JPS50129016A - - Google Patents
Info
- Publication number
- JPS50129016A JPS50129016A JP3544174A JP3544174A JPS50129016A JP S50129016 A JPS50129016 A JP S50129016A JP 3544174 A JP3544174 A JP 3544174A JP 3544174 A JP3544174 A JP 3544174A JP S50129016 A JPS50129016 A JP S50129016A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Image Input (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Focusing (AREA)
- Automatic Focus Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3544174A JPS5410458B2 (en) | 1974-03-29 | 1974-03-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3544174A JPS5410458B2 (en) | 1974-03-29 | 1974-03-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50129016A true JPS50129016A (en) | 1975-10-11 |
| JPS5410458B2 JPS5410458B2 (en) | 1979-05-07 |
Family
ID=12441916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3544174A Expired JPS5410458B2 (en) | 1974-03-29 | 1974-03-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5410458B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57100303A (en) * | 1980-12-15 | 1982-06-22 | Mitsubishi Electric Corp | Detection of pattern defect of semiconductor element |
| JPS57172305A (en) * | 1981-04-17 | 1982-10-23 | Hitachi Ltd | Automatic focusing method |
| JPS59123811A (en) * | 1982-12-20 | 1984-07-17 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Selection of optimum focus adjustment for optical machine |
| JPH0388079A (en) * | 1989-08-31 | 1991-04-12 | Seikosha Co Ltd | Method for recognizing object |
| JP2020501111A (en) * | 2016-10-06 | 2020-01-16 | アイリス インターナショナル， インコーポレイテッド | Dynamic focus system and method |
-
1974
- 1974-03-29 JP JP3544174A patent/JPS5410458B2/ja not_active Expired
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57100303A (en) * | 1980-12-15 | 1982-06-22 | Mitsubishi Electric Corp | Detection of pattern defect of semiconductor element |
| JPS57172305A (en) * | 1981-04-17 | 1982-10-23 | Hitachi Ltd | Automatic focusing method |
| JPS59123811A (en) * | 1982-12-20 | 1984-07-17 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Selection of optimum focus adjustment for optical machine |
| JPH0388079A (en) * | 1989-08-31 | 1991-04-12 | Seikosha Co Ltd | Method for recognizing object |
| JPH0551944B2 (en) * | 1989-08-31 | 1993-08-04 | Seikosha Kk | |
| JP2020501111A (en) * | 2016-10-06 | 2020-01-16 | アイリス インターナショナル， インコーポレイテッド | Dynamic focus system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5410458B2 (en) | 1979-05-07 |