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JPS5622904A - Measuring method for web unevenness - Google Patents

Measuring method for web unevenness

Info

Publication number
JPS5622904A
JPS5622904A JP9886379A JP9886379A JPS5622904A JP S5622904 A JPS5622904 A JP S5622904A JP 9886379 A JP9886379 A JP 9886379A JP 9886379 A JP9886379 A JP 9886379A JP S5622904 A JPS5622904 A JP S5622904A
Authority
JP
Japan
Prior art keywords
web
photodetector
measured value
unevenness
roller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9886379A
Other languages
Japanese (ja)
Inventor
Yuzuru Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP9886379A priority Critical patent/JPS5622904A/en
Publication of JPS5622904A publication Critical patent/JPS5622904A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE: To make it possible to obtain an accurate measured value of web unevenness by correcting the measured value after measuring influences of a light projecting surface, photodetecting surface, roller surface, etc.
CONSTITUTION: Over web 5, projecting surface 2 of projector 1 and photodetecting surface 4 of photodetector 3 are provided adjoining to web 5. Light from projector 1, after passing through web 5, is reflected by surface 6 of a roller and passed through web 5 again, thereby detecting it by photodetector 3. The quantity of this photodetected light is converted by photodetector 3 into an electric signal, which is stored in memory unit 8. When card operation is started, influences of surface states of the projecting surface, photodetecting surface and roller surface 6 right before web 5 is spun out are previously measured and stored by being photodetected by photodetector 3 and a measured value when web 5 is passed is corrected in terms of them, thereby measuring web unevenness.
COPYRIGHT: (C)1981,JPO&Japio
JP9886379A 1979-08-01 1979-08-01 Measuring method for web unevenness Pending JPS5622904A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9886379A JPS5622904A (en) 1979-08-01 1979-08-01 Measuring method for web unevenness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9886379A JPS5622904A (en) 1979-08-01 1979-08-01 Measuring method for web unevenness

Publications (1)

Publication Number Publication Date
JPS5622904A true JPS5622904A (en) 1981-03-04

Family

ID=14231038

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9886379A Pending JPS5622904A (en) 1979-08-01 1979-08-01 Measuring method for web unevenness

Country Status (1)

Country Link
JP (1) JPS5622904A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277038A (en) * 1985-05-31 1986-12-08 Kanai Hiroyuki Method for measuring card web
JPS62150146A (en) * 1985-12-25 1987-07-04 Japan Vilene Co Ltd Nonwoven fabric defect detection device
JPH01310866A (en) * 1988-06-10 1989-12-14 Hitachi Ltd Control system for thin film polishing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277038A (en) * 1985-05-31 1986-12-08 Kanai Hiroyuki Method for measuring card web
JPS62150146A (en) * 1985-12-25 1987-07-04 Japan Vilene Co Ltd Nonwoven fabric defect detection device
JPH01310866A (en) * 1988-06-10 1989-12-14 Hitachi Ltd Control system for thin film polishing device

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