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JPS5445163A - Shape detecting method - Google Patents

Shape detecting method

Info

Publication number
JPS5445163A
JPS5445163A JP11125477A JP11125477A JPS5445163A JP S5445163 A JPS5445163 A JP S5445163A JP 11125477 A JP11125477 A JP 11125477A JP 11125477 A JP11125477 A JP 11125477A JP S5445163 A JPS5445163 A JP S5445163A
Authority
JP
Japan
Prior art keywords
beams
shape
thru
examined
television camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11125477A
Other languages
Japanese (ja)
Inventor
Isamu Ichijima
Kazuo Miyagawa
Takao Sugimoto
Koji Kawamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP11125477A priority Critical patent/JPS5445163A/en
Publication of JPS5445163A publication Critical patent/JPS5445163A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To detect the shape abnormalities of flat members with high accuracy by radiating a plurality of beams at a fixed spacing on the surface of material being examined.
CONSTITUTION: At the time of detecting the shape of the metarial 1 to be examined by adiating beams in the width direction of the material 1 on the surface of the traveling material 1, receiving the reflected beams thereof with a television camera and processing the electrical signals thus obtained; a plurality of beams are simultaneously radiated at a fixed spacing l on the surface of the material 1 by using of larzer light sovrces 101 thru 106, beam collimators 121 thru 126, rotating mirrors 111 thru 116 and are received with the television camera in such a maner that its scanning direction becomes at a right angle to the beam direction, thence the spacings of the receiving signals thereof are obtaied and from the difference therein, the shape abnormality is detected. Thereby, the shape abnormalities of the flat members including the blister flaws of the web part of wide flange beam may be dtected with good accuracy
COPYRIGHT: (C)1979,JPO&Japio
JP11125477A 1977-09-17 1977-09-17 Shape detecting method Pending JPS5445163A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11125477A JPS5445163A (en) 1977-09-17 1977-09-17 Shape detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11125477A JPS5445163A (en) 1977-09-17 1977-09-17 Shape detecting method

Publications (1)

Publication Number Publication Date
JPS5445163A true JPS5445163A (en) 1979-04-10

Family

ID=14556512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11125477A Pending JPS5445163A (en) 1977-09-17 1977-09-17 Shape detecting method

Country Status (1)

Country Link
JP (1) JPS5445163A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4591726A (en) * 1983-09-22 1986-05-27 Erwin Sick Gmbh Optik-Elektronik Optical fault seeking apparatus for webs
JP2011232324A (en) * 2010-04-09 2011-11-17 Nippon Steel Corp Surface defect inspection device, surface defect inspection method, and program

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4591726A (en) * 1983-09-22 1986-05-27 Erwin Sick Gmbh Optik-Elektronik Optical fault seeking apparatus for webs
JP2011232324A (en) * 2010-04-09 2011-11-17 Nippon Steel Corp Surface defect inspection device, surface defect inspection method, and program

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