JPS56122905A - Optical detecting device for surface defect - Google Patents
Optical detecting device for surface defectInfo
- Publication number
- JPS56122905A JPS56122905A JP2709780A JP2709780A JPS56122905A JP S56122905 A JPS56122905 A JP S56122905A JP 2709780 A JP2709780 A JP 2709780A JP 2709780 A JP2709780 A JP 2709780A JP S56122905 A JPS56122905 A JP S56122905A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical fibers
- conical surface
- minute region
- scattered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE:To enhance the capability for detection of scattered lights, by providing plural optical fibers, which receive scattered reflection lights, on the conical surface with the light condensed point as the apex and by leading the light to the photodetector through optical fibers. CONSTITUTION:The light from light source 1 is condensed through condenser lens 2 and is irradiated to minute region B on object 3. If a defect exists in minute region B, the reflection light becomes a scattered light. Many optical fibers 5 are arranged on conical surface D with minute region B as the apex so that their one end faces are placed on the same circle on conical surface D in the direction of light condensed point B, and they are fixed by fixing material 6. The other end faces of optical fibers 5 are bundled and are led to photodetector 4 arranged apart.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2709780A JPS56122905A (en) | 1980-03-04 | 1980-03-04 | Optical detecting device for surface defect |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2709780A JPS56122905A (en) | 1980-03-04 | 1980-03-04 | Optical detecting device for surface defect |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56122905A true JPS56122905A (en) | 1981-09-26 |
Family
ID=12211574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2709780A Pending JPS56122905A (en) | 1980-03-04 | 1980-03-04 | Optical detecting device for surface defect |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56122905A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS622114A (en) * | 1985-06-28 | 1987-01-08 | Ando Electric Co Ltd | Surface roughness meter using reflected light |
JPS622113A (en) * | 1985-06-28 | 1987-01-08 | Ando Electric Co Ltd | Surface roughness meter using reflected light |
US4681442A (en) * | 1984-05-14 | 1987-07-21 | International Business Machines Corporation | Method for surface testing |
US5450291A (en) * | 1990-01-29 | 1995-09-12 | Ezel Inc. | Lighting system for camera |
-
1980
- 1980-03-04 JP JP2709780A patent/JPS56122905A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4681442A (en) * | 1984-05-14 | 1987-07-21 | International Business Machines Corporation | Method for surface testing |
JPS622114A (en) * | 1985-06-28 | 1987-01-08 | Ando Electric Co Ltd | Surface roughness meter using reflected light |
JPS622113A (en) * | 1985-06-28 | 1987-01-08 | Ando Electric Co Ltd | Surface roughness meter using reflected light |
US5450291A (en) * | 1990-01-29 | 1995-09-12 | Ezel Inc. | Lighting system for camera |
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