JPS57179772A - Measuring device of radiant ray - Google Patents
Measuring device of radiant rayInfo
- Publication number
- JPS57179772A JPS57179772A JP6593281A JP6593281A JPS57179772A JP S57179772 A JPS57179772 A JP S57179772A JP 6593281 A JP6593281 A JP 6593281A JP 6593281 A JP6593281 A JP 6593281A JP S57179772 A JPS57179772 A JP S57179772A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- measurement
- count
- during
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
- G01T1/178—Circuit arrangements not adapted to a particular type of detector for measuring specific activity in the presence of other radioactive substances, e.g. natural, in the air or in liquids such as rain water
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To obtain the titled device with which the accuracy of measurement is greatly increased, by obtaining the measured value of a sample by subtracting the background value before and after the measurement of the sample or the averaged value of the count factor from the count value during the measurement of the sample. CONSTITUTION:The measured value of a sample is obtained by subtracting the background count value before and after the measurement of the sample or the averaged value of the count factor from the count value during the measurement of the sample. For instance, a radiation detector 13 is connected to an arithmetic circuit 16 via an amplifier 14 and a counter 15. At the same time, a control part 12 is also connected to the circuit 16. The part 12 delivers the timing control signals which are obtained right before the existence of a sample 11, during the existence of the sample and right after a moment when the sample does not exist any more respectively. The circuit 16 stores the count values in a certain period of time right before the measurement, during the measurement and right after the measurement of the sample 11 respectively into a memory based on the timing control signal given from the part 12. Then the background count value before and after the measurement of the sample is subtracted from the count value during the measurement of the sample.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6593281A JPS57179772A (en) | 1981-04-30 | 1981-04-30 | Measuring device of radiant ray |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6593281A JPS57179772A (en) | 1981-04-30 | 1981-04-30 | Measuring device of radiant ray |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57179772A true JPS57179772A (en) | 1982-11-05 |
Family
ID=13301224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6593281A Pending JPS57179772A (en) | 1981-04-30 | 1981-04-30 | Measuring device of radiant ray |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57179772A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002263074A (en) * | 2001-03-06 | 2002-09-17 | Aloka Co Ltd | Radiation measuring device and method |
JP2013137237A (en) * | 2011-12-28 | 2013-07-11 | Hamamatsu Photonics Kk | Distance meter |
JP2014077747A (en) * | 2012-10-12 | 2014-05-01 | Shimadzu Corp | Radiation screening test device |
JP2016090228A (en) * | 2014-10-29 | 2016-05-23 | 鹿島建設株式会社 | Radioactive concentration measurement device |
-
1981
- 1981-04-30 JP JP6593281A patent/JPS57179772A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002263074A (en) * | 2001-03-06 | 2002-09-17 | Aloka Co Ltd | Radiation measuring device and method |
JP4627602B2 (en) * | 2001-03-06 | 2011-02-09 | アロカ株式会社 | Radioactivity measuring device and radioactivity measuring method |
JP2013137237A (en) * | 2011-12-28 | 2013-07-11 | Hamamatsu Photonics Kk | Distance meter |
US9151831B2 (en) | 2011-12-28 | 2015-10-06 | Hamamatsu Photonics K.K. | Distance measurement device |
JP2014077747A (en) * | 2012-10-12 | 2014-05-01 | Shimadzu Corp | Radiation screening test device |
JP2016090228A (en) * | 2014-10-29 | 2016-05-23 | 鹿島建設株式会社 | Radioactive concentration measurement device |
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