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JPS57174927A - Skew adjusting circuit - Google Patents

Skew adjusting circuit

Info

Publication number
JPS57174927A
JPS57174927A JP56060311A JP6031181A JPS57174927A JP S57174927 A JPS57174927 A JP S57174927A JP 56060311 A JP56060311 A JP 56060311A JP 6031181 A JP6031181 A JP 6031181A JP S57174927 A JPS57174927 A JP S57174927A
Authority
JP
Japan
Prior art keywords
circuit
amplifier
points
phase
vcd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56060311A
Other languages
Japanese (ja)
Other versions
JPH0318373B2 (en
Inventor
Hideyuki Obara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56060311A priority Critical patent/JPS57174927A/en
Publication of JPS57174927A publication Critical patent/JPS57174927A/en
Publication of JPH0318373B2 publication Critical patent/JPH0318373B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Pulse Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Networks Using Active Elements (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)

Abstract

PURPOSE:To achieve skew adjustment with high accuracy, by assembling a voltage controlled delay circuit used as a delay element in a phase locked loop circuit. CONSTITUTION:Points of skew adjustment are taken as points A and B. A voltage controlled delay circuit VCD is used as a delay element. A phase locked loop circuit consists of the VCD1, a phase comparator 2, a charge pump circuit 3, a low pass filter 4, a DC amplifier 5 and a logical gate circuit 8. When the phase of the point B leads than that of the point A, the delay time of the VCD is increased by an output voltage of a DC amplifier 5. When the phases of two inputs of the phase comparator 2 are equal, the output voltage of the DC amplifier 5 is constant. Thus, the skew at the points A and B can be corrected.
JP56060311A 1981-04-21 1981-04-21 Skew adjusting circuit Granted JPS57174927A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56060311A JPS57174927A (en) 1981-04-21 1981-04-21 Skew adjusting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56060311A JPS57174927A (en) 1981-04-21 1981-04-21 Skew adjusting circuit

Publications (2)

Publication Number Publication Date
JPS57174927A true JPS57174927A (en) 1982-10-27
JPH0318373B2 JPH0318373B2 (en) 1991-03-12

Family

ID=13138489

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56060311A Granted JPS57174927A (en) 1981-04-21 1981-04-21 Skew adjusting circuit

Country Status (1)

Country Link
JP (1) JPS57174927A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230711A (en) * 1984-04-28 1985-11-16 Hioki Denki Kk Phase rotation correcting circuit
JPS6181026A (en) * 1984-09-28 1986-04-24 Yokogawa Hokushin Electric Corp Test signal generating system
JPH021620A (en) * 1987-11-30 1990-01-05 Toshiba Corp Voltage controlled oscillation circuit
JPH0289422A (en) * 1988-05-17 1990-03-29 Toshiba Corp Voltage controlled oscillating circuit
JPH02226302A (en) * 1988-12-27 1990-09-07 Texas Instr Inc <Ti> Tuning system for controlling change in variable parameter generated from subject system and correction feedback for system
JPH03120130U (en) * 1990-03-20 1991-12-10
JP2008078995A (en) * 2006-09-21 2008-04-03 Nec Electronics Corp Phase shifting circuit
WO2010004755A1 (en) * 2008-07-09 2010-01-14 株式会社アドバンテスト Testing device and testing method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537031A (en) * 1978-09-07 1980-03-14 Trio Kenwood Corp Phase synchronizing circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537031A (en) * 1978-09-07 1980-03-14 Trio Kenwood Corp Phase synchronizing circuit

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230711A (en) * 1984-04-28 1985-11-16 Hioki Denki Kk Phase rotation correcting circuit
JPS6181026A (en) * 1984-09-28 1986-04-24 Yokogawa Hokushin Electric Corp Test signal generating system
JPH021620A (en) * 1987-11-30 1990-01-05 Toshiba Corp Voltage controlled oscillation circuit
JPH0289422A (en) * 1988-05-17 1990-03-29 Toshiba Corp Voltage controlled oscillating circuit
JPH02226302A (en) * 1988-12-27 1990-09-07 Texas Instr Inc <Ti> Tuning system for controlling change in variable parameter generated from subject system and correction feedback for system
JPH03120130U (en) * 1990-03-20 1991-12-10
JP2008078995A (en) * 2006-09-21 2008-04-03 Nec Electronics Corp Phase shifting circuit
WO2010004755A1 (en) * 2008-07-09 2010-01-14 株式会社アドバンテスト Testing device and testing method
CN102077104A (en) * 2008-07-09 2011-05-25 爱德万测试株式会社 Testing device and testing method
JP5208211B2 (en) * 2008-07-09 2013-06-12 株式会社アドバンテスト Test apparatus and test method

Also Published As

Publication number Publication date
JPH0318373B2 (en) 1991-03-12

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