JPS5752056A - Photomask - Google Patents
PhotomaskInfo
- Publication number
- JPS5752056A JPS5752056A JP12758880A JP12758880A JPS5752056A JP S5752056 A JPS5752056 A JP S5752056A JP 12758880 A JP12758880 A JP 12758880A JP 12758880 A JP12758880 A JP 12758880A JP S5752056 A JPS5752056 A JP S5752056A
- Authority
- JP
- Japan
- Prior art keywords
- film
- face
- etched
- light shielding
- light transmitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
PURPOSE:To prevent the projection of dust, etc. on the surface of a photosensitive mateial by forming a fixed difference in level between the light shielding face and the light transmitting face of a photomask by etching a part except the light shielding pattern so as to locate the light transmitting face at the outside of the depth of the focus of a projective lens. CONSTITUTION:A light shielding film 13 of chromium oxide and a photosensitive material 16 are formed on a substrate 12 of quartz glass or the like in order. The material 16 is exposed through a patterned mask and developed. The film 13 is then etched with ion beams or the like, leaving the material 16 on the etched film 13. By further carrying out etching, a little material 16 is left on the film 13, and a part of the subtstrate 12 not covered with the film 13 is etched deeply and concavely to form a light transmitting face 14 having a difference (h). The material 16 is finally removed to obtain a photomask 11. Thus, even if dust, etc. are stuck to the face 14, they are not projected on the surface of a photosensitive material since the face 14 is not within the depth of the focus of the projective lens of an exposing device, and the formation of a defective pattern is prevented in the manufacture of an integrated circuit, etc.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12758880A JPS5752056A (en) | 1980-09-12 | 1980-09-12 | Photomask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12758880A JPS5752056A (en) | 1980-09-12 | 1980-09-12 | Photomask |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5752056A true JPS5752056A (en) | 1982-03-27 |
Family
ID=14963779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12758880A Pending JPS5752056A (en) | 1980-09-12 | 1980-09-12 | Photomask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5752056A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2629605A1 (en) * | 1988-03-29 | 1989-10-06 | Francou Marc | Method for manufacturing microelectronic semiconductor components in microlithography by hard contact and corresponding microelectronic semiconductor components |
FR2641622A1 (en) * | 1988-12-19 | 1990-07-13 | Weill Andre | Photolithography mask |
US20140113020A1 (en) * | 2011-04-06 | 2014-04-24 | Hoya Corporation | Mold manufacturing mask blanks and method of manufacturing mold |
-
1980
- 1980-09-12 JP JP12758880A patent/JPS5752056A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2629605A1 (en) * | 1988-03-29 | 1989-10-06 | Francou Marc | Method for manufacturing microelectronic semiconductor components in microlithography by hard contact and corresponding microelectronic semiconductor components |
FR2641622A1 (en) * | 1988-12-19 | 1990-07-13 | Weill Andre | Photolithography mask |
US20140113020A1 (en) * | 2011-04-06 | 2014-04-24 | Hoya Corporation | Mold manufacturing mask blanks and method of manufacturing mold |
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