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JPS61231404A - Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film - Google Patents

Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film

Info

Publication number
JPS61231404A
JPS61231404A JP60073349A JP7334985A JPS61231404A JP S61231404 A JPS61231404 A JP S61231404A JP 60073349 A JP60073349 A JP 60073349A JP 7334985 A JP7334985 A JP 7334985A JP S61231404 A JPS61231404 A JP S61231404A
Authority
JP
Japan
Prior art keywords
light
tube
surface coating
film
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60073349A
Other languages
Japanese (ja)
Inventor
Masayoshi Iwasaki
岩崎 全良
Yoshiro Nishimoto
善郎 西元
Yorozu Gonda
権田 萬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP60073349A priority Critical patent/JPS61231404A/en
Publication of JPS61231404A publication Critical patent/JPS61231404A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)

Abstract

PURPOSE:To enhance inspection efficiency and to improve inspection accuracy, by reflecting light from a light emitting element by a rotary mirror to irradiate the film on the inner surface of a pipe to be inspected to perform rotary scanning and receiving the change in the quantity of reflected light by a photoelectric converter element. CONSTITUTION:The laser beam generated from a semiconductive laser element is condensed by a lens to be projected to a pipe to be inspected in the center axis direction thereof and reflected by a rotary mirror to irradiate the inner wall of the pipe to be inspected as a spot with a diameter of 1mm or less. The photoelectric converter element of a light receiver receives weak reflected beam from the surface of the film on the inner surface of said pipe to photoelectrically convert of reflected beam. This electric signal is amplified by an amplifier 20 through a connection cable 16 to be inputted to a cathode ray tube oscilloscope 22 of a cathode the through a differentiator 21 and receives the observation of a wave form to be automatically recorded on a pen writing oscillograph 24 through a peak hold circuit 23. When there was a voltage signal exceeding the threshold value preset by a comparator 25, that is, the increase in the quantity of reflected beam, an alarm is emitted by an automatic alarm 26 to discriminate the pressure of a coating inferior part.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は火力および原子力@電プクントにおける復水器
の冷却細管として用いられる内面塗装皮膜付熱交換器管
の内面皮膜の検査方法および装置VC@する。
Detailed Description of the Invention (Industrial Field of Application) The present invention relates to a method and apparatus for inspecting the inner surface coating of heat exchanger tubes with an inner surface coated coating used as cooling tubes for condensers in thermal power and nuclear power plants. @do.

復水器の冷却細管は外径1〜11/4インチ(25,4
〜51.75 @l ) 、長さ10〜25 m程度の
小径長尺管で、1器当91万本前後の本数が使用される
The cooling capillary of the condenser has an outer diameter of 1 to 11/4 inches (25,4
~51.75 @l), small diameter long tubes with a length of about 10 to 25 m, and around 910,000 tubes are used per device.

(従来の技術) 前記の復水器の冷却細管をはじめとする各種熱交換器管
の耐蝕性はその保!i皮膜の性状に大きく左右される。
(Prior Art) The corrosion resistance of various heat exchanger tubes, including the cooling capillary tubes of the condenser mentioned above, is maintained! iIt largely depends on the properties of the film.

復水器冷却細管として多く用いらnて来九アルミグラス
と呼ばれる銅アルミニクム合金の耐蝕性は主として管内
面に形成される酸化鉄皮膜に依存している。
The corrosion resistance of a copper-aluminum alloy called aluminum glass, which is often used as condenser cooling tubes, mainly depends on the iron oxide film formed on the inner surface of the tubes.

保護皮膜生成技術としてY′11961年Boatwi
ckが硫酸第1欣注入法tI!唱して以来、各発電所に
おいて採用さfL、優れた防蝕効果が必められて米た。
Y'11961 Boatwi as a protective film generation technology
ck is the first sulfuric acid injection method tI! Since its introduction, fL has been adopted at various power plants, and excellent corrosion protection has been required.

しかし冷却水として管内を通る海水が汚染されている場
合には、この方法によっても保護皮膜が生成され薙いと
いう問題と、近年環境保全の見地から海水に薬品が流出
する怖のある薬品注入法は制約されるよう忙なりた0こ
のような状況から熱交換器管の内面防蝕を目的として、
(1)管の製造工場において管内面に鉄分を含む塗料を
塗布しておき人工的に保腰皮l!lIt形成させる。(
1)使用中の管、すなわち旧管についても内面に前記塗
妓処理を行ない人工的に保護皮膜を形成嘔せるようKな
って来た。
However, if the seawater that passes through the pipes as cooling water is contaminated, this method also has the problem of forming a protective film, and in recent years, from the perspective of environmental conservation, chemical injection methods that pose a risk of chemicals leaking into the seawater have been discouraged. Due to this situation, for the purpose of corrosion prevention on the inner surface of heat exchanger tubes,
(1) At the pipe manufacturing factory, a paint containing iron is applied to the inner surface of the pipe to artificially preserve the skin. Form lIt. (
1) It has become possible to artificially form a protective film on the inner surface of pipes in use, that is, old pipes, by applying the coating treatment described above.

このように#1合金の熱炎換器管内面に人工的保護皮膜
を形成させて耐蝕性を高める場合1部分的にでも皮膜不
完全部が残存していると、その部分において集中的に孔
蝕6るいは潰蝕が発生する。従って前記の塗装匙埋を行
なった管は。
In this way, when forming an artificial protective film on the inner surface of a heat exchanger tube made of #1 alloy to improve corrosion resistance, 1. If even a partial film remains, pores will be concentrated in that part. Erosion or ulceration occurs. Therefore, the pipe that was filled with the paint spoon mentioned above.

その全1につき管内面の全周、全長にわ次って検査を実
施することが望ましい。
It is desirable to carry out the inspection over the entire circumference and entire length of the inner surface of the tube.

しかしながら復水器冷却細管等は前記のように寸法的な
制約がらり1本数の量的な制約があるので、従来技術の
検査方法では次のような抜取り検査が1i!施されてい
るに過ぎなかった。
However, as mentioned above, condenser cooling thin tubes, etc. are subject to dimensional restrictions and quantitative restrictions on the number of tubes, so in the conventional inspection method, the following sampling inspection is carried out at 1i! It was just being done.

+1)  代表サンプル管の抜FIL破壊検査全1の0
.148i&C1本数を塗装も3M後に抜取り、学割し
てその内面状況を観察する・(1)内視鏡による観察 ボアスコープt7tttファイバスコープ等の内祝装置
を用いて管内面の観察を行うものであるが、ボアスコー
プではその構造機能上の制約により適用範囲は管端から
1〜5mtでの部分に限定される・1mファイバースコ
ープでは近牛適用範囲が10〜20 mの長尺のものが
製作さn、復水器冷却細管内の全長の観察も可能ではあ
るが、その検査速度が約1m/分と遅<& tyt−y
アイパスフ−1の原理的な問題から解像度が不足であり
、さらに目視判断によらなければならないので熟練が必
要である等により、検査効率および検査精度の点で問題
がある。いずれにせよ多数本の全1検査の実施は不可能
とされ、全量の1〜2%の抜取検査が実atされている
4C過ぎない。
+1) Extraction FIL destructive inspection of representative sample tube Total 1 of 0
.. 148i&C is removed after 3M of painting and its inner surface condition is observed. (1) Observation with an endoscope The inner surface of the tube is observed using a private device such as a borescope T7ttt fiberscope. Due to structural and functional constraints, the applicable range of borescopes is limited to 1 to 5 m from the end of the tube.1m fiberscopes are manufactured in long lengths with an applicable range of 10 to 20 m. Although it is possible to observe the entire length inside the condenser cooling tube, the inspection speed is slow at approximately 1 m/min.
Due to a fundamental problem with the Eye Pass 1, the resolution is insufficient, and since visual judgment must be made, skill is required, which poses problems in terms of inspection efficiency and accuracy. In any case, it is considered impossible to conduct a complete inspection on a large number of samples, and only 4C samples of 1 to 2% of the total quantity are actually inspected.

(発明が解決しようとする問題点) 本発明は前記の従来の検査技術の問題点を解決し、復水
器冷却細管のような小径長尺管も全長、全周にわたって
検査を実施することができ。
(Problems to be Solved by the Invention) The present invention solves the problems of the conventional inspection techniques described above, and makes it possible to inspect the entire length and circumference of small diameter long tubes such as condenser cooling tubes. I can do it.

また検査速度が速く検査能率が高くて多数本の全量検査
を行なうことができ、しかも検査精度が良好で信頼性の
高い検査方法および装置tt−提供することを目的とす
る。
Another object of the present invention is to provide an inspection method and apparatus which have a fast inspection speed, high inspection efficiency, can perform a full inspection of a large number of items, have good inspection accuracy, and are highly reliable.

(問題点を解決する次めの手段1作用、実施例)前記目
的は1本発明方法により、被検査管である内面塗装皮膜
付熱交換器管内を管軸線方向に移行可能なプローブ型の
検出器の透明円筒体の外套内に発光素子1回転ミラーお
よび光電変換素子の一式を搭載して発光素子からの光を
回転ミラーで反射させて被検査管の内面皮1llIを照
射し回転走査し1反射光111o質化を光I!変換素子
に受光して電気iIの変化に変換しP3面BcWX。
(Next Means for Solving the Problems 1 Effects, Examples) The purpose is 1 to detect a probe type that can be moved in the tube axis direction inside a heat exchanger tube with an inner surface coating film, which is a tube to be inspected, by the method of the present invention. A light-emitting element, a rotating mirror, and a set of photoelectric conversion elements are mounted inside the transparent cylindrical envelope of the vessel, and the light from the light-emitting element is reflected by the rotating mirror to irradiate and rotate the inner skin of the tube to be inspected. Reflected light 111o quality is light I! The light is received by the conversion element and converted into a change in electrical iI, which becomes the P3 surface BcWX.

不良部を検知するようFCすることにより達成される。This is achieved by performing FC to detect defective parts.

以下1本発明を添付図を参照しつつ臭体的に説明する。The present invention will be explained in detail below with reference to the accompanying drawings.

先づ目視観察に依存しないで受光1変化により高い検出
精度で不amの検出を可能とする光学系の原理的な構成
から始めて、検出部、制御部、装置全体の構成を順次に
説明する。
First, we will sequentially explain the configuration of the detection section, the control section, and the entire device, starting from the basic configuration of the optical system that enables ambiguity detection with high detection accuracy based on a change in received light without relying on visual observation.

一般に鋼板などの表1ili疵の誦運検査手段として、
可視光線やヘリクムネオンガスレーデー光線を用いる光
学的検査方法が公知である・この方法は、いわゆるシー
ト材を対象とし1発光器よりの光を対象物体に照射し、
対象物体が不透明のときはその反射光soy化1−.ま
九グラスチ7り材など透明のときは透過光loR化を受
光器でとらえて欠陥部tI/g1知する0反射光一方式
には、欠陥入党式と欠陥連光式とがある。欠陥入党式は
、第1図(イ)忙示すように、受光器(alt対象物体
(b)の面での正規の反射光を受光しない位置に配置し
て置き、第1図IP)に示すように対象物体に疵などの
欠陥(c)がわると反射光は散乱するのでその散乱光を
受光して光電変換する。ま九欠陥遣光式では第1図(ハ
)k示すように受光器(a)を正規反射光の入党状mに
しておき、第1図に)に示すように欠陥(C)による散
乱の九めに正規反射光lが減衰する変化を光電変換する
Generally, it is used as a test method for surface flaws on steel plates, etc.
An optical inspection method using visible light or Helium neon gas LED light is known. This method targets a so-called sheet material and irradiates the target object with light from one light emitter.
When the target object is opaque, its reflected light is converted into soy 1-. When the material is transparent, such as a transparent material, the 0-reflection light method detects the loR of the transmitted light with a light receiver and detects the defect tI/g1.There are two types: the defect entry method and the defect continuous light method. The defective joining ceremony is as shown in Figure 1 (a), where the light receiver (alt is placed in a position where it does not receive the normal reflected light from the surface of the target object (b), as shown in Figure 1 IP). When the target object has a defect (c) such as a scratch, the reflected light is scattered, so the scattered light is received and photoelectrically converted. In the case of the defect beaming method, the receiver (a) is set to receive regular reflected light as shown in Fig. 1(c)k, and the scattering due to the defect (C) is set as shown in Fig. 1(c). Ninthly, the change in the attenuation of the regular reflected light l is photoelectrically converted.

本発明では、前記の何れの反射光量方式とも異なり1次
の現象を利用した新しい反射光量方式を採択する。すな
わち、物体の表面の変色や汚れがあると光は散乱せず反
射光量は吸収によ’)iliE資する。本発明はこの現
象を逆用して皮膜の検査を可能とする。実験を行なった
ところ。
The present invention adopts a new reflected light amount method that utilizes a first-order phenomenon, which is different from any of the above-mentioned reflected light amount methods. In other words, if the surface of an object is discolored or dirty, light will not be scattered and the amount of reflected light will be due to absorption. The present invention makes it possible to inspect coatings by making reverse use of this phenomenon. Where the experiment was conducted.

本発明対象物体における金属面(d)からの正規反射光
量と塗装皮膜(s)南からの正規反射先掘の比率は約4
0:1となう九〇皮膜面からの反射光量は極めて微弱で
あるから1本発明では第1図(ホ)”k示すように受光
器(a)に配置する。この配置において第1図(へ)に
示すように塗装不完全部の金属面(d)が通過すれば正
規反射光lが約40倍に増し金属面の通過が検知される
。欠陥両光式と異り散乱反射光による受光1の減少を利
用するものではない。
The ratio of the amount of normal reflected light from the metal surface (d) to the normal reflected light from the south of the painted film (s) in the object of the present invention is approximately 4.
Since the amount of light reflected from the coating surface is extremely weak (90:0:1), in the present invention, the light receiver (a) is arranged as shown in FIG. As shown in (f), when the metal surface (d) of the incompletely painted part passes through, the normal reflected light l increases by about 40 times, and passing through the metal surface is detected.Unlike the defect double-beam method, the scattered reflected light This method does not utilize the decrease in received light 1 due to

本発明くおいては、検査対象の位置が管の内表面である
から、前記現象の利用の九め1発光器を管の中心軸上忙
位置させ、中心軸力向に発光するようにして1回転ミラ
ーで受け、管内壁に向けて放射し、その正規反射光重が
受光できる位置に受光素子を配置する・ 第2図は本発明において使用する光学系のプローブ型の
検出1! (1)の1例を示す。この検出器(1)は小
!!長尺の被検査管(2)内面を管軸線方向に移行可能
なようIC移行間隙だけ小径としたガイド(3) (a
)を中間の透明円筒体(4)と結合して外套(5)とす
る。外筒透明円筒体(4)内には発光素子(6)を持つ
発光!(7)h回転ミラー(8)、光電変換素子(9)
を持つ受光器(至)を固定収納する。
In the present invention, since the position to be inspected is the inner surface of the tube, the ninth step of utilizing the above phenomenon is to position the light emitting device on the central axis of the tube so that it emits light in the direction of the central axis force. It is received by a one-rotation mirror, radiated toward the inner wall of the tube, and a light receiving element is placed at a position where it can receive the regular reflected light weight. Figure 2 shows the probe type detection 1 of the optical system used in the present invention! An example of (1) is shown below. This detector (1) is small! ! A long tube to be inspected (2) A guide (3) with a small diameter for the IC transfer gap so that the inner surface can be moved in the tube axis direction (3) (a
) is combined with an intermediate transparent cylinder (4) to form a mantle (5). Light emitting with a light emitting element (6) inside the outer transparent cylindrical body (4)! (7) h rotating mirror (8), photoelectric conversion element (9)
Securely stores the receiver (to) with a

発光素子(6)としては、指向などの点からシーデー光
線を用い、管内に挿入できる大きさの制限から光通信な
どに用いられる半導体レーザー。
As the light emitting element (6), a semiconductor laser is used for optical communication etc. due to the limitation of the size that can be inserted into the tube, and the CD beam is used from the point of view of directivity.

例えば出力4mwm波長0.8μm、近赤外光のものを
用いる。半導体レーデ−素子【6)より発生し几レーデ
ー光線は発光器ホルダ(ロ)内のレンズ(2)で集光さ
れて管中心軸方向忙放射され、回転ミラー(8)で反射
し透明円筒体(4)を透過して被検査管(2)の内壁に
径1a以下のスポットとして照射される。管内壁からの
正規反射線と透明内筒体の中心線との交点に、前記の受
光器αQの光電変換素子(9)が配置され、管内壁皮膜
面からの微弱反射光を常時受光し反射光1を光電変換す
る0回転ミラー(8)は小形直流モータ(2)により約
12.00Orpmの高速回転を与えられており、レー
デ−スポットビームはこの回転速度で管内壁に照射され
周方向の走査を行う。
For example, one with an output of 4 mw, a wavelength of 0.8 μm, and near-infrared light is used. The radar beam generated by the semiconductor radar element [6] is focused by the lens (2) in the light emitter holder (b) and emitted in the direction of the center axis of the tube, reflected by the rotating mirror (8), and reflected by the transparent cylindrical body. (4) and is irradiated onto the inner wall of the tube to be inspected (2) as a spot with a diameter of 1a or less. The photoelectric conversion element (9) of the light receiver αQ is placed at the intersection of the regular reflection line from the tube inner wall and the center line of the transparent inner cylinder, and constantly receives and reflects the weak reflected light from the tube inner wall coating surface. The zero-rotation mirror (8) that photoelectrically converts the light 1 is given high-speed rotation of about 12.00 Orpm by a small DC motor (2), and the radar spot beam is irradiated onto the inner wall of the tube at this rotation speed and is rotated in the circumferential direction. Perform scanning.

プローブ型の検出器の受光器側の端部にはケーブルコネ
クタα◆が設けられ第3図、第4図に示す後述の管外の
制御装a(ト)と接続ケーブル(至)を介して接続され
る。グロー1型の検出器Fi反射端に連結用鉄片(ロ)
を持つ。
A cable connector α◆ is provided at the end of the probe-type detector on the receiver side, and is connected to an external control device a (g), which will be described later, as shown in Figs. 3 and 4 via a connecting cable (to). Connected. Connecting iron piece (b) to the Glow 1 detector Fi reflection end
have.

第3図は接続ケープtv o#により管内を移動するプ
ローブ型検出器(1)と接続される制御装置の構成の1
例を示す・この装置はプローブ型検出器(1)の九めの
レーデ−ik#(至)回路、モータ電源四回路ならびに
受光信号処理制御回路1表示配録装置等よりなる。前記
のように、管内壁からの反射光は光電変換素子(9)に
受光されて光電変換され、この電気信号は接続ケーブル
(至)を経て増巾器四で増巾てれ微分器(2)を経てグ
ラクン管オシロスコープ(2)に入力され波形観測され
るとともに、ピークホールド回路に)を経てペン書オシ
ログラフ(2)に自動記録される01次比較器に)によ
りあらかじめ設定されたしきい値を越える電圧信号、す
なわち反射光量の増加があったときは自動警報器に)よ
り警報を発して塗装不艮部の存在を判別させる・ 第4図はプローブ型の検出器(1)の管軸線方向の移動
手段を含む検査装置全体の構成を示す。
Figure 3 shows one of the configurations of a control device connected to a probe-type detector (1) that moves in the pipe by a connecting cape tv o#.
To give an example: This device consists of a ninth radar ik# (to) circuit of a probe type detector (1), four motor power supply circuits, a light reception signal processing control circuit, a display/distribution device, etc. As mentioned above, the reflected light from the inner wall of the tube is received by the photoelectric conversion element (9) and photoelectrically converted, and this electrical signal is amplified by the amplifier 4 through the connection cable (to) and then sent to the differentiator (2). ), the waveform is observed by inputting it to the Grain tube oscilloscope (2), and the threshold set in advance by the 01st order comparator (to the peak hold circuit), which automatically records it to the pen oscilloscope (2). If there is a voltage signal that exceeds the value, that is, an increase in the amount of reflected light, an automatic alarm will issue an alarm to determine the presence of unpainted areas. Figure 4 shows the tube of the probe-type detector (1). The overall configuration of the inspection device including the axial moving means is shown.

ベークライトなどの棒状体の先端に永久磁石@を成句は
之遅結具@倉用意し、引張りケーブル@を接続し二τ−
ガンに)を用いて被検査管内に制御装置(至)と反射I
l(ト)から送り込んで通過させ、他側(4)で永久磁
石@、tkM卯の吸着によりプローブ型検出器(1)を
連結する。こうして自動巻歌機(51)を駆動してケー
グル@、連結Amを介しプローブ型検出m(1)をム側
からB1#に管軸線方向に一定運度で牽引移行させなが
ら回転ミラー(8)虻より管内面の回転走査を行う。こ
の移行速度は照射レーデ−光のスポット径1−1回転ミ
ラー(8)の回転数12*000 rpmの場合12m
/分とすることが可能である。検出器(υがB側に達す
ると自動巻取機(si) を停止させ、検出4m1(1
)t一連結具@により取外し、引戻して次の管の検査に
移行する。
Prepare a permanent magnet at the tip of a rod-shaped body such as Bakelite, and prepare a late connection device, and connect a tension cable to the
control device (to) and reflector I in the tube to be inspected using
It is sent from l (g) and allowed to pass through, and the probe type detector (1) is connected to the other side (4) by the attraction of a permanent magnet @, tkM rabbit. In this way, the automatic winding machine (51) is driven to move the probe type detection m(1) from the mu side to B1# with a constant motion in the direction of the tube axis through the cable @ and the connection Am, while the rotating mirror (8) A rotary scan of the inner surface of the tube is performed using a horsefly. This transition speed is 12 m when the spot diameter of the irradiated radar light is 1-1 and the rotation speed of the rotating mirror (8) is 12*000 rpm.
/min. When the detector (υ) reaches the B side, the automatic winder (si) is stopped and the detection 4m1 (1
)T Remove with a series of knots @, pull back, and move on to inspecting the next pipe.

第5図は検出波形例を示す。JIES図に)は皮膜不良
のない正常管部分、第5図(ロ)は中3−2長さ15m
の皮膜不IL部の検出例、第5図−うは面積を有する皮
膜不良部の検出例、第5図に)は点状の皮膜不良の集合
部の検出例である。
FIG. 5 shows an example of a detected waveform. In the JIES diagram) is a normal pipe section with no coating defects, and Figure 5 (b) is the middle 3-2 length of 15 m.
An example of detecting a defective part of the film, FIG. 5 - An example of detecting a defective part of the film having a large area, FIG. 5) is an example of detecting a collection of point-like film defects.

(発明の効果) 本発明によると次OH効果が得られる。(Effect of the invention) According to the present invention, the following OH effect can be obtained.

(1)  高効率化が達成される。(1) High efficiency is achieved.

ファイバースコープなどを媒体とした人為的目視判断忙
依存しない自動検査を実施することが可能となり、従来
技術に比較し約10数倍の高効率化が達成できた。従っ
て復水器冷却細管の全1検査も可能となる・ (鳳) 検出精度の向上 (−目視生新に依存しないため、不艮部の判 〜別kW
&練を必要とせず、かつ不艮部の見落しが皆無となつ几
It has become possible to carry out automatic inspections that do not rely on human visual judgment using a medium such as a fiberscope, and the efficiency has been improved by about 10 times compared to conventional technology. Therefore, it becomes possible to inspect all the condenser cooling tubes (Otori) Improved detection accuracy (-Since it does not depend on visual regeneration, it is possible to identify undisappeared parts by kW
& Natsuri does not require any training and there is no oversight of the unpainted part.

(b)1!米技術では7アイパースコープの解像度の限
界からする不艮部の識別限界が1−以上でありtが1本
発明忙よれば0.5−以上の不Jjsが充分精度よく検
出でき、著しく検査精度が向上し九〇
(b)1! With American technology, the limit of identification of unidentified parts based on the resolution limit of the 7-eye scope is 1- or more, and if t is 1, according to the present invention, irregularities of 0.5- or more can be detected with sufficient accuracy, and the inspection accuracy is significantly improved. improved by 90

【図面の簡単な説明】[Brief explanation of drawings]

第1図(イ)は反射光1方式の欠陥入光式の光学系の配
置を示す図、第1図(ロ)はその欠陥1!1米時の状態
を示す図、第1図(ハ)は反射光1方式の欠陥端光式の
光学系の配dを示す図、第1図に)はその欠陥到来時の
状態を示す図、第1図(ホ)は本発明の光学系の配置お
よび受光状態を示す図。 第1図(へ)はその塗装不完全部の金1I4rNの到来
時の受光量増加状感を示す図、第2図は本発明において
使用する光学系の検出器の1例を示す縦断側面図、第5
因は管内検出器および管外制御装置の構成を示すグロッ
ク配線図、第4因は検出器の管軸方向移動手段を含む本
発明において使用する検査装置の1例の全体の部分縦断
配置説aA幽、第5図(槓は正常管部のオシロスフープ
オシログラフの検出波形図、第5図(ロ)は線状皮膜不
良部の量検出波形図、第5図G−→は面状皮膜下s、m
の量検出波形図、第5図に)は集合点状皮膜下ILsの
同検出波形図である。 (1) @・プローブ型の検出器、(2)・自被検査管
。 (3)・Oガイド* (4) 拳・透明円崎体、(5)
・・外套。 (6)・・発光素子、(7)・・発光!、(8)・・回
転ミラー、(9)・・光w1変換素子、Ql)・・受光
l、(ロ)・−発光mホルダ、(2)・・レンズ&−・
・モータ、 (141・・ケーブルコネクタ、(至)・
・制御装置。 −・働接続ケーグル、(ロ)・・連結用鉄片、(至)・
・レーザー電源、(至)・・毫−夕電源、GIJ・・増
中器、@・・微分器、@・・1クワン管オシロスコープ
、@・・ピークホールド回路、(財)・・ベン書オシロ
グラフ、@・・比較器、(2)・命警報!i1. @・
・永久磁石、@・・連結具、@・−引張りケ−7”/I
/、働・−エヤーガン、 (si)・・自動巻a機、(
4)CB)・・管端記号、(a)・・受光器。 (b)・・対象物体、(C)・・欠陥、(由・・企真面
。 (・)拳・皮膜面。
Figure 1 (a) is a diagram showing the arrangement of the optical system of the defective light incident type of reflected light 1 method, Figure 1 (b) is a diagram showing the state at the time of defect 1! ) is a diagram showing the layout of the optical system of the defective edge light type of the reflected light 1 method, Figure 1) is a diagram showing the state when the defect occurs, and Figure 1 (e) is the diagram of the optical system of the present invention. A diagram showing the arrangement and light reception state. Fig. 1(f) is a diagram showing an increase in the amount of light received when gold 1I4rN arrives at the incompletely painted part, and Fig. 2 is a longitudinal side view showing an example of the detector of the optical system used in the present invention. , 5th
The cause is a Glock wiring diagram showing the configuration of the in-tube detector and the extra-tube control device, and the fourth reason is the overall partial longitudinal layout of an example of the inspection device used in the present invention, including the means for moving the detector in the tube axis direction aA Figure 5 (Figure 5 is a detection waveform diagram of the oscilloscope hoop oscillograph for a normal tube section, Figure 5 (b) is a waveform diagram for detecting the amount of a linear coating defect, and Figure 5 G-→ is a detection waveform diagram for the area under the planar membrane. s, m
Figure 5) shows the detection waveform of ILs under the membrane in the form of aggregated points. (1) @ Probe-type detector, (2) Self-inspection tube. (3)・O guide* (4) Fist・Transparent Enzaki body, (5)
··mantle. (6)...Light emitting element, (7)...Light emission! , (8)...Rotating mirror, (9)...Light w1 conversion element, Ql)...Light receiving l, (B)...-Emitting m holder, (2)...Lens &-...
・Motor, (141...cable connector, (to)
·Control device. −・Working connection cable, (B)・Connecting iron piece, (To)・
・Laser power supply, (to) ・・Light power supply, GIJ・・Intensifier, @・・Differentiator, @・・1 quan tube oscilloscope, @・・Peak hold circuit, (Foundation)・・・Benn book oscilloscope Graph, @... Comparator, (2) - Life alert! i1. @・
・Permanent magnet, @...Connector, @-Tension case-7"/I
/, working - air gun, (si)... automatic winding a machine, (
4) CB)...tube end symbol, (a)...light receiver. (b)...Target object, (C)...Defect, (Yu...Surious face. (・)Fist/film surface.

Claims (3)

【特許請求の範囲】[Claims] (1)被検査管である内面塗装皮膜付熱交換器管内を管
軸線方向に移行可能なプローブ型の検出器の透明円筒体
の外套内に発光素子、回転ミラーおよび光電変換素子の
一式を搭載して、発光素子からの光を回転ミラーで反射
させて被検査管の内面皮膜を照射し回転走査し、反射光
量の変化を光電変換素子に受光して電気量の変化に変換
し内面皮膜の不良部を検知することを特徴とする内面塗
装皮膜付熱交換器管の内面皮膜の検査方法。
(1) A set of light-emitting elements, rotating mirrors, and photoelectric conversion elements are mounted inside the transparent cylindrical jacket of a probe-type detector that can be moved in the tube axis direction inside a heat exchanger tube with an inner surface coating, which is the tube to be inspected. Then, the light from the light emitting element is reflected by a rotating mirror to irradiate the inner surface coating of the tube to be inspected and then rotated and scanned, and the change in the amount of reflected light is received by a photoelectric conversion element and converted into a change in the amount of electricity, which detects the inner surface coating. A method for inspecting the inner surface coating of a heat exchanger tube with an inner surface coating film, which is characterized by detecting defective parts.
(2)内面皮膜からの正規反射光を光電変換素子により
受光する特許請求の範囲第1項記載の方法。
(2) The method according to claim 1, wherein the regularly reflected light from the inner surface film is received by a photoelectric conversion element.
(3)外套を透明円筒体により形成してその内部に発光
素子、回転ミラーおよび光電変換素子の一式を搭載した
プローブ型の検出器と、プローブ型検出器を被検査管で
ある内面皮膜付熱交換器管内を管軸線方向に移行走査さ
せる牽引移行装置と、プローブ型の検出器から牽引方向
と反射方向に管内を通して接続される駆動、制御、測定
装置とからなる内面塗装皮膜付熱交換器管の内面皮膜の
検査装置。
(3) A probe-type detector whose jacket is made of a transparent cylindrical body and a set of light-emitting elements, rotating mirrors, and photoelectric conversion elements are mounted inside it; A heat exchanger tube with an inner surface coating, consisting of a traction transfer device that scans the inside of the exchanger tube in the tube axis direction, and a drive, control, and measurement device connected from a probe-type detector through the tube in the traction and reflection directions. Inspection device for inner surface coating.
JP60073349A 1985-04-05 1985-04-05 Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film Pending JPS61231404A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60073349A JPS61231404A (en) 1985-04-05 1985-04-05 Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60073349A JPS61231404A (en) 1985-04-05 1985-04-05 Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film

Publications (1)

Publication Number Publication Date
JPS61231404A true JPS61231404A (en) 1986-10-15

Family

ID=13515595

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60073349A Pending JPS61231404A (en) 1985-04-05 1985-04-05 Method and apparatus for inspecting of film on inner surface of heat exchange pipe provided with inner surface coating film

Country Status (1)

Country Link
JP (1) JPS61231404A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63127112A (en) * 1986-11-17 1988-05-31 Komatsu Ltd Apparatus for detecting crack of tunnel
JPS6479613A (en) * 1987-09-21 1989-03-24 Komatsu Mfg Co Ltd Tunnel crack detection apparatus
FR2694836A1 (en) * 1992-08-11 1994-02-18 Framatome Sa Device for controlling the guide elements of a guide tube of the upper internal equipment of a pressurized water nuclear reactor.
EP0655747A1 (en) * 1993-11-25 1995-05-31 Framatome Apparatus and method for inspecting the guiding elements of a guide thimble in the upper internals of a pressurized water reactor
JP2001194483A (en) * 2000-01-12 2001-07-19 Ishikawajima Harima Heavy Ind Co Ltd Coating degradation diagnosis method and device
US6952264B2 (en) * 2001-12-13 2005-10-04 3M Innovative Properties Company Dose radiometer
CN103776396A (en) * 2012-10-17 2014-05-07 深圳富泰宏精密工业有限公司 Flatness detection device
CN109539984A (en) * 2018-11-29 2019-03-29 华南农业大学 A kind of rice strain identification positioning device and localization method based on infrared sensor

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63127112A (en) * 1986-11-17 1988-05-31 Komatsu Ltd Apparatus for detecting crack of tunnel
JPS6479613A (en) * 1987-09-21 1989-03-24 Komatsu Mfg Co Ltd Tunnel crack detection apparatus
FR2694836A1 (en) * 1992-08-11 1994-02-18 Framatome Sa Device for controlling the guide elements of a guide tube of the upper internal equipment of a pressurized water nuclear reactor.
EP0655747A1 (en) * 1993-11-25 1995-05-31 Framatome Apparatus and method for inspecting the guiding elements of a guide thimble in the upper internals of a pressurized water reactor
FR2713010A1 (en) * 1993-11-25 1995-06-02 Framatome Sa Device and method for controlling the guide elements of a guide tube of the upper internal equipment of a pressurized water nuclear reactor.
JP2001194483A (en) * 2000-01-12 2001-07-19 Ishikawajima Harima Heavy Ind Co Ltd Coating degradation diagnosis method and device
US6952264B2 (en) * 2001-12-13 2005-10-04 3M Innovative Properties Company Dose radiometer
CN103776396A (en) * 2012-10-17 2014-05-07 深圳富泰宏精密工业有限公司 Flatness detection device
CN103776396B (en) * 2012-10-17 2017-12-22 深圳富泰宏精密工业有限公司 Flatness checking device
CN109539984A (en) * 2018-11-29 2019-03-29 华南农业大学 A kind of rice strain identification positioning device and localization method based on infrared sensor

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