JPS6163174U - - Google Patents
Info
- Publication number
- JPS6163174U JPS6163174U JP14760184U JP14760184U JPS6163174U JP S6163174 U JPS6163174 U JP S6163174U JP 14760184 U JP14760184 U JP 14760184U JP 14760184 U JP14760184 U JP 14760184U JP S6163174 U JPS6163174 U JP S6163174U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor element
- terminals
- measured
- jig
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 5
- 230000010355 oscillation Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図はこの考案の一実施例のＧａＡｓ ＦＥ
Ｔ特性測定治具にＧａＡｓ ＦＥＴを装着した状
態を示す斜視図、第２図はＧａＡｓ ＦＥＴが装
着された従来の特性測定治具を示す斜視図、第３
図ａは第２図の従来の測定治具を用いて測定した
ときの異常（発振）特性波形図、第３図ｂは本来
の正常特性波形図、第４図は従来の発振防止策を
施した特性測定治具にＧａＡｓ ＦＥＴを装着し
た状態を示す斜視図である。
図において、１は半導体素子（ＧａＡｓ ＦＥ
Ｔ）、２は絶縁基板（プリント基板）、３，４，
５，６は接触端子、１０は誘電体板である。なお
、各図中同一符号は同一または相当部分を示す。
Figure 1 shows a GaAs FE that is an embodiment of this invention.
Fig. 2 is a perspective view showing a GaAs FET mounted on a T-characteristic measuring jig; Fig. 2 is a perspective view showing a conventional characteristic measuring jig with a GaAs FET mounted;
Figure a shows the abnormal (oscillation) characteristic waveform when measured using the conventional measuring jig shown in Figure 2, Figure 3 b shows the original normal characteristic waveform, and Figure 4 shows the conventional oscillation prevention measures. FIG. 2 is a perspective view showing a state in which a GaAs FET is mounted on the characteristic measuring jig. In the figure, 1 is a semiconductor element (GaAs FE
T), 2 is an insulating board (printed board), 3, 4,
5 and 6 are contact terminals, and 10 is a dielectric plate. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
数個の接触端子を備え、これらに半導体素子の複
数個の外部電極端子をそれぞれ接触させ、所要電
圧を印加した状態で上記半導体素子の特性を測定
するものにおいて、所要上記接触端子間に誘電体
板を張りつけたことを特徴とする半導体素子特性
測定治具。 (2) 誘電体板にセラミツク板を用いたことを特
徴とする実用新案登録請求の範囲第１項記載の半
導体素子特性測定治具。[Claims for Utility Model Registration] (1) A plurality of contact terminals are formed on an insulating substrate and insulated from each other, and a plurality of external electrode terminals of a semiconductor element are brought into contact with these terminals to apply a required voltage. 1. A jig for measuring characteristics of a semiconductor element, characterized in that a dielectric plate is pasted between the required contact terminals, in which the characteristics of the semiconductor element are measured in a state in which the characteristics of the semiconductor element are measured. (2) The jig for measuring semiconductor device characteristics according to claim 1, which is characterized in that a ceramic plate is used as the dielectric plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14760184U JPS6163174U (en) | 1984-09-29 | 1984-09-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14760184U JPS6163174U (en) | 1984-09-29 | 1984-09-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6163174U true JPS6163174U (en) | 1986-04-28 |
Family
ID=30705827
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14760184U Pending JPS6163174U (en) | 1984-09-29 | 1984-09-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6163174U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011080796A (en) * | 2009-10-05 | 2011-04-21 | Mitsubishi Electric Corp | Package of semiconductor element, and socket for testing the semiconductor element |
-
1984
- 1984-09-29 JP JP14760184U patent/JPS6163174U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011080796A (en) * | 2009-10-05 | 2011-04-21 | Mitsubishi Electric Corp | Package of semiconductor element, and socket for testing the semiconductor element |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6163174U (en) | ||
| JPS60174325U (en) | piezoelectric resonator | |
| JPS61151374U (en) | ||
| JPS60109290U (en) | High voltage protection device for electronic equipment | |
| JPS6439676U (en) | ||
| JPH02118274U (en) | ||
| JPS6292679U (en) | ||
| JPH02150797U (en) | ||
| JPS592034U (en) | Sealed limit switch | |
| JPS58125880U (en) | Semiconductor device measurement jig | |
| JPS60176555U (en) | semiconductor equipment | |
| JPS6078102U (en) | plate barista | |
| JPS59138389U (en) | Integrated structure of surge absorption circuit | |
| JPS58150829U (en) | Feedthrough capacitor | |
| JPS6088480U (en) | Ultra high frequency IC socket | |
| JPS60183455U (en) | pressure sensor | |
| JPS63181098U (en) | ||
| JPS6212983U (en) | ||
| JPS6135383U (en) | integrated circuit socket | |
| JPH0231134U (en) | ||
| JPS60147095U (en) | IC socket | |
| JPS61199010U (en) | ||
| JPS6226048U (en) | ||
| JPS5949974U (en) | Characteristic measuring device for electronic components | |
| JPS6051853U (en) | switch element |