JPS5472981A - Checking method for characteristics of semiconductor element - Google Patents
Checking method for characteristics of semiconductor elementInfo
- Publication number
- JPS5472981A JPS5472981A JP13997177A JP13997177A JPS5472981A JP S5472981 A JPS5472981 A JP S5472981A JP 13997177 A JP13997177 A JP 13997177A JP 13997177 A JP13997177 A JP 13997177A JP S5472981 A JPS5472981 A JP S5472981A
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- electrodes
- conductors
- checked unit
- elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To automatize characteristic checking measurements by mounting a checked unit, composed of a plural number of semiconductor elements connected in series, on a flexible conductive board with metal foil on its surface and by measuring elements one after another by sliding the measuring terminal of an automatic measuring instrument on electrodes of elements.
CONSTITUTION: The checked unit composed of a plural number of semiconductor elements 2 linked mutually into a plate body via resin 5 is mounted, by being pressed, on flexible conductive plate 1 of resin-like rubber clay provided with metal foil such as Al on its surface. Then, jig 6 with conductors 8 at the same pitch as electrodes 4 of the checked unit on insulating plate 7 is mounted on the checked unit while electrodes 4 and conductors 8 are made in contact. Next, measuring terminals 19 of measuring runner 10 connected to automatic measuring instrument 15 are caused to touch electrodes 4 via conductors 8 to measure characteristics of each element one after another while moving. If a defective is found, the mark of defect display is recorded through the automatic operation of marking runner 20.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52139971A JPS6047744B2 (en) | 1977-11-24 | 1977-11-24 | Method for testing characteristics of semiconductor devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52139971A JPS6047744B2 (en) | 1977-11-24 | 1977-11-24 | Method for testing characteristics of semiconductor devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5472981A true JPS5472981A (en) | 1979-06-11 |
JPS6047744B2 JPS6047744B2 (en) | 1985-10-23 |
Family
ID=15257926
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52139971A Expired JPS6047744B2 (en) | 1977-11-24 | 1977-11-24 | Method for testing characteristics of semiconductor devices |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6047744B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5465658A (en) * | 1977-10-31 | 1979-05-26 | Matsushita Electric Works Ltd | Hair dryer |
-
1977
- 1977-11-24 JP JP52139971A patent/JPS6047744B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5465658A (en) * | 1977-10-31 | 1979-05-26 | Matsushita Electric Works Ltd | Hair dryer |
Also Published As
Publication number | Publication date |
---|---|
JPS6047744B2 (en) | 1985-10-23 |
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