JPS5712558A - Mos transistor having high withstand voltage - Google Patents
Mos transistor having high withstand voltageInfo
- Publication number
- JPS5712558A JPS5712558A JP8687980A JP8687980A JPS5712558A JP S5712558 A JPS5712558 A JP S5712558A JP 8687980 A JP8687980 A JP 8687980A JP 8687980 A JP8687980 A JP 8687980A JP S5712558 A JPS5712558 A JP S5712558A
- Authority
- JP
- Japan
- Prior art keywords
- parts
- withstand voltage
- channel
- region
- mos transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005452 bending Methods 0.000 abstract 3
- 230000005684 electric field Effects 0.000 abstract 1
- 230000002349 favourable effect Effects 0.000 abstract 1
- 238000005468 ion implantation Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
- H10D62/126—Top-view geometrical layouts of the regions or the junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
- H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
- H10D62/235—Channel regions of field-effect devices of FETs of IGFETs
Landscapes
- Bipolar Transistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8687980A JPS5712558A (en) | 1980-06-25 | 1980-06-25 | Mos transistor having high withstand voltage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8687980A JPS5712558A (en) | 1980-06-25 | 1980-06-25 | Mos transistor having high withstand voltage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5712558A true JPS5712558A (en) | 1982-01-22 |
Family
ID=13899113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8687980A Pending JPS5712558A (en) | 1980-06-25 | 1980-06-25 | Mos transistor having high withstand voltage |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5712558A (ja) |
Cited By (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4933740A (en) * | 1986-11-26 | 1990-06-12 | General Electric Company | Insulated gate transistor with vertical integral diode and method of fabrication |
| US4987464A (en) * | 1987-01-23 | 1991-01-22 | Oki Electric Industry Co., Ltd. | Encapsulated FET semiconductor device with large W/L ratio |
| EP0546377A2 (en) * | 1991-12-12 | 1993-06-16 | Power Integrations, Inc. | Semiconductor device with improved breakdown voltage characteristics |
| EP0613187A3 (en) * | 1993-02-15 | 1994-12-21 | Fuji Electric Co Ltd | High-voltage MIS field effect transistor. |
| US6168983B1 (en) | 1996-11-05 | 2001-01-02 | Power Integrations, Inc. | Method of making a high-voltage transistor with multiple lateral conduction layers |
| US6207994B1 (en) | 1996-11-05 | 2001-03-27 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6501130B2 (en) | 2001-01-24 | 2002-12-31 | Power Integrations, Inc. | High-voltage transistor with buried conduction layer |
| US6509220B2 (en) | 2000-11-27 | 2003-01-21 | Power Integrations, Inc. | Method of fabricating a high-voltage transistor |
| US6635544B2 (en) | 2001-09-07 | 2003-10-21 | Power Intergrations, Inc. | Method of fabricating a high-voltage transistor with a multi-layered extended drain structure |
| US6639277B2 (en) | 1996-11-05 | 2003-10-28 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| EP1089345A3 (en) * | 1999-09-28 | 2003-11-12 | Fuji Electric Co. Ltd. | Lateral power field-effect transistor |
| US6768171B2 (en) | 2000-11-27 | 2004-07-27 | Power Integrations, Inc. | High-voltage transistor with JFET conduction channels |
| US6781198B2 (en) | 2001-09-07 | 2004-08-24 | Power Integrations, Inc. | High-voltage vertical transistor with a multi-layered extended drain structure |
| US6815293B2 (en) | 2001-09-07 | 2004-11-09 | Power Intergrations, Inc. | High-voltage lateral transistor with a multi-layered extended drain structure |
| US7115958B2 (en) | 2001-10-29 | 2006-10-03 | Power Integrations, Inc. | Lateral power MOSFET for high switching speeds |
| US9601613B2 (en) | 2007-02-16 | 2017-03-21 | Power Integrations, Inc. | Gate pullback at ends of high-voltage vertical transistor structure |
| US9660053B2 (en) | 2013-07-12 | 2017-05-23 | Power Integrations, Inc. | High-voltage field-effect transistor having multiple implanted layers |
| US10325988B2 (en) | 2013-12-13 | 2019-06-18 | Power Integrations, Inc. | Vertical transistor device structure with cylindrically-shaped field plates |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS568882A (en) * | 1979-07-03 | 1981-01-29 | Sharp Corp | High dielectric strength field effect semiconductor device |
-
1980
- 1980-06-25 JP JP8687980A patent/JPS5712558A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS568882A (en) * | 1979-07-03 | 1981-01-29 | Sharp Corp | High dielectric strength field effect semiconductor device |
Cited By (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4933740A (en) * | 1986-11-26 | 1990-06-12 | General Electric Company | Insulated gate transistor with vertical integral diode and method of fabrication |
| US4987464A (en) * | 1987-01-23 | 1991-01-22 | Oki Electric Industry Co., Ltd. | Encapsulated FET semiconductor device with large W/L ratio |
| EP0546377A2 (en) * | 1991-12-12 | 1993-06-16 | Power Integrations, Inc. | Semiconductor device with improved breakdown voltage characteristics |
| US5258636A (en) * | 1991-12-12 | 1993-11-02 | Power Integrations, Inc. | Narrow radius tips for high voltage semiconductor devices with interdigitated source and drain electrodes |
| EP0613187A3 (en) * | 1993-02-15 | 1994-12-21 | Fuji Electric Co Ltd | High-voltage MIS field effect transistor. |
| US5523599A (en) * | 1993-02-15 | 1996-06-04 | Fuji Electric Co., Ltd. | High voltage MIS field effect transistor |
| US6828631B2 (en) | 1996-11-05 | 2004-12-07 | Power Integrations, Inc | High-voltage transistor with multi-layer conduction region |
| US6207994B1 (en) | 1996-11-05 | 2001-03-27 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6724041B2 (en) | 1996-11-05 | 2004-04-20 | Power Integrations, Inc. | Method of making a high-voltage transistor with buried conduction regions |
| US6168983B1 (en) | 1996-11-05 | 2001-01-02 | Power Integrations, Inc. | Method of making a high-voltage transistor with multiple lateral conduction layers |
| US6777749B2 (en) | 1996-11-05 | 2004-08-17 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6570219B1 (en) | 1996-11-05 | 2003-05-27 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6633065B2 (en) | 1996-11-05 | 2003-10-14 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6800903B2 (en) | 1996-11-05 | 2004-10-05 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6639277B2 (en) | 1996-11-05 | 2003-10-28 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6768172B2 (en) | 1996-11-05 | 2004-07-27 | Power Integrations, Inc. | High-voltage transistor with multi-layer conduction region |
| US6787437B2 (en) | 1996-11-05 | 2004-09-07 | Power Integrations, Inc. | Method of making a high-voltage transistor with buried conduction regions |
| EP1089345A3 (en) * | 1999-09-28 | 2003-11-12 | Fuji Electric Co. Ltd. | Lateral power field-effect transistor |
| US6509220B2 (en) | 2000-11-27 | 2003-01-21 | Power Integrations, Inc. | Method of fabricating a high-voltage transistor |
| US6768171B2 (en) | 2000-11-27 | 2004-07-27 | Power Integrations, Inc. | High-voltage transistor with JFET conduction channels |
| US6818490B2 (en) | 2001-01-24 | 2004-11-16 | Power Integrations, Inc. | Method of fabricating complementary high-voltage field-effect transistors |
| US6504209B2 (en) | 2001-01-24 | 2003-01-07 | Power Integrations, Inc. | High-voltage transistor with buried conduction layer |
| US6501130B2 (en) | 2001-01-24 | 2002-12-31 | Power Integrations, Inc. | High-voltage transistor with buried conduction layer |
| US6667213B2 (en) | 2001-09-07 | 2003-12-23 | Power Integrations, Inc. | Method of fabricating a high-voltage transistor with a multi-layered extended drain structure |
| US6750105B2 (en) | 2001-09-07 | 2004-06-15 | Power Integrations, Inc. | Method of fabricating a high-voltage transistor with a multi-layered extended drain structure |
| US6635544B2 (en) | 2001-09-07 | 2003-10-21 | Power Intergrations, Inc. | Method of fabricating a high-voltage transistor with a multi-layered extended drain structure |
| US6815293B2 (en) | 2001-09-07 | 2004-11-09 | Power Intergrations, Inc. | High-voltage lateral transistor with a multi-layered extended drain structure |
| US6787847B2 (en) | 2001-09-07 | 2004-09-07 | Power Integrations, Inc. | High-voltage vertical transistor with a multi-layered extended drain structure |
| US6781198B2 (en) | 2001-09-07 | 2004-08-24 | Power Integrations, Inc. | High-voltage vertical transistor with a multi-layered extended drain structure |
| US6838346B2 (en) | 2001-09-07 | 2005-01-04 | Power Integrations, Inc. | Method of fabricating a high-voltage transistor with a multi-layered extended drain structure |
| US6882005B2 (en) | 2001-09-07 | 2005-04-19 | Power Integrations, Inc. | High-voltage vertical transistor with a multi-layered extended drain structure |
| US6987299B2 (en) | 2001-09-07 | 2006-01-17 | Power Integrations, Inc. | High-voltage lateral transistor with a multi-layered extended drain structure |
| US7115958B2 (en) | 2001-10-29 | 2006-10-03 | Power Integrations, Inc. | Lateral power MOSFET for high switching speeds |
| US9601613B2 (en) | 2007-02-16 | 2017-03-21 | Power Integrations, Inc. | Gate pullback at ends of high-voltage vertical transistor structure |
| US9660053B2 (en) | 2013-07-12 | 2017-05-23 | Power Integrations, Inc. | High-voltage field-effect transistor having multiple implanted layers |
| US10325988B2 (en) | 2013-12-13 | 2019-06-18 | Power Integrations, Inc. | Vertical transistor device structure with cylindrically-shaped field plates |
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