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JPS5916160U - Storage device - Google Patents

Storage device

Info

Publication number
JPS5916160U
JPS5916160U JP1982109343U JP10934382U JPS5916160U JP S5916160 U JPS5916160 U JP S5916160U JP 1982109343 U JP1982109343 U JP 1982109343U JP 10934382 U JP10934382 U JP 10934382U JP S5916160 U JPS5916160 U JP S5916160U
Authority
JP
Japan
Prior art keywords
storage device
nitride film
abstract
layer
cvdsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1982109343U
Other languages
Japanese (ja)
Inventor
卓久 日下
新谷 昭
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP1982109343U priority Critical patent/JPS5916160U/en
Publication of JPS5916160U publication Critical patent/JPS5916160U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図から第5図までは本考案の一実施例の製造工程を
示す断面図、第6図は同じ〈実施例構造の断面図である
。 1・・・・・・ケイ素単結晶基板、2. 6. 7・・
四酸化ケイ素層、3・・・・・・熱窒化による窒化ケイ
素層、4・・・・・・窒化ケイ素層、5.8・・・・・
・低抵抗率の多結晶ケイ素層、9.10・・・・・・高
濃度N型領域、11−・・・・・リンガラス層、12・
・・・・・金属電極。
1 to 5 are cross-sectional views showing the manufacturing process of an embodiment of the present invention, and FIG. 6 is a cross-sectional view of the same embodiment structure. 1...Silicon single crystal substrate, 2. 6. 7...
Silicon tetroxide layer, 3...Silicon nitride layer by thermal nitriding, 4...Silicon nitride layer, 5.8...
・Low resistivity polycrystalline silicon layer, 9.10... High concentration N type region, 11-... Phosphorus glass layer, 12.
...Metal electrode.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] トランジスタメモリセル型記憶装置において、電荷蓄積
用容量の誘電体物質としてCVDSi窒化膜/Si熱窒
化膜なる二層膜を用いることを特徴とする記憶装置。
A transistor memory cell type memory device characterized in that a two-layer film of CVDSi nitride film/Si thermal nitride film is used as a dielectric material of a charge storage capacitor.
JP1982109343U 1982-07-21 1982-07-21 Storage device Pending JPS5916160U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1982109343U JPS5916160U (en) 1982-07-21 1982-07-21 Storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1982109343U JPS5916160U (en) 1982-07-21 1982-07-21 Storage device

Publications (1)

Publication Number Publication Date
JPS5916160U true JPS5916160U (en) 1984-01-31

Family

ID=30254746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1982109343U Pending JPS5916160U (en) 1982-07-21 1982-07-21 Storage device

Country Status (1)

Country Link
JP (1) JPS5916160U (en)

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