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JPS5473278A - Tester - Google Patents

Tester

Info

Publication number
JPS5473278A
JPS5473278A JP9162878A JP9162878A JPS5473278A JP S5473278 A JPS5473278 A JP S5473278A JP 9162878 A JP9162878 A JP 9162878A JP 9162878 A JP9162878 A JP 9162878A JP S5473278 A JPS5473278 A JP S5473278A
Authority
JP
Japan
Prior art keywords
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9162878A
Other languages
Japanese (ja)
Other versions
JPS5827869B2 (en
Inventor
Jieemuzu Rongu Eberetsuto
Uorutaa Miyuuinchi Erumaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Inc
Original Assignee
Everett Charles Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/851,847 external-priority patent/US4138186A/en
Application filed by Everett Charles Inc filed Critical Everett Charles Inc
Publication of JPS5473278A publication Critical patent/JPS5473278A/en
Publication of JPS5827869B2 publication Critical patent/JPS5827869B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP53091628A 1977-11-16 1978-07-28 test equipment Expired JPS5827869B2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/851,847 US4138186A (en) 1977-07-22 1977-11-16 Test apparatus

Publications (2)

Publication Number Publication Date
JPS5473278A true JPS5473278A (en) 1979-06-12
JPS5827869B2 JPS5827869B2 (en) 1983-06-11

Family

ID=25311854

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53091628A Expired JPS5827869B2 (en) 1977-11-16 1978-07-28 test equipment

Country Status (4)

Country Link
JP (1) JPS5827869B2 (en)
DE (1) DE2836018C2 (en)
FR (1) FR2409664A1 (en)
GB (1) GB2009423B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58135974A (en) * 1982-02-09 1983-08-12 Akira Koga Testing device for printed circuit board using detecting needle
JPS6124674U (en) * 1984-07-19 1986-02-14 株式会社 三社電機製作所 Printed wiring board inspection equipment
JPS61104388U (en) * 1984-12-17 1986-07-02
JP2016164491A (en) * 2015-03-06 2016-09-08 三菱電機株式会社 Semiconductor device inspection tool

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2921007C2 (en) * 1979-05-23 1987-02-26 Siemens AG, 1000 Berlin und 8000 München Device for testing an electrical circuit board
JPH051939Y2 (en) * 1986-10-28 1993-01-19

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5376874U (en) * 1976-11-29 1978-06-27

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1297377A (en) * 1969-11-27 1972-11-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5376874U (en) * 1976-11-29 1978-06-27

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58135974A (en) * 1982-02-09 1983-08-12 Akira Koga Testing device for printed circuit board using detecting needle
JPS6124674U (en) * 1984-07-19 1986-02-14 株式会社 三社電機製作所 Printed wiring board inspection equipment
JPS61104388U (en) * 1984-12-17 1986-07-02
JPH0416231Y2 (en) * 1984-12-17 1992-04-10
JP2016164491A (en) * 2015-03-06 2016-09-08 三菱電機株式会社 Semiconductor device inspection tool

Also Published As

Publication number Publication date
DE2836018C2 (en) 1984-09-20
FR2409664B1 (en) 1983-03-18
GB2009423A (en) 1979-06-13
FR2409664A1 (en) 1979-06-15
GB2009423B (en) 1982-06-09
DE2836018A1 (en) 1979-05-17
JPS5827869B2 (en) 1983-06-11

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