JPS6312379B2 - - Google Patents
Info
- Publication number
- JPS6312379B2 JPS6312379B2 JP55132597A JP13259780A JPS6312379B2 JP S6312379 B2 JPS6312379 B2 JP S6312379B2 JP 55132597 A JP55132597 A JP 55132597A JP 13259780 A JP13259780 A JP 13259780A JP S6312379 B2 JPS6312379 B2 JP S6312379B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- transfer
- carrier jig
- wafer carrier
- processing table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000003491 array Methods 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 169
- 239000012530 fluid Substances 0.000 description 12
- 239000004809 Teflon Substances 0.000 description 8
- 229920006362 Teflon® Polymers 0.000 description 8
- 238000002347 injection Methods 0.000 description 7
- 239000007924 injection Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000005339 levitation Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67784—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Registering Or Overturning Sheets (AREA)
Description
【発明の詳細な説明】
半導体装置の製造プロセスにおける拡散処理工
程では、薄板状のシリコンウエハをウエハキヤリ
ヤ治具(25枚のウエハを収納するテフロン等から
なる治具)から取り出し、100枚以上のウエハを
ウエハ処理載置台の溝へ立てて載置し、加熱炉内
へ導き所望の処理を行ない、処理後のウエハをウ
エハキヤリヤ治具へ炉外で移し替える作業がくり
かえして行なわれる。本発明はこのように薄板状
の物品、たとえば半導体装置の製造に使用するウ
エハ移し替え装置に関するものである。[Detailed Description of the Invention] In the diffusion treatment step in the semiconductor device manufacturing process, a thin silicon wafer is taken out from a wafer carrier jig (a jig made of Teflon or the like that accommodates 25 wafers), and more than 100 wafers are removed. The wafer is placed upright in the groove of a wafer processing table, guided into a heating furnace, subjected to desired processing, and the processed wafer is transferred to a wafer carrier jig outside the furnace. This process is repeated. The present invention thus relates to a wafer transfer apparatus used in the manufacture of thin plate-shaped articles, such as semiconductor devices.
従来、上記ウエハ移し替え作業は、1枚ごとに
真空チヤツク等でウエハを吸着して行なうか、ウ
エハキヤリヤ治具内の25枚のウエハを全部を同時
に移す方法がとられるが、汎用性の面で前者の方
法が多く用いられる。しかし作業者が手作業で行
なう部分が多く、自動化までには至つていなかつ
た。1枚ごとにウエハを移し替える方法では、ウ
エハキヤリヤ治具内でウエハを真空チヤツクで吸
着してウエハ処理載置台までウエハを搬送してウ
エハ処理載置台の溝に立てることにより行なうた
め、真空チヤツクの吸引力によつてウエハの表面
に割れ、傷等の発生を招いたり、作業者の手作業
による汚染など不良発生の原因となり、半導体装
置の製造コストを高め、生産歩留りの低下などの
重大な問題があつた。 Conventionally, the above-mentioned wafer transfer work has been carried out by suctioning the wafers one by one using a vacuum chuck or the like, or by transferring all 25 wafers in a wafer carrier jig at the same time. The former method is often used. However, much of the work was done manually by workers, and automation had not yet been achieved. In the method of transferring wafers one by one, the wafers are picked up by a vacuum chuck in a wafer carrier jig, transported to a wafer processing table, and placed in the groove of the wafer processing table. The suction force can cause cracks, scratches, etc. on the surface of the wafer, and it can cause defects such as contamination due to manual work by workers, increasing the manufacturing cost of semiconductor devices and causing serious problems such as lowering production yields. It was hot.
本発明は、上記欠点を除去し、汎用性に富み、
多数のウエハを単時間に確実に処理し得ると共
に、従来にも増して作業者の作業効率を向上させ
ることのできる新規なウエハ移し替え装置を提供
するものである。 The present invention eliminates the above drawbacks, is highly versatile, and
The present invention provides a novel wafer transfer device that can reliably process a large number of wafers in a single hour and can improve the work efficiency of workers more than ever before.
このような目的を達成するために、本発明の半
導体ウエハの移し替え装置は、ウエハを正逆可能
に搬送するための気体の噴流孔列を有する搬送テ
ーブルと、この搬送テーブルに平行かつ隣接配置
され、等ピツチの溝を持つウエハ処理載置台と、
2個のフインガーによつて直立したウエハをハン
ドリングし搬送テーブルとウエハ処理載置台間を
移動するハンバドング手段と、ウエハ処理載置台
の溝ピツチずつ移動すると共に水平死点と上方へ
略90゜死点間を往復するウエハ載置板によつて、
ウエハを直立状態においてはハンドリング手段を
用いてウエハ処理載置台に移し替え、水平状態に
おいては搬送テーブルに載置し移送を行なうウエ
ハ姿勢変換手段とからなることを特徴とする。 In order to achieve such an object, the semiconductor wafer transfer apparatus of the present invention includes a transfer table having an array of gas jet holes for transferring the wafer forward and backward, and a transfer table arranged parallel to and adjacent to the transfer table. a wafer processing table with grooves of equal pitch;
A humbadong means that handles an upright wafer with two fingers and moves it between the transfer table and the wafer processing table, and moves the wafer processing table by the groove pitch, and moves the wafer from the horizontal dead center to approximately 90 degrees upward. The wafer mounting plate moves back and forth between the
The present invention is characterized by comprising a wafer posture changing means that transfers the wafer to a wafer processing table using a handling means when it is in an upright state, and places it on a transfer table and transfers it when it is in a horizontal state.
以下、本発明の一実施例であるウエハ移し替え
装置を図面を参照しながら詳述する。 DESCRIPTION OF THE PREFERRED EMBODIMENTS A wafer transfer apparatus according to an embodiment of the present invention will be described in detail below with reference to the drawings.
第1図は、本発明の一実施例であるウエハの移
し替え装置の全体の斜視図である。この装置は同
図に示すように大別して、ウエハを収納するため
の複数個のウエハキヤリヤ治具1a,1b、(1
c,1dは第2図a参照)を移送交換するための
ウエハキヤリヤ治具の移送交換手段2、および該
移送交換手段2の部分をなす機能を具備したエレ
ベータ部3、ウエハを該ウエハキヤリヤ治具の内
部に収納、若しくは外部に排出移送し得るウエハ
移送手段4、ウエハを水平に往復移送するための
搬送装置5にウエハを水平に載置、若しくは略
90゜に直立させるためのウエハ姿勢変換手段6、
前記搬送装置5と平行に隣接配置したウエハ処理
載置台7と前記ウエハ姿勢変換手段6へウエハの
下部側面をハンドリングしてウエハを移し替える
ハンドリング手段8とから構成されている。ウエ
ハキヤリヤ治具の移送交換手段2はウエハキヤリ
ヤ治具1a,1b,1c,1d(1cは第2図a
参照)を載置するためのリフト駒9a,9b,9
c,9d,9e(9b〜9eは第2図a参照)、ウ
エハキヤリヤ治具移送テーブル10、ウエハキヤ
リヤ治具の排出シリンダー11を有している。ウ
エハ移送手段4は水平に往復動する本体部材1
2、該部材12に配設された上下動軸13に片持
支持されウエハを載置するための凹部を有するフ
オーク体14とを有している。搬送装置5はウエ
ハを流体浮上により搬送するテフロン等からなる
細長い板状の搬送テーブル15a,15b、該搬
送テーブル15a,15bの側面に各々ガイド側
板16a,16b、端支持柱17a,17b,1
7c,17d(17c,17dは第5図参照)に
よつて前記搬送テーブル15a,15bは支持さ
れ高架になつている。該支持柱17a〜17dは
基板18に固定されている。ウエハ処理載置台7
はウエハ23の厚さと同程度の狭い溝(図示せ
ず)を有し、該ウエハ23が直立するように加工
されており、位置決めブロツク24a,24b上
に載置されている。25,26は前記ウエハ処理
載置台に載置されたウエハ23の有無を検出する
ための検出装置である。ハンドリング手段8は前
記搬送装置5と前記ウエハ処理載置台7と矢印
BB′間を往復運動するシリンダ19、該シリンダ
19の端に支持された矢印CC′および矢印DD′間
を上下動するシリンダ20、ウエハをハンドリン
グするためのフインガ21a,21b(21bは
第7図a参照)を開閉動作させるためのシリンダ
22とを有している。 FIG. 1 is an overall perspective view of a wafer transfer apparatus which is an embodiment of the present invention. As shown in the figure, this device is roughly divided into a plurality of wafer carrier jigs 1a, 1b, (1) for storing wafers.
c and 1d are a wafer carrier jig transfer/exchange means 2 for transferring and exchanging wafers (see FIG. The wafer is placed horizontally on a wafer transfer means 4 that can be stored inside or discharged and transferred to the outside, and a transfer device 5 for horizontally reciprocating the wafer.
wafer posture changing means 6 for making the wafer stand upright at 90°;
It is composed of a wafer processing table 7 arranged parallel to and adjacent to the transfer device 5, and a handling means 8 for handling the lower side surface of the wafer to the wafer attitude changing means 6 and transferring the wafer. The wafer carrier jig transfer/exchange means 2 are wafer carrier jigs 1a, 1b, 1c, and 1d (1c is shown in FIG. 2a).
lift pieces 9a, 9b, 9 for placing the
c, 9d, 9e (see FIG. 2a for 9b to 9e), a wafer carrier jig transfer table 10, and a discharge cylinder 11 for the wafer carrier jig. The wafer transfer means 4 includes a main body member 1 that reciprocates horizontally.
2. It has a fork body 14 which is cantilever-supported by a vertically moving shaft 13 disposed on the member 12 and has a recessed portion for placing a wafer. The transfer device 5 includes elongated plate-shaped transfer tables 15a, 15b made of Teflon or the like to transfer the wafer by fluid levitation, guide side plates 16a, 16b, and end support columns 17a, 17b, 1 on the side surfaces of the transfer tables 15a, 15b, respectively.
The transport tables 15a and 15b are supported by rails 7c and 17d (see FIG. 5 for 17c and 17d) and are elevated. The support columns 17a to 17d are fixed to the substrate 18. Wafer processing table 7
has a narrow groove (not shown) as thick as the wafer 23, is processed so that the wafer 23 stands upright, and is placed on positioning blocks 24a and 24b. 25 and 26 are detection devices for detecting the presence or absence of the wafer 23 placed on the wafer processing table. The handling means 8 is connected to the transfer device 5, the wafer processing table 7, and the arrow
A cylinder 19 that reciprocates between BB', a cylinder 20 supported at the end of the cylinder 19 that moves up and down between arrows CC' and DD', and fingers 21a and 21b for handling wafers (21b is shown in FIG. 7). (see a)) and a cylinder 22 for opening and closing.
28a,28b,28c,28dは操作制御部
27に取付けられたスイツチ群、29はモータ1
04によつて駆動されるウエハ姿勢変換手段6お
よびハンドリング手段8の移動量を前記ウエハ処
理載置台7の溝と溝との間隔すなわちピツチ量に
プリセツトするためのデイジタルスイツチ、30
はウエハ処理載置台7上のウエハ23をウエハキ
ヤリヤ治具1a〜1d毎に収納するウエハ枚数を
予め設定するためのキーボードスイツチである。
31は操作制御装置(図示せず)を内蔵した操作
制御部である。32は前記各シリンダの制御を行
なわせるバルブ等の部品の内蔵部である。 28a, 28b, 28c, 28d are a group of switches attached to the operation control section 27; 29 is a group of switches attached to the motor 1;
a digital switch 30 for presetting the amount of movement of the wafer posture converting means 6 and the handling means 8 driven by the wafer position converting means 6 and the handling means 8 to the distance between the grooves of the wafer processing table 7, that is, the pitch amount;
is a keyboard switch for presetting the number of wafers 23 on the wafer processing table 7 to be stored in each of the wafer carrier jigs 1a to 1d.
Reference numeral 31 denotes an operation control unit incorporating an operation control device (not shown). Reference numeral 32 denotes a built-in part containing parts such as valves for controlling each cylinder.
次にこのような構成のウエハ移し替え装置をさ
らに具体的に説明する。第2図aはキヤリヤ治具
の移送交換手段2および該移送交換手段の部分を
なす機能を具備したエレベータ部の平面図であ
る。同図bは第2図aのA−A断面図、同図cは
エレベータ部3の斜視図である。第2図aにおい
て、ウエハキヤリヤ治具1a,1b,1cはリフ
ト駒9a,9b,9c,9dに載置されており、
ウエハキヤリヤ治具1dは前記エレベータ部3に
移送された状態を示す。11cは流体圧(図示せ
ず)によつて駆動され矢印EE′方向に往復動作す
る排出シリンダ11aの軸11bに取付けられた
テフロン等からなるウエハキヤリヤ治具の突き出
し駒である。堤33a,33bは前記ウエハキヤ
リヤ治具移送テーブル10に取付けられており、
前記駒11cによつて突き出されたキヤリヤ治具
を案内するために設けられている。34はウエハ
キヤリヤ治具の排出ベルト35に取付けられ、前
記移送テーブル10の長窓36a,36b内に配
設された排出ピン37a,37bを矢印FF′方向
に往復動させるためのモータである。該排出ピン
37a,37bに係止して矢印F′方向に排出され
たウエハキヤリヤ治具は、さらに前記駒11cに
よつて矢印E′方向に移送される。 Next, the wafer transfer apparatus having such a configuration will be explained in more detail. FIG. 2a is a plan view of the carrier jig transfer and exchange means 2 and the elevator section which functions as a part of the transfer and exchange means. 2B is a sectional view taken along the line AA in FIG. 2A, and FIG. 2C is a perspective view of the elevator section 3. In FIG. 2a, wafer carrier jigs 1a, 1b, 1c are placed on lift pieces 9a, 9b, 9c, 9d,
The wafer carrier jig 1d is shown transferred to the elevator section 3. Reference numeral 11c is an ejecting piece of a wafer carrier jig made of Teflon or the like and attached to the shaft 11b of the ejection cylinder 11a which is driven by fluid pressure (not shown) and reciprocates in the direction of arrow EE'. The embankments 33a and 33b are attached to the wafer carrier jig transfer table 10,
It is provided to guide the carrier jig projected by the piece 11c. Reference numeral 34 denotes a motor attached to the ejection belt 35 of the wafer carrier jig for reciprocating ejection pins 37a and 37b disposed within the long windows 36a and 36b of the transfer table 10 in the direction of arrow FF'. The wafer carrier jig, which has been ejected in the direction of arrow F' while being engaged with the ejection pins 37a and 37b, is further transferred in the direction of arrow E' by the piece 11c.
第2図bにおいて、前述のリフト駒9a,9
b,9c,9d,9eは斜面部9a−1,9b−
1,9b−2,9c−1,9c−2,9d−1,
9d−2,9e−1を有し、ウエハキヤリヤ治具
1a,1b,1c,1dを位置決めする。該駒9
a,9b,9c,9dはそれぞれ支柱38a,3
8b,38c,38d,38eを介してプレート
39に取付けられている。 In FIG. 2b, the aforementioned lift pieces 9a, 9
b, 9c, 9d, 9e are slope portions 9a-1, 9b-
1,9b-2,9c-1,9c-2,9d-1,
9d-2 and 9e-1, and position the wafer carrier jigs 1a, 1b, 1c, and 1d. The piece 9
a, 9b, 9c, 9d are pillars 38a, 3, respectively.
It is attached to the plate 39 via 8b, 38c, 38d, and 38e.
基台40には柱41を固着し、該柱41の上端
にブラケツト42を配設し、該ブラケツト42に
シリンダ43および案内軸44a,44bを設
け、該案内軸44a,44bの上端部には前記プ
レート39をナツト45a,45bを用いて固定
する。矢印GG′はシリンダ43の上下動の往復運
動を示し、上端死点にマイクロスイツチ46、下
端死点にマイクロスイツチ47が設けられてい
る。該上端死点において作動し、ウエハキヤリヤ
治具1a,1b,1c,1dの有無を検出するた
めのマイクロスイツチ48a,48b,48c,
48dが前記プレート39の上に配設されてい
る。 A column 41 is fixed to the base 40, a bracket 42 is provided at the upper end of the column 41, a cylinder 43 and guide shafts 44a, 44b are provided on the bracket 42, and the upper ends of the guide shafts 44a, 44b are provided with a cylinder 43 and guide shafts 44a, 44b. The plate 39 is fixed using nuts 45a and 45b. Arrow GG' indicates the reciprocating vertical movement of the cylinder 43, and a micro switch 46 is provided at the top dead center and a micro switch 47 is provided at the bottom dead center. Micro-switches 48a, 48b, 48c, which operate at the top dead center and detect the presence or absence of the wafer carrier jigs 1a, 1b, 1c, 1d.
48d is arranged on the plate 39.
次にウエハキヤリヤ治具移送テーブル10の矢
印AA′方向の水平往復運動とシリンダ43の上下
動の往復動作によつて行なわれるウエハキヤリヤ
治具の移送動作を説明する。前記駒9a〜9dの
斜面部9a−1〜9d−1に当接して位置P1、
P2P3に位置決めされたウエハキヤリヤ治具1a,
1b,1cは前記キヤリヤ治具移送テーブル10
が矢印A′方向に移動→該駒9a〜9e下降→該
テーブル10を矢印A方向に移動→該駒9a〜9
e上昇→該駒9d〜9eに該ウエハキヤリヤ治具
1a〜1cを載置の順序動作により、それぞれ位
置P2、P3、P4へ移送される。 Next, the transfer operation of the wafer carrier jig performed by the horizontal reciprocating movement of the wafer carrier jig transfer table 10 in the direction of arrow AA' and the vertical reciprocating movement of the cylinder 43 will be explained. The pieces 9a to 9d are brought into contact with the slope portions 9a-1 to 9d-1 at position P1,
Wafer carrier jig 1a positioned at P2P3,
1b and 1c are the carrier jig transfer tables 10;
moves in the direction of arrow A' → lowers the pieces 9a to 9e → moves the table 10 in the direction of arrow A → pieces 9a to 9
The wafer carrier jigs 1a to 1c are moved to positions P2, P3, and P4, respectively, by the sequence of lifting e and placing the wafer carrier jigs 1a to 1c on the pieces 9d to 9e.
第2図cはウエハキヤリヤ治具移送交換手段2
の部分をなす機能を具備したエレベータ部3を示
し、第2図aの矢印HH方向からみた斜視図であ
る。駒9d,9eに載置された位置P4のウエハ
キヤリヤ治具1dは旋回支持部材49aに取付け
られたモータ50の駆動によつて図の如く状態と
位置P4の間を正逆旋回しうるように構成されて
いる。すなわち前記モータ50の軸(図示せる)
および旋回支持部材49bに配設された軸受51
に遊嵌する軸52と一体となつている略L型のウ
エハキヤリヤ治具載せ台53は、前記旋回支持部
材49a,49bに支持され、該モータの正逆回
転によつて姿勢変換が行なわれる。前記旋回支持
部材49a,49bはモータ54、プーリ55,
56、ベルト57および送りネジ58等によつて
矢印JJ′方向に上下動の往復動作する上下動部材
59と一体となつている。ウエハキヤリヤ治具1
dは該ウエハキヤリヤ治具載せ台53の逆旋回動
作によつて位置P4に戻されると、駒9d,9e
はシリンダ43によつて下降し、前記キヤリヤ治
具1d(駒9a〜9c上に存在するウエハキヤリ
ヤ治具も同様)は前記ウエハキヤリヤ治具移送テ
ーブル10の上に載せられ、次いで前記ウエハキ
ヤリヤ治具1dのみウエハキヤリヤ治具排出ピン
37a,37bに係止して矢印F′方向へ移送され
る。 Figure 2c shows wafer carrier jig transfer and exchange means 2.
FIG. 2 is a perspective view showing the elevator section 3 having the function of forming the part shown in FIG. The wafer carrier jig 1d placed on the pieces 9d and 9e at the position P4 is configured to be able to rotate forward and backward between the state and the position P4 as shown in the figure by driving a motor 50 attached to the rotation support member 49a. has been done. That is, the shaft of the motor 50 (as shown)
and a bearing 51 disposed on the swing support member 49b.
A substantially L-shaped wafer carrier jig platform 53, which is integral with a shaft 52 which is loosely fitted in the wafer carrier jig, is supported by the swing support members 49a and 49b, and its posture is changed by forward and reverse rotation of the motor. The rotation support members 49a and 49b are provided with a motor 54, a pulley 55,
56, a belt 57, a feed screw 58, etc., it is integrated with a vertically moving member 59 that reciprocates vertically in the direction of arrow JJ'. Wafer carrier jig 1
When d is returned to position P4 by the reverse rotation of the wafer carrier jig platform 53, pieces 9d and 9e
is lowered by the cylinder 43, and the carrier jig 1d (same as the wafer carrier jig present on the pieces 9a to 9c) is placed on the wafer carrier jig transfer table 10, and then only the wafer carrier jig 1d is placed on the wafer carrier jig transfer table 10. The wafer carrier jig is engaged with ejection pins 37a and 37b and transferred in the direction of arrow F'.
第3図はウエハをウエハキヤリヤ治具内に収
納、若しくはウエハキヤリヤ治具外へ排出移送す
るための移送手段の要部正面図である。60a,
60bはネジ(図示せず)によつて一体となつて
いる本体部材、61a,61bは該本体部材60
bに配設され、水平ガイド軸62上に転動するロ
ーラ、63は前記本体部材60bにその一端をネ
ジ(図示せず)に固着され、他端はL型連結金具
64にピン65によつて固定された連結棒、66
は一端を支持ブロツク67のピン68によつて揺
動しうるように配設されたシリンダ、69は前記
L型連結金具64にピン70によつて固定された
シリンダ軸、前記本体部材60a,60bは流体
圧(図示せず)によつて上下方向に駆動される軸
71を有し、該軸71の上端部にネジ72によつ
て取付けられ、ウエハを載置するための凹部73
aを有するフオーク体73が片持支持されてい
る。74はウエハの有無を検出するための光電検
出器、該光電検出器74は前記フオーク体73の
下部に取付けられており、ランプ75のビーム7
5aを受光しうるように構成され、ウエハキヤリ
ヤ治具1d内のウエハ23を検出する。76は搬
送テーブル15a,15b上のウエハ(図示せ
ず)を検出するランプ、該ランプ76のビーム
(図示せず)は前記フオーク体73が前記シリン
ダ66によつて搬送テーブル15a,15b上に
移送された状態において、前記光電検出器74に
よつて受光されるように構成されている。77は
前記ランプ75,76のホルダ78a,78bを
取付けるための取付板、該取付板77は前記搬送
テーブル15a,15bの上方に配設され、柱1
7c,17d(第5図参照)に取付けられている。 FIG. 3 is a front view of essential parts of a transfer means for storing the wafer in the wafer carrier jig or ejecting and transferring the wafer to the outside of the wafer carrier jig. 60a,
60b is a main body member that is integrated with a screw (not shown), and 61a and 61b are main body members 60.
A roller 63, which is disposed on the main body member 60b and rolls on a horizontal guide shaft 62, has one end fixed to the main body member 60b with a screw (not shown), and the other end fixed to an L-shaped connecting fitting 64 with a pin 65. connecting rod, 66
69 is a cylinder whose one end is arranged to be swingable by a pin 68 of a support block 67; 69 is a cylinder shaft fixed to the L-shaped connecting fitting 64 by a pin 70; and the main body members 60a, 60b. has a shaft 71 that is driven in the vertical direction by fluid pressure (not shown), is attached to the upper end of the shaft 71 with a screw 72, and has a recess 73 for placing a wafer.
A fork body 73 having a shape is supported in a cantilever manner. 74 is a photoelectric detector for detecting the presence or absence of a wafer; the photoelectric detector 74 is attached to the lower part of the fork body 73;
5a, and detects the wafer 23 in the wafer carrier jig 1d. A lamp 76 detects a wafer (not shown) on the transfer tables 15a, 15b, and a beam (not shown) of the lamp 76 detects a wafer (not shown) on the transfer table 15a, 15b when the fork body 73 is transferred onto the transfer table 15a, 15b by the cylinder 66. In this state, the light is received by the photoelectric detector 74. Reference numeral 77 denotes a mounting plate for mounting the holders 78a and 78b of the lamps 75 and 76, and the mounting plate 77 is disposed above the transport tables 15a and 15b.
7c and 17d (see Figure 5).
ウエハキヤリヤ治具1d内のウエハを搬送テー
ブル上へ排出移送する場合は次のようにして行な
われる。前記フオーク体73がウエハキヤリヤ治
具1d内に進入すると、第2図cにおけるウエハ
キヤリヤ治具載せ台53上のウエハキヤリヤ治具
1dはモータ54等の駆動によつて下降し、前記
フオーク体73の凹部73aにウエハ23を載置
する。該フオーク体73の凹部73aに載置され
たウエハ23はシリンダ66によつて流体浮上等
による搬送装置からなるウエハ搬送テーブル15
a,15b(詳細は後述する)の上部まで移送さ
れ、前記本体部材60a,60bの軸71を流体
圧(図示せず)によつて降下させ、該搬送テーブ
ル15a,15b上に載置される。以下同様にく
りかえされ、ウエハキヤリヤ治具1d内のウエハ
をウエハキヤリヤ治具外へ排出移送する場合は、
最下層のウエハより順次行なわれる。 The wafer in the wafer carrier jig 1d is discharged and transferred onto the transfer table as follows. When the fork body 73 enters the wafer carrier jig 1d, the wafer carrier jig 1d on the wafer carrier jig platform 53 in FIG. The wafer 23 is placed on. The wafer 23 placed in the recess 73a of the fork body 73 is transferred to the wafer transfer table 15, which is a transfer device using fluid levitation or the like, by means of a cylinder 66.
a, 15b (details will be described later), the shafts 71 of the main body members 60a, 60b are lowered by fluid pressure (not shown), and the main body members 60a, 60b are placed on the transport tables 15a, 15b. . The same procedure is repeated below, and when the wafer in the wafer carrier jig 1d is discharged and transferred to the outside of the wafer carrier jig,
The process is performed sequentially starting from the bottom layer of the wafer.
搬送テーブル15a,15b上のウエハをウエ
ハキヤリヤ治具内に収納する場合は次のようにし
て行なわれる。前記本体部材60a,60bの軸
71を流体圧(図示せず)によつて上昇させ、前
記フオーク体73の凹部73aにウエハを載置
し、次いでフオーク体73はシリンダ66によつ
てウエハキヤリヤ治具1d内の所望の位置まで進
入する。次に該ウエハキヤリヤ治具1dのウエハ
を載置するための切溝(図示せず)にウエハを載
置するまで前記ウエハキヤリヤ治具1dを前記モ
ータ54等の駆動によつて上昇させる。以下同様
にウエハをウエハキヤリヤ治具内に収納する場合
は、最上層より順次行なう。 The wafers on the transfer tables 15a, 15b are stored in the wafer carrier jig as follows. The shafts 71 of the main body members 60a and 60b are raised by fluid pressure (not shown), and the wafer is placed in the recess 73a of the fork body 73, and then the fork body 73 is moved by the cylinder 66 to the wafer carrier jig. Enter the desired position within 1d. Next, the wafer carrier jig 1d is raised by driving the motor 54 or the like until the wafer is placed in a groove (not shown) for placing the wafer in the wafer carrier jig 1d. Similarly, when wafers are stored in the wafer carrier jig, the process is performed sequentially starting from the top layer.
第4図a,bはウエハを水平に往復移動可能な
搬送装置の実施例を示すもので、テフロン等から
なる細長い板状の搬送テーブル15a,15bを
平行かつ水平に配置し、各テーブル15a,15
bの側面にテフロン等からなるガイド側板16
a,16bを設け、ウエハサイズの変更に対応で
きるように構成されている。なおガイド側板16
a,16bの内側距離Wはウエハ23の直径dよ
り1〜3mm広くしておく。搬送テーブル15aに
はウエハの下面より正搬送方向+Xに向つて、か
つ内方に向つて形成された第1の流体の噴射孔列
151a(噴流は矢印X1方向となる)と、逆搬送
方向−Xに向つて、かつ内方に向つて形成された
第2の流体の噴流孔列152a(噴流は矢印−X1
方向となる)を備え、搬送テーブル15bにはウ
エハの下面より正搬送方向+Xに向つて、かつ内
方に向つて形成された第1の流体の噴射孔列15
2a(噴流は矢印X2方向となる)と、逆搬送方向
−Xに向つて、かつ内方に向つて形成された第2
の流体の噴射孔列152b(噴流は矢印−X2方向
となる)を備えている。 4a and 4b show an embodiment of a transfer device capable of horizontally reciprocating a wafer, in which elongated plate-shaped transfer tables 15a and 15b made of Teflon or the like are arranged parallel and horizontally, and each table 15a, 15
A guide side plate 16 made of Teflon or the like is provided on the side of b.
a and 16b, and is configured to accommodate changes in wafer size. Note that the guide side plate 16
The inner distance W between a and 16b is set to be 1 to 3 mm wider than the diameter d of the wafer 23. The transfer table 15a has a first fluid injection hole array 151a formed from the lower surface of the wafer in the forward transfer direction +X and inward (the jet flow is in the direction of arrow -X and inwardly formed second fluid jet hole row 152a (jet flow is indicated by arrow -X 1
The transfer table 15b has a first fluid injection hole array 15 formed from the lower surface of the wafer in the positive transfer direction +X and inward.
2a (the jet flow is in the two directions of arrow X), and a second
The fluid injection hole array 152b (jet flow is in the direction of arrow -X 2 ) is provided.
第4図bは第4図aの断面図を示す。搬送テー
ブル15a,15bの内側の中空部79はウエハ
23を浮上させる働きを持たない。添板80は細
長い部材で前記噴射孔列151aを連通させるた
めの溝81、切替え弁82と導通し前記溝81に
接続された通路83および前記噴射孔列152a
を連通させるための溝84及び切替え弁85と導
通し、通路86を形成している。添板87は細長
い部材で前記噴射孔列152bを連通させるため
の溝88、切替え弁89と導通し、溝88に接続
された通路90および前記噴射孔列151bを連
通させるための溝91、切替え弁92と導通し、
通路93等が形成されている。なお前記搬送テー
ブル15aと添板80および搬送テーブル15b
と添板87はそれぞれのネジ(図示せず)によつ
て固定されている。 FIG. 4b shows a cross-sectional view of FIG. 4a. The hollow portions 79 inside the transfer tables 15a, 15b do not have the function of floating the wafer 23. The splint plate 80 is an elongated member that includes a groove 81 for communicating the injection hole row 151a, a passage 83 that conducts with the switching valve 82 and is connected to the groove 81, and the injection hole row 152a.
It communicates with a groove 84 and a switching valve 85 to form a passage 86. The splint plate 87 is an elongated member that communicates with a groove 88 for communicating the injection hole row 152b, a switching valve 89, and a groove 91 for communicating the passage 90 connected to the groove 88 and the injection hole row 151b, and a switching valve. communicates with the valve 92;
A passage 93 etc. are formed. Note that the transport table 15a, the plate 80, and the transport table 15b
and splice plate 87 are fixed by respective screws (not shown).
第5図はウエハの搬送装置およびウエハ姿勢変
換手段の斜視図である。搬送テーブル15a,1
5bによつて矢印+X方向に搬送されるウエハ2
3は、該搬送テーブル15a,15bの中間の空
間部79に配設された旋回部材94に取付けられ
たテフロン等からなる停止部材95のR面をなす
停止面95aに当接して停止する前記停止部材9
5にはウエハの有無を検出するための検出器(図
示せず)が配設されており、ウエハ23が停止部
材95に到達したことを検知する。第6図に示す
如く旋回部材94は移動台96の上面にネジ97
を用いて取付けられた旋回ブラケツト98に配設
されており、停止部材95およびテフロン等から
なるウエハ載置板99は旋回ブラケツト98の軸
100を旋回軸として、前記移動台96に取付け
られたモータ101によつて歯車102,103
を介してウエハ載置板99が水平死点から上方に
略90゜死点間に往復旋回(矢印KK′)し得るよう
になつている。該移動台96はパルスモータによ
り送りネジ105を正逆回転させ、長手方向に一
定ピツチ、すなわち前記ウエハ処理載置台7の溝
ピツチずつ正逆移動し位置決めできるようになつ
ている。 FIG. 5 is a perspective view of the wafer transfer device and the wafer attitude changing means. Transport table 15a, 1
Wafer 2 is transported by arrow 5b in the +X direction.
3 is the stop that comes into contact with a stop surface 95a forming an R surface of a stop member 95 made of Teflon or the like attached to a rotating member 94 disposed in a space 79 between the transport tables 15a and 15b. Part 9
5 is provided with a detector (not shown) for detecting the presence or absence of a wafer, and detects when the wafer 23 has reached the stop member 95. As shown in FIG.
The stop member 95 and the wafer mounting plate 99 made of Teflon or the like are mounted on a rotating bracket 98 mounted on the movable table 96 with the shaft 100 of the rotating bracket 98 as the pivot axis. Gears 102, 103 by 101
The wafer mounting plate 99 can be reciprocated (arrow KK') from the horizontal dead center to approximately 90° upward from the dead center. The moving table 96 is configured to rotate a feed screw 105 in the forward and reverse directions by a pulse motor, and to move forward and backward in the longitudinal direction by a constant pitch, that is, by the groove pitch of the wafer processing table 7, so that positioning can be performed.
第6図はウエハ姿勢変換手段の側面図で、ウエ
ハ載置板99はウエハ23を載置し、水平死点か
ら上方に略90゜死点に旋回した状態を示す。該90゜
死点にはマイクロスイツチ106およびストツパ
ネジ107を配設し、L型作動板108によつて
マイクロスイツチ106を作動させるようになつ
ている。ウエハ23はノズル109に接続したク
リーンエア110の噴流111によつて前記ウエ
ハ載置板99に押しつけられ、略90゜の直立状態
を保つ。前記水平死点にはマイクロスイツチ11
2およびストツパネジ113を配設し、前記旋回
部材によつて該マイクロスイツチ112を作動さ
せるようになつている。 FIG. 6 is a side view of the wafer posture changing means, showing a state in which the wafer placement plate 99 has a wafer 23 placed on it and has been pivoted upward from the horizontal dead center to approximately 90 degrees to the dead center. A micro switch 106 and a stopper screw 107 are disposed at the 90° dead center, and the micro switch 106 is operated by an L-shaped operating plate 108. The wafer 23 is pressed against the wafer mounting plate 99 by a jet stream 111 of clean air 110 connected to the nozzle 109, and is maintained in an upright position at approximately 90 degrees. A micro switch 11 is installed at the horizontal dead center.
2 and a stopper screw 113 are provided, and the micro switch 112 is actuated by the rotating member.
又、第7図aはハンドリング手段の部分をなす
ウエハチヤツク機構の正面図である。シリンダ2
2のハウジング120a,120bはプレート1
21を介してチヤツク機構本体122にネジ(図
示せず)止めされる。しかもシリンダ22のロツ
ド123の先端部にはラツク124が形成される
と共にこのロツド123は前記ハウジング120
aに取付けられたホース接続口125に接続され
た流体126の圧力によつて上下動(矢印LL′)
する。前記ハウジング120bの端部には前記ロ
ツド123の上端ストロークのストツパーネジ1
27が配設され、ロツクナツト127aで固定さ
れている。前記ラツク124と挾持する如く噛合
う2個の小歯車128a,128bはそれぞれの
中心軸129a,129bに固定され、フインガ
ー21a,21bを矢印ML,MRの如く旋回さ
せ、フインガー21a,21bの開閉動作を行な
わせると共にフインガー21a,21bにはそれ
ぞれの先端内側に略凹状130a,131aを形
成したテフロン等からなる駒130,131を有
し、前記ウエハ処理載置台7の溝7aに立てて載
置されているウエハ23の外周の下部側面をハン
ドリングするように構成されている。 FIG. 7a is a front view of the wafer chuck mechanism forming a part of the handling means. cylinder 2
2 housings 120a, 120b are plate 1
21 to the chuck mechanism main body 122 by a screw (not shown). Furthermore, a rack 124 is formed at the tip of the rod 123 of the cylinder 22, and this rod 123 is attached to the housing 120.
vertical movement (arrow LL') due to the pressure of the fluid 126 connected to the hose connection port 125 attached to a.
do. A stopper screw 1 of the upper end stroke of the rod 123 is provided at the end of the housing 120b.
27 is provided and fixed with a lock nut 127a. Two small gears 128a, 128b, which engage with the rack 124 in a pinching manner, are fixed to their respective central shafts 129a, 129b, and the fingers 21a, 21b are rotated as shown by arrows M L and M R to rotate the fingers 21a, 21b. The fingers 21a and 21b have pieces 130 and 131 made of Teflon or the like that have substantially concave shapes 130a and 131a formed on the inside of their tips, and are placed upright in the groove 7a of the wafer processing table 7. It is configured to handle the lower side surface of the outer periphery of the wafer 23 placed thereon.
第7図bは第7図aの断面NNを示す。前記ハ
ウジング120a,120bの内部はシリンダの
ロツド123を支持するダイヤフラム132によ
つて室133,134の2つに分けられ、一方の
室133はホース接続口125の開口と通じ、他
方の室134は大気開口135と通じており、バ
ネ136が配設されている。前記ダイヤフラムの
中心部はリテイナ137,138に挾持され、前
記シリンダのロツド123の端部にナツト139
によつて結合されており、しかもシリンダのロツ
ド123は前記ハウジング120aに配設された
軸受140,141に静合し、前記バネ136お
よび流体126の圧力によつて上下動の往復動作
する。前記チヤツク機構本体122に気体の吐出
口142を設け、クリーンエア等の気体143に
よつてウエハ23の表面を清浄化しうるようにな
つている。 FIG. 7b shows the cross section NN of FIG. 7a. The interior of the housings 120a, 120b is divided into two chambers 133, 134 by a diaphragm 132 supporting the rod 123 of the cylinder, one chamber 133 communicating with the opening of the hose connection port 125, and the other chamber 134 communicating with the opening of the hose connection port 125. It communicates with an atmospheric opening 135, and a spring 136 is disposed therein. The center of the diaphragm is held between retainers 137 and 138, and a nut 139 is attached to the end of the rod 123 of the cylinder.
Moreover, the rod 123 of the cylinder is statically engaged with bearings 140, 141 disposed in the housing 120a, and is moved up and down and reciprocated by the pressure of the spring 136 and the fluid 126. A gas discharge port 142 is provided in the chuck mechanism main body 122 so that the surface of the wafer 23 can be cleaned with a gas 143 such as clean air.
上述のように本発明のウエハ移し替え装置は半
導体ウエハについて述べたが、これに限定される
ことなく他のウエハ(薄板状の物品)にも適用し
うるものであり、汎用性があり、多数のウエハを
単時間に確実に移し替えると共に、従来にも増し
て作業者の作動効率を大巾に向上させることので
きるウエハ移し替え装置が実現できる。 As mentioned above, the wafer transfer device of the present invention has been described for semiconductor wafers, but it is not limited to this and can be applied to other wafers (thin plate-shaped articles), and is versatile and can be used in many applications. It is possible to realize a wafer transfer device that can reliably transfer 100 wafers in a single hour and can greatly improve the operating efficiency of the operator compared to the past.
図面は本発明の一実施例を示し、第1図はウエ
ハ移し替え装置全体の斜視図、第2図aはウエハ
キヤリヤ治具の移送交換手段およびその一部の機
能を具備したエレベータ部の平面図、第2図b
は、第2図aのAA断面図、第2図cは、エレベ
ータ部の斜視図、第3図はウエハをウエハキヤリ
ヤ治具内に収納、若しくはウエハキヤリヤ治具外
へ排出移送するためのウエハ移送手段の要部正面
図、第4図aはウエハを水平に移送可能な搬送装
置の部分平面図、第4図bは第4図aの断面図、
第5図はウエハ姿勢変換手段を載置したウエハ搬
送装置の斜視図、第6図はウエハ姿勢変換手段の
側面図、第7図aはハンドリング手段の一部分を
なすウエハチヤツク機構の正面図、第7図bは第
7図aのN−N断面図である。
1a,1b,1c,1d……ウエハキヤリヤ治
具、2……ウエハキヤリヤ治具の移送交換部、3
……エレベータ部、4……ウエハ移送手段、5…
…搬送装置、6……ウエハ姿勢変換手段、7……
ウエハ処理載置台、8……ハンドリング手段、2
3……ウエハ。
The drawings show one embodiment of the present invention, and FIG. 1 is a perspective view of the entire wafer transfer device, and FIG. , Figure 2b
2A is a cross-sectional view of FIG. 2A, FIG. 2C is a perspective view of the elevator section, and FIG. 3 is a wafer transfer means for storing the wafer in the wafer carrier jig or ejecting and transferring the wafer to the outside of the wafer carrier jig. FIG. 4a is a partial plan view of a transfer device capable of horizontally transferring a wafer, FIG. 4b is a sectional view of FIG. 4a,
5 is a perspective view of a wafer transport device on which a wafer attitude changing means is mounted, FIG. 6 is a side view of the wafer attitude changing means, FIG. 7a is a front view of a wafer chuck mechanism forming a part of the handling means, FIG. 7b is a sectional view taken along line N--N in FIG. 7a. 1a, 1b, 1c, 1d... wafer carrier jig, 2... wafer carrier jig transfer exchange section, 3
...Elevator section, 4...Wafer transfer means, 5...
...Transfer device, 6...Wafer posture changing means, 7...
Wafer processing table, 8...handling means, 2
3...Wafer.
Claims (1)
ハ搬送装置において、 第1および第2の気体の噴流孔列を有し、流路
切り換えによつて搬送方向を変更し、正逆搬送可
能に形成された搬送テーブルと、 この搬送テーブルに対して平行かつ隣接配置さ
れ、等ピツチの溝を持つウエハ処理載置台と、 ラツクと2個の歯車で駆動され、先端内側に略
凹状に形成された駒を有する2個のフインガーに
よつて直立したウエハの下部側面をハンドリング
し、かつ前記搬送テーブルと前記ウエハ処理載置
台間を移動するハンドリング手段と、 前記搬送テーブルの中間の空間部に配設され、
前記ウエハ処理載置台の溝ピツチずつ移動すると
共に水平死点と上方へ略90゜死点間を往復移動す
るウエハ載置板を有し、このウエハ載置板によつ
て、ウエハを直立状態においては前記ハンドリン
グ手段を用いて前記ウエハ処理載置台に移し替
え、水平状態においては前記搬送テーブルに載置
し移送を行なうウエハ姿勢変換手段とからなるこ
とを特徴とするウエハ移し替え装置。[Claims] 1. A wafer transfer device that levitates and feeds a wafer using a gas jet, which has first and second gas jet hole arrays, changes the transfer direction by switching the flow path, and can be used in forward and reverse directions. A transfer table formed to allow transfer; a wafer processing table disposed parallel to and adjacent to the transfer table and having equally pitched grooves; a handling means for handling a lower side surface of an upright wafer using two fingers having pieces formed thereon, and for moving between the transfer table and the wafer processing table; arranged,
The wafer processing table has a wafer placement plate that moves in groove pitch increments and reciprocates between a horizontal dead center and an upward dead center of about 90 degrees, and this wafer placement plate allows the wafer to be held in an upright position. A wafer transfer apparatus comprising: a wafer posture changing means for transferring the wafer to the wafer processing table using the handling means, and for transferring the wafer by placing it on the transfer table in a horizontal state.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13259780A JPS5758330A (en) | 1980-09-24 | 1980-09-24 | Wafer transferring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13259780A JPS5758330A (en) | 1980-09-24 | 1980-09-24 | Wafer transferring apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5758330A JPS5758330A (en) | 1982-04-08 |
JPS6312379B2 true JPS6312379B2 (en) | 1988-03-18 |
Family
ID=15085055
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13259780A Granted JPS5758330A (en) | 1980-09-24 | 1980-09-24 | Wafer transferring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5758330A (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5942038U (en) * | 1982-09-10 | 1984-03-17 | 三和システムエンジニアリング株式会社 | Belt conveyor for transporting hybrid ICs |
US4539479A (en) * | 1983-02-28 | 1985-09-03 | Sheets Ronald E | Automatic apparatus and method for exposing, registering, and handling double-sided printed circuit boards |
US6199376B1 (en) | 1998-09-28 | 2001-03-13 | Honda Giken Kogyo Kabushiki Kaisha | Extension of exhaust manifold conduit into exhaust pipe |
US6209319B1 (en) | 1998-09-28 | 2001-04-03 | Honda Giken Kogyo Kabushiki Kaisha | Pipe assembly having inner and outer pipes |
US6122911A (en) * | 1998-09-28 | 2000-09-26 | Honda Giken Kogyo Kabushiki Kaisha | Exhaust manifold pipe weld assembly |
GB2502617B (en) * | 2012-06-01 | 2017-01-18 | Dtg Int Gmbh | Apparatus for and method of aligning and transporting workpieces |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5599739A (en) * | 1979-01-26 | 1980-07-30 | Hitachi Ltd | Wafer treating method and its equipment |
-
1980
- 1980-09-24 JP JP13259780A patent/JPS5758330A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5599739A (en) * | 1979-01-26 | 1980-07-30 | Hitachi Ltd | Wafer treating method and its equipment |
Also Published As
Publication number | Publication date |
---|---|
JPS5758330A (en) | 1982-04-08 |
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