JPS57174927A - Skew adjusting circuit - Google Patents
Skew adjusting circuitInfo
- Publication number
- JPS57174927A JPS57174927A JP56060311A JP6031181A JPS57174927A JP S57174927 A JPS57174927 A JP S57174927A JP 56060311 A JP56060311 A JP 56060311A JP 6031181 A JP6031181 A JP 6031181A JP S57174927 A JPS57174927 A JP S57174927A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- amplifier
- points
- phase
- vcd
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Pulse Circuits (AREA)
- Manipulation Of Pulses (AREA)
- Networks Using Active Elements (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Abstract
PURPOSE:To achieve skew adjustment with high accuracy, by assembling a voltage controlled delay circuit used as a delay element in a phase locked loop circuit. CONSTITUTION:Points of skew adjustment are taken as points A and B. A voltage controlled delay circuit VCD is used as a delay element. A phase locked loop circuit consists of the VCD1, a phase comparator 2, a charge pump circuit 3, a low pass filter 4, a DC amplifier 5 and a logical gate circuit 8. When the phase of the point B leads than that of the point A, the delay time of the VCD is increased by an output voltage of a DC amplifier 5. When the phases of two inputs of the phase comparator 2 are equal, the output voltage of the DC amplifier 5 is constant. Thus, the skew at the points A and B can be corrected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56060311A JPS57174927A (en) | 1981-04-21 | 1981-04-21 | Skew adjusting circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56060311A JPS57174927A (en) | 1981-04-21 | 1981-04-21 | Skew adjusting circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57174927A true JPS57174927A (en) | 1982-10-27 |
JPH0318373B2 JPH0318373B2 (en) | 1991-03-12 |
Family
ID=13138489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56060311A Granted JPS57174927A (en) | 1981-04-21 | 1981-04-21 | Skew adjusting circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57174927A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60230711A (en) * | 1984-04-28 | 1985-11-16 | Hioki Denki Kk | Phase rotation correcting circuit |
JPS6181026A (en) * | 1984-09-28 | 1986-04-24 | Yokogawa Hokushin Electric Corp | Test signal generating system |
JPH021620A (en) * | 1987-11-30 | 1990-01-05 | Toshiba Corp | Voltage controlled oscillation circuit |
JPH0289422A (en) * | 1988-05-17 | 1990-03-29 | Toshiba Corp | Voltage controlled oscillating circuit |
JPH02226302A (en) * | 1988-12-27 | 1990-09-07 | Texas Instr Inc <Ti> | Tuning system for controlling change in variable parameter generated from subject system and correction feedback for system |
JPH03120130U (en) * | 1990-03-20 | 1991-12-10 | ||
JP2008078995A (en) * | 2006-09-21 | 2008-04-03 | Nec Electronics Corp | Phase shifting circuit |
WO2010004755A1 (en) * | 2008-07-09 | 2010-01-14 | 株式会社アドバンテスト | Testing device and testing method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5537031A (en) * | 1978-09-07 | 1980-03-14 | Trio Kenwood Corp | Phase synchronizing circuit |
-
1981
- 1981-04-21 JP JP56060311A patent/JPS57174927A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5537031A (en) * | 1978-09-07 | 1980-03-14 | Trio Kenwood Corp | Phase synchronizing circuit |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60230711A (en) * | 1984-04-28 | 1985-11-16 | Hioki Denki Kk | Phase rotation correcting circuit |
JPS6181026A (en) * | 1984-09-28 | 1986-04-24 | Yokogawa Hokushin Electric Corp | Test signal generating system |
JPH021620A (en) * | 1987-11-30 | 1990-01-05 | Toshiba Corp | Voltage controlled oscillation circuit |
JPH0289422A (en) * | 1988-05-17 | 1990-03-29 | Toshiba Corp | Voltage controlled oscillating circuit |
JPH02226302A (en) * | 1988-12-27 | 1990-09-07 | Texas Instr Inc <Ti> | Tuning system for controlling change in variable parameter generated from subject system and correction feedback for system |
JPH03120130U (en) * | 1990-03-20 | 1991-12-10 | ||
JP2008078995A (en) * | 2006-09-21 | 2008-04-03 | Nec Electronics Corp | Phase shifting circuit |
WO2010004755A1 (en) * | 2008-07-09 | 2010-01-14 | 株式会社アドバンテスト | Testing device and testing method |
CN102077104A (en) * | 2008-07-09 | 2011-05-25 | 爱德万测试株式会社 | Testing device and testing method |
JP5208211B2 (en) * | 2008-07-09 | 2013-06-12 | 株式会社アドバンテスト | Test apparatus and test method |
Also Published As
Publication number | Publication date |
---|---|
JPH0318373B2 (en) | 1991-03-12 |
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