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JPS5389794A - Defect inspecting apparatus - Google Patents

Defect inspecting apparatus

Info

Publication number
JPS5389794A
JPS5389794A JP402277A JP402277A JPS5389794A JP S5389794 A JPS5389794 A JP S5389794A JP 402277 A JP402277 A JP 402277A JP 402277 A JP402277 A JP 402277A JP S5389794 A JPS5389794 A JP S5389794A
Authority
JP
Japan
Prior art keywords
inspection
inspecting apparatus
defect inspecting
subject
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP402277A
Other languages
English (en)
Other versions
JPS577663B2 (ja
Inventor
Tomokazu Godai
Yasuto Takeuchi
Kozo Nakai
Kazuo Takeuchi
Yoshihisa Morioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Kobe Steel Ltd
Original Assignee
Toshiba Corp
Kobe Steel Ltd
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Kobe Steel Ltd, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP402277A priority Critical patent/JPS5389794A/ja
Priority to DE2801869A priority patent/DE2801869C3/de
Priority to US05/870,497 priority patent/US4185921A/en
Priority to SE7800593A priority patent/SE7800593L/xx
Priority to GB2199/78A priority patent/GB1588371A/en
Publication of JPS5389794A publication Critical patent/JPS5389794A/ja
Publication of JPS577663B2 publication Critical patent/JPS577663B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP402277A 1977-01-19 1977-01-19 Defect inspecting apparatus Granted JPS5389794A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP402277A JPS5389794A (en) 1977-01-19 1977-01-19 Defect inspecting apparatus
DE2801869A DE2801869C3 (de) 1977-01-19 1978-01-17 Vorrichtung zum Feststellen von Oberflächenfehlern an stabartigen Gegenständen
US05/870,497 US4185921A (en) 1977-01-19 1978-01-18 Surface flaw detector
SE7800593A SE7800593L (sv) 1977-01-19 1978-01-18 Ytsprickdetektor
GB2199/78A GB1588371A (en) 1977-01-19 1978-01-19 Surface flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP402277A JPS5389794A (en) 1977-01-19 1977-01-19 Defect inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS5389794A true JPS5389794A (en) 1978-08-07
JPS577663B2 JPS577663B2 (ja) 1982-02-12

Family

ID=11573328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP402277A Granted JPS5389794A (en) 1977-01-19 1977-01-19 Defect inspecting apparatus

Country Status (5)

Country Link
US (1) US4185921A (ja)
JP (1) JPS5389794A (ja)
DE (1) DE2801869C3 (ja)
GB (1) GB1588371A (ja)
SE (1) SE7800593L (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002209853A (ja) * 2001-01-16 2002-07-30 Tomey Corp 角膜厚み測定アタッチメント

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4331872A (en) * 1979-06-29 1982-05-25 Nippon Steel Corporation Method for measurement of distribution of inclusions in a slab by electron beam irradiation
FR2580203B1 (fr) * 1985-04-12 1987-08-28 Usinor Machine d'ebavurage de brames
DE4214321C2 (de) * 1992-05-04 2002-05-16 Focke & Co Vorrichtung zum Wenden von Packungen
FR2816296B1 (fr) * 2000-11-09 2002-12-20 Commissariat Energie Atomique Dispositif de mise en defilement continu d'objet a symetrie de revolution-application a l'inspection visuelle et au controle
US20070146692A1 (en) * 2005-12-23 2007-06-28 Xerox Corporation Fiber optic specular surface flaw detection
US7362450B2 (en) * 2005-12-23 2008-04-22 Xerox Corporation Specular surface flaw detection
DE102008020245A1 (de) * 2008-04-22 2009-11-05 Mas Gmbh Prüfstand und Automatisierungsmaschine

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3036491A (en) * 1958-08-20 1962-05-29 Schier Hans Optical arrangement for inspecting bodies of revolution

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2857800A (en) * 1952-11-20 1958-10-28 Timken Roller Bearing Co Roller inspecting device
GB1206136A (en) * 1966-09-29 1970-09-23 Talcoma Teoranta Improved method and apparatus for inspecting translucent containers
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
JPS5149234B2 (ja) * 1971-08-31 1976-12-25
US3812349A (en) * 1973-04-06 1974-05-21 Laser Sciences Inc Apparatus for inspecting cigarettes or the like
US3901381A (en) * 1973-10-10 1975-08-26 Ball Brothers Service Corp Automatic ware handler
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3036491A (en) * 1958-08-20 1962-05-29 Schier Hans Optical arrangement for inspecting bodies of revolution

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002209853A (ja) * 2001-01-16 2002-07-30 Tomey Corp 角膜厚み測定アタッチメント

Also Published As

Publication number Publication date
DE2801869B2 (de) 1981-02-26
SE7800593L (sv) 1978-07-20
DE2801869C3 (de) 1981-11-12
GB1588371A (en) 1981-04-23
DE2801869A1 (de) 1978-07-20
JPS577663B2 (ja) 1982-02-12
US4185921A (en) 1980-01-29

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