JPS5714758A - Characteristic measuring instrument of semiconductor - Google Patents
Characteristic measuring instrument of semiconductorInfo
- Publication number
- JPS5714758A JPS5714758A JP8981080A JP8981080A JPS5714758A JP S5714758 A JPS5714758 A JP S5714758A JP 8981080 A JP8981080 A JP 8981080A JP 8981080 A JP8981080 A JP 8981080A JP S5714758 A JPS5714758 A JP S5714758A
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- output side
- tolerance
- constitution
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To prevent damage of amplifier by setting attenuators on the front stage of the amplifier to adjust the level of signals inputted by variation of impedance on the output side. CONSTITUTION:An amplifier 12 is connected on the output side of the high-frequency oscillator 10 through a circulator 13 and a continuously variable type attenuator 19, and a measuring transistor 18 and an output voltmeter 17 are connected to the output side of the amplifier 12 through a directional coupling 14. If input side of the TR18 is short-circuited, load impedance against the amplifier 12 becomes small and amplifier may be broken because the maximum output power exceeds the tolerance. In this case, attenuation is controlled by the attenuator 19 by using the negative feedback loop NF1 so that the maximum output power does not exceed the tolerance. Therefore, by this constitution, damage of amplifier can be prevented.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8981080A JPS5714758A (en) | 1980-07-01 | 1980-07-01 | Characteristic measuring instrument of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8981080A JPS5714758A (en) | 1980-07-01 | 1980-07-01 | Characteristic measuring instrument of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5714758A true JPS5714758A (en) | 1982-01-26 |
Family
ID=13981073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8981080A Pending JPS5714758A (en) | 1980-07-01 | 1980-07-01 | Characteristic measuring instrument of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5714758A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5650238A (en) * | 1994-08-01 | 1997-07-22 | Nkk Corporation | Zinc-electroplated steel sheet |
-
1980
- 1980-07-01 JP JP8981080A patent/JPS5714758A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5650238A (en) * | 1994-08-01 | 1997-07-22 | Nkk Corporation | Zinc-electroplated steel sheet |
US5810991A (en) * | 1994-08-01 | 1998-09-22 | Nkk Corporation | Zinc-electroplated steel sheet and method thereof |
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