JPS6038869A - Two-dimensional charge coupled device image sensor - Google Patents
Two-dimensional charge coupled device image sensorInfo
- Publication number
- JPS6038869A JPS6038869A JP58146929A JP14692983A JPS6038869A JP S6038869 A JPS6038869 A JP S6038869A JP 58146929 A JP58146929 A JP 58146929A JP 14692983 A JP14692983 A JP 14692983A JP S6038869 A JPS6038869 A JP S6038869A
- Authority
- JP
- Japan
- Prior art keywords
- transfer
- image sensor
- electrodes
- dimensional
- vertical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011159 matrix material Substances 0.000 claims description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 19
- 229920005591 polysilicon Polymers 0.000 abstract description 19
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 9
- 229910052782 aluminium Inorganic materials 0.000 abstract description 9
- 230000006866 deterioration Effects 0.000 abstract description 5
- 238000001444 catalytic combustion detection Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 241000276457 Gadidae Species 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は二次元CODイメージセンサ、とくに、垂直転
送電極の低抵抗化をはかったインタライン型二次元CO
Dイメージセンサに関する。現在、固体二次元イメージ
センサとしてはフレームトランスファCCD 、インタ
ラインCOD 、MOS型、CID型など多種多様のデ
バイスが開発されている。このなかでもインタラインC
ODによる二次元イメージセンサは、S/N、感度がよ
いことから現在もつとも性能のよいデバイスとして開発
が盛んである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a two-dimensional COD image sensor, particularly an interline type two-dimensional COD image sensor with a low resistance vertical transfer electrode.
Regarding D image sensor. Currently, a wide variety of devices are being developed as solid-state two-dimensional image sensors, such as frame transfer CCDs, interline CODs, MOS types, and CID types. Among these, interline C
Two-dimensional image sensors using OD are currently being actively developed as devices with excellent performance due to their good S/N and sensitivity.
ところでこのような二次元イメージセンサは急像度の向
上をはかるため多画素・高密度化される軸向にある。こ
のためインタライン型CODイメージセンサでは、垂直
転送チャネルがますます微細化され取扱い得る信号電荷
量が減少する。一般に信号電荷量はCODのチャネル容
量、ム動電圧に依存し、チャネル容量はデバイス形状、
プロセス条件によって決定される。一方駆動電圧は外部
から印加されるパルス電圧によシ決まる。したがって充
分な信号量を確保するにはチャネル容量の増大とともに
外部から印加するパルス電圧が正確にデバイスに供給さ
れる必要がある。ところでCODの転送電極は一般にポ
リシリコンで形成されているためその抵抗は必ずしも小
さくはない。このボリシリコンを用いた二次元CODイ
メージセンサの垂直転送電極は外部パルスにとって容量
性負荷のみならず高抵抗負荷として働く。このため外部
パルスから見た垂直転送電極は抵抗と容量の分布定数回
路負荷となシ、印加パルスは内部垂直転送電極に正確に
供給されないことになる。このことは外部から印加した
駆動電圧がそのまま転送電極に伝わらないばかシではな
く、一般に垂@CODの駆動に用いられるダブルクロッ
キング法における各パルス間のクロスポイント電圧の制
御が困難となることを意味する。したがって垂直COD
の信号電荷量も充分に確保されなくなる。By the way, such a two-dimensional image sensor is designed to have a large number of pixels and a high density in order to improve the sharpness of the image. For this reason, in the interline type COD image sensor, the vertical transfer channels are increasingly miniaturized, and the amount of signal charge that can be handled is reduced. In general, the amount of signal charge depends on the COD channel capacitance and dynamic voltage, and the channel capacitance depends on the device shape,
Determined by process conditions. On the other hand, the driving voltage is determined by a pulse voltage applied from the outside. Therefore, in order to ensure a sufficient amount of signal, it is necessary to increase the channel capacity and to accurately supply the externally applied pulse voltage to the device. By the way, since the transfer electrode of COD is generally formed of polysilicon, its resistance is not necessarily small. The vertical transfer electrode of this two-dimensional COD image sensor using polysilicon acts not only as a capacitive load but also as a high resistance load for external pulses. Therefore, the vertical transfer electrode viewed from the external pulse becomes a distributed constant circuit load of resistance and capacitance, and the applied pulse is not accurately supplied to the internal vertical transfer electrode. This does not mean that the drive voltage applied from the outside is not directly transmitted to the transfer electrode, but it also means that it is difficult to control the cross-point voltage between each pulse in the double clocking method that is generally used to drive the vertical COD. do. Therefore the vertical COD
A sufficient amount of signal charge will not be ensured.
第1図は従来のインタライン型CCD二次元イメージセ
ンサの単位画素平面図を示す。図においてlはチャネル
ストッパ、2はフォトダイオード領域、3は垂直COD
の転送チャネル、4は第1層ポリシリコン電極、5は第
2層ポリシリコン電極10はアルミの元シールド電極で
ある。第1層および第2層のポリシリコン電極は6〜9
の水平に細長い領域上で隣接する画素と共通接続されて
いる。FIG. 1 shows a unit pixel plan view of a conventional interline type CCD two-dimensional image sensor. In the figure, l is a channel stopper, 2 is a photodiode region, and 3 is a vertical COD.
4 is a first layer polysilicon electrode, and 5 is a second layer polysilicon electrode 10, which is an original shield electrode made of aluminum. The polysilicon electrodes of the first and second layers are 6 to 9
The pixels are commonly connected to adjacent pixels on a horizontally elongated region.
二次元イメージセンサはこのような単位画素をマトリッ
クス状に配列することによって形成される。A two-dimensional image sensor is formed by arranging such unit pixels in a matrix.
また垂直転送電極を構成する第1層および第2層のポリ
シリコン電極の左右両面から垂直転送パルスが印加され
る。とζろで第1図に示す単位画素を構成するポリシリ
コン電極は6〜9のような比較的細長い高抵抗領域とC
OD転送チャネル3を覆う4,5のような庇板的容量の
大きな領域とから成シ立っている。すなわち二次元CC
Dイメージセンサのポリシリコンによる垂直転送正極は
一種の抵抗と容量の分布定数回路と見なせる。このため
、左右から印加される岳直転送パルス波形は、この分布
定数回路によシ袈形を受けCCD内部の電極上ではもと
の電圧おるいは立上り、立下り波形が再現されなくなる
。したがってまず第一に実効的な印加電圧がは下し、H
S二にダブルクロッキングパルスのクロスポイント電圧
の制御が困難となる。このことは直接垂直CODで取シ
扱い得る信号電荷量の減少につながる。Further, vertical transfer pulses are applied from both left and right sides of the first layer and second layer polysilicon electrodes constituting the vertical transfer electrodes. The polysilicon electrodes constituting the unit pixel shown in FIG.
It consists of areas 4 and 5 that cover the OD transfer channel 3 and have a large capacitance like eaves plates. That is, two-dimensional CC
The vertical transfer positive electrode made of polysilicon in the D image sensor can be regarded as a kind of distributed constant circuit of resistance and capacitance. Therefore, the direct transfer pulse waveforms applied from the left and right sides are distorted by this distributed constant circuit, and the original voltage or rising and falling waveforms are no longer reproduced on the electrodes inside the CCD. Therefore, first of all, the effective applied voltage decreases and H
Second, it becomes difficult to control the cross-point voltage of the double clocking pulse. This directly leads to a reduction in the amount of signal charge that can be handled by the vertical COD.
本発明の目的は上記従来の欠点を除去した二次元COD
イメージセンサを提供することにある。The purpose of the present invention is to provide a two-dimensional COD that eliminates the above-mentioned conventional drawbacks.
Our goal is to provide image sensors.
不発明姉よればマトリ、クス状に配列された複数のフォ
トダイオードと垂直方向に並ぶ各フォトダイオード列の
間に配置されたCOD転送チャネルとを有し、該COD
垂直垂直転送チルネル定の相数を有する転送電極で構成
されているインタライン型CCD二次元イメージセンサ
において、前記相数毎の前記各転送チャネル上で同相の
前記転送電極上にコンタクトホールを設け、該同相の転
送電極を低抵抗電極で共通に接続したことを特徴とする
二次元CCDイメージ七ンサが得られる。According to Fuinenane, the COD has a matrix, a plurality of photodiodes arranged in a box shape, and a COD transfer channel arranged between each photodiode column arranged in the vertical direction.
In an interline CCD two-dimensional image sensor configured with transfer electrodes having a constant number of vertical transfer channels, contact holes are provided on the transfer electrodes in the same phase on each of the transfer channels for each of the number of phases, A two-dimensional CCD image sensor characterized in that the in-phase transfer electrodes are commonly connected by a low resistance electrode is obtained.
以下本発明について図面を用いて詳細に説明する。第2
図は本発明による二次元CODイメージセンサの一実施
例を示し、主要部の平面図を示している1図において1
1〜14は第1層ポリシリコン電極、15〜17は第2
層ポリシリコ/電極、18〜33はフォトダイオード領
域、34〜42は第1層あるいは第2層のポリシリコン
電極に開けられたコンタクトホール、43〜47は垂直
方向に同相のポリシリコン電極を共通に接続するための
アルミ電極である。本実施例では4相駆動を仮定してお
シ、4転送チヤネル毎に同相の転送電極が共通に接続さ
れている。また垂直転送パルスは、従来は左右から供給
されていたのに対し、本実施例では垂直方向のアルミ配
線から供給される。このため垂直転送電極の一水平ライ
ン、例えば12についてみると、従来は約10闘前後の
長さのポリシリコン電極に対してパルスを印加する必要
があったのに対し、本実施例では4画素毎にアルミでパ
スラインが配線されているためその間隔はせいぜい数十
μm程度となシ、パルス波形の劣化はほとんど無視でき
ることになる。もちろん41iji素毎ではなくその整
数倍の画素毎にフルミバスラインを配線してもよい。本
発明はこのようなパルス波形劣化を防止するのみならず
第1図の6〜9の比較的細長い部分でのポリシリコン断
線による不良防止にも役立つ。また本実施例のアルミパ
スライン43〜47は従来のアルミによる元シールド電
極10と同様に元シールド電極としての役目もすること
はもちろんであシ、従来プロセスと両立性がある。The present invention will be described in detail below with reference to the drawings. Second
The figure shows an embodiment of the two-dimensional COD image sensor according to the present invention, and 1 shows a plan view of the main part.
1 to 14 are first layer polysilicon electrodes, 15 to 17 are second layer polysilicon electrodes, and 15 to 17 are second layer polysilicon electrodes.
Layer polysilicon/electrode, 18 to 33 are photodiode regions, 34 to 42 are contact holes made in the first or second layer polysilicon electrodes, and 43 to 47 are vertically in-phase polysilicon electrodes in common. This is an aluminum electrode for connection. In this embodiment, four-phase drive is assumed, and transfer electrodes of the same phase are commonly connected for every four transfer channels. Furthermore, while the vertical transfer pulses were conventionally supplied from the left and right sides, in this embodiment they are supplied from the aluminum wiring in the vertical direction. For this reason, for one horizontal line of the vertical transfer electrode, for example 12, conventionally it was necessary to apply a pulse to a polysilicon electrode with a length of about 10 pixels, but in this embodiment, it is necessary to apply a pulse to 4 pixels. Since the pass lines are wired with aluminum in each case, the interval between them is approximately several tens of μm at most, and the deterioration of the pulse waveform can be almost ignored. Of course, the Fulmi bus line may be wired not every 41 iji pixels but every integral multiple of the pixels. The present invention not only prevents such deterioration of the pulse waveform, but also helps prevent defects due to polysilicon wire breakage in the relatively long and narrow portions 6 to 9 in FIG. Furthermore, the aluminum pass lines 43 to 47 of this embodiment not only serve as the original shield electrode like the conventional original shield electrode 10 made of aluminum, but are also compatible with conventional processes.
以上述べたように本発明によれば、パルス波形の劣化を
防いだインタライン型COD二次元イメージセンサを実
現できる。As described above, according to the present invention, it is possible to realize an interline COD two-dimensional image sensor that prevents deterioration of pulse waveforms.
第1図は従来のインタライン型COD二次元イメージセ
ンサの単位画素平面図、第2図は本発明による一実施例
を示す。図において4,11〜14は第1層ポリシリコ
ン電極、5.15〜17は第2層ポリシリコン電極、3
4〜42はコンタクトホール、43〜47はアルミによ
るパスラインである。
Ivl 図
0【。
−いJ rIl 7FIG. 1 is a plan view of a unit pixel of a conventional interline type COD two-dimensional image sensor, and FIG. 2 shows an embodiment according to the present invention. In the figure, 4, 11-14 are first layer polysilicon electrodes, 5.15-17 are second layer polysilicon electrodes, 3
4 to 42 are contact holes, and 43 to 47 are pass lines made of aluminum. Ivl Figure 0 [. -I J rIl 7
Claims (1)
垂直方向に並ぶ各フォトダイオード列の間に配置された
CCD垂直転送チャネルとを有し、該CCD垂直転送チ
ャネルは一定の相数を有する転送電極で構成されている
インタライン型CCD二次元イメージセンサにおいて、
前記相数毎の前記各転送チャネル上で同相の前記転送電
極上にコンタクトホールを設け、該同相の転送電極を低
抵抗電極で共通に接続したことを特徴とする二次元CO
Dイメージセンサ。It has a plurality of photodiodes arranged in a matrix and a CCD vertical transfer channel arranged between each vertically aligned photodiode row, and the CCD vertical transfer channel is composed of transfer electrodes having a fixed number of phases. In the interline type CCD two-dimensional image sensor,
A two-dimensional CO characterized in that contact holes are provided on the transfer electrodes of the same phase on each of the transfer channels for each of the number of phases, and the transfer electrodes of the same phase are commonly connected by a low resistance electrode.
D image sensor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58146929A JPH061829B2 (en) | 1983-08-11 | 1983-08-11 | Two-dimensional CCD image sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58146929A JPH061829B2 (en) | 1983-08-11 | 1983-08-11 | Two-dimensional CCD image sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6038869A true JPS6038869A (en) | 1985-02-28 |
JPH061829B2 JPH061829B2 (en) | 1994-01-05 |
Family
ID=15418762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58146929A Expired - Lifetime JPH061829B2 (en) | 1983-08-11 | 1983-08-11 | Two-dimensional CCD image sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH061829B2 (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH025473A (en) * | 1988-06-23 | 1990-01-10 | Toshiba Corp | Solid state image sensor and manufacture thereof |
JPH02133963A (en) * | 1988-11-15 | 1990-05-23 | Toshiba Corp | Solid-state image sensing device |
EP0409174A2 (en) * | 1989-07-17 | 1991-01-23 | Sony Corporation | Structure of solid-state image sensing devices |
EP0478946A1 (en) * | 1990-10-01 | 1992-04-08 | Polaroid Corporation | CCD frame transfer image device |
JPH04239172A (en) * | 1991-01-11 | 1992-08-27 | Nec Corp | Solid-state image sensing device and manufacture thereof |
US5194751A (en) * | 1989-07-17 | 1993-03-16 | Sony Corporation | Structure of solid-state image sensing devices |
US5256890A (en) * | 1990-09-05 | 1993-10-26 | Sony Corporation | Non-interlacing charge coupled device of a frame interline transfer type |
US5313081A (en) * | 1990-07-19 | 1994-05-17 | Kabushiki Kaisha Toshiba | Solid-state imaging device with transport channels between photosensitive elements |
US5393997A (en) * | 1992-02-21 | 1995-02-28 | Sony Corporation | CCD having transfer electrodes of 3 layers |
US5432363A (en) * | 1992-01-30 | 1995-07-11 | Matsushita Electric Industrial Co., Ltd. | Solid-state image pickup device and manufacturing method of the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5337392A (en) * | 1976-09-17 | 1978-04-06 | Sanyo Electric Co Ltd | Driving pulse supplying method of charge coupled type semiconductor device |
-
1983
- 1983-08-11 JP JP58146929A patent/JPH061829B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5337392A (en) * | 1976-09-17 | 1978-04-06 | Sanyo Electric Co Ltd | Driving pulse supplying method of charge coupled type semiconductor device |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH025473A (en) * | 1988-06-23 | 1990-01-10 | Toshiba Corp | Solid state image sensor and manufacture thereof |
JPH02133963A (en) * | 1988-11-15 | 1990-05-23 | Toshiba Corp | Solid-state image sensing device |
EP0409174A2 (en) * | 1989-07-17 | 1991-01-23 | Sony Corporation | Structure of solid-state image sensing devices |
US5194751A (en) * | 1989-07-17 | 1993-03-16 | Sony Corporation | Structure of solid-state image sensing devices |
US5313081A (en) * | 1990-07-19 | 1994-05-17 | Kabushiki Kaisha Toshiba | Solid-state imaging device with transport channels between photosensitive elements |
US5256890A (en) * | 1990-09-05 | 1993-10-26 | Sony Corporation | Non-interlacing charge coupled device of a frame interline transfer type |
EP0478946A1 (en) * | 1990-10-01 | 1992-04-08 | Polaroid Corporation | CCD frame transfer image device |
JPH04239172A (en) * | 1991-01-11 | 1992-08-27 | Nec Corp | Solid-state image sensing device and manufacture thereof |
US5432363A (en) * | 1992-01-30 | 1995-07-11 | Matsushita Electric Industrial Co., Ltd. | Solid-state image pickup device and manufacturing method of the same |
US5393997A (en) * | 1992-02-21 | 1995-02-28 | Sony Corporation | CCD having transfer electrodes of 3 layers |
Also Published As
Publication number | Publication date |
---|---|
JPH061829B2 (en) | 1994-01-05 |
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