JPS63172976U - - Google Patents
Info
- Publication number
- JPS63172976U JPS63172976U JP6636187U JP6636187U JPS63172976U JP S63172976 U JPS63172976 U JP S63172976U JP 6636187 U JP6636187 U JP 6636187U JP 6636187 U JP6636187 U JP 6636187U JP S63172976 U JPS63172976 U JP S63172976U
- Authority
- JP
- Japan
- Prior art keywords
- reflector
- rotation axis
- reflective surface
- detector
- ect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Details Of Measuring And Other Instruments (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
第1図は本考案の1実施例を示した全体斜視図
、第2図はその要部斜視図、第3図はその要部断
面図、第4図は他の実施例を示した要部斜視図、
第5図はさらに別の実施例を示した要部斜視図、
第6図はその断面図である。
3は検出器、4はスタンド、5は光源、6は第
1反射体、7は第2反射体、8は反射体支持板で
ある。
Fig. 1 is an overall perspective view showing one embodiment of the present invention, Fig. 2 is a perspective view of its main parts, Fig. 3 is a sectional view of its main parts, and Fig. 4 is a main part showing another embodiment. Perspective view,
FIG. 5 is a perspective view of main parts showing yet another embodiment;
FIG. 6 is a sectional view thereof. 3 is a detector, 4 is a stand, 5 is a light source, 6 is a first reflector, 7 is a second reflector, and 8 is a reflector support plate.
Claims (1)
いしシンチレーシヨンカメラが被検体の回りを回
転するECT装置において、平行で細束な光線を
発生する投光点源と、回転可能な第1反射体と、
第1反射体の反射面に平行な反射面を有する第2
反射体とを具有していることを特徴とする、EC
T位置決め機構。 (2) スタンドから延びた支持腕により検出器な
いしシンチレーシヨンカメラが被検体の回りを回
転するECT装置において、平行で細束な光線を
発生し検出器回転軸上に配設された投光点源と、
検出器回転軸上で前後に移動可能でかつ回転可能
に配設された第1反射体と、第1反射体の反射面
を平行な反射面を内面に有する第2円錐形反射体
とを具有して、検出器回転軸上の光線と同心の環
状光線がその回転軸より半径距離可変で照射され
ることを特徴とする、ECT位置決め機構。 (3) 第1反射体が外面に反射面を有する円錐体
であり、検出器回転軸に対し垂直に変位可能であ
ることを特徴とする、実用新案登録請求の範囲第
2項に記載のECT位置決め機構。[Claims for Utility Model Registration] (1) In an ECT device in which a detector or scintillation camera rotates around a subject by a support arm extending from a stand, a point source that emits parallel and narrow beams of light; , a rotatable first reflector;
A second reflector having a reflective surface parallel to the reflective surface of the first reflector.
An EC characterized by comprising a reflector.
T positioning mechanism. (2) In an ECT device in which a detector or scintillation camera rotates around the subject using a support arm extending from a stand, a light emitting point that generates parallel, narrow beams and is located on the detector rotation axis. source and
A first reflector that is movable back and forth and rotatably disposed on the detector rotation axis, and a second conical reflector that has a reflective surface parallel to the reflective surface of the first reflector on its inner surface. An ECT positioning mechanism characterized in that an annular light beam concentric with a light beam on a detector rotation axis is irradiated with a variable radial distance from the rotation axis. (3) The ECT according to claim 2 of the utility model registration claim, characterized in that the first reflector is a cone having a reflective surface on its outer surface and is displaceable perpendicularly to the detector rotation axis. Positioning mechanism.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6636187U JPS63172976U (en) | 1987-04-30 | 1987-04-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6636187U JPS63172976U (en) | 1987-04-30 | 1987-04-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63172976U true JPS63172976U (en) | 1988-11-10 |
Family
ID=30904297
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6636187U Pending JPS63172976U (en) | 1987-04-30 | 1987-04-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63172976U (en) |
-
1987
- 1987-04-30 JP JP6636187U patent/JPS63172976U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS63172976U (en) | ||
US4171882A (en) | Light reflective projection system | |
JPS63172977U (en) | ||
JPS58193453U (en) | Backscattered electron detection device in electron beam equipment | |
JPS5937772Y2 (en) | Optical system fine adjustment device | |
JPS5839599A (en) | Earth imitation device | |
JPS6218831U (en) | ||
JPS62150613U (en) | ||
JPH0269740U (en) | ||
JP2604663Y2 (en) | Stage lighting equipment | |
JPH043314U (en) | ||
JPS63172978U (en) | ||
JPS5916824Y2 (en) | Optical axis adjustment mechanism for optical detection devices, etc. | |
JPS62150614U (en) | ||
JPS6432241U (en) | ||
JPS61152969U (en) | ||
JPS63184058U (en) | ||
JPS6222512U (en) | ||
JPH0181622U (en) | ||
JPS63102018U (en) | ||
JPS61174018U (en) | ||
JPS6297990U (en) | ||
JPS5987688U (en) | Slice plane positioning device for scintillation camera | |
JPH01131108U (en) | ||
JPH0167554U (en) |