JPS56138949A - Semiconductor memory element - Google Patents
Semiconductor memory elementInfo
- Publication number
- JPS56138949A JPS56138949A JP4179180A JP4179180A JPS56138949A JP S56138949 A JPS56138949 A JP S56138949A JP 4179180 A JP4179180 A JP 4179180A JP 4179180 A JP4179180 A JP 4179180A JP S56138949 A JPS56138949 A JP S56138949A
- Authority
- JP
- Japan
- Prior art keywords
- type
- layer
- impurity layer
- gate
- semiconductor memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 239000012535 impurity Substances 0.000 abstract 4
- 239000003990 capacitor Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
Landscapes
- Semiconductor Memories (AREA)
Abstract
PURPOSE:To form a semiconductor memory element of a simple writing operation by forming one conductive type second impurity layer directly under a gate insulating film and the other conductivite type third impurity layer directly under the second layer in a substantially one insulating gate FET. CONSTITUTION:A P type epitaxial layer 2 is formed on an N type substrate 1. It is electrically isolated with an oxide film layer 10. An N type impurity layer 3, a P type impurity layer 4, a gate oxide film 5, a gate electrode 6, source and drain N<+> type diffused layers 7, 8 and a P<+> type diffused layer 9 are sequentially formed thereon. In the memory configuration with the MOS transistor of the element structure as memory cell, an RX electrode is used as a word line at the time of reading, P<+> type buried region 9 and the electrode 6 as word lines at the time of writing, and the source and the drain are used as bit lines. Thus, a semiconductor memory element having simple writing operation, sufficient operation margin and substantially one insulating gate FET without storage capacitor can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4179180A JPS56138949A (en) | 1980-03-31 | 1980-03-31 | Semiconductor memory element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4179180A JPS56138949A (en) | 1980-03-31 | 1980-03-31 | Semiconductor memory element |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56138949A true JPS56138949A (en) | 1981-10-29 |
JPS623986B2 JPS623986B2 (en) | 1987-01-28 |
Family
ID=12618155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4179180A Granted JPS56138949A (en) | 1980-03-31 | 1980-03-31 | Semiconductor memory element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56138949A (en) |
-
1980
- 1980-03-31 JP JP4179180A patent/JPS56138949A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS623986B2 (en) | 1987-01-28 |
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