JPS5539774B2 - - Google Patents

Info

Publication number: JPS5539774B2
Authority: JP; Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP1515573A

Other languages

Other versions

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1973-02-08

Filing date

1973-02-08

Publication date

1980-10-14

1973-02-08 Application filed filed Critical

1973-02-08 Priority to JP1515573A priority Critical patent/JPS5539774B2/ja

1974-10-05 Publication of JPS49105585A publication Critical patent/JPS49105585A/ja

1980-10-14 Publication of JPS5539774B2 publication Critical patent/JPS5539774B2/ja

Status Expired legal-status Critical Current

Landscapes

Optical Measuring Cells (AREA)
Investigating Or Analysing Materials By Optical Means (AREA)

JP1515573A 1973-02-08 1973-02-08 Expired JPS5539774B2 (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP1515573A JPS5539774B2 (en)	1973-02-08	1973-02-08

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1515573A JPS5539774B2 (en)	1973-02-08	1973-02-08

Publications (2)

Publication Number	Publication Date
JPS49105585A JPS49105585A (en)	1974-10-05
JPS5539774B2 true JPS5539774B2 (en)	1980-10-14

Family

ID=11880893

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1515573A Expired JPS5539774B2 (en)	1973-02-08	1973-02-08

Country Status (1)

Country	Link
JP (1)	JPS5539774B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS57154034A (en) *	1981-03-19	1982-09-22	Tech Res & Dev Inst Of Japan Def Agency	Method for measuring electromagnetic wave shielding ability by suspended fine particle
EP3695208B1 (en)	2019-01-02	2024-09-18	Tosoh Corporation	Light scattering detectors and sample cells for the same
US11150175B2 (en)	2019-01-02	2021-10-19	M & J Scientific, Llc	Light scattering detectors and methods for the same

1973
- 1973-02-08 JP JP1515573A patent/JPS5539774B2/ja not_active Expired

Also Published As

Publication number	Publication date
JPS49105585A (en)	1974-10-05

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