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JPS6476764A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6476764A
JPS6476764A JP23232287A JP23232287A JPS6476764A JP S6476764 A JPS6476764 A JP S6476764A JP 23232287 A JP23232287 A JP 23232287A JP 23232287 A JP23232287 A JP 23232287A JP S6476764 A JPS6476764 A JP S6476764A
Authority
JP
Japan
Prior art keywords
implanted
ion
manufacturing
trenches
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23232287A
Other languages
Japanese (ja)
Other versions
JPH0581173B2 (en
Inventor
Yukio Kamiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP23232287A priority Critical patent/JPS6476764A/en
Publication of JPS6476764A publication Critical patent/JPS6476764A/en
Publication of JPH0581173B2 publication Critical patent/JPH0581173B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Bipolar Transistors (AREA)

Abstract

PURPOSE:To enable manufacturing a bipolar transistor without epitaxial growth process in the course of manufacturing, by implanting ion from the bottom surface of a trench formed to a required depth from the upper surface of a semiconductor substrate, and forming a buried layer of impurity by annealing. CONSTITUTION:A plurarity of deep trenches of cylindrical shape are formed, by etching a silicon substrate 1 by using a photo resist 2 as a mask. When arsenic ion is implanted vertically to the substrate through the trenches 3, the ion is implanted only in bottom parts of the trenches 3. After the photo resist 2 used for forming the trench is eliminated, phosphorus ion is implanted at an angle with respect to the substrate. As a result, the arsenic ion is implanted in the surface of the silicon substrate 1 and the side surfaces of the trenches 3. By annealing treatment. the arsenic ion implanted part is formed as an N+ buried layer 4, and the phosphorus ion implanted part is formed as an N- collector layer 5, on account of diffusion rate difference. During the manufacturing process of bipolar transistor, epitaxial growth is unnecessitated, so that the manufacturing is facilitated, and the manufacturing term can be reduced.
JP23232287A 1987-09-18 1987-09-18 Manufacture of semiconductor device Granted JPS6476764A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23232287A JPS6476764A (en) 1987-09-18 1987-09-18 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23232287A JPS6476764A (en) 1987-09-18 1987-09-18 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS6476764A true JPS6476764A (en) 1989-03-22
JPH0581173B2 JPH0581173B2 (en) 1993-11-11

Family

ID=16937383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23232287A Granted JPS6476764A (en) 1987-09-18 1987-09-18 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6476764A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010007559A1 (en) * 2008-07-14 2010-01-21 Nxp B.V. A transistor device and a method of manufacturing the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60150643A (en) * 1984-01-18 1985-08-08 Toshiba Corp Complementary semiconductor device and manufacture thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60150643A (en) * 1984-01-18 1985-08-08 Toshiba Corp Complementary semiconductor device and manufacture thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010007559A1 (en) * 2008-07-14 2010-01-21 Nxp B.V. A transistor device and a method of manufacturing the same

Also Published As

Publication number Publication date
JPH0581173B2 (en) 1993-11-11

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