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JPS5658645A - Flaw detecting device - Google Patents

Flaw detecting device

Info

Publication number
JPS5658645A
JPS5658645A JP13580579A JP13580579A JPS5658645A JP S5658645 A JPS5658645 A JP S5658645A JP 13580579 A JP13580579 A JP 13580579A JP 13580579 A JP13580579 A JP 13580579A JP S5658645 A JPS5658645 A JP S5658645A
Authority
JP
Japan
Prior art keywords
flaw
web
signal
threshold value
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13580579A
Other languages
Japanese (ja)
Inventor
Yoshio Sanbe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP13580579A priority Critical patent/JPS5658645A/en
Publication of JPS5658645A publication Critical patent/JPS5658645A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE: To stabilize the sensitivity of flaw detection by providing a reference flaw sample near a web to be inspected and by controlling the threshold value of the web when any flaw is detected.
CONSTITUTION: The reference flaw sample 4 having the same transmission volume or reflection volume with the limited photo-transmission volume or reflection volume out of flaws desired to detect is set in a part of the optical path of a photoreceiver 1, the sample 4 and the web 2 having the flaw to be detected are scanned by a point line of light, and thereby the output signal is obtained by the photoreceiver 1. And out of the output signals, the signal from the web 2 is compared with the threshold value set beforehand, and the signal exceeding the threshold value is taken out as the flaw signal from the web 2. In addition, the signal from the sample 4 is made to be for correction of the threshold value. Accordingly, the sensitivity of flaw detection turns to be insensitive for the fluctuation of the detecting system and thus the stable sensitivity of detection is obtained.
COPYRIGHT: (C)1981,JPO&Japio
JP13580579A 1979-10-19 1979-10-19 Flaw detecting device Pending JPS5658645A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13580579A JPS5658645A (en) 1979-10-19 1979-10-19 Flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13580579A JPS5658645A (en) 1979-10-19 1979-10-19 Flaw detecting device

Publications (1)

Publication Number Publication Date
JPS5658645A true JPS5658645A (en) 1981-05-21

Family

ID=15160222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13580579A Pending JPS5658645A (en) 1979-10-19 1979-10-19 Flaw detecting device

Country Status (1)

Country Link
JP (1) JPS5658645A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60188365U (en) * 1984-05-25 1985-12-13 エヌオーケー株式会社 Surface defect inspection equipment
JPS60188364U (en) * 1984-05-25 1985-12-13 エヌオーケー株式会社 Surface defect inspection equipment
JPS61170640A (en) * 1985-01-25 1986-08-01 Shigumatsukusu Kk Material body recognizing device
JP2013205377A (en) * 2012-03-29 2013-10-07 Nisshin Steel Co Ltd Adjustment method for surface inspection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5276985A (en) * 1975-12-23 1977-06-28 Canon Inc Flaw detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5276985A (en) * 1975-12-23 1977-06-28 Canon Inc Flaw detector

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60188365U (en) * 1984-05-25 1985-12-13 エヌオーケー株式会社 Surface defect inspection equipment
JPS60188364U (en) * 1984-05-25 1985-12-13 エヌオーケー株式会社 Surface defect inspection equipment
JPS61170640A (en) * 1985-01-25 1986-08-01 Shigumatsukusu Kk Material body recognizing device
JP2013205377A (en) * 2012-03-29 2013-10-07 Nisshin Steel Co Ltd Adjustment method for surface inspection device

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