JPS5645897A - Manufacture of silicon carbide crystal - Google Patents
Manufacture of silicon carbide crystalInfo
- Publication number
- JPS5645897A JPS5645897A JP12127979A JP12127979A JPS5645897A JP S5645897 A JPS5645897 A JP S5645897A JP 12127979 A JP12127979 A JP 12127979A JP 12127979 A JP12127979 A JP 12127979A JP S5645897 A JPS5645897 A JP S5645897A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- substrate
- sic
- stand
- temp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
PURPOSE: To continuously grow an SiC tertiary layer by mounting an Si substrate with a primary layer of polycrystal SiC formed on a stand with the layer surface downward, melting the substrate to form an SiC secondary layer, and feeding starting materials from a vapor phase.
CONSTITUTION: A surface layer of Si substrate 2 on sample stand 26 is removed by etching with HCl-H2 mixed gas, and the temp. of substrate 2 is set to the m.p. or below, preferably 1,200W1,300°C, SiH2Cl2 and C3H8 as starting material gases are fed together with H2 gas as carrier gas to form SiC primary layer 4 of polycrystal SiC on substrate 2. After dropping the temp. stand 26 is taken out to invert substrate 2 so that layer 4 contacts with stand 26. Stand 26 is placed in reaction tube 22, heated to about 1,500°C in an H2 atmosphere to melt substrate 2, maintained at the temp. for a predetermined time to form single crystal SiC secondary layer 14, and heated to about 1,700°C under reduced pressure to reduce the Si melt by evaporation. SiH2Cl2, C3H8 and H2 are then fed by a predetermined amount each under reduced pressure to grow high temp. CVD-SiC layer (tertiary layer) 15.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12127979A JPS5645897A (en) | 1979-09-19 | 1979-09-19 | Manufacture of silicon carbide crystal |
DE3002671A DE3002671C2 (en) | 1979-01-25 | 1980-01-25 | Process for making a silicon carbide substrate |
US06/369,911 US4582561A (en) | 1979-01-25 | 1982-04-19 | Method for making a silicon carbide substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12127979A JPS5645897A (en) | 1979-09-19 | 1979-09-19 | Manufacture of silicon carbide crystal |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5645897A true JPS5645897A (en) | 1981-04-25 |
JPS6121197B2 JPS6121197B2 (en) | 1986-05-26 |
Family
ID=14807313
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12127979A Granted JPS5645897A (en) | 1979-01-25 | 1979-09-19 | Manufacture of silicon carbide crystal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5645897A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63283014A (en) * | 1987-04-28 | 1988-11-18 | Sharp Corp | Silicon carbide semiconductor element |
US5471946A (en) * | 1992-10-13 | 1995-12-05 | Cs Halbleiter-Und Solartechnologie Gmbh | Method for producing a wafer with a monocrystalline silicon carbide layer |
WO2018180013A1 (en) * | 2017-03-28 | 2018-10-04 | 三菱電機株式会社 | Silicon carbide substrate, method for producing silicon carbide substrate, and method for producing silicon carbide semiconductor device |
-
1979
- 1979-09-19 JP JP12127979A patent/JPS5645897A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63283014A (en) * | 1987-04-28 | 1988-11-18 | Sharp Corp | Silicon carbide semiconductor element |
US5471946A (en) * | 1992-10-13 | 1995-12-05 | Cs Halbleiter-Und Solartechnologie Gmbh | Method for producing a wafer with a monocrystalline silicon carbide layer |
WO2018180013A1 (en) * | 2017-03-28 | 2018-10-04 | 三菱電機株式会社 | Silicon carbide substrate, method for producing silicon carbide substrate, and method for producing silicon carbide semiconductor device |
JPWO2018180013A1 (en) * | 2017-03-28 | 2019-11-07 | 三菱電機株式会社 | Silicon carbide substrate, method for manufacturing silicon carbide substrate, and method for manufacturing silicon carbide semiconductor device |
CN110462112A (en) * | 2017-03-28 | 2019-11-15 | 三菱电机株式会社 | The manufacturing method of silicon carbide substrate, the manufacturing method of silicon carbide substrate and manufacturing silicon carbide semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS6121197B2 (en) | 1986-05-26 |
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