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JPS53145479A - Temperature characteristics testing method of semiconductor device - Google Patents

Temperature characteristics testing method of semiconductor device

Info

Publication number
JPS53145479A
JPS53145479A JP5941577A JP5941577A JPS53145479A JP S53145479 A JPS53145479 A JP S53145479A JP 5941577 A JP5941577 A JP 5941577A JP 5941577 A JP5941577 A JP 5941577A JP S53145479 A JPS53145479 A JP S53145479A
Authority
JP
Japan
Prior art keywords
temperature characteristics
semiconductor device
testing method
characteristics testing
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5941577A
Other languages
Japanese (ja)
Inventor
Yasuo Shirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5941577A priority Critical patent/JPS53145479A/en
Publication of JPS53145479A publication Critical patent/JPS53145479A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To perform temperature characteristics testing by forward-biasing a PN junction to heat substrate to a specified temperature thorugh self-evolution of heat thereafter applying a regular bias and comparing the voltage with reference characteristics.
COPYRIGHT: (C)1978,JPO&Japio
JP5941577A 1977-05-24 1977-05-24 Temperature characteristics testing method of semiconductor device Pending JPS53145479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5941577A JPS53145479A (en) 1977-05-24 1977-05-24 Temperature characteristics testing method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5941577A JPS53145479A (en) 1977-05-24 1977-05-24 Temperature characteristics testing method of semiconductor device

Publications (1)

Publication Number Publication Date
JPS53145479A true JPS53145479A (en) 1978-12-18

Family

ID=13112607

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5941577A Pending JPS53145479A (en) 1977-05-24 1977-05-24 Temperature characteristics testing method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS53145479A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5838876A (en) * 1981-08-31 1983-03-07 Nec Corp Testing of semiconductor device
JPS61108978A (en) * 1984-11-01 1986-05-27 Nec Corp Method for measuring thermal resistance of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5838876A (en) * 1981-08-31 1983-03-07 Nec Corp Testing of semiconductor device
JPS61108978A (en) * 1984-11-01 1986-05-27 Nec Corp Method for measuring thermal resistance of semiconductor device

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