JPS5658645A - Flaw detecting device - Google Patents
Flaw detecting deviceInfo
- Publication number
- JPS5658645A JPS5658645A JP13580579A JP13580579A JPS5658645A JP S5658645 A JPS5658645 A JP S5658645A JP 13580579 A JP13580579 A JP 13580579A JP 13580579 A JP13580579 A JP 13580579A JP S5658645 A JPS5658645 A JP S5658645A
- Authority
- JP
- Japan
- Prior art keywords
- flaw
- web
- signal
- threshold value
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE: To stabilize the sensitivity of flaw detection by providing a reference flaw sample near a web to be inspected and by controlling the threshold value of the web when any flaw is detected.
CONSTITUTION: The reference flaw sample 4 having the same transmission volume or reflection volume with the limited photo-transmission volume or reflection volume out of flaws desired to detect is set in a part of the optical path of a photoreceiver 1, the sample 4 and the web 2 having the flaw to be detected are scanned by a point line of light, and thereby the output signal is obtained by the photoreceiver 1. And out of the output signals, the signal from the web 2 is compared with the threshold value set beforehand, and the signal exceeding the threshold value is taken out as the flaw signal from the web 2. In addition, the signal from the sample 4 is made to be for correction of the threshold value. Accordingly, the sensitivity of flaw detection turns to be insensitive for the fluctuation of the detecting system and thus the stable sensitivity of detection is obtained.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13580579A JPS5658645A (en) | 1979-10-19 | 1979-10-19 | Flaw detecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13580579A JPS5658645A (en) | 1979-10-19 | 1979-10-19 | Flaw detecting device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5658645A true JPS5658645A (en) | 1981-05-21 |
Family
ID=15160222
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13580579A Pending JPS5658645A (en) | 1979-10-19 | 1979-10-19 | Flaw detecting device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5658645A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60188365U (en) * | 1984-05-25 | 1985-12-13 | エヌオーケー株式会社 | Surface defect inspection equipment |
JPS60188364U (en) * | 1984-05-25 | 1985-12-13 | エヌオーケー株式会社 | Surface defect inspection equipment |
JPS61170640A (en) * | 1985-01-25 | 1986-08-01 | Shigumatsukusu Kk | Material body recognizing device |
JP2013205377A (en) * | 2012-03-29 | 2013-10-07 | Nisshin Steel Co Ltd | Adjustment method for surface inspection device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5276985A (en) * | 1975-12-23 | 1977-06-28 | Canon Inc | Flaw detector |
-
1979
- 1979-10-19 JP JP13580579A patent/JPS5658645A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5276985A (en) * | 1975-12-23 | 1977-06-28 | Canon Inc | Flaw detector |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60188365U (en) * | 1984-05-25 | 1985-12-13 | エヌオーケー株式会社 | Surface defect inspection equipment |
JPS60188364U (en) * | 1984-05-25 | 1985-12-13 | エヌオーケー株式会社 | Surface defect inspection equipment |
JPS61170640A (en) * | 1985-01-25 | 1986-08-01 | Shigumatsukusu Kk | Material body recognizing device |
JP2013205377A (en) * | 2012-03-29 | 2013-10-07 | Nisshin Steel Co Ltd | Adjustment method for surface inspection device |
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