JPS63228733A - Cutting method for semiconductor substrate - Google Patents
Cutting method for semiconductor substrateInfo
- Publication number
- JPS63228733A JPS63228733A JP62062911A JP6291187A JPS63228733A JP S63228733 A JPS63228733 A JP S63228733A JP 62062911 A JP62062911 A JP 62062911A JP 6291187 A JP6291187 A JP 6291187A JP S63228733 A JPS63228733 A JP S63228733A
- Authority
- JP
- Japan
- Prior art keywords
- film
- semiconductor substrate
- cutting
- chips
- organic film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 31
- 238000005520 cutting process Methods 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000004065 semiconductor Substances 0.000 title claims abstract description 24
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 22
- 238000005406 washing Methods 0.000 claims abstract description 4
- 239000000853 adhesive Substances 0.000 abstract description 5
- 230000001070 adhesive effect Effects 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000003892 spreading Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 6
- 238000002161 passivation Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- -1 diazide compound Chemical class 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 229920002085 Dialdehyde starch Polymers 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- SOCTUWSJJQCPFX-UHFFFAOYSA-N dichromate(2-) Chemical compound [O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O SOCTUWSJJQCPFX-UHFFFAOYSA-N 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 150000004676 glycans Chemical class 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000010137 moulding (plastic) Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 229920001282 polysaccharide Polymers 0.000 description 1
- 239000005017 polysaccharide Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
Landscapes
- Dicing (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は半導体基板を特定の機能を有するチップに分割
するために前記半導体基板を切断する方法に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method of cutting a semiconductor substrate in order to divide the substrate into chips having specific functions.
従来の技術
半導体集積回路の高性能化、低価格化にともない、組立
工程の製品にかかるコスト、性能2歩留りに与える効果
は無視できない。組立工程フローチャートは一般に第2
図のようになり、ウェハをチップに分割するベレタイズ
工程、チップをIJ−ドフV−ム上のタブに固着し、チ
ップ上の電極とリードフレーム間を配線する工程、そし
て樹脂により封止する工程から成る。現在一般に実用化
されているダイシング工程を第3図に示す。半導体基板
1を粘着シート3に貼り付けた後、高速回転する薄い円
板(ブレード)により、チップ6のカッティングライン
4にそって切シ込みを入れる。BACKGROUND OF THE INVENTION As the performance of semiconductor integrated circuits increases and their prices decrease, the effects of the assembly process on product costs and performance2 yields cannot be ignored. The assembly process flowchart is generally the second
As shown in the figure, there is a veretizing process in which the wafer is divided into chips, a process in which the chips are fixed to the tabs on the IJ dome, a process in which the electrodes on the chips and the lead frame are wired, and a process in which the wafer is sealed with resin. Consists of. FIG. 3 shows a dicing process that is currently in practical use. After the semiconductor substrate 1 is attached to the adhesive sheet 3, a cut is made along the cutting line 4 of the chip 6 using a thin disk (blade) rotating at high speed.
切り込み量によりハーフカット、セミフルカット。Half cut or semi-full cut depending on the depth of cut.
フルカットの3モードがある。ハーフカットは基板厚さ
の約半分まで切り込むもので、チップ6に分割するには
ブレーキングが必要である。下半分はへき開となり、ブ
レーキング後貼シ付はシートをひき伸ばす必要がある。There are 3 full cut modes. A half cut is a cut to about half the thickness of the substrate, and breaking is required to divide it into chips 6. The bottom half will be cleaved, and the sheet will need to be stretched to attach the patch after braking.
セミフルカットは、ダイシング中に切残部にクラックが
入るため、ブレーキング、引き伸ばしは特に必要としな
い。フルカットは粘着シート3まで切り込み、チップを
完全に分割する。いずれの場合でも切屑6が発生し、前
述のブレードの冷却と切屑5の除去をかねて純水をかけ
る方法がとられており、特に切断後は基板金属に付着し
た切屑除去の為、高圧純水を基板全面に当てる事を実施
している。Semi-full cutting does not require any special braking or stretching because cracks will form in the uncut portion during dicing. Full cut cuts down to adhesive sheet 3 and completely divides the chip. In either case, chips 6 are generated, and a method is used in which pure water is applied to both cool the blade and remove the chips 5 mentioned above.Especially after cutting, high-pressure pure water is used to remove chips attached to the substrate metal. is applied to the entire surface of the board.
発明が解決しようとする問題点
半導体基板の切断時における切屑は、はとんどがその基
板屑であり、時にはブレードの成分である事もある。大
きな切屑は、ブレードと基板との摩擦により生ずる発熱
によるブレードの切れ味低下を防ぐ冷却の為の純水によ
って流される。しかし、サブミクロンから数ミクロンに
至る無数の切屑は流される事なく、はとんどが基板表面
に取シ残される。一方、基板表面は通常パシベーション
膜と呼ばれる酸化膜や窒化膜あるいはポリイミドのよう
な高分子膜等で、パッド部、つまりワイヤボンディング
を行なう部分のみを除いては、被覆されている。従って
前述の切屑は、パシベーション膜の上か、パッド部つま
りアルミ金属部上に残渣として残る。通常それらを除去
する為に、純水にかなシの圧力をかけて、純水と共に流
し去る方法をとる。しかし、切屑の付着力はかなシ強く
、1oOボンド/平方インチ以上の高圧純水でないと流
れない。この程度の高圧になると、例えば電荷転送素子
による固体撮像板の場合だと白点欠陥が増加するという
悪い現象が見られ、ますます微細化するLSIチップに
対しても絶縁破壊等の悪い影響を及ぼす。従って、現在
の組立工程においては、はとんどのチップ上に微小な切
屑が残っている。この小さな切屑は以下の問題点を持つ
。Problems to be Solved by the Invention Chips generated during cutting of a semiconductor substrate are mostly substrate scraps, and sometimes are components of the blade. Large chips are washed away by pure water for cooling purposes, which prevents the sharpness of the blade from deteriorating due to heat generation caused by friction between the blade and the substrate. However, countless chips ranging in size from submicrons to several microns are not washed away, and most of them are left behind on the substrate surface. On the other hand, the surface of the substrate is usually covered with an oxide film, nitride film, or polymer film such as polyimide called a passivation film, except for the pad portion, that is, the portion where wire bonding is performed. Therefore, the aforementioned chips remain as residue on the passivation film or on the pad portion, that is, the aluminum metal portion. Usually, in order to remove them, a method is used in which a large amount of pressure is applied to the pure water and they are washed away together with the pure water. However, the adhesion of the chips is very strong and will only flow with high-pressure pure water of 100 bonds/square inch or more. At this level of high voltage, for example, in the case of a solid-state image sensor using a charge transfer element, a negative phenomenon such as an increase in white spot defects is observed, and it also has negative effects such as dielectric breakdown on LSI chips, which are becoming smaller and smaller. affect Therefore, in current assembly processes, tiny chips remain on most chips. These small chips have the following problems.
(イ)パッド上の切屑は、次工程のワイヤボンディング
時にワイヤとパッド電極のボンディング力の低下や、ボ
ンディング不良を発生し、長期信頼性という点からも疑
問が残る。(a) Chips on the pad reduce the bonding force between the wire and the pad electrode during the next process of wire bonding, and cause bonding defects, leaving doubts about long-term reliability.
(ロ)パシベーション膜上の切屑は、封止工程において
、特にプラスチックモールドにおいて、切屑が半導体基
板と同質である為、モールド時に切屑がパシベーション
膜に入シ込んでパシベーション特性を劣化させ、信頼性
不良が発生する。(b) Chips on the passivation film are the same as the semiconductor substrate during the sealing process, especially in plastic molding, so the chips enter the passivation film during molding and deteriorate the passivation characteristics, resulting in poor reliability. occurs.
本発明は、上述の問題点に鑑みて為されたもので、切断
時の切屑を別種の膜上に付着させ、純水浸漬だけでも、
簡単に除去させる事が出来る半導体基板の切断方法を提
供する事を目的とする。The present invention has been made in view of the above-mentioned problems, and it allows cutting chips to adhere to a different type of membrane, and even by immersion in pure water,
It is an object of the present invention to provide a method for cutting a semiconductor substrate that can be easily removed.
問題点を解決する為の手段
本発明は、上述の問題点を解決するため、半導体基板の
切断前に、水溶性有機膜を塗布し、切断後に純水で水洗
するという方法を採るものである。Means for Solving the Problems In order to solve the above-mentioned problems, the present invention employs a method in which a water-soluble organic film is applied before cutting the semiconductor substrate, and after cutting it is washed with pure water. .
作 用
本発明は、上述の構成によって、水溶性有機膜上に、切
断切屑が飛び散り、後工程の純水水洗によって水溶性有
機膜ごと切屑を全て除去しうる事が可能となる。Effects According to the present invention, with the above-described configuration, cutting chips are scattered on the water-soluble organic film, and all of the cutting chips can be removed together with the water-soluble organic film by washing with pure water in the subsequent step.
実施例
第1図に本発明の実施例によるダイシング工程の概略を
示す。先ず半導体基板1上に水溶性有機膜2を塗布する
。水溶性有機膜としては、多糖体。Embodiment FIG. 1 schematically shows a dicing process according to an embodiment of the present invention. First, a water-soluble organic film 2 is applied onto a semiconductor substrate 1 . Polysaccharides are used as water-soluble organic films.
たんばく質、ポリビニルピロリドン、ポリビニルアルコ
ール等を用い、更に水への溶解速度を調整するためのジ
アルデヒドデンプン、重クロム酸塩。Using proteins, polyvinylpyrrolidone, polyvinyl alcohol, etc., and dialdehyde starch and dichromate to adjust the dissolution rate in water.
ジアジド化合物、アジド化合物、アルデヒド化合物など
と、水から構成すれば良い。塗布方法としては、半導体
基板1を真空吸着して前記水溶性有機膜2を適量たらし
た後、基板を高速回転して薄く引き伸ばすと良い。例え
ば半導体基板が3インチ位の直径であれば、1000程
度の溶液で500〜5000回転/抄する事によって、
1〜5μm程度の厚みに塗布する事が出来る。もちろん
噴霧状にしてスプレー塗布しても何らさしつかえない。It may be composed of a diazide compound, an azide compound, an aldehyde compound, etc., and water. As a coating method, it is preferable to apply vacuum suction to the semiconductor substrate 1 to deposit an appropriate amount of the water-soluble organic film 2 thereon, and then rotate the substrate at high speed to stretch it thinly. For example, if the semiconductor substrate has a diameter of about 3 inches, by using a solution of about 1000 and spinning at 500 to 5000 revolutions/paper,
It can be applied to a thickness of about 1 to 5 μm. Of course, there is nothing wrong with applying it in the form of a spray.
但し、有機膜自体にダストが混入して半導体基板に、何
らかの悪影響を及ぼす事のないよう、金属イオンの含有
量を全てについて1 ppm以下にし、又溶液を塗布前
に少なくとも0.2μm程度のフィルターで濾過して、
後工程での水洗残りが出来ないようにしておいた方が良
い。However, in order to prevent dust from entering the organic film itself and having any adverse effect on the semiconductor substrate, the content of metal ions should be kept below 1 ppm in all cases, and a filter of at least 0.2 μm should be filtered before applying the solution. Filter it with
It is better to prevent water residue from forming in the subsequent process.
次に半導体基板1を粘着シート3に貼り付ける。Next, the semiconductor substrate 1 is attached to the adhesive sheet 3.
その後、高速回転するブレードによって半導体基板1の
カッティングライン4に沿って切り込みを入れて切断す
る。ブレードには、通常、純水をかけて、半導体基板と
の摩擦による熱の発生を押さえる。これは又、ブレード
に水溶性有機膜2がブレードに付着して切り味を落とす
事を妨げる。つまり付着した有機膜は純水で洗い落とさ
れる為である。このように、カッティングライン4領域
近辺以外は、切断によって生じた切屑5が全て水溶性有
機膜2上に残る事になる。その後、純水を流水させ、水
溶性有機膜2を溶融させ洗い流す事により、膜上の切屑
を膜と共にリフトオンして全て除去する事が可能となり
、d図に示すように、良好なチップ6の分割が出来る。Thereafter, the semiconductor substrate 1 is cut by cutting along the cutting line 4 with a blade rotating at high speed. The blade is usually sprayed with pure water to suppress the generation of heat due to friction with the semiconductor substrate. This also prevents the water-soluble organic film 2 from adhering to the blade and impairing its cutting quality. In other words, the attached organic film is washed away with pure water. In this way, all the chips 5 generated by cutting remain on the water-soluble organic film 2 except in the vicinity of the cutting line 4 region. After that, by running pure water to melt and wash away the water-soluble organic film 2, it becomes possible to lift-on and remove all the chips on the film together with the film, resulting in a good chip 6 as shown in Figure d. Can be divided.
発明の効果
以上の説明から明らかなように、本発明は半導体基板を
チップに切断する前に、水溶性有機膜を全面に塗布する
事によって、切断時の切屑を有機膜上に集める事が出来
純水水洗で前記切屑が水溶性有機膜と共に、完全に除去
されるという効果を持つものである。更に、簡単なる流
水水洗で有機膜を除去出来、従来のように切屑を飛ばす
為の高圧純水を必要としない。このように切屑を非常に
簡単な方法で完全に除去出来る為、組立工程の歩留りの
改善と信頼性の向上をはかる事も出来る。Effects of the Invention As is clear from the above explanation, the present invention is capable of collecting cutting chips on the organic film by applying a water-soluble organic film to the entire surface of the semiconductor substrate before cutting it into chips. This has the effect that the chips are completely removed together with the water-soluble organic film by washing with pure water. Furthermore, the organic film can be removed by simple rinsing with running water, and there is no need for high-pressure pure water to blow away chips as in the conventional method. In this way, since chips can be completely removed in a very simple manner, it is possible to improve the yield and reliability of the assembly process.
第1図は本発明の実施例の工程断面図、第2図は通常の
組立工程の70−チャート図、第3図は従来のカッティ
ング工程を示す図である。
1 ・・・・半導体基板、2・・・・・・水溶性有機膜
、3・・・・・・粘着シート、4・・・・・・カッティ
ングライン、6・・・・・・切屑、6・・・・チップ。
代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図
カッティングライン
第2図FIG. 1 is a sectional view of a process according to an embodiment of the present invention, FIG. 2 is a 70-chart diagram of a normal assembly process, and FIG. 3 is a diagram showing a conventional cutting process. 1... Semiconductor substrate, 2... Water-soluble organic film, 3... Adhesive sheet, 4... Cutting line, 6... Chips, 6 ...chip. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Diagram cutting line diagram 2
Claims (1)
板の一主面に水溶性有機膜を塗布する工程と、前記半導
体基板をそのカッティングラインに沿って高速回転する
薄板円板で切断する工程と、前記切断された半導体基板
を純水で水洗する工程とから成る事を特徴とする半導体
基板の切断方法。a step of applying a water-soluble organic film to one main surface of a semiconductor substrate on which a semiconductor device having a specific function is formed; a step of cutting the semiconductor substrate along the cutting line with a thin disk rotating at high speed; A method for cutting a semiconductor substrate, comprising the step of washing the cut semiconductor substrate with pure water.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62062911A JPS63228733A (en) | 1987-03-18 | 1987-03-18 | Cutting method for semiconductor substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62062911A JPS63228733A (en) | 1987-03-18 | 1987-03-18 | Cutting method for semiconductor substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63228733A true JPS63228733A (en) | 1988-09-22 |
Family
ID=13213911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62062911A Pending JPS63228733A (en) | 1987-03-18 | 1987-03-18 | Cutting method for semiconductor substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63228733A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02127004A (en) * | 1988-11-08 | 1990-05-15 | Fujitsu Ltd | Manufacture of semiconductor chip |
KR970033654A (en) * | 1995-12-30 | 1997-07-22 | 이대원 | Workpiece cutting method |
WO2024080255A1 (en) * | 2022-10-11 | 2024-04-18 | 株式会社レゾナック | Method for producing semiconductor device |
WO2024080253A1 (en) * | 2022-10-11 | 2024-04-18 | 株式会社レゾナック | Method for producing semiconductor device |
-
1987
- 1987-03-18 JP JP62062911A patent/JPS63228733A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02127004A (en) * | 1988-11-08 | 1990-05-15 | Fujitsu Ltd | Manufacture of semiconductor chip |
KR970033654A (en) * | 1995-12-30 | 1997-07-22 | 이대원 | Workpiece cutting method |
WO2024080255A1 (en) * | 2022-10-11 | 2024-04-18 | 株式会社レゾナック | Method for producing semiconductor device |
WO2024080253A1 (en) * | 2022-10-11 | 2024-04-18 | 株式会社レゾナック | Method for producing semiconductor device |
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