rearward, and 13 is a support rod 1.
The position of the bottom surface (height H' from the top surface of the support table 4') is the same as that of the sample plate 1' placed on the support table 4. These are a plurality of sample plate covers that are normally lower than the top surface (thickness H of the sample plate 1') and are arranged in series toward the rear. 14 is a support member fixed on the bottom wall of the support base 4'; 15 is a support member 14;
16 is an upper lever fixed to the upper end of the vertical support shaft 15;
7 is a lower lever fixed to the lower end of the vertical support shaft 15; 18 is interposed between the upper lever 16 and the support member 14; A spring 19 is a support member 14 that provides an upward movement habit.
A stopper 20 is fixed to the upper end and restricts the lifting of the vertical support shaft 15, upper lever 16, and lower lever 17 to a predetermined position. The upper end 20b can pass through the slot 4'a of the support base 4' and engage with the engagement hole 1'c of the sample plate 1'. A pair of left and right sample plate feed levers are provided with a longitudinally long slot 20c in the center thereof, and 21 is a disk 2 rotated by a motor (not shown).
This is a drive pin which is fixed at a predetermined position on the outer circumference of the drive pin 2 and whose tip engages with the slot 20c. Then, due to the displacement of the drive pin 21 due to the rotation of the disk 22 in the clockwise direction in FIG. Since the upper lever 16 is pushed down by the stroke h from the lift restriction position against the elastic force of the upper lever 18, the sample feed lever 20 is also lowered by the stroke h from the lift restriction position. 2. At this time, the drive pin 21 comes off the upper lever 16, so the sample feed lever 20 moves up by the stroke h due to the elasticity of the spring 18 and returns to the rise restriction position.) Point position c (position shown by the one-dot chain line in FIG. 2. At this time, the drive pin 21 has not yet pushed down the upper lever 16,
remains in the rise restriction position. ) is made to swing and move up and down in sequence, and this is repeated. Further, the forward movement distance of the sample pan 1' from the front opening 3' due to the displacement of the upper end 20b of the sample feed lever 20 from the reset position a to the front dead center position b is determined by the front-to-back width w of the sample pan 1'. The sample dispensing concave portion 1'a of the sample dish 1' is set to be sufficiently exposed from the sample dish storage container 3'. or,
The backward movement distance from the rear opening 3'c of the sample pan 1' due to the displacement of the upper end 20b of the sample feed lever 20 from the front dead center position b to the rear dead center position c is determined from the front-to-back width W of the sample pan 1'. is also set to be large.

試料供給装置は上述の如く構成されているか
ら、まず多数の試料皿1′を試料皿収納容器3′内
に上部開口3′aから順次挿入してやれば、上部
開口3′aと内側の寸法が試料皿1′の外側寸法と
ほぼ同じなので該試料皿1′は必ず水平状態で落
下し、試料皿収納容器3′内にて正確に積み重な
る。その後、試料皿保護カバー5′も上部開口
3′aから挿入して最上位の試料皿1′の上に置
く。尚、この時試料皿送りレバー20の上端20
bはリセツト位置aで停止している。次に、円盤
22を回転させると、まず駆動ピン21が上側レ
バー16から外れるので試料皿送りレバー20の
上端20bが上昇して最下位の試料皿1′の係合
穴1′cに係合し、続いて上端20bが前方死点
位置bまで移動するので最下位の試料皿1′は試
料皿収納容器3′の前部開口3′bを通つて試料分
注用凹部1′aが試料付着位置Aに達するまで前
方移動せしめられる。そして、ここで第5図のと
同様に試料塗布具8の塗布先9に試料分注用凹部
1′a内の試料2を付着させ、更に試料塗布位置
Bにおいて塗布先9に付着している試料2を支持
体10上に塗布する。尚、この場合、最下位の試
料皿1′の前部開口3′bからの前方移動距離が該
試料皿1′の前後幅より小さく設定してあるので、
最下位の試料皿1′の後部が試料皿収納容器3′内
に残留し、そのため下から二番目以上に位置する
試料皿1′は下降できないでいる。次に試料皿送
りレバー20の上端20bが後方死点位置まで移
動するので、試料付着の終了した最下位の試料皿
1′は試料皿収納容器3′の後部開口3′c及び固
定部材11の孔11aを通つて後方移動せしめら
れ、試料皿1′の傾斜部1′bの作用により試料皿
カバー13を押し上げつつ移動して該カバー13
と一致した位置で停止する。そして、この間に、
残りの試料皿1′と保護カバー5′は自重により試
料皿一個分だけ下降し、二番目にあつた試料皿
1′が最下位に位置するようになる。続いて、試
料皿送りレバー20の上端bが再び前方へ移動し
始めるが、これと同時に駆動ピン21が上側レバ
ー16を押し下げ始めるので上端20bは下降も
開始し、而も前方移動に比べて下降の方が速いの
で上端20bは試料皿1′を前方へ移動せしめる
ことなく係合穴1′cから離脱し、リセツト位置
aで停止する。かくして、以上の動作が順次繰返
されることにより、試料収納容器3′内の全ての
試料皿1′についての試料2の供給が行われ、全
ての試料皿1′は試料付着後試料皿カバー13の
下へ送られる。そして、分析終了後試料皿カバー
13を支持している固定部材11を水平支持棒1
2と一緒に支持台4′から取り外すことにより使
用済みの試料皿1′が回収される。
Since the sample supply device is constructed as described above, firstly, by sequentially inserting a large number of sample plates 1' into the sample plate storage container 3' from the upper opening 3'a, the dimensions of the upper opening 3'a and the inside are adjusted. Since the outer dimensions are approximately the same as the sample trays 1', the sample trays 1' always fall horizontally and are accurately stacked in the sample tray storage container 3'. Thereafter, the sample plate protection cover 5' is also inserted through the upper opening 3'a and placed on top of the uppermost sample plate 1'. At this time, the upper end 20 of the sample plate feed lever 20
b is stopped at reset position a. Next, when the disk 22 is rotated, the drive pin 21 is first disengaged from the upper lever 16, so the upper end 20b of the sample plate feed lever 20 rises and engages with the engagement hole 1'c of the lowest sample plate 1'. Then, as the upper end 20b moves to the front dead center position b, the lowermost sample tray 1' passes through the front opening 3'b of the sample tray storage container 3', and the sample dispensing recess 1'a is inserted into the sample tray 1'. It is moved forward until it reaches the attachment position A. Then, as in FIG. 5, the sample 2 in the sample dispensing recess 1'a is attached to the tip 9 of the sample applicator 8, and the sample 2 is further attached to the tip 9 at the sample application position B. Sample 2 is applied onto support 10. In this case, since the forward movement distance of the lowest sample plate 1' from the front opening 3'b is set smaller than the front-to-back width of the sample plate 1',
The rear part of the lowest sample plate 1' remains in the sample plate storage container 3', and therefore the second and higher sample plates 1' from the bottom cannot be lowered. Next, the upper end 20b of the sample plate feed lever 20 moves to the rear dead center position, so that the lowest sample plate 1' to which the sample has been attached is moved to the rear opening 3'c of the sample plate storage container 3' and the fixing member 11. The sample plate cover 13 is moved backward through the hole 11a, and moved while pushing up the sample plate cover 13 by the action of the inclined portion 1'b of the sample plate 1'.
It will stop at the position that matches. And during this time,
The remaining sample pans 1' and protective cover 5' are lowered by one sample pan due to their own weight, and the second sample pan 1' is positioned at the lowest position. Subsequently, the upper end b of the sample plate feed lever 20 begins to move forward again, but at the same time, the drive pin 21 begins to push down the upper lever 16, so the upper end 20b begins to descend, and is lower than the forward movement. Since this is faster, the upper end 20b disengages from the engagement hole 1'c without moving the sample plate 1' forward and stops at the reset position a. In this way, by sequentially repeating the above operations, the sample 2 is supplied to all the sample plates 1' in the sample storage container 3', and all the sample plates 1' are covered with the sample plate cover 13 after the sample is attached. sent down. After the analysis is completed, the fixing member 11 supporting the sample plate cover 13 is moved to the horizontal support rod 1.
The used sample dish 1' is recovered by removing it together with the sample dish 2 from the support stand 4'.

上記実施例によれば、試料皿収納容器3′内に
ある各試料皿1′は保護カバー5′又はすぐ上に重
ねられた試料皿1′によつて密封状態が維持され
るので、これにより試料2からの水分の蒸発が防
止される。更に、試料付着後も各試料皿1′は試
料皿カバー13により密封されるので、試料2か
らの水分の蒸発が防止される。又、こうした状態
で使用済みの試料2からの水分の蒸発が防止され
るので、再検査等のために試料2を再利用するこ
とが出来る。更に、試料付着位置Aと試料塗布位
置Bとの間に何の部材も位置しないので両位置
A,B間の距離が短くなり、その結果塗布先9の
移動時間が短くなつて該塗布先9に付着した試料
2を支持体10上に塗布するまでにほとんど乾燥
させないで済む。
According to the above embodiment, each sample plate 1' in the sample plate storage container 3' is maintained in a sealed state by the protective cover 5' or the sample plate 1' stacked immediately above. Evaporation of moisture from Sample 2 is prevented. Further, even after the sample is attached, each sample plate 1' is sealed by the sample plate cover 13, so that moisture from the sample 2 is prevented from evaporating. In addition, since evaporation of moisture from the used sample 2 is prevented in this state, the sample 2 can be reused for re-inspection or the like. Furthermore, since no member is located between the sample attachment position A and the sample application position B, the distance between both positions A and B is shortened, and as a result, the travel time of the application destination 9 is shortened, and the application destination 9 The sample 2 adhered to the substrate 10 does not need to be dried much before being coated on the support 10.

尚、上記実施例の場合、試料皿収納容器3′内
に試料皿1′が水平状態で落下し得るようにする
ために上部開口3′aと内側寸法を試料皿1′の外
側寸法とほぼ同じにしているが、その代りに第3
図に示した如く試料皿1′の左右端にU字状の凹
部1′dを設け且つ試料皿収納容器3′の左右内壁
に該凹部1′dが嵌合し得る図示しない鉛直ガイ
ドを設けても良い。
In the case of the above embodiment, in order to allow the sample plate 1' to fall horizontally into the sample plate storage container 3', the inner dimensions of the upper opening 3'a are approximately the same as the outer dimensions of the sample plate 1'. the same, but instead the third
As shown in the figure, U-shaped recesses 1'd are provided at the left and right ends of the sample dish 1', and vertical guides (not shown) into which the recesses 1'd can fit are provided on the left and right inner walls of the sample dish storage container 3'. It's okay.

[発明の効果] 本発明の電気泳動用試料皿によれば、試料から
水分の蒸発を防いで電気泳動装置に供給すること
ができる。
[Effects of the Invention] According to the electrophoresis sample dish of the present invention, the sample can be supplied to an electrophoresis apparatus while preventing moisture from evaporating from the sample.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図Aは本発明の試料皿の一実施例の斜視
図、第1図Bは第1図Aの横断面図、第2図は本
発明の試料皿を使用した試料供給装置の垂直断面
図、第3図は本発明の試料皿の他の実施例の斜視
図、第4図は従来の試料皿の斜視図、第5図は従
来の試料皿を使用した試料供給装置の垂直断面図
である。 1′……試料皿、1′a……分注用凹部、1′b
……傾斜部、2……試料。
FIG. 1A is a perspective view of an embodiment of the sample dish of the present invention, FIG. 1B is a cross-sectional view of FIG. 1A, and FIG. 2 is a vertical cross-section of a sample supply device using the sample dish of the present invention. 3 is a perspective view of another embodiment of the sample dish of the present invention, FIG. 4 is a perspective view of a conventional sample dish, and FIG. 5 is a vertical sectional view of a sample supply device using a conventional sample dish. It is. 1'...Sample dish, 1'a...Dispensing recess, 1'b
...Slope part, 2...Sample.

Claims (1)

【特許請求の範囲】[Claims] 1 試料を収納するための複数の凹部を有する試
料皿の縁部に、複数の試料皿を重ねて収納する試
料皿収納容器に設けた試料皿排出用開口の方向
に、試料皿カバーを押し上げるための傾斜部を設
けたことを特徴とする電気泳動用試料皿。
1. To push up the sample plate cover in the direction of the sample plate discharge opening provided in the sample plate storage container that stores multiple sample plates stacked on the edge of the sample plate that has multiple recesses for storing samples. A sample dish for electrophoresis, characterized in that it is provided with an inclined part.
JP61251053A 1986-10-22 1986-10-22 Sample tray for electrophoresis Granted JPS62142259A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61251053A JPS62142259A (en) 1986-10-22 1986-10-22 Sample tray for electrophoresis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61251053A JPS62142259A (en) 1986-10-22 1986-10-22 Sample tray for electrophoresis

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP13773979A Division JPS5661641A (en) 1979-05-11 1979-10-26 Sample feeder

Publications (2)

Publication Number Publication Date
JPS62142259A JPS62142259A (en) 1987-06-25
JPS6323502B2 true JPS6323502B2 (en) 1988-05-17

Family

ID=17216917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61251053A Granted JPS62142259A (en) 1986-10-22 1986-10-22 Sample tray for electrophoresis

Country Status (1)

Country Link
JP (1) JPS62142259A (en)

Also Published As

Publication number Publication date
JPS62142259A (en) 1987-06-25

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