JPS6457648U - - Google Patents
Info
- Publication number
- JPS6457648U JPS6457648U JP15172787U JP15172787U JPS6457648U JP S6457648 U JPS6457648 U JP S6457648U JP 15172787 U JP15172787 U JP 15172787U JP 15172787 U JP15172787 U JP 15172787U JP S6457648 U JPS6457648 U JP S6457648U
- Authority
- JP
- Japan
- Prior art keywords
- holes
- finished product
- chip
- electric wires
- outer periphery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011265 semifinished product Substances 0.000 claims description 5
- 230000000295 complement effect Effects 0.000 claims 2
- 239000002131 composite material Substances 0.000 claims 1
- 239000011159 matrix material Substances 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000004080 punching Methods 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003856 thermoforming Methods 0.000 description 1
Landscapes
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
Description
第1図a,bは本考案の実施例ICチツプパツ
ケージ半製品の表面及び裏面の要部拡大図、第2
図a,b,cは第1図とは異る実施例半製品の表
面、裏面及び側面を示す要部拡大図、第3図は第
2図cで示す半製品切断面の要部拡大図、第4図
a,bは第1図及び第2図に示す切断面を形成す
る装置の一部工程を示す要部断面図、第5図は第
3図に相当する厚さの異る銅線により振動熱成形
された切断面の要部拡大図を示す。
1……本体、2……半導体素子(ICチツプ)
、2′……ICチツプの嵌入凹部、3……スルー
ホール、4……銅線、10……切断面。
1a and 1b are enlarged views of main parts of the front and back surfaces of a semi-finished IC chip package according to an embodiment of the present invention;
Figures a, b, and c are enlarged views of the main parts showing the front, back, and side surfaces of the semi-finished product of the example different from those shown in Fig. 1, and Fig. 3 is an enlarged view of the main parts of the cut section of the semi-finished product shown in Fig. 2 c. , FIGS. 4a and 4b are cross-sectional views of main parts showing some steps of the apparatus for forming the cut surfaces shown in FIGS. 1 and 2, and FIG. An enlarged view of the main part of the cut surface subjected to vibration thermoforming is shown by lines. 1...Main body, 2...Semiconductor element (IC chip)
, 2'... IC chip insertion recess, 3... Through hole, 4... Copper wire, 10... Cut surface.
Claims (1)
とする複合材料で作られ上面にICチツプ、その
外周を取囲み上面から裏面に貫通する多数のピン
立て用スルーホール、及び上面に形成された前記
ICチツプと各前記スルーホール及び各スルーホ
ールからさらに外方まで延在する電線、及び下面
に貫通された各スルーホールから外方外周部まで
延在する電線を有するICチツプパツケージ半製
品において、前記スルーホールから外方外周部に
延在する上面及び下面の電線の厚みを約18μm
以下にするか又は除去し、かつ前記ICチツプパ
ツケージ半製品は前記外方外周部の切断面に補合
する穴を有する上下ダイ及び前記補合する穴に嵌
入され外周押圧面を有する上下パンチでクランプ
されかつ前記切断面となる部分が塑性変形する程
度の振幅で上下ダイ又は上下パンチに上下に同期
振動を加えて前記切断面となる部分が局所熱軟化
した時点で前記上下パンチ又は上下ダイを打抜き
送りして切断された切断面を有することを特徴と
するICチツプパツケージ半製品。 It is made of plastic or a composite material having a plastic matrix and has an IC chip on the top surface, a large number of through holes for pin mounting surrounding the outer periphery and penetrating from the top surface to the back surface, and the IC chip and each of the through holes formed on the top surface. and an IC chip package semi-finished product having electric wires extending further outward from each through hole, and electric wires extending from each through hole penetrated through the lower surface to the outer outer circumference, from the through hole to the outer outer circumference. The thickness of the electric wires on the upper and lower surfaces extending to approximately 18 μm
and the IC chip package semi-finished product is formed using upper and lower dies having holes that complement the cut surface of the outer periphery, and upper and lower punches that are fitted into the complementary holes and have outer periphery pressing surfaces. A synchronous vibration is applied vertically to the upper and lower dies or the upper and lower punches with an amplitude that is such that the portion that is clamped and becomes the cutting surface is plastically deformed, and when the portion that becomes the cutting surface is locally thermally softened, the upper and lower punch or the upper and lower dies are removed. An IC chip package semi-finished product characterized by having a cut surface cut by punching and feeding.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15172787U JPS6457648U (en) | 1987-10-05 | 1987-10-05 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15172787U JPS6457648U (en) | 1987-10-05 | 1987-10-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6457648U true JPS6457648U (en) | 1989-04-10 |
Family
ID=31426029
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15172787U Pending JPS6457648U (en) | 1987-10-05 | 1987-10-05 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6457648U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7485478B2 (en) | 2001-02-19 | 2009-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
-
1987
- 1987-10-05 JP JP15172787U patent/JPS6457648U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7485478B2 (en) | 2001-02-19 | 2009-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US7825419B2 (en) | 2001-02-19 | 2010-11-02 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
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