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JPS6439745A - Manufacture of semiconductor substrate for integrated circuit device - Google Patents

Manufacture of semiconductor substrate for integrated circuit device

Info

Publication number
JPS6439745A
JPS6439745A JP19692387A JP19692387A JPS6439745A JP S6439745 A JPS6439745 A JP S6439745A JP 19692387 A JP19692387 A JP 19692387A JP 19692387 A JP19692387 A JP 19692387A JP S6439745 A JPS6439745 A JP S6439745A
Authority
JP
Japan
Prior art keywords
groove
substrate
face
silicon
approx
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19692387A
Other languages
Japanese (ja)
Inventor
Ichiro Takatsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP19692387A priority Critical patent/JPS6439745A/en
Publication of JPS6439745A publication Critical patent/JPS6439745A/en
Pending legal-status Critical Current

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  • Element Separation (AREA)

Abstract

PURPOSE:To eliminate the wasteful use of a single crystalline silicon material and to save the material cost of a semiconductor substrate by digging a second groove from the opposite face to the face of a silicon substrate in which polycrystalline silicon is grown in the step of cutting the second groove to separate dielectrically the silicon substrate from a partial region. CONSTITUTION:A first groove 2 is dug in depth of approx. 150mum by anisotropically etching on one side face of a silicon substrate 1 to surround a range of a partial region. Then, the substrate 1 including the groove face is so covered on one whole face relatively thick to approx. 2mum by a steam oxidizing method as a dielectric film 3. Then, a polycrystalline silicon 4 is grown in thickness of 300-400mum on the whole film 3. Then, a second groove 5 is dug in depth of approx. 50mum to arrive at the film 3 by anisotropically etching at a position corresponding to the first groove 2 from the other side face of a semiconductor substrate. Thus, since the substrate 1 is separated dielectrically to a plurality of partial regions 6, an integrated circuit element may be formed. Thus, considerable part of the silicon substrate is not necessarily removed by polishing to save material cost.
JP19692387A 1987-08-06 1987-08-06 Manufacture of semiconductor substrate for integrated circuit device Pending JPS6439745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19692387A JPS6439745A (en) 1987-08-06 1987-08-06 Manufacture of semiconductor substrate for integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19692387A JPS6439745A (en) 1987-08-06 1987-08-06 Manufacture of semiconductor substrate for integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6439745A true JPS6439745A (en) 1989-02-10

Family

ID=16365917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19692387A Pending JPS6439745A (en) 1987-08-06 1987-08-06 Manufacture of semiconductor substrate for integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6439745A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE44312E1 (en) 2001-04-05 2013-06-25 Pedro Queiroz Vieira Evaporation device for multiple volatile substances

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE44312E1 (en) 2001-04-05 2013-06-25 Pedro Queiroz Vieira Evaporation device for multiple volatile substances

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