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JPS61153548A - Inspecting method of printed matter - Google Patents

Inspecting method of printed matter

Info

Publication number
JPS61153548A
JPS61153548A JP59278817A JP27881784A JPS61153548A JP S61153548 A JPS61153548 A JP S61153548A JP 59278817 A JP59278817 A JP 59278817A JP 27881784 A JP27881784 A JP 27881784A JP S61153548 A JPS61153548 A JP S61153548A
Authority
JP
Japan
Prior art keywords
signal
difference
pattern
printed matter
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59278817A
Other languages
Japanese (ja)
Other versions
JPH0367631B2 (en
Inventor
Toshiaki Masuda
増田 俊朗
Koichi Ishizuka
石塚 紘一
Toshiji Fujita
藤田 利治
Yoshio Kinoshita
喜夫 木下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Toppan Inc
Original Assignee
Mitsubishi Heavy Industries Ltd
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd, Toppan Printing Co Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP59278817A priority Critical patent/JPS61153548A/en
Publication of JPS61153548A publication Critical patent/JPS61153548A/en
Publication of JPH0367631B2 publication Critical patent/JPH0367631B2/ja
Granted legal-status Critical Current

Links

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  • Image Processing (AREA)
  • Character Discrimination (AREA)
  • Image Analysis (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve inspection precision by decomposing the entire surface of the pattern of printed matter into plural picture elements and inputting a pattern signal, extracting picture elements whose print trouble detection signal exceeds a permissible value and edge parts of the pattern, and masking detection signals of corresponding picture elements. CONSTITUTION:A pattern signal of each picture element inputted from a detection part is stored in a reference memory 17 in reference signal fetch mode through an A/D converter 15. At the same time, a reference signal SSS is transferred to a difference circuit 16 to calculate a difference of each picture element from the signal SSS. At this time, the signal SSS is in the zero state and a difference inspection signal DIS becomes equal to the signal SSS. The signal DIS is delayed by several picture elements through a delay circuit 19 and a difference circuit 18 performs difference arithmetic to obtain a secondary difference signal DDS. A threshold circuit 20 extracts a picture element corresponding to the secondary difference signal DDS exceeding the permissible value as an edge part of the pattern and a CPU14 writes the edge extraction result of each picture element in a mask memory 30. Then, inspection as to pattern information inputted to a detection part 4 is carried out to improve the precision of the inspection.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は印刷機において印刷中の印刷物の状態をインラ
インで、標準状態と比較し、印刷物の異常を検出するた
めの印刷物検査方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a printed matter inspection method for in-line comparing the condition of a printed matter being printed with a standard state in a printing press to detect abnormalities in the printed matter.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

従来、印刷物の検査はオフラインで人間の視覚に頼って
行なわれる方法が主流であった。これは印刷物が1点1
点絵柄が違うということや、印刷物における検査項目が
人間の視覚に頼らざるを得ない微妙な差を問題にしてい
ると考えられてきたことに由来している。一方、印刷中
の印刷物を評価したいという要望に答えて、印刷速度に
同期したストロボ照明を行ったり、高速で同期回転する
ミラーを用いて印刷中の印刷物を静止画像として判断し
ようとする試みが行われた。しかし、これらの手段も人
間の視覚に検査を依存しているという点では検査機と呼
べる段階のシステムではながった。また、印刷物の絵柄
と同時にカラーバッチを印刷し、カラーパッチの検査を
行うことにより印刷物の検査を代行させようという試み
も行われている。しかし、この方法では印刷障害(油タ
ン、汚れ等)が絵柄部に生じた場合、見逃してしまうこ
とになり、検査機の機能を十分果しているとはいえなか
った。
Conventionally, the mainstream method for inspecting printed matter has been offline and relying on human vision. This is one printed item.
This comes from the fact that the dot patterns are different, and the subtle differences in inspection items on printed matter that require reliance on human vision have been thought to be a problem. On the other hand, in response to the desire to evaluate printed matter while it is being printed, attempts have been made to use strobe lighting that is synchronized with the printing speed and to use mirrors that rotate synchronously at high speed to judge printed matter that is being printed as a still image. I was disappointed. However, in that these methods rely on human vision for inspection, they are no longer systems that can be called inspection machines. In addition, attempts have been made to print color batches at the same time as the patterns on the printed matter and inspect the color patches, thereby allowing the inspection of the printed matter to be carried out for them. However, with this method, if printing defects (oil stains, stains, etc.) occur in the pattern area, they will be overlooked, and it could not be said that the function of the inspection machine was fully fulfilled.

一方、最近特願昭57−220515号による「印刷物
検査装置」に見られるように印刷物の検査をインライン
でラインセンサを利用して行うというシステムが提案さ
れている。この方法を利用することにより印刷物の絵柄
自体をインラインで自動検査できるため、前述の欠点が
な(検査機としては優れた効果が期待でき□る。
On the other hand, a system has recently been proposed in which printed matter is inspected in-line using a line sensor, as seen in Japanese Patent Application No. 57-220515 titled "Print Inspection Apparatus." By using this method, the pattern itself of printed matter can be automatically inspected in-line, so the above-mentioned drawbacks are avoided (excellent effects can be expected as an inspection machine).

しかし、このシステムにも問題がないわけではなく、印
刷物の絵柄を画素単位で画像情報として入力して取扱う
ため、印刷紙面上の画素と入力のサンプリングの位相ズ
レが大きな問題としてクローズアップされる。
However, this system is not without its problems, and because the design of printed matter is input and handled pixel by pixel as image information, the phase shift between the pixels on the printed paper and the input sampling has been highlighted as a major problem.

この問題を解決するために、特願昭58−172777
号「走行印刷物の検査における同期不良補正方法」に見
られるように同期ズレを補正しながらサンプリングを行
う方法が提案されているし。
In order to solve this problem, patent application No. 58-172777
A method of sampling while correcting synchronization errors has been proposed, as seen in the issue of ``Method for correcting synchronization errors in inspection of running printed matter''.

また、特願昭59−134816号の「印刷物検査方法
」のように光学的なボケと加算回路を利用して同期ズレ
によるエツジ部の偽異常検出を防ぐ方法も提案されてい
る。
Furthermore, a method has been proposed, such as the ``printed matter inspection method'' of Japanese Patent Application No. 59-134816, which utilizes optical blur and an addition circuit to prevent false detection of abnormalities at edges due to synchronization deviations.

このように、印刷物の絵柄情報の入力の際の位相ズレは
インラインでの印刷物の検査において大きな問題であり
、特にその傾向は絵柄のエツジ部(輪郭)において顕著
である。
As described above, the phase shift when inputting the pattern information of printed matter is a major problem in in-line inspection of printed matter, and this tendency is particularly noticeable at the edges (contours) of the pattern.

〔発明の目的〕[Purpose of the invention]

本発明は上記問題点を解決し1位相ズレに伴なう絵柄エ
ツジ部の偽異常信号の発生を防止し、精度の高い検査を
可能とする印刷物検査方法を提供するものである。
The present invention solves the above-mentioned problems, and provides a printed matter inspection method that prevents the generation of false abnormal signals at the edge of a pattern due to a one-phase shift, and enables highly accurate inspection.

〔発明の概要〕[Summary of the invention]

本発明は、上記目的を達既すべくなされたものであり印
刷物の絵柄を画素毎にとり込み、この検出された画素毎
の絵柄情報をデジタル信号に変換して、予じめ記憶され
ている画素毎の基準情報との差分を行い、得られた差分
情報をセンサの走査方向に数画素移動した差分情報と再
度差分を行い、その結果が許容範囲内に存在するか否か
を判別する印刷物検査方法(特願昭58−172778
号「印刷物の検査方法」)と組合せてセンサの走査方向
におけるエツジ抽出の結果得られたエツジ部に検査実行
可否のマスキングを行うことにより、位相ズレに伴う絵
柄エツジ部の偽異常信号の発生を防止することを特徴と
する印刷物検査方法である。
The present invention has been made to achieve the above-mentioned object, and it captures the pattern of a printed matter pixel by pixel, converts the detected pattern information for each pixel into a digital signal, and converts the detected pattern information of each pixel into a digital signal. Print inspection that performs a difference with reference information for each time, then performs a difference again with the difference information obtained by moving several pixels in the scanning direction of the sensor, and determines whether the result is within the allowable range. Method (Patent application No. 58-172778
By masking whether the inspection can be performed or not on the edges obtained as a result of edge extraction in the scanning direction of the sensor, it is possible to prevent the generation of false abnormal signals at the edges of the picture due to phase shift. This is a printed matter inspection method characterized by preventing.

〔発明の詳述〕[Details of the invention]

以下に、本発明を図面に示す実施例を参考に詳細に説明
する。第1図は本発明にかかる印刷物の検査方法を実施
するための装置のブロックダイアグラムであり、第2図
は輪転印刷機に第1図に示す装置を取り付けた状態を示
す概略説明図である。
The present invention will be described in detail below with reference to embodiments shown in the drawings. FIG. 1 is a block diagram of an apparatus for implementing the printed matter inspection method according to the present invention, and FIG. 2 is a schematic explanatory diagram showing the apparatus shown in FIG. 1 attached to a rotary printing press.

第2図に示されるように、ロール状の巻取用紙(2)よ
り供給された帯状の印刷用紙(3)は印刷部(11で表
裏4色(墨、藍、赤、黄)づつの印刷が行なわれた後、
ドライヤ、折損部(図示せず)に搬送される。印刷物検
査装置は表裏4色づつの印刷された後の印刷状態を検査
するため、印刷部にとりつけられたロータリーエンコー
ダ(5)でサンプリングのタイミングをとりながら、絵
柄情報を印刷物の流れ方向に直向する方向に延在した検
出部(4)のCOD−MOS等のラインセンサにより該
ラインセンサの走査を主走査とし、印刷物の流れを副走
査として絵柄全面を画素単位で処理回路(6)へとりこ
み、印刷物の正常・異常の判断作業を行なう。この結果
、印刷状態が異常であると判別された場合には、アラー
ム、マーキング、リジェクト等の手段にて対応すること
が可能となる。上記処理回路(6)として1本出願人は
、特願昭58−172788号−「印刷物の検査方法」
にて、第1図に示される回路構成を用いて印刷不良を精
度良く検出できる方法を提案している。
As shown in Fig. 2, a strip of printing paper (3) fed from a roll of paper (2) is printed at a printing section (11) in four colors (black, indigo, red, yellow) on each side. After the
It is transported to a dryer and a broken section (not shown). The printed matter inspection device inspects the printing condition after the front and back sides have been printed in four colors, so the rotary encoder (5) attached to the printing section adjusts the sampling timing and directs the pattern information in the direction of flow of the printed matter. A line sensor such as a COD-MOS of a detection unit (4) extending in the direction of the image captures the entire image pixel by pixel into the processing circuit (6) with the line sensor scanning as main scanning and the flow of the printed material as sub-scanning. , to determine whether printed materials are normal or abnormal. As a result, if it is determined that the printing condition is abnormal, it becomes possible to take measures such as alarms, markings, and rejects. As the above-mentioned processing circuit (6), the present applicant has filed Japanese Patent Application No. 172788-1988 - "Printed matter inspection method"
proposed a method for accurately detecting printing defects using the circuit configuration shown in FIG.

この検査方法について説明すれば、第1図に示されるよ
うに、印刷部の版胴或いは圧胴等にとりつげられたロー
タリーエンコーダ(5)より発生したタイミングパルス
TMPに基づいて、タイミングコントロール部1111
カメモリ−コントロール部α3及びサンプリングコント
ロール部(121を制御し、メモリーコントロール部(
131はタイミングコントロール部(12+の信号とC
PUc!31からのモード切替信号MSSに従って、基
準メモ!j−(17)への基準信号SSSのとりこみゃ
差分回路(1e、累積カウンタ(2Dを制御する。サン
プリングコントロール部(121はCC’Dラインセン
サ等から構放される検出部(4)に転送りロックやサン
プリングスタート信号を与える。以上の回路によって、
本処理回路のタイミング及びスイッチングが制御される
To explain this inspection method, as shown in FIG. 1, a timing control section 1111
The memory control unit α3 and the sampling control unit (121) are controlled, and the memory control unit (
131 is a timing control section (12+ signal and C
PUc! According to the mode switching signal MSS from 31, the standard memo! The reference signal SSS is taken into the differential circuit (1e, which controls the cumulative counter (2D). The above circuit provides lock and sampling start signals.
The timing and switching of the processing circuitry is controlled.

次に、検出部(4)から入力される画素毎の絵柄信号は
A/Dコンバータ霞を介してデジタル信号とされた後、
検量に先だって、正常な印刷物の絵柄信号がとり込まれ
たときに、基準信号とり込みモードでその絵柄信号を基
準メモリー(171に記憶される。基準信号が設定され
た後、検査モードに移行し、絵柄信号は検査信号SIS
として第1の差分回路ルヘ送られる。この際、メモリー
コントロール部(131よりのコントロール信号に基づ
いて基準信号SSSが基準メモ+)−(Inより読み出
され、第1の差分回路畑へ転送される。
Next, the picture signal for each pixel input from the detection unit (4) is converted into a digital signal via an A/D converter, and then
Prior to calibration, when the pattern signal of a normal printed matter is captured, the pattern signal is stored in the reference memory (171) in the reference signal capture mode. After the reference signal is set, the mode is shifted to the inspection mode. , the picture signal is the inspection signal SIS
The signal is sent to the first differential circuit as a signal. At this time, the reference signal SSS is read from the reference memory +)-(In based on the control signal from the memory control unit (131) and transferred to the first differential circuit field.

第1の差分回路時では、対応する画素毎に基準信号SS
Sと検査信号SISの差分演算がなされ。
In the first differential circuit, the reference signal SS is set for each corresponding pixel.
A difference calculation is performed between S and the inspection signal SIS.

この結果差分検査信号DISが得られる。この後、該差
分検査信号CDSは6つに分岐され、その1つは遅延回
路(11を経て第2の差分回路時へ、他の1つは直接第
2の差分回路t18)へ転送される。遅延回路a9にお
ける遅延量は検査対称の数画素(6〜5画素)相当が適
当である。第2の差分回路a&では、差分検査信号DI
Sと数画素遅延された差分検査信号DISとの画素毎の
差分演算が施され。
As a result, a differential test signal DIS is obtained. After this, the differential test signal CDS is branched into six parts, one of which is transferred to the second differential circuit via the delay circuit (11), and the other one is transferred directly to the second differential circuit t18. . The appropriate amount of delay in the delay circuit a9 is equivalent to several pixels (6 to 5 pixels) to be inspected. In the second differential circuit a&, the differential test signal DI
A pixel-by-pixel difference calculation is performed between S and the differential inspection signal DIS delayed by several pixels.

2次差分信号DDSが得られる。A secondary difference signal DDS is obtained.

この2次差分信号DDSはスレッシュホールド回路■へ
送られ、CPU(141からのスレッシュホールド設定
信号SHCに基づいたスレッシュホールドレベルにて判
別され、2次差分信号DDSがスレッシュホールドレベ
ルを超えた場合には印刷異常であるとして異常信号IR
3をCPU(141に送る。
This secondary difference signal DDS is sent to the threshold circuit ■, and is determined based on the threshold level based on the threshold setting signal SHC from the CPU (141), and when the secondary difference signal DDS exceeds the threshold level, is a printing error and sends an error signal IR.
3 to the CPU (141).

一方、3分岐された残りの1つの差分検査信号DI8は
その値が累積カウンタにて一定画素数毎に集計され、積
分一度信号IDSとして判別回路(221に転送される
。判別回路(2)は全体濃度変動の範囲があらかじめ設
定された値をオーバーした場合には異常信号IR8をC
PU(141に送る。
On the other hand, the value of the remaining three-branched differential test signal DI8 is totaled for each fixed number of pixels by an accumulation counter, and transferred to the discrimination circuit (221) as an integrated signal IDS.The discrimination circuit (2) If the range of overall concentration fluctuation exceeds the preset value, the abnormal signal IR8 is activated.
Send to PU (141).

CPU(141は、スレッシュホールド回路口または判
別回路のより異常信号IR8が送られてきた場合にはア
ラーム、マーキング、リジェクト等を行なうための信号
を出力する。このように、2次差分信号DDS=積分濃
度信号IDSに基づいて異常判別を行なえば、正確な検
査を期待することができる。
When the CPU (141) receives the abnormal signal IR8 from the threshold circuit or the discrimination circuit, it outputs a signal for alarming, marking, rejecting, etc. In this way, the secondary difference signal DDS= If an abnormality is determined based on the integrated concentration signal IDS, accurate inspection can be expected.

本発明によれば、このような正確な検査を行なうことの
できる回路構成と同一の回路構成にて印刷物の絵柄のエ
ツジ部(輪郭)を抽出するものである。
According to the present invention, the edge portion (contour) of a pattern on a printed matter is extracted using the same circuit configuration as that capable of performing such accurate inspection.

即ち、基準信号SSS設定時に基準メモ’J −(17
1への書き込みと同時に第1の差分回路061へ基準信
号SSSを転送し、基準メモIJ −(171からの基
準信号SSSと画素毎の差分を行なう。このとき、基準
信号SSSは、絵柄信号の記憶前であるので零の状態で
あり、結果的に差分検査信号DISは基準信号SSSと
等しくなる。従って差分検査信号DISは、絵柄のエツ
ジ部では濃度変化が存在するために、例えば第3図に実
線で示されるような信号となる。
That is, when setting the reference signal SSS, the reference memo 'J - (17
At the same time as writing to 1, the reference signal SSS is transferred to the first difference circuit 061, and a difference is made for each pixel with the reference signal SSS from the reference memo IJ-(171. At this time, the reference signal SSS is the picture signal. Since it is before storage, it is in a zero state, and as a result, the differential inspection signal DIS becomes equal to the reference signal SSS.Therefore, since there is a change in density at the edge of the pattern, the differential inspection signal DIS is, for example, as shown in FIG. The signal will be as shown by the solid line.

この差分検査信号DISを遅延回路a9にて数画素遅延
すると、第6図に示されるようにもとの差分検査信号D
ISに対して一点鎖線で示されるような関係にある信号
となる。両者を第2の差分回路(181にて差分演算す
ると、第4図に示されるように濃度が変化している絵柄
のエツジ部において突出する二次差分信号DDSを得る
ことができ、スレッシュホールド回路■にて適当なスレ
ッシュホールドレベルSHCを設定し、これを超える信
号を抽出することによりエツジ抽出信号を得ることがで
きる。このエツジ抽出信号は検査時における異常信号I
tsに対応するものである。
When this differential test signal DIS is delayed by several pixels in the delay circuit a9, the original differential test signal D is returned as shown in FIG.
The signal has a relationship with the IS as shown by the dashed line. When the difference between the two is calculated by the second difference circuit (181), it is possible to obtain a secondary difference signal DDS that stands out at the edge portion of the pattern where the density is changing as shown in FIG. An edge extraction signal can be obtained by setting an appropriate threshold level SHC and extracting a signal exceeding this level.This edge extraction signal is used as an abnormal signal I during inspection.
This corresponds to ts.

CPUa市では、エツジ抽出信号を受けてマスクメモI
7− (3fll)に画素毎にエツジ抽出の結果を例え
ばエツジ1.非エツジ0として書き込む。
CPUa receives the edge extraction signal and prints mask memo I.
7- (3fl), the result of edge extraction for each pixel, for example, edge 1. Write as non-edge 0.

このようにして基準メモリー出力と同時にマスクメモリ
ー(7)が設定された後、検出部(4)にてとり込まれ
ろ絵柄情報について前述した如(の検査を行ない1画素
毎の印刷異常の判別を行なう。CPU04+からは、画
素毎に印刷異常時1.正常時0の判別信号が出力され、
他方これと同期してマスクメモリー(30)からエツジ
抽出信号(エツジ1.非エツジ0)を画素毎に読み出し
、さらに反転してエツジ0、非エツジ1とした信号を前
記判別信号とともにアンド回路31)に入力する。これ
により絵柄のエツジ部分がマスキングされ、たとえエツ
ジ部分に印刷異常が生じてもアンド回路(31)の出力
はエツジ部分において常に0となり、印刷異常を示す1
nの信号は出力されない。
After the mask memory (7) is set at the same time as the reference memory output in this way, the image information taken in by the detection unit (4) is inspected as described above to determine whether there is a printing abnormality for each pixel. The CPU04+ outputs a discrimination signal of 1 for printing abnormality and 0 for normal printing, for each pixel.
On the other hand, in synchronization with this, an edge extraction signal (edge 1, non-edge 0) is read out for each pixel from the mask memory (30), and the signal is further inverted to make edge 0 and non-edge 1, and is sent to the AND circuit 31 together with the discrimination signal. ). As a result, the edge portion of the pattern is masked, and even if a printing error occurs in the edge portion, the output of the AND circuit (31) will always be 0 at the edge portion, and the output will be 1 indicating a printing error.
The n signal is not output.

〔発明の効果〕〔Effect of the invention〕

以上に詳述したように、本発明によれば、基準信号との
比較を常に検出部(4)のラインセンサの走置方向にの
み行なう特願昭58−172788号「印刷物の検査方
法」に提案した検査手段にて印刷物に発生した異常を検
出するので、全体的な濃度変化に左右されず、しかも印
刷物搬送方向における同期ズレに対して影響を受けに(
い等の高精度の検査を行なうことができることはもちろ
んのこと、前記「印刷物の検査方法」を実施するfこめ
の回路を利用して絵柄のエツジ部(輪郭)を抽出するこ
とができるので回路構成を簡素化することが可能となり
5またこのエツジ抽出信号を利用して1位相ズレが発生
した際偽の異常信号の発生する可能性の高いエツジ部の
検査をキャンセルすることが可能となり、より精度の高
い検査を行なうことができるものである。
As detailed above, according to the present invention, the comparison with the reference signal is always performed only in the running direction of the line sensor of the detection unit (4). Since the proposed inspection means detects abnormalities that occur in printed matter, it is not affected by overall density changes and is not affected by synchronization deviations in the printed matter transport direction (
Not only is it possible to perform high-precision inspections such as It becomes possible to simplify the configuration, and using this edge extraction signal, it becomes possible to cancel the inspection of the edge part where there is a high possibility of generating a false abnormal signal when a one-phase shift occurs. This allows for highly accurate inspection.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の一実施例を示すものであり、第1図は本
発明にかかる検査装置の回路構成を示すブロックダイア
グラム、第2図は本発明を輪転印刷機に応用する場合の
説明図、第3図は絵柄のエツジ部における基準信号の一
例を示すモデル図、第4図は2次差分信号を示すモデル
図である。 (4)・・・検出部 15)・・・ロータリーエンコーダ 住e・・・第1の差分回路 囮・・・第2の差分回路 (14I・・・CPU 艶・・・マスクメモリー (31)・・・アンド回路
The drawings show one embodiment of the present invention, and FIG. 1 is a block diagram showing the circuit configuration of an inspection device according to the present invention, and FIG. 2 is an explanatory diagram when the present invention is applied to a rotary printing press. FIG. 3 is a model diagram showing an example of a reference signal at the edge portion of a picture, and FIG. 4 is a model diagram showing a secondary difference signal. (4)...Detection unit 15)...Rotary encoder housing e...First differential circuit decoy...Second differential circuit (14I...CPU gloss...Mask memory (31)...・AND circuit

Claims (1)

【特許請求の範囲】[Claims] 1)印刷物の絵柄全面を複数の画素に分解して絵柄信号
を取り込み、正常な印刷物の絵柄信号を基準メモリに基
準信号として設定し、以後の印刷物の絵柄信号を前記基
準信号と第1の差分回路にて差分演算し、さらにこの差
分演算により得られた信号とこの差分演算により得られ
た信号を数画素遅延した信号を第2の差分回路にて差分
演算し、この差分演算値について基準値と比較して印刷
障害の有無を検出する印刷物の検査方法において、前記
基準情報となるべき絵柄情報を基準メモリーに設定する
とともに零状態の基準メモリーの内容と前記第1の差分
回路にて差分演算を施し、この差分信号とこの差分信号
を数画素遅延した信号とを第2の差分回路にて差分演算
し、この差分信号に対して許容値を設定し、許容値を超
える信号に対応する画素を絵柄のエッジ部として抽出し
、この絵柄のエッジ部に相当する画素につき前記印刷障
害検出信号にマスク処理を施すことを特徴とする印刷物
の検査方法。
1) Decompose the entire image of the printed matter into a plurality of pixels and capture the image signal, set the image signal of the normal printed matter in the reference memory as the reference signal, and calculate the pattern signal of the subsequent printed matter by the first difference between the reference signal and the reference signal. A difference calculation is performed in the circuit, and a difference is calculated between the signal obtained by this difference calculation and a signal obtained by delaying the signal obtained by this difference calculation by several pixels in a second difference circuit, and a reference value is calculated for this difference calculation value. In a printed matter inspection method for detecting the presence or absence of a printing failure by comparing with the reference information, the picture information to be the reference information is set in the reference memory, and a difference is calculated between the content of the reference memory in the zero state and the first difference circuit. A second difference circuit calculates a difference between this difference signal and a signal delayed by several pixels from this difference signal, sets a tolerance value for this difference signal, and selects a pixel corresponding to a signal exceeding the tolerance value. 1. A method for inspecting a printed matter, comprising: extracting the image as an edge portion of a pattern, and performing mask processing on the printing failure detection signal for pixels corresponding to the edge portion of the pattern.
JP59278817A 1984-12-26 1984-12-26 Inspecting method of printed matter Granted JPS61153548A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59278817A JPS61153548A (en) 1984-12-26 1984-12-26 Inspecting method of printed matter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59278817A JPS61153548A (en) 1984-12-26 1984-12-26 Inspecting method of printed matter

Publications (2)

Publication Number Publication Date
JPS61153548A true JPS61153548A (en) 1986-07-12
JPH0367631B2 JPH0367631B2 (en) 1991-10-23

Family

ID=17602564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59278817A Granted JPS61153548A (en) 1984-12-26 1984-12-26 Inspecting method of printed matter

Country Status (1)

Country Link
JP (1) JPS61153548A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01263050A (en) * 1988-04-15 1989-10-19 Nec Corp Examining device for printed matter
JPH04339653A (en) * 1991-05-16 1992-11-26 Nireco Corp Apparatus for inspecting printing fault
JPH07325044A (en) * 1995-06-09 1995-12-12 Dainippon Screen Mfg Co Ltd Pattern inspection apparatus for printed board
JP2003025690A (en) * 2001-07-16 2003-01-29 Canon Inc Imaging apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01263050A (en) * 1988-04-15 1989-10-19 Nec Corp Examining device for printed matter
JPH04339653A (en) * 1991-05-16 1992-11-26 Nireco Corp Apparatus for inspecting printing fault
JPH07325044A (en) * 1995-06-09 1995-12-12 Dainippon Screen Mfg Co Ltd Pattern inspection apparatus for printed board
JP2003025690A (en) * 2001-07-16 2003-01-29 Canon Inc Imaging apparatus

Also Published As

Publication number Publication date
JPH0367631B2 (en) 1991-10-23

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