JPS5618704A - Device for measuring length of crack at high temperature - Google Patents
Device for measuring length of crack at high temperatureInfo
- Publication number
- JPS5618704A JPS5618704A JP9316279A JP9316279A JPS5618704A JP S5618704 A JPS5618704 A JP S5618704A JP 9316279 A JP9316279 A JP 9316279A JP 9316279 A JP9316279 A JP 9316279A JP S5618704 A JPS5618704 A JP S5618704A
- Authority
- JP
- Japan
- Prior art keywords
- crack
- test piece
- piece
- change
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
PURPOSE: To avoid the influence of temperature and accurately measure the length of a crack, by using a dummy piece and utilizing the change in the resistance of the dummy piece to cancel the change in the resistance of a test piece due to the temperature.
CONSTITUTION: A test piece A and a dummy piece B are connected in series with a DC constant-current supply C and placed in a high-temperature furnace 1. The voltage drops picked out from the points a1, a2, b1, b2 of the pieces A, B are applied to amplifiers D, E. A subtracted voltage value VR is displayed on an indicator F. The pieces A, B have the same shape and are made of the same material. Load is applied to the test piece A but no load is applied to the dummy piece B. According to this constitution, the change in the resistance of the test piece A due to temperature is cancelled by that of the dummy piece B and only the change in the resistance corresponding to the length of a crack due to the load applied to the test piece is displayed on the indicator F. Therefore, the length of the crack in the test piece A can be calculated if the relationship between the length of the crack and the change in the resistance is previously calibrated.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9316279A JPS5946323B2 (en) | 1979-07-24 | 1979-07-24 | Crack length measuring device in high temperature environment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9316279A JPS5946323B2 (en) | 1979-07-24 | 1979-07-24 | Crack length measuring device in high temperature environment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5618704A true JPS5618704A (en) | 1981-02-21 |
JPS5946323B2 JPS5946323B2 (en) | 1984-11-12 |
Family
ID=14074860
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9316279A Expired JPS5946323B2 (en) | 1979-07-24 | 1979-07-24 | Crack length measuring device in high temperature environment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5946323B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63144204A (en) * | 1986-12-08 | 1988-06-16 | Babcock Hitachi Kk | Strain detecting method for metallic material |
JPH06341942A (en) * | 1993-06-01 | 1994-12-13 | Nec Corp | Measuring method for adhesion of thin film and device therefor |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61135318U (en) * | 1985-02-13 | 1986-08-23 | ||
JP3000594U (en) * | 1994-01-31 | 1994-08-09 | 福井めがね工業株式会社 | Eye mirror |
-
1979
- 1979-07-24 JP JP9316279A patent/JPS5946323B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63144204A (en) * | 1986-12-08 | 1988-06-16 | Babcock Hitachi Kk | Strain detecting method for metallic material |
JPH06341942A (en) * | 1993-06-01 | 1994-12-13 | Nec Corp | Measuring method for adhesion of thin film and device therefor |
Also Published As
Publication number | Publication date |
---|---|
JPS5946323B2 (en) | 1984-11-12 |
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