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JPS63188783A - Logic analyzer - Google Patents

Logic analyzer

Info

Publication number
JPS63188783A
JPS63188783A JP62020763A JP2076387A JPS63188783A JP S63188783 A JPS63188783 A JP S63188783A JP 62020763 A JP62020763 A JP 62020763A JP 2076387 A JP2076387 A JP 2076387A JP S63188783 A JPS63188783 A JP S63188783A
Authority
JP
Japan
Prior art keywords
time width
analyzed
detection part
prescribed
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62020763A
Other languages
Japanese (ja)
Inventor
Hiroshi Tanuma
田沼 博志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62020763A priority Critical patent/JPS63188783A/en
Publication of JPS63188783A publication Critical patent/JPS63188783A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To analyze a logic waveform flexibly by detecting a fact that a prescribed logic relation holds among input two binary signals to be analyzed for longer time than a prescribed time. CONSTITUTION:A logic relation establishment detection part 10, a time width detection part 20, and an analytic object selection part 30 are provided. Then the detection part 10 detects the setting of a prescribed logic relation among plural input binary signals I1, I2, I3...In to be analyzed and supplies its detection output to the detection part 20. The detection part 20 detects whether or not the logic relation detected by the detection part 10 continuing to prescribed time width and supplies its detection result as a trigger signal TR to the selection part 30. The selection part 30 selects a prescribed input signal to be analyzed among input binary signal groups I1-In to start analyzing the input signal or recording a waveform for subsequent analyses.

Description

【発明の詳細な説明】 発明の目的 産業上の利用分野 本発明は、ディジタル回路のテストなどに使用されるロ
ジック・アナライザに関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a logic analyzer used for testing digital circuits and the like.

従来の技術 従来、ディジタル回路のテストなどに利用されるロジッ
ク・アナライザは、解析対象の複数の入力二値信号の間
に所定の論理積が成立したことを検出し、この検出出力
をトリガとして解析対象の信号波形を選択している。
Conventional technology Conventionally, logic analyzers used for testing digital circuits detect when a predetermined AND is established between multiple input binary signals to be analyzed, and use this detection output as a trigger for analysis. The target signal waveform is selected.

発明が解決しようとする問題点 上記従来のロジック・アナライザは、所定の論理積の成
否だけから解析対象選択用トリガを発生させるか否かを
決定しているので、波形の変化点で生ずる過渡的な状態
に対してトリガがかかってしまうなど柔軟性にかけると
いう問題がある。
Problems to be Solved by the Invention The conventional logic analyzer described above determines whether or not to generate an analysis target selection trigger based only on the success or failure of a predetermined logical product. There is a problem with flexibility, such as triggers being applied in certain situations.

問題点を解決するための手段 本発明のロジック・アナライザは、解析対象の複数の大
カニ値信号の間に所定の論理関係が成立したことを検出
する論理関係成立検出部と、この検出された論理関係が
所定時間幅にわたって続いたことを検出する時間幅検出
部と、この時間幅検出部の検出出力をトリガとして解析
対象の入力信号を選択する入力信号選択部とを備えるこ
とにより、トリガのかけ方に柔軟性を持たせるように構
成されている。
Means for Solving the Problems The logic analyzer of the present invention includes a logical relationship establishment detection unit that detects that a predetermined logical relationship is established between a plurality of large value signals to be analyzed, and By including a time width detection unit that detects that a logical relationship has continued over a predetermined time width, and an input signal selection unit that uses the detection output of this time width detection unit as a trigger to select an input signal to be analyzed, the trigger can be It is designed to give flexibility in how it is applied.

以下、本発明の作用を実施例と共に詳細に説明する。Hereinafter, the operation of the present invention will be explained in detail together with examples.

実施例 第1図は、本発明の一実施例のロジック・アナライザの
構成を示すブロック図である。
Embodiment FIG. 1 is a block diagram showing the configuration of a logic analyzer according to an embodiment of the present invention.

このロジック・アナライザは、論理関係成立検出部10
と、時間幅検出部20と、解析対象選択部30とを備え
ている。
This logic analyzer includes a logical relationship establishment detection section 10
, a time width detection section 20 , and an analysis target selection section 30 .

論理関係成立検出部10は、解析対象の複数の大カニ値
信号1..I2,1.  ・・・11の間に所定の論理
関係が成立したことを検出し、検出出力を時間幅検出部
20に供給する。時間幅検出部20は、論理関係成立検
出部10で検出された論理関係が所定時間幅にわたって
続いたかどうかを・検出し、検出結果をトリガ信号TR
として解析対象選択部30に供給する。解析対象選択部
30は、時間幅検出部20からのトリガと信号TRに基
づき上記人カニ値信号群■1〜I7から所定の解析対象
の入力信号を選択し、その解析を開始したり、のちの解
析に備えた波形の記録などを開始する。
The logical relationship establishment detection unit 10 detects a plurality of large crab value signals 1. .. I2,1. . . . 11, it is detected that a predetermined logical relationship is established, and the detection output is supplied to the time width detection section 20. The time width detection unit 20 detects whether the logical relationship detected by the logical relationship establishment detection unit 10 continues for a predetermined time width, and sends the detection result to the trigger signal TR.
It is supplied to the analysis target selection unit 30 as The analysis target selection unit 30 selects a predetermined input signal to be analyzed from the human value signal group ■1 to I7 based on the trigger and signal TR from the time width detection unit 20, and starts its analysis. Start recording waveforms in preparation for future analysis.

第2図と第3図は、第1図の論理関係成立検出部10と
時間幅検出部20の構成の一例を示すブロック図である
。これらの回路は、大カニ値信号l、と■2の間に、I
、ll2=″1”という論理関係が3クロック周期にわ
たって成立した時にトリガ信号TRが発生する例を示す
FIGS. 2 and 3 are block diagrams showing an example of the configuration of the logical relationship establishment detection section 10 and the time width detection section 20 shown in FIG. 1. These circuits have I
, ll2=“1” is established for three clock cycles, the trigger signal TR is generated.

まず、論理関係成立検出部10は、第2図に示すように
、n個の論理回路11,12.13・・・・1nと、3
人カアンドゲートAとで構成される。この検出部10に
おいて、II*I2=“1”の論理が成立した時に検出
信号りが出力されるように、i、=l11fl、i2=
“o”、’sl−’s2−“1”、Is3〜+sn−“
0”が設定される。
First, as shown in FIG. 2, the logic relationship establishment detection unit 10 detects n logic circuits 11, 12.
It consists of a person and a gate A. In this detection unit 10, i,=l11fl, i2=
"o", 'sl-'s2-"1", Is3~+sn-"
0'' is set.

一方、時間幅検出部20は、第3図に示すように、m個
の遅延フリップ・フロップ21〜2mと、3人カアンド
ゲートAと、遅延フリップ・フロップDとから構成され
ている。t、=j2=t3=“0”、L4〜t、−“1
”と設定することにより、前段の3個のフリップ・フロ
ップ21〜23についてだけその出力の初期値が“0”
となるようにプリセットされる。検出信号りがクロック
信号CKの周期の3倍の期間にわたって“1”になると
、3人カアンドゲートAの出力が“1”となり、遅延フ
リップ・フロップDから出力されるトリガ信号TRが“
1”となる。
On the other hand, the time width detection section 20 is composed of m delay flip-flops 21 to 2m, a three-man AND gate A, and a delay flip-flop D, as shown in FIG. t,=j2=t3="0", L4~t,-"1
”, the initial value of the output of the three flip-flops 21 to 23 in the previous stage is set to “0”.
It is preset so that When the detection signal R becomes "1" for a period three times the period of the clock signal CK, the output of the three-man AND gate A becomes "1", and the trigger signal TR output from the delay flip-flop D becomes "1".
1”.

第4図は、上記TR信号発生のタイムチャートである。FIG. 4 is a time chart of the generation of the TR signal.

信号りがクロック信号CKの3周期以上の期間にわたっ
て1”になると、トリガ信号TRが“0”から“1”に
i変化する。
When the signal becomes 1 for a period of three or more cycles of the clock signal CK, the trigger signal TR changes from "0" to "1".

以上、入力信号間に成立する所定の論理関係として2人
力体号の間に論理積が成立する場合を例示したが、その
ような論理関係は2以上の入力信号の間に成立する論理
積や論理和を含む任意のものでよい。
Above, we have exemplified the case where a logical product holds true between two human power figures as a predetermined logical relationship that holds true between input signals, but such a logical relationship can also be a logical product that holds true between two or more input signals. Any value including logical sum may be used.

発明の効果 以上詳細に説明したように、本発明のロジック・アナラ
イザは、解析対象の複数の入力二値信号の間に所定の論
理関係が所定時間以上にわたって成立したことを検出し
、この検出出力をトリガとして解析対象の入力信号を選
択する構成であるから、波形の変化点における過渡的な
状態を除くなど柔軟性の高いロジック波形の解析を実現
できるという効果がある。
Effects of the Invention As explained in detail above, the logic analyzer of the present invention detects that a predetermined logical relationship has been established between a plurality of input binary signals to be analyzed over a predetermined period of time, and outputs this detection output. Since the input signal to be analyzed is selected using the input signal as a trigger, it is effective in realizing highly flexible analysis of logic waveforms, such as eliminating transient states at waveform change points.

特に、入力信号がダイナミックに変化している場合でも
トリガのかけ方が容易になるという効果がある。
In particular, this has the effect of making it easier to apply a trigger even when the input signal is dynamically changing.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のロジック・アナライザの構
成を示すブロック図、第2図は第1図の論理関係成立検
出部10の構成の一例を示す論理回路図、第3図は第1
図の時間幅検出部20の構成の一例を示す論理回路図、
第4図は第2図と第3図の論理回路の動作を説明するた
めのタイミングチャートである。 10・・・論理関係成立検出部、20・・・時間幅検出
部、30・・・解析対象選択部。
FIG. 1 is a block diagram showing the configuration of a logic analyzer according to an embodiment of the present invention, FIG. 2 is a logic circuit diagram showing an example of the configuration of the logical relationship establishment detection section 10 of FIG. 1, and FIG. 1
A logic circuit diagram showing an example of the configuration of the time width detection unit 20 shown in the figure,
FIG. 4 is a timing chart for explaining the operation of the logic circuits of FIGS. 2 and 3. 10... Logical relationship establishment detection unit, 20... Time width detection unit, 30... Analysis target selection unit.

Claims (1)

【特許請求の範囲】 解析対象の複数の入力二値信号の間に所定の論理関係が
成立したことを検出する論理関係成立検出部と、 この検出された論理関係が所定時間幅にわたって続いた
ことを検出する時間幅検出部と、 この時間幅検出部の検出出力をトリガとして解析対象の
入力信号を選択する入力信号選択部とを備えたことを特
徴とするロジック・アナライザ。
[Claims] A logical relationship establishment detection unit that detects that a predetermined logical relationship is established between a plurality of input binary signals to be analyzed, and that the detected logical relationship continues for a predetermined time width. What is claimed is: 1. A logic analyzer comprising: a time width detection section that detects the time width detection section; and an input signal selection section that selects an input signal to be analyzed using the detection output of the time width detection section as a trigger.
JP62020763A 1987-01-31 1987-01-31 Logic analyzer Pending JPS63188783A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62020763A JPS63188783A (en) 1987-01-31 1987-01-31 Logic analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62020763A JPS63188783A (en) 1987-01-31 1987-01-31 Logic analyzer

Publications (1)

Publication Number Publication Date
JPS63188783A true JPS63188783A (en) 1988-08-04

Family

ID=12036219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62020763A Pending JPS63188783A (en) 1987-01-31 1987-01-31 Logic analyzer

Country Status (1)

Country Link
JP (1) JPS63188783A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6611934B2 (en) 1988-09-07 2003-08-26 Texas Instruments Incorporated Boundary scan test cell circuit
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6763485B2 (en) 1998-02-25 2004-07-13 Texas Instruments Incorporated Position independent testing of circuits
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6611934B2 (en) 1988-09-07 2003-08-26 Texas Instruments Incorporated Boundary scan test cell circuit
US6813738B2 (en) 1988-09-07 2004-11-02 Texas Instruments Incorporated IC test cell with memory output connected to input multiplexer
US6763485B2 (en) 1998-02-25 2004-07-13 Texas Instruments Incorporated Position independent testing of circuits
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter

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