JPS5445163A - Shape detecting method - Google Patents
Shape detecting methodInfo
- Publication number
- JPS5445163A JPS5445163A JP11125477A JP11125477A JPS5445163A JP S5445163 A JPS5445163 A JP S5445163A JP 11125477 A JP11125477 A JP 11125477A JP 11125477 A JP11125477 A JP 11125477A JP S5445163 A JPS5445163 A JP S5445163A
- Authority
- JP
- Japan
- Prior art keywords
- beams
- shape
- thru
- examined
- television camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE: To detect the shape abnormalities of flat members with high accuracy by radiating a plurality of beams at a fixed spacing on the surface of material being examined.
CONSTITUTION: At the time of detecting the shape of the metarial 1 to be examined by adiating beams in the width direction of the material 1 on the surface of the traveling material 1, receiving the reflected beams thereof with a television camera and processing the electrical signals thus obtained; a plurality of beams are simultaneously radiated at a fixed spacing l on the surface of the material 1 by using of larzer light sovrces 101 thru 106, beam collimators 121 thru 126, rotating mirrors 111 thru 116 and are received with the television camera in such a maner that its scanning direction becomes at a right angle to the beam direction, thence the spacings of the receiving signals thereof are obtaied and from the difference therein, the shape abnormality is detected. Thereby, the shape abnormalities of the flat members including the blister flaws of the web part of wide flange beam may be dtected with good accuracy
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11125477A JPS5445163A (en) | 1977-09-17 | 1977-09-17 | Shape detecting method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11125477A JPS5445163A (en) | 1977-09-17 | 1977-09-17 | Shape detecting method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5445163A true JPS5445163A (en) | 1979-04-10 |
Family
ID=14556512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11125477A Pending JPS5445163A (en) | 1977-09-17 | 1977-09-17 | Shape detecting method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5445163A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4591726A (en) * | 1983-09-22 | 1986-05-27 | Erwin Sick Gmbh Optik-Elektronik | Optical fault seeking apparatus for webs |
JP2011232324A (en) * | 2010-04-09 | 2011-11-17 | Nippon Steel Corp | Surface defect inspection device, surface defect inspection method, and program |
-
1977
- 1977-09-17 JP JP11125477A patent/JPS5445163A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4591726A (en) * | 1983-09-22 | 1986-05-27 | Erwin Sick Gmbh Optik-Elektronik | Optical fault seeking apparatus for webs |
JP2011232324A (en) * | 2010-04-09 | 2011-11-17 | Nippon Steel Corp | Surface defect inspection device, surface defect inspection method, and program |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SE7807659L (en) | METHODS AND DEVICES FOR DIMENSIONING WIDTHS OR SIMILAR GEOMETRICALLY UNDETERMINED FOREMALS | |
IT1083683B (en) | APPARATUS FOR TOMOGRAPHY | |
JPS569763A (en) | Beam recording device | |
JPS5445163A (en) | Shape detecting method | |
JPS56142404A (en) | System for measuring plate width | |
JPS57128834A (en) | Inspecting apparatus of foreign substance | |
JPS55134314A (en) | Wave observation device | |
JPS5255657A (en) | Photoelectric type range finding system | |
JPS55154402A (en) | Shape measuring apparatus | |
JPS5538002A (en) | Dicing line monitoring device | |
JPS5292778A (en) | Section indicating apparatus in use of ultrasonic wave | |
JPS55117945A (en) | Defect detection unit | |
JPS57118105A (en) | Detector | |
JPS5324233A (en) | Pattern examination system | |
JPS5563759A (en) | Ultrasonic wave oblique flaw detector | |
JPS551571A (en) | Non-contact ultrasonic flaw detection method and apparatus used for its execution | |
JPS5680710A (en) | Two-dimensional position detector | |
JPS649306A (en) | Detector for light transmitting fine pattern | |
JPS54103378A (en) | Densitometer | |
JPS54118891A (en) | Surface deffct inspecting device | |
JPS5539022A (en) | Optical thickness meter | |
JPS54136888A (en) | Surface defect detecting device | |
JPS5461777A (en) | Conveyed article detector for conveyor | |
JPS5292783A (en) | Detecting end of flaw detector | |
JPS5563776A (en) | Electron beam strength distribution detection |