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Hitachi Ltd
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Hitachi Ltd
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Publication date
Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP11303576ApriorityCriticalpatent/JPS5339181A/en
Publication of JPS5339181ApublicationCriticalpatent/JPS5339181A/en
Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves
(AREA)
Abstract
PURPOSE: To display the defect of the substance to be inspected and the boundary face of different kind metal at the same time, by separating received signal of ultrasonic wave defect inspection into each component of high and low frequency and treating the above signal.
COPYRIGHT: (C)1978,JPO&Japio
JP11303576A1976-09-221976-09-22Defect inspecting apparatus by ultrasonic wave
PendingJPS5339181A
(en)