[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

JPS53133489A - Apparatus for chemical analysis - Google Patents

Apparatus for chemical analysis

Info

Publication number
JPS53133489A
JPS53133489A JP4876477A JP4876477A JPS53133489A JP S53133489 A JPS53133489 A JP S53133489A JP 4876477 A JP4876477 A JP 4876477A JP 4876477 A JP4876477 A JP 4876477A JP S53133489 A JPS53133489 A JP S53133489A
Authority
JP
Japan
Prior art keywords
chemical analysis
abnormal
occations
estimate
displaying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4876477A
Other languages
Japanese (ja)
Inventor
Toyohiko Naono
Hitoshi Hosokawa
Bunichi Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP4876477A priority Critical patent/JPS53133489A/en
Publication of JPS53133489A publication Critical patent/JPS53133489A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)

Abstract

PURPOSE:To estimate the cause of abnormal measuring results instantly by displaying the data which can check the conditions at the time of obtaining abnormal measurements immediately after such occations.
JP4876477A 1977-04-27 1977-04-27 Apparatus for chemical analysis Pending JPS53133489A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4876477A JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4876477A JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Publications (1)

Publication Number Publication Date
JPS53133489A true JPS53133489A (en) 1978-11-21

Family

ID=12812337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4876477A Pending JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Country Status (1)

Country Link
JP (1) JPS53133489A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154651A (en) * 1980-05-01 1981-11-30 Olympus Optical Co Ltd Automatic analyzer
JPS56155835A (en) * 1980-05-02 1981-12-02 Olympus Optical Co Ltd Component analyzing method
JPS576343A (en) * 1980-06-13 1982-01-13 Toshiba Corp Apparatus for chemical analysis
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918395A (en) * 1972-04-17 1974-02-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918395A (en) * 1972-04-17 1974-02-18

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154651A (en) * 1980-05-01 1981-11-30 Olympus Optical Co Ltd Automatic analyzer
JPS56155835A (en) * 1980-05-02 1981-12-02 Olympus Optical Co Ltd Component analyzing method
JPH0224337B2 (en) * 1980-05-02 1990-05-29 Olympus Optical Co
JPS576343A (en) * 1980-06-13 1982-01-13 Toshiba Corp Apparatus for chemical analysis
JPS6348301B2 (en) * 1980-06-13 1988-09-28 Tokyo Shibaura Electric Co
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method
JPS6317175B2 (en) * 1980-10-31 1988-04-12 Nippon Electron Optics Lab

Similar Documents

Publication Publication Date Title
JPS51114985A (en) Mothod to analyse urine, etc.
JPS5424062A (en) Ultrasonic type measuring apparatus
DK154247C (en) SAMPLE TEST FOR DIAGNOSIS
JPS5255578A (en) Analyzing apparatus
JPS5433090A (en) Apparatus for inspecting liquid sample for analysis
NL7704628A (en) REMOVABLE PROBE UNIT FOR ELECTRONIC MEASUREMENT SYSTEM.
DK156976C (en) MEASURING DEVICE FOR POLAROGRAPHIC BLOOD GAS MEASUREMENT
IT7830604A0 (en) APPARATUS FOR MEASURING THE CORROSION OF RADIOACTIVE COMPONENTS.
JPS5328489A (en) Measuring apparatus for xxray fluorescence analysis
JPS53133489A (en) Apparatus for chemical analysis
NL185305C (en) MEASURING DEVICE FOR ROENTGENFLUORESCENCE ANALYSIS.
IT1100970B (en) TEST APPARATUS OR ULTRASONIC TESTING
JPS5251967A (en) Measuring apparatus for inspecting drill
JPS5425786A (en) Repeated bending tester
JPS5315868A (en) Temperature measuring device
JPS53128238A (en) Velocity test system
JPS5494070A (en) Device for measuring instrument for preferably visually determining definite plane by optical means
JPS53109691A (en) Flow cell type analysis method and apparatus liquid for specimen
JPS5346784A (en) Multiplex measuring method for number of vibration
JPS5235684A (en) Method and apparatus for total reflection absorption measurement at lo w temperatures
JPS549514A (en) Restoration completion confirmation test system
JPS53142282A (en) Intermittent radiation measuring apparatus
JPS5262070A (en) Measurement of observation waveforms of oscilloscope
JPS5284762A (en) Detector for measuring transmission characteristics of optical fiber
JPS53143289A (en) Semiconductor radiation measuring instrument