JPS6423554A - Semiconductor device and manufacture thereof - Google Patents
Semiconductor device and manufacture thereofInfo
- Publication number
- JPS6423554A JPS6423554A JP62178977A JP17897787A JPS6423554A JP S6423554 A JPS6423554 A JP S6423554A JP 62178977 A JP62178977 A JP 62178977A JP 17897787 A JP17897787 A JP 17897787A JP S6423554 A JPS6423554 A JP S6423554A
- Authority
- JP
- Japan
- Prior art keywords
- conductive layer
- layer
- connection hole
- tungsten
- metallic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Drying Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To retain a fine connection hole and to improve production yield and reliability, by opening the connection hole in an insulation layer formed on a first conductive layer and forming a metallic column on the first conductive layer inside the connection hole and forming a second conductive layer connected with the metallic column and next by tapering sidewalls of the connection hole. CONSTITUTION:An SiO2 layer 12 is formed on an Si substrate (a first conductive layer) 11, and a contact hole 13 is opened. Next, tungsten 14 is made to selectively grow as a metallic column. Sidewalls of the contact hole 13 are tapered 13 with starting points where the side walls contact with an upper plane of the tungsten. Namely, selective sputter etching by oxygen ions is used to form tapered parts 16 on the side. walls of the contact hole 13. Since the tungsten 14 is not etched accordingly, the positions of the points 15 are not varied. Therefore accompanied by slight decrease in film thickness of the SiO2 layer 12 on a flat plane, an angle theta of the tapered part 16 is only changed from 90 deg. into 0 deg.. The angle theta of the tapered part 16 is thus determined. After the sticking of a metallic layer, a wiring layer 17 is formed as a second conductive layer by lithography and etching.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62178977A JPH0680665B2 (en) | 1987-07-20 | 1987-07-20 | Method for manufacturing semiconductor device |
EP88111550A EP0300414B1 (en) | 1987-07-20 | 1988-07-18 | Method of connecting wirings through connection hole |
DE3851802T DE3851802T2 (en) | 1987-07-20 | 1988-07-18 | Method of connecting lines through connection holes. |
KR1019880008981A KR920002863B1 (en) | 1987-07-20 | 1988-07-19 | Wire contecting method by using through-hole |
US08/101,780 US5320979A (en) | 1987-07-20 | 1993-08-03 | Method of connecting wirings through connection hole |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62178977A JPH0680665B2 (en) | 1987-07-20 | 1987-07-20 | Method for manufacturing semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6423554A true JPS6423554A (en) | 1989-01-26 |
JPH0680665B2 JPH0680665B2 (en) | 1994-10-12 |
Family
ID=16057959
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62178977A Expired - Fee Related JPH0680665B2 (en) | 1987-07-20 | 1987-07-20 | Method for manufacturing semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0680665B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5529955A (en) * | 1993-08-27 | 1996-06-25 | Yamaha Corporation | Wiring forming method |
US5776827A (en) * | 1993-08-27 | 1998-07-07 | Yamaha Corporation | Wiring-forming method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5935451A (en) * | 1982-08-23 | 1984-02-27 | Fujitsu Ltd | Forming method for inter-layer insulating film |
JPS59181030A (en) * | 1983-03-30 | 1984-10-15 | Toshiba Corp | Manufacture of semiconductor device |
JPS6092633A (en) * | 1983-10-26 | 1985-05-24 | Sony Corp | Manufacture of semiconductor device |
JPS61113258A (en) * | 1984-11-07 | 1986-05-31 | Fujitsu Ltd | Manufacture of semiconductor device |
-
1987
- 1987-07-20 JP JP62178977A patent/JPH0680665B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5935451A (en) * | 1982-08-23 | 1984-02-27 | Fujitsu Ltd | Forming method for inter-layer insulating film |
JPS59181030A (en) * | 1983-03-30 | 1984-10-15 | Toshiba Corp | Manufacture of semiconductor device |
JPS6092633A (en) * | 1983-10-26 | 1985-05-24 | Sony Corp | Manufacture of semiconductor device |
JPS61113258A (en) * | 1984-11-07 | 1986-05-31 | Fujitsu Ltd | Manufacture of semiconductor device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5529955A (en) * | 1993-08-27 | 1996-06-25 | Yamaha Corporation | Wiring forming method |
US5776827A (en) * | 1993-08-27 | 1998-07-07 | Yamaha Corporation | Wiring-forming method |
Also Published As
Publication number | Publication date |
---|---|
JPH0680665B2 (en) | 1994-10-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |